CN107862111A - A kind of propagation analysis method of assessment system single-particle disabler rate - Google Patents
A kind of propagation analysis method of assessment system single-particle disabler rate Download PDFInfo
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- 239000002245 particle Substances 0.000 title claims abstract description 79
- 238000004458 analytical method Methods 0.000 title claims abstract description 39
- 238000000034 method Methods 0.000 claims abstract description 27
- 230000001902 propagating effect Effects 0.000 claims abstract description 12
- 230000000644 propagated effect Effects 0.000 claims abstract description 5
- 230000008878 coupling Effects 0.000 claims description 27
- 238000010168 coupling process Methods 0.000 claims description 27
- 238000005859 coupling reaction Methods 0.000 claims description 27
- 239000011159 matrix material Substances 0.000 claims description 8
- 230000003068 static effect Effects 0.000 claims description 6
- 230000006854 communication Effects 0.000 claims description 5
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- 230000000694 effects Effects 0.000 claims description 4
- 230000001953 sensory effect Effects 0.000 claims description 2
- 238000002474 experimental method Methods 0.000 abstract description 11
- 238000005510 radiation hardening Methods 0.000 abstract 1
- 230000005855 radiation Effects 0.000 description 7
- 238000013461 design Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 4
- 238000003780 insertion Methods 0.000 description 3
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- JJWKPURADFRFRB-UHFFFAOYSA-N carbonyl sulfide Chemical compound O=C=S JJWKPURADFRFRB-UHFFFAOYSA-N 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000012512 characterization method Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000012812 general test Methods 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 230000007480 spreading Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 230000007306 turnover Effects 0.000 description 1
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Abstract
The invention discloses a kind of propagation analysis method of assessment system single-particle disabler rate, methods described is by carrying out Module Division, the angle propagated from single-particle soft error to circuit system, analyze the probability of single-particle soft error output end from producing to propagating to, the final single-particle disabler rate for obtaining system.The inventive method need not carry out heavy ion experiment can and successfully predict single-particle disabler rate for the circuit system in space environment, good basis for estimation is provided for the selection of equipment in space environment, equipment is avoided the occurrence of to use on ground well, and serious single-particle disabler phenomenon occurs once space environment is reached and occurs, and analysis result can be as the foundation that radiation hardening is done to system and module.
Description
Technical field
The present invention relates to the circuit system reliability field in space environment, and in particular to a kind of assessment system single-particle work(
The propagation analysis method of energy crash rate, this method can be used from the single-particle disabler rate for the angle estimator system for propagating analysis
In the single-particle sensitivity assessment of space circuit system, and the analysis of sensitive position, sensitive blocks, add for space circuit system
It is fixed to be counted as referring to.
Background technology
There are substantial amounts of high energy particle, such as high energy proton, high energy electron, galactic cosmic rays, these grains in space environment
Son is the principal element for causing radiation effect.The influence object of radiation effect is mainly the satellite or its operated in space environment
His spacecraft, especially circuit system, the signal that these circuit systems are responsible on star receives, collection, processing, sends, and is satellite
The formant of its function is realized, its reliability and stability determines service behaviour and the life-span of satellite.
Space circuit system integrated level is high, and its main radiation effect is single particle effect, especially single-particle inversion.
The anti-single particle effect capability of circuit is extremely important in space, will be to the anti-single particle of circuit on ground before satellite launch
It can be assessed, it is necessary to multiple testing and evaluation be done, to ensure its reliability.In general test method is heavy ion experiment,
Time-consuming for this test method, costly, and experiment implementation is inconvenient, and object is all the circuit system of complete design flow
System, even if too high because designing unreasonable or other reasonses system single-particle sensitiveness, it is also difficult to redesign.Therefore it is required to
In the method for design phase RES(rapid evaluation system) single-particle sensitiveness, the reliability index of system is obtained, such as single-particle soft error
Caused systemic-function crash rate.Disabler shows as the output of system external and system normal function is not implemented, can be with
It is interpreted as a kind of output error.
System output error finds expression in system output, and the generation of single-particle soft error may be in each mould of system
Block, the Spreading and diffusion of mistake is contained among these.The communication process of single-particle soft error is：(1) a certain module occurs in system
Single-particle soft error, such as single-particle inversion；(2) this single-particle soft error has certain probability to cause the module that output occurs wrong
Miss, and the output error of the module travels to the module in downstream by signal connecting line；(3) place of the downstream module to error signal
Reason may cause downstream module that output error occurs again, and this process is referred to as the coupling of mistake, in this patent by a module
Mistake output causes the definition of probability of another module generation output error to be the degree of coupling；(4) so mistake travels to output always
End module causes output error, shows as the output error of system, i.e. disabler.
But still without the method assessed for this system output error in currently available technology, it is necessary to
Completed by heavy ion experiment.If it is possible to provide a kind of appraisal procedure, it can be in system design, just success
Ground Prediction System disabler rate, without carrying out heavy ion experiment, it will be the circuit design section of system in space environment
Save huge expense.
The content of the invention
For the above-mentioned problems in the prior art, the present invention provides a kind of assessment system single-particle disabler rate
Analysis method is propagated, this method carries out Module Division, and the angle propagated from single-particle soft error, analysis to circuit system
The probability of single-particle soft error output end from producing to propagating to, the final single-particle disabler rate for obtaining system.
Specifically, the present invention provides a kind of propagation analysis method of assessment system single-particle disabler rate, the side
Method by circuit system carry out Module Division, based on single-particle soft error intermodule propagation condition, analysis single-particle it is soft
The probability of mistake output end from producing to propagating to, the final single-particle disabler rate for obtaining system.
Preferably, methods described comprises the following steps：
(1) Module Division is carried out to single particle effect sensory system, is divided into N number of module；
(2) degree of coupling w between modules is determinedij, the degree of coupling wijInput errors of the representation module i to module j is led
The probability of module j output error is caused, forms the coupling matrix of system module, size is N × N, wherein i and j for less than N just
Integer；
(3) system output module is determined from the module divided, the output end of the system output module makes a mistake
Representing system, there occurs disabler, systemic-function crash rate are general for the system output module generating function output error
Rate；
(4) if output error caused by single-particle soft error occurs for module i, its error condition is changed into 1 from 0；According to propagation
Rule, the row vector for propagating as module error state every time are multiplied once with coupling matrix, amount to and propagate n times, it is ensured that mistake
Output end is propagated to, calculating it causes the output error rate P of system output modulei, i.e., systemic-function fails caused by the module
Rate；
(5) systemic-function caused by traveling through the error propagation that each module occurs to propagate by N steps after output error fails
Rate P1~PN；
(6) systemic-function crash rate P caused by previous step has calculated module ii, calculate system caused by modules
Disabler rate is：Fi=σsi×AVFi×Pi, wherein σsiFor module i static upset cross section, σsi×AVFiRepresent to obtain mould
The probability of block output error caused by single-particle soft error；
(7) add up systemic-function crash rate caused by modulesThe single-particle disabler of acquisition system
Rate F.
Preferably, methods described is ignored two modules during being included in calculating single-particle disabler rate while occurred
The situation of single-particle soft error.
Preferably, it is contemplated that in circuit system, single-particle soft error system output from producing to propagating to is one
The extremely short time, so in the process, ignoring the situation that single-particle soft error occurs in communication process.
Preferably, methods described is used for signal Analysis processing circuit system.
It should be noted that some terms its implication that the present invention is previously mentioned in the text is as follows：
(1) structure sensitive factors A VF (architectural vulnerability factor)：Represent a module or
After system jam, cause the probability of system or module output error.
(2) degree of coupling：One module i mistakes output causes the definition of probability of another module j generations output error to be coupling
Degree, uses wijRepresent, when module i and module j does not have annexation, wij=0, if a system has N number of module, then whole
N × N matrix is formed between individual system modules.
(3) system single-particle disabler rate：For a system, the performance of its function is exactly that it exports the defeated of end module
The signal gone out, system single-particle disabler rate are the probability that output end signal makes a mistake.
(4) error condition：Module is in output error shape probability of state.
(5) direct fault location：Direct fault location in general sense refers to deliberately introduce failure into system by controlled experiment,
And behavior of observing system when failure be present.The direct fault location of this patent：Its function of the devices such as FPGA is by each configurable
Position is configured and realizes its function, and direct fault location disturbs its function by being modified to these positions, and observation configuration bit is repaiied
Behavior after changing.
(6) static upset cross section：The bit positions of electronic device (such as FPGA) are in radiation environment (such as space environment, terrestrial surface radiation
Source) under can cause to overturn due to radiation, the bit digits and device of this upset probability and device unit area are in itself
Radiation resistance is relevant, and the unit of static upset cross section is cm2/ bit, represent that unit area, single radiating particle incidence cause
The probability that bit positions are overturn.
The method have the advantages that：
(1) heavy ion experiment or in-orbit experiment are needed not move through, can analysis space applying electronic in laboratory environments
The disabler rate of system.
(2) propagation rule and step that propose form the analysis method of complete set.
(3) disabler time that the disabler number for once obtaining the analysis of transmission method obtains with heavy ion experiment
Number is contrasted, and for error within 30%, analysis result is accurate.
(4) compared with heavy ion experiment or prolonged direct fault location, the propagation analysis method used time is short, expense is few.
(5) structure sensitive factor (AVF) of relevant parameter such as the intermodule degree of coupling, module etc., can have correlation module
Other systems analysis in apply, possess parameter portability.
The method of the present invention can successfully predict the simple grain for the circuit system in space environment under simulated environment
Subfunction crash rate, the selection for circuit design in space environment and analysis provide good theoretical foundation, avoid the occurrence of and set
It is standby to use single-particle disabler phenomenon appearance that is good, and occurring serious once space environment is reached on ground.
Brief description of the drawings
Accompanying drawing 1 is the annexation and the degree of coupling between the modulator modules as analyzed object example；
Accompanying drawing 2 is the flow chart of the propagation analysis method of the assessment system single-particle disabler rate of the present invention.
Embodiment
Below in conjunction with accompanying drawing and embodiment, the present invention is described in detail, but not therefore by the protection model of the present invention
Enclose and be limited among the scope of embodiment description.
It should be noted that the propagation analysis method of the assessment system single-particle disabler rate of the present invention, is based on such as
Lower propagation rule and establish：
(1) it is extremely low that the probability of single-particle soft error occurs in real work due to module, so not considering two modules
The situation of single-particle soft error occurs simultaneously；
(2) in circuit system, single-particle soft error system output from producing to propagating to is an extremely short time,
So during analysis, do not consider the situation of single-particle soft error occurs in communication process；
(3) if it is that error condition is changed into 1 from 0 that single-particle soft error, which occurs, for module；
(4) error condition of module is no more than 1 in communication process, the probability of error condition characterization module output error,
So 1 can not possibly be more than；
(5) assume that single-particle soft error occurs for module i, then its corresponding degree of coupling wii=1, because single-particle soft error
Principal mode is upset, and single-particle inversion will not be repaired automatically without reconfiguring for system, wii=1 means that wrong meeting
Always present in module i；And the diagonal item w of the degree of coupling corresponding to other modulesjjAll it is then 0, because at the signal of circuit system
Reason process is continuous and is transmitted to output end, so mistake will not stop in the module always, and other modules are in itself
Soft error does not occur.In the present embodiment, the analysis completely according to the progress of this propagation rule.
Fig. 1 is the annexation and the degree of coupling between the modulator modules as analyzed object example.Below just with
Exemplified by modulator in Fig. 1, carry out analysis of the specific method for introducing the present invention when analyzing signal processing circuitry
Process.
(1) Module Division is carried out to modulating system, is divided into N number of module.
Modulating system is the analysis object of the present embodiment, and it is common signal processing circuitry, the work(of modulating system
Can realization principle be：
Modulating system generates primary signal by signal source generation module, and scrambled, RS codings, convolutional encoding insertion are only
After the special a series of order modulation of word, modulation externally output is eventually passed through.By analyzing the realization of its function and internal code, its
System, which is mainly realized, to be realized by signal source module, scrambling, coding, unique word insertion, digital modulation module, also clock
Management module and reseting module realize the management control function of system.
Therefore, in the present embodiment, according to the function and annexation of system various pieces, modulating system is divided into 8
Module, it is respectively：
1) clock generation module
2) generation module is resetted
3) information source generation module
4) scrambling module
5) RS coding modules
6) convolutional encoder module
7) unique word insertion module
8) digital modulation module
(2) analysis obtains the degree of coupling w of modulesij, degree of coupling wijInput errors of the module i to module j is defined as to lead
The probability of module j output error is caused, and forms coupling matrix, size is N × N, is here 8*8.
The degree of coupling of modulator can be obtained by the direct fault location of module, if wanting coupling of the analysis module 1 to module 2
Degree, then just carry out traversal direct fault location to the connection signal of module 1 to module 2, the probability of the output error of analysis module 2, i.e.,
Degree of coupling w of the module 1 to module 2 can be obtained12.Fig. 1 also show the degree of coupling between modules；Disjunct intermodule
The degree of coupling is 0.The coupling matrix of modulating system is as follows：
(3) next, analyzing the output module of system, i.e. in which module, these systems are defeated for system output
The output end for going out module makes a mistake and is defined as system there occurs disabler, and analysis system disabler rate is exactly to analyze this
The probability of a little output module generating function output errors.In the present embodiment, output module is digital modulation module.
(4) and then each module output error is analyzed by disabler rate P caused by 8 propagation1~P8.(this propagation
The error condition that analysis method soft error travels to system after output port is constant, propagates 8 times and can ensure that mistake all passes
It is multicast to output end.)
Assuming that output error caused by single-particle soft error occurs for module i, its error condition is changed into 1 from 0；Advised according to propagating
Then, the row vector for propagating as module error state every time is multiplied once with coupling matrix, amounts to and propagates n times, it is ensured that mistake passes
Cast to output end.Analyzing it causes the output error rate P of system output modulei, i.e., systemic-function crash rate caused by the module；
Formula below represents that t during soft error occurs for i0Moment is to subsequent time t1Propagation.
(5) systemic-function caused by traveling through the error propagation that each module occurs to propagate by N steps after output error fails
Rate P1~PN。
Specifically, the probability of module output error caused by analyzing each module single-particle soft error, i.e., each module
σsi×AVFi, the system operation is on the XC4VSX55 chips of Xilinx companies, it is assumed that the LET values of particle when it is in radiation
For 3.03MeV/mg.cm-2, searching pertinent literature can obtain, and XC4VSX55 chips under this LET value radiation parameter, turn over by static state
It is 2.3e to turn section-9cm2/bit.In the present embodiment, AVF is obtained by direct fault location, if a certain configuration bit to module
Progress direct fault location, and module output error, then the position is sensitive position, and AVF is shared by the sensitive digit and module of module
The ratio between resource digit.(FPGA module can all take a number of resource-niche, and module work(is realized by shared resource-niche
Energy.)
(6) systemic-function crash rate caused by calculating modules.
Led according to the probability of module output error caused by each module single-particle soft error and each module output error
The disabler rate of cause obtains disabler rate F caused by module single-particle soft error1~F8, wherein Fi=σsi×AVFi×Pi。
Wherein σsiFor module i static upset cross section, generally, module belongs to a chip, so σsiAnd chip is quiet
State section, it can be obtained from paper or device radiation resistance test report；AVFiFor the module i structure sensitive factor
(architectural vulnerability factor), the in the industry definition for system are failed after soft error occurs for system
Probability, herein for module (module can also be considered as a system) be defined as module occur single-particle soft error cause to export
The probability of mistake.σsi×AVFiThe probability of module output error caused by single-particle soft error can be obtained.
Table 1 below shows that the upset cross section, AVF, module output error of modules are general to causing systemic-function to fail
Rate PiAnd disabler rate F caused by the single-particle soft error of each modulei。
Table 1
(7) add up modulating system disabler rate caused by modulesObtain the single-particle of modulating system
Disabler rate F, can be seen that systemic-function crash rate from form above is 3.8294e-10cm2/bit。
Present inventor is analyzed a variety of circuit systems using the method for the present invention, by point of transmission method
Analyse the disabler number that obtained disabler number obtains with heavy ion experiment to be contrasted, error is divided within 30%
It is accurate to analyse result.
Presently preferred embodiments of the present invention is the foregoing is only, any formal limitation is not done to the present invention, it is all at this
Within the spirit and principle of invention, the technical spirit according to the present invention is to any simple modification made for any of the above embodiments, equivalent
Change and modification, still fall within protection scope of the present invention.
Although the principle of the present invention is described in detail above in conjunction with the preferred embodiments of the present invention, this area skill
Art personnel are it should be understood that above-described embodiment is only the explanation to the exemplary implementation of the present invention, not to present invention bag
Restriction containing scope.Details in embodiment is simultaneously not meant to limit the scope of the invention, in the spirit without departing substantially from the present invention and
In the case of scope, any equivalent transformation based on technical solution of the present invention, simple replacement etc. are obvious to be changed, and is all fallen within
Within the scope of the present invention.
Claims (5)
1. a kind of propagation analysis method of assessment system single-particle disabler rate, methods described to circuit system by carrying out mould
Block divide, based on single-particle soft error intermodule propagation condition, analysis single-particle soft error exported from producing to propagating to
The probability at end, the final single-particle disabler rate for obtaining system.
2. the propagation analysis method of assessment system single-particle disabler rate according to claim 1, it is characterised in that institute
The method of stating comprises the following steps：
(1) Module Division is carried out to single particle effect sensory system, is divided into N number of module；
(2) degree of coupling w between modules is determinedij, the degree of coupling wijInput errors of the representation module i to module j causes mould
The probability of block j output error, forms the coupling matrix of system module, and size is that N × N, wherein i and j are just whole less than N
Number；
(3) system output module is determined from the module divided, the output end of the system output module makes a mistake i.e. table
Show system there occurs disabler, systemic-function crash rate is the probability of the system output module generating function output error；
(4) if output error caused by single-particle soft error occurs for module i, its error condition is changed into 1 from 0；Foundation propagation rule,
The row vector for propagating as module error state every time is multiplied once with coupling matrix, amounts to and propagates n times, it is ensured that error propagation is extremely
Output end, calculating it causes the output error rate P of system output modulei, i.e., systemic-function crash rate caused by the module；
(5) systemic-function crash rate P caused by walking the error propagation propagated by N after each module generation output error of traversal1~
PN；
(6) systemic-function crash rate P caused by previous step has calculated module ii, calculate systemic-function caused by modules
Crash rate is：Fi=σsi×AVFi×Pi, wherein σsiFor module i static upset cross section, σsi×AVFiRepresent obtain module because
The probability of output error caused by single-particle soft error；
(7) add up systemic-function crash rate caused by modulesThe single-particle disabler rate F of acquisition system.
3. the propagation analysis method of assessment system single-particle disabler rate according to claim 2, it is characterised in that institute
The method of stating ignores two modules during being included in calculating single-particle disabler rate while the feelings of single-particle soft error occurs
Condition.
4. the propagation analysis method of assessment system single-particle disabler rate according to claim 2, it is characterised in that examine
To consider in circuit system, single-particle soft error system output from producing to propagating to is an extremely short time, so
In methods described, ignore the situation that single-particle soft error occurs in communication process.
5. the propagation analysis method of assessment system single-particle disabler rate according to claim 2, it is characterised in that institute
State method and be used for signal Analysis processing circuit system.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109408975A (en) * | 2018-10-30 | 2019-03-01 | 北京航空航天大学 | Satellite soft error communication process modeling and simulation method based on Finite State Machine |
| CN112257226A (en) * | 2020-09-17 | 2021-01-22 | 北京空间飞行器总体设计部 | Heavy ion single particle turnover rate analysis method independent of device process parameters |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102521467A (en) * | 2011-12-29 | 2012-06-27 | 北京航空航天大学 | Bit-by-bit upset fault injection method specifically for SRAM (static random access memory) type FPGA (field programmable gate array) |
| US20140189696A1 (en) * | 2012-12-28 | 2014-07-03 | Enric H. Abellanas | Failure rate based control of processors |
| CN103913662A (en) * | 2014-04-14 | 2014-07-09 | 中国人民解放军国防科学技术大学 | Method for testing single-particle function failure rate of system based on fault injection |
| CN104035834A (en) * | 2014-07-02 | 2014-09-10 | 东南大学 | Buffering reliability analytical method considering safeguard measures |
| CN104102562A (en) * | 2014-06-23 | 2014-10-15 | 中国人民解放军国防科学技术大学 | Cellular automata-based single particle soft error system level propagation analysis method |
| CN104123225A (en) * | 2014-07-23 | 2014-10-29 | 中国人民解放军国防科学技术大学 | Method for analyzing system single-particle soft error propagation process through fault coupling matrix |
-
2017
- 2017-10-19 CN CN201710977051.3A patent/CN107862111B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102521467A (en) * | 2011-12-29 | 2012-06-27 | 北京航空航天大学 | Bit-by-bit upset fault injection method specifically for SRAM (static random access memory) type FPGA (field programmable gate array) |
| US20140189696A1 (en) * | 2012-12-28 | 2014-07-03 | Enric H. Abellanas | Failure rate based control of processors |
| CN103913662A (en) * | 2014-04-14 | 2014-07-09 | 中国人民解放军国防科学技术大学 | Method for testing single-particle function failure rate of system based on fault injection |
| CN104102562A (en) * | 2014-06-23 | 2014-10-15 | 中国人民解放军国防科学技术大学 | Cellular automata-based single particle soft error system level propagation analysis method |
| CN104035834A (en) * | 2014-07-02 | 2014-09-10 | 东南大学 | Buffering reliability analytical method considering safeguard measures |
| CN104123225A (en) * | 2014-07-23 | 2014-10-29 | 中国人民解放军国防科学技术大学 | Method for analyzing system single-particle soft error propagation process through fault coupling matrix |
Non-Patent Citations (3)
| Title |
|---|
| HE WEI 等: "SEE Vulnerability Bit Analysis Method for Switch Matrix of SRAM-based FPGA Circuits", 《2016 IEEE INTERNATIONAL CONFERENCE ON MECHATRONICS AND AUTOMATION》 * |
| 何伟: "SRAM型FPGA单粒子故障传播特性", 《中国优秀硕士学位论文全文数据库 工程科技Ⅱ辑》 * |
| 周永彬 等: "SRAM型FPGA单粒子翻转失效率自动测试系统设计与实现", 《计算机测量与控制》 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109408975A (en) * | 2018-10-30 | 2019-03-01 | 北京航空航天大学 | Satellite soft error communication process modeling and simulation method based on Finite State Machine |
| CN112257226A (en) * | 2020-09-17 | 2021-01-22 | 北京空间飞行器总体设计部 | Heavy ion single particle turnover rate analysis method independent of device process parameters |
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