CN102891093A - 测量超级结深沟槽内外延层电阻纵向分布的方法 - Google Patents
测量超级结深沟槽内外延层电阻纵向分布的方法 Download PDFInfo
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN108258045A (zh) * | 2016-12-29 | 2018-07-06 | 无锡华润华晶微电子有限公司 | 超结半导体器件的制备方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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US5652151A (en) * | 1995-04-27 | 1997-07-29 | Nec Corporation | Method for determining an impurity concentration profile |
JP2006229145A (ja) * | 2005-02-21 | 2006-08-31 | Oki Electric Ind Co Ltd | 不純物の注入深さの監視方法 |
CN101278377A (zh) * | 2005-10-06 | 2008-10-01 | 胜高股份有限公司 | 半导体衬底及其制造方法 |
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Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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US5652151A (en) * | 1995-04-27 | 1997-07-29 | Nec Corporation | Method for determining an impurity concentration profile |
JP2006229145A (ja) * | 2005-02-21 | 2006-08-31 | Oki Electric Ind Co Ltd | 不純物の注入深さの監視方法 |
CN101278377A (zh) * | 2005-10-06 | 2008-10-01 | 胜高股份有限公司 | 半导体衬底及其制造方法 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108258045A (zh) * | 2016-12-29 | 2018-07-06 | 无锡华润华晶微电子有限公司 | 超结半导体器件的制备方法 |
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