CN102890166B - 检查用接触器和检查用夹具 - Google Patents

检查用接触器和检查用夹具 Download PDF

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Publication number
CN102890166B
CN102890166B CN201210252405.5A CN201210252405A CN102890166B CN 102890166 B CN102890166 B CN 102890166B CN 201210252405 A CN201210252405 A CN 201210252405A CN 102890166 B CN102890166 B CN 102890166B
Authority
CN
China
Prior art keywords
notch part
inspection
cartridge
cylinder portion
checkpoint
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201210252405.5A
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English (en)
Chinese (zh)
Other versions
CN102890166A (zh
Inventor
沼田清
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidec Advance Technology Corp
Original Assignee
Nidec Read Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nidec Read Corp filed Critical Nidec Read Corp
Publication of CN102890166A publication Critical patent/CN102890166A/zh
Application granted granted Critical
Publication of CN102890166B publication Critical patent/CN102890166B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2896—Testing of IC packages; Test features related to IC packages

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Environmental & Geological Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
CN201210252405.5A 2011-07-21 2012-07-20 检查用接触器和检查用夹具 Active CN102890166B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2011-159519 2011-07-21
JP2011159519A JP5845678B2 (ja) 2011-07-21 2011-07-21 検査用接触子及び検査用治具

Publications (2)

Publication Number Publication Date
CN102890166A CN102890166A (zh) 2013-01-23
CN102890166B true CN102890166B (zh) 2015-03-25

Family

ID=47533731

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201210252405.5A Active CN102890166B (zh) 2011-07-21 2012-07-20 检查用接触器和检查用夹具

Country Status (4)

Country Link
JP (1) JP5845678B2 (ja)
KR (1) KR101312340B1 (ja)
CN (1) CN102890166B (ja)
TW (1) TWI457571B (ja)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6317270B2 (ja) * 2015-02-03 2018-04-25 株式会社日本マイクロニクス 電気的接続装置およびポゴピン
TW201723492A (zh) * 2015-12-31 2017-07-01 旺矽科技股份有限公司 探針結構及探針裝置
JP2017142080A (ja) * 2016-02-08 2017-08-17 日本電産リード株式会社 接触端子、検査治具、及び検査装置
WO2018101232A1 (ja) * 2016-11-30 2018-06-07 日本電産リード株式会社 接触端子、検査治具、及び検査装置
CN109596677A (zh) * 2018-11-02 2019-04-09 大族激光科技产业集团股份有限公司 一种质量检测装置、方法、系统及一体式探针组件
JP2022060711A (ja) 2020-10-05 2022-04-15 東京特殊電線株式会社 コンタクトプローブ

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101900748A (zh) * 2009-05-29 2010-12-01 日本电产理德株式会社 检查用夹具
CN101907642A (zh) * 2009-06-02 2010-12-08 日本电产理德株式会社 检查用夹具及检查用触头

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3990915B2 (ja) 2002-01-23 2007-10-17 日本発条株式会社 導電性接触子
US6945827B2 (en) * 2002-12-23 2005-09-20 Formfactor, Inc. Microelectronic contact structure
JP4614434B2 (ja) * 2004-09-30 2011-01-19 株式会社ヨコオ プローブ
JP2010281592A (ja) * 2009-06-02 2010-12-16 Nidec-Read Corp プローブ及び検査用治具
JP5381609B2 (ja) * 2009-10-20 2014-01-08 日本電産リード株式会社 検査用治具及び接触子
GB201000344D0 (en) * 2010-01-11 2010-02-24 Cambridge Silicon Radio Ltd An improved test probe
JP4572303B1 (ja) * 2010-02-12 2010-11-04 株式会社ルス・コム 通電検査治具用接触子の製造方法及び、これにより製造した通電検査治具用接触子、並びにこれを備えている通電検査治具

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101900748A (zh) * 2009-05-29 2010-12-01 日本电产理德株式会社 检查用夹具
CN101907642A (zh) * 2009-06-02 2010-12-08 日本电产理德株式会社 检查用夹具及检查用触头

Also Published As

Publication number Publication date
TW201329457A (zh) 2013-07-16
JP2013024716A (ja) 2013-02-04
KR20130011964A (ko) 2013-01-30
CN102890166A (zh) 2013-01-23
JP5845678B2 (ja) 2016-01-20
TWI457571B (zh) 2014-10-21
KR101312340B1 (ko) 2013-09-27

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