CN107862111B - Propagation analysis method for evaluating system single-particle functional failure rate - Google Patents
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Abstract
The invention discloses a propagation analysis method for evaluating the single event functional failure rate of a system, which analyzes the probability of single event soft errors from generation to propagation to an output end by carrying out module division on a circuit system from the point of single event soft error propagation, and finally obtains the single event functional failure rate of the system. The method can successfully predict the single event function failure rate of the circuit system used in the space environment without carrying out heavy ion tests, provides a good judgment basis for the selection of equipment in the space environment, avoids the occurrence of the phenomenon that the equipment is well used on the ground and the serious single event function failure occurs once the equipment reaches the space environment, and the analysis result can be used as the basis for carrying out anti-radiation reinforcement on the system and the module.
Description
Technical Field
The invention relates to the field of circuit system reliability in a space environment, in particular to a propagation analysis method for evaluating the single-particle functional failure rate of a system.
Background
There are a large number of high energy particles in the space environment, such as high energy protons, high energy electrons, galaxy cosmic rays, etc., which are the main factors responsible for the radiation effect. The main objects of the radiation effect are satellites or other space vehicles operating in a space environment, and particularly, the circuit systems, which are responsible for receiving, acquiring, processing and transmitting signals on the satellites, are the main units of the satellites for realizing the functions thereof, and the reliability and stability of the circuits determine the working performance and the service life of the satellites.
The space circuit system has high integration level, and the main radiation effect is single event effect, especially single event upset. The single event effect resistance of the circuit in space is very important, the single event resistance of the circuit needs to be evaluated on the ground before satellite transmission, and multiple times of tests and evaluation are needed to ensure the reliability of the circuit. The general test method is a heavy ion test, the test method is long in time consumption and high in cost, the test is inconvenient to implement, the target is a circuit system which is already designed with a flow sheet, and the redesign is difficult even if the single particle sensitivity of the system is too high due to unreasonable design or other reasons. Therefore, a method capable of rapidly evaluating the single-particle sensitivity of the system in the design stage is required to obtain the reliability index of the system, such as the system failure rate caused by single-particle soft errors. The functional failure is characterized in that the output of the system to the outside does not realize the normal function of the system, and can be understood as an output error.
The system output error is shown at the system output end, and the generation of single-particle soft error may be in each module of the system, which includes the error propagation diffusion. The propagation process of the single-particle soft error is as follows: (1) a certain module in the system generates single-event soft errors, such as single-event upset; (2) the single-particle soft error has a certain probability to cause the module to generate an output error, and the output error of the module is transmitted to a downstream module through a signal connecting line; (3) the process that the downstream module processes the error signal may cause the downstream module to generate an output error is called as error coupling, and the probability that the error output of one module causes the output error of another module is defined as the coupling degree in the patent; (4) such errors propagate all the way to the output module resulting in output errors, manifested as output errors of the system, i.e. a functional failure.
However, no method for evaluating the output error of the system exists in the prior art, and the evaluation must be completed through heavy ion experiments. Therefore, if an evaluation method can be provided, which can successfully estimate the system functional failure rate without performing heavy ion experiments during the system design, it will save huge expenses for the circuit design of the system in the space environment.
Disclosure of Invention
Aiming at the problems in the prior art, the invention provides a propagation analysis method for evaluating the single-particle functional failure rate of a system, which is used for carrying out module division on a circuit system and analyzing the probability of a single-particle soft error from generation to propagation to an output end from the point of single-particle soft error propagation so as to finally obtain the single-particle functional failure rate of the system.
Specifically, the invention provides a propagation analysis method for evaluating the single-particle functional failure rate of a system, which is characterized in that a circuit system is divided into modules, and the probability of single-particle soft errors from generation to propagation to an output end is analyzed based on the propagation condition of the single-particle soft errors among the modules, so that the single-particle functional failure rate of the system is finally obtained.
Preferably, the method comprises the steps of:
(1) carrying out module division on the single event effect sensitive system to divide the single event effect sensitive system into N modules;
(2) determining the degree of coupling w between the individual modulesijThe degree of coupling wijRepresenting the probability of the input error of the module i to the module j to cause the output error of the module j, forming a coupling matrix of the system module, wherein the size is NxN, and i and j are positive integers smaller than N;
(3) determining a system output module from the divided modules, wherein the occurrence of an error at the output end of the system output module indicates that the system has a functional failure, and the functional failure rate of the system is the probability of the occurrence of a functional output error of the system output module;
(4) if the module i has an output error caused by a single-event soft error, the error state of the module i is changed from 0 to 1; according to the propagation rule, each propagation is that the row vector of the module error state is multiplied by the coupling matrix once, the propagation is performed for N times in total, the error propagation to the output end is ensured, and the output error rate P of the system output module caused by the error propagation is calculatediI.e., the system failure rate caused by the module;
(5) system functional failure rate P caused by error propagation through N-step propagation after output error occurs in each traversal module1～PN；
(6) The last step calculates the system function failure rate P caused by the module iiCalculating the system functional failure rate caused by each module as follows: fi＝σsi×AVFi×PiWhere σ issiIs a static flip section of module i, σsi×AVFiRepresenting the probability of the output error of the acquisition module caused by the single-particle soft error;
(7) accumulating system function failure rate caused by each module
And obtaining the single-particle functional failure rate F of the system.
Preferably, the method comprises the step of ignoring the condition that the two modules simultaneously generate single-event soft errors in the process of calculating the single-event failure rate.
Preferably, considering that in the circuit system, the single-particle soft error has an extremely short time from generation to propagation to the output end of the system, in the method, the condition that the single-particle soft error occurs in the propagation process is ignored.
Preferably, the method is used for analyzing signal processing circuitry.
It should be noted that some terms mentioned herein have the following meanings:
(1) structural sensitivity factor AVF (architectural usability factor): indicating the probability of causing a system or module to output an error after a module or system failure.
(2) Coupling degree: the probability of the wrong output of one module i causing the wrong output of another module j is defined as the coupling degree, and w is usedijIndicates that when the module i and the module j have no connection relationship, wijIf a system has N modules, an N × N matrix is formed among the modules in the whole system.
(3) Failure rate of single particle function of the system: for a system, the functional expression is the signal output by the output end module, and the system single-particle functional failure rate is the probability of error of the output end signal.
(4) Error state: the module is in a probability of outputting an error state.
(5) Fault injection: fault injection in the general sense means that a fault is deliberately introduced into a system through controlled experiments and the behavior of the system in the presence of the fault is observed. The fault injection of this patent: the functions of devices such as FPGA are realized by configuring each configurable bit, the functions of the devices are disturbed by modifying the bits in fault injection, and the modified behaviors of the configuration bits are observed.
(6) Static turnover section: the bit of an electronic device (such as FPGA) can be turned over due to radiation in a radiation environment (such as a space environment and a ground radiation source), and the turning over is causedThe transition probability is related to the bit number of the unit area of the device and the radiation resistance of the device, and the unit of the static turnover section is cm2And/bit, which represents the probability of bit flipping caused by single radiation particle incidence per unit area.
The method of the invention has the following advantages:
(1) the functional failure rate of a space application electronic system can be analyzed in a laboratory environment without heavy ion test or on-orbit test.
(2) The proposed propagation rules and steps form a complete set of analysis methods.
(3) The functional failure times obtained by analysis of the propagation method are compared with the functional failure times obtained by a heavy ion test, the error is within 30 percent, and the analysis result is accurate.
(4) Compared with heavy ion tests or long-time fault injection, the propagation analysis method is short in time and low in cost.
(5) The related parameters such as coupling degree between modules, structure sensitive factor (AVF) of the modules and the like can be applied to other system analysis with related modules, and have parameter portability.
The method can successfully predict the single event function failure rate of the circuit system used in the space environment in the simulation environment, provides a good theoretical basis for circuit design and analysis in the space environment, and avoids the phenomenon that the equipment is well used on the ground and serious single event function failure occurs once the equipment reaches the space environment.
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FIG. 1 shows the connection relationship and coupling between modules of a modulator as an example of an object to be analyzed;
FIG. 2 is a flow chart of a propagation analysis method for evaluating the single event dysfunction rate of the system of the present invention.
Detailed Description
The invention is described in detail below with reference to the drawings and the embodiments thereof, but the scope of the invention is not limited thereto.
It should be noted that the propagation analysis method for evaluating the single event functional failure rate of the system is established based on the following propagation rules:
(1) because the probability of single-particle soft errors of the modules in actual work is extremely low, the condition that the two modules simultaneously generate the single-particle soft errors is not considered;
(2) in a circuit system, a short time is required from generation to propagation of a single-particle soft error to the output end of the system, so that the condition of the single-particle soft error in the propagation process is not considered in the analysis process;
(3) if the module has single-event soft error, namely the error state is changed from 0 to 1;
(4) the error state of the module is not more than 1 in the process of propagation, and the error state represents the probability of the module outputting errors, so that the error state cannot be more than 1;
(5) assuming that a single-event soft error occurs in the module i, the corresponding degree of coupling wiiBecause the main form of the single-event soft error is upset, the single-event upset cannot be automatically repaired without reconfiguration of a system, and w is 1ii1 means that an error will always exist in module i; and the other modules corresponding coupling degree diagonal terms wjjThen all are 0's and since the signal processing of the circuitry is continuous and directed to the output, the error does not stay in the module at all times and no soft errors occur in other modules themselves. In this embodiment, the analysis is performed completely according to the propagation rule.
Fig. 1 shows a connection relationship and a coupling degree between respective modules of a modulator as an example of an object to be analyzed. The following takes the modulator in fig. 1 as an example to specifically describe the analysis process of the method of the present invention when analyzing the signal processing circuitry.
(1) And carrying out module division on the modulation system to divide the modulation system into N modules.
The modulation system is an analysis object of the embodiment, and is a common signal processing circuit system, and the function realization principle of the modulation system is as follows:
the modulation system generates an original signal through a signal source generation module, and finally outputs the original signal through modulation after a series of sequential modulation of scrambling, RS coding, convolutional coding and insertion of unique words. By analyzing the function realization and the internal code, the system is mainly realized by a signal source module, a scrambling module, a coding module, a unique word insertion module and a digital modulation module, and a clock management module and a reset module realize the management control function of the system.
Therefore, in this embodiment, according to the functions and connection relationships of each part of the system, the modulation system is divided into 8 modules, which are:
1) clock generation module
2) Reset generation module
3) Information source generating module
4) Scrambling module
5) RS coding module
6) Convolutional coding module
7) Unique character insertion module
8) Digital modulation module
(2) Analyzing and obtaining the coupling degree w of each moduleijDegree of coupling wijDefined as the probability that an input error of module i to module j results in an output error of module j and forms a coupling matrix of size N × N, here 8 × 8.
The coupling degree of the modulator can be obtained through fault injection of the module, if the coupling degree of the module 1 to the module 2 is to be analyzed, traversal fault injection is carried out on connection signals from the module 1 to the module 2, the probability of error output by the module 2 is analyzed, and then the coupling degree w of the module 1 to the module 2 can be obtained12. FIG. 1 also shows the degree of coupling between the various modules; the degree of coupling between the unconnected modules is 0. The coupling matrix of the modulation system is as follows:
(3) next, the output modules of the system, on which the system output is located, are analyzed, and the error occurring at the output ends of the system output modules is defined as the system failing to function, and the analysis of the system failing to function rate is the analysis of the probability of the functional output error occurring at the output modules. In this embodiment, the output module is a digital modulation module.
(4) Then analyzing the functional failure rate P caused by 8 times of propagation of each module output error1～P8. (the error state of the system is unchanged after the soft error is propagated to the output port by the propagation analysis method, and the propagation can be ensured to be propagated to the output port after the soft error is propagated for 8 times.)
Assuming that a module i generates an output error caused by a single-event soft error, and the error state of the module i is changed from 0 to 1; according to the propagation rule, each propagation is that the row vector of the module error state is multiplied by the coupling matrix once, and the propagation is performed for N times in total, so that the error is ensured to be propagated to the output end. Analyzing the output error rate P of the system output moduleiI.e., the system failure rate caused by the module; the following equation indicates when i has a soft error t0From the moment to the next moment t1Is transmitted.
(5) System functional failure rate P caused by error propagation through N-step propagation after output error occurs in each traversal module1～PN。
In particular, the probability of a block output error due to a single-event soft error per block, i.e., σ per block, is analyzedsi×AVFiThe system was run on a Xilinx XC4VSX55 chip, assuming that the LET value of the particles when exposed to radiation was 3.03MeV/mg.cm-2Finding out relevant documents can obtain that the static flip section of the XC4VSX55 chip is 2.3e under the LET value irradiation condition-9cm2And/bit. In this embodiment, the AVF is obtained by fault injection, and if a certain configuration bit of the module is subjected to fault injection and the module outputs an error, the bit is a sensitive bit, and the AVF is a ratio of a sensitive bit number of the module to a resource bit number occupied by the module. (the modules of the FPGA all occupy a certain number of resource bits, and the module functions are realized through the occupied resource bits.)
(6) And calculating the system function failure rate caused by each module.
Obtaining the functional failure rate F caused by the module single-particle soft error according to the probability of the module output error caused by the single-particle soft error of each module and the functional failure rate F caused by the output error of each module1～F8In which F isi＝σsi×AVFi×Pi. Wherein sigmasiThe static flip section of module i, which is usually a chip, is defined by σsiThe static cross section of the chip can be obtained from a paper or a device radiation resistance test report; AVFiThe architecture sensitivity factor (architecture virtualization probability factor) of a module i is defined in the industry as the probability of failure after a soft error occurs in a system, and the architecture (module can also be regarded as a system) is defined as the probability of an output error caused by a single-event soft error occurring in the module. Sigmasi×AVFiThe probability of an output error of the module due to a single-event soft error can be obtained.
Table 1 below shows the flip section, AVF, and probability P of module output error to cause system function failure for each moduleiAnd the functional failure rate F caused by single-event soft error of each modulei。
TABLE 1
(7) Summing the modulation system failure rates caused by the various modules
The single-particle failure rate F of the modulation system is obtained, and as can be seen from the above table, the system failure rate is 3.8294e-10cm2/bit。
The inventor of the application analyzes various circuit systems by using the method, compares the functional failure times obtained by analyzing the propagation method with the functional failure times obtained by heavy ion test, and has the error within 30 percent and accurate analysis result.
The foregoing is considered as illustrative and not restrictive, and all changes that come within the spirit and scope of the invention are intended to be embraced therein.
While the principles of the invention have been described in detail in connection with the preferred embodiments thereof, it will be understood by those skilled in the art that the foregoing embodiments are merely illustrative of exemplary implementations of the invention and are not limiting of the scope of the invention. The details of the embodiments are not to be interpreted as limiting the scope of the invention, and any obvious changes, such as equivalent alterations, simple substitutions and the like, based on the technical solution of the invention, can be interpreted without departing from the spirit and scope of the invention.
Claims (4)
1. A propagation analysis method for evaluating the failure rate of single particle function of a system is characterized in that a circuit system is divided into modules, the probability of single particle soft errors from generation to propagation to an output end is analyzed based on the propagation condition of the single particle soft errors among the modules, and finally the failure rate of single particle function of the system is obtained,
the method comprises the following steps:
(1) carrying out module division on the single event effect sensitive system to divide the single event effect sensitive system into N modules;
(2) determining the degree of coupling w between the individual modulesijThe degree of coupling wijRepresenting the probability of the input error of the module i to the module j to cause the output error of the module j, forming a coupling matrix of the system module, wherein the size of the coupling matrix is NxN, and i and j are positive integers less than or equal to N;
(3) determining a system output module from the divided modules, wherein the occurrence of an error at the output end of the system output module indicates that the system has a functional failure, and the functional failure rate of the system is the probability of the occurrence of a functional output error of the system output module;
(4) if module iAn output error caused by a single-event soft error occurs, and the error state of the output error is changed from 0 to 1; according to the propagation rule, each propagation is that the row vector of the module error state is multiplied by the coupling matrix once, the propagation is performed for N times in total, the error propagation to the output end is ensured, and the output error rate P of the system output module caused by the error propagation is calculatediI.e., the system failure rate caused by the module;
(5) system functional failure rate P caused by error propagation through N-step propagation after output error occurs in each traversal module1～PN；
(6) The last step calculates the system function failure rate P caused by the module iiCalculating the system functional failure rate caused by each module as follows: fi＝σsi×AVFi×PiWhere σ issiIs a static flip section of module i, σsi×AVFiIndicating the probability of an output error of the acquisition module due to a single event soft error, AVFiIs the structural sensitivity factor of module i;
(7) accumulating system function failure rate caused by each module
And obtaining the single-particle functional failure rate F of the system.
2. The method for propagation analysis of single event dysfunction rate of an evaluation system according to claim 1, wherein the method comprises ignoring the situation that two modules simultaneously generate single event soft errors in the process of calculating single event dysfunction rate.
3. The method according to claim 2, wherein the propagation of single-event soft errors during the propagation process is ignored in the method considering that the single-event soft errors are very short time from generation to propagation to the output of the system in the circuit system.
4. A propagation analysis method for evaluating a system single particle failure rate according to claim 2, wherein the method is used for analyzing signal processing circuitry.
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