CN102842839A - 太赫兹波产生装置、相机、成像装置和测量装置 - Google Patents

太赫兹波产生装置、相机、成像装置和测量装置 Download PDF

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Publication number
CN102842839A
CN102842839A CN2012102109955A CN201210210995A CN102842839A CN 102842839 A CN102842839 A CN 102842839A CN 2012102109955 A CN2012102109955 A CN 2012102109955A CN 201210210995 A CN201210210995 A CN 201210210995A CN 102842839 A CN102842839 A CN 102842839A
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CN
China
Prior art keywords
light source
light
thz wave
electrodes
pair
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CN2012102109955A
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English (en)
Chinese (zh)
Inventor
富冈纮斗
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Seiko Epson Corp
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Seiko Epson Corp
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Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Publication of CN102842839A publication Critical patent/CN102842839A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2823—Imaging spectrometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2/00—Demodulating light; Transferring the modulation of modulated light; Frequency-changing of light
    • G02F2/02—Frequency-changing of light, e.g. by quantum counters
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2203/00—Function characteristic
    • G02F2203/13—Function characteristic involving THZ radiation

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Optics & Photonics (AREA)
  • Toxicology (AREA)
  • Nonlinear Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CN2012102109955A 2011-06-24 2012-06-20 太赫兹波产生装置、相机、成像装置和测量装置 Pending CN102842839A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2011141089A JP5765086B2 (ja) 2011-06-24 2011-06-24 テラヘルツ波発生装置、カメラ、イメージング装置および計測装置
JP2011-141089 2011-06-24

Publications (1)

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CN102842839A true CN102842839A (zh) 2012-12-26

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US (1) US8859970B2 (enExample)
JP (1) JP5765086B2 (enExample)
CN (1) CN102842839A (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103368042A (zh) * 2013-07-05 2013-10-23 中国科学院半导体研究所 基于半导体超短脉冲激光器的太赫兹源设备
CN104236721A (zh) * 2013-06-05 2014-12-24 精工爱普生株式会社 太赫兹波检测装置、照相机、成像装置以及测量装置
CN104236722A (zh) * 2013-06-05 2014-12-24 精工爱普生株式会社 太赫兹波检测装置、照相机、图像装置以及测量装置
CN104868345A (zh) * 2014-02-24 2015-08-26 精工爱普生株式会社 光导天线、拍摄装置、成像装置以及测量装置

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5799538B2 (ja) * 2011-03-18 2015-10-28 セイコーエプソン株式会社 テラヘルツ波発生装置、カメラ、イメージング装置、計測装置および光源装置
JP6457803B2 (ja) * 2014-12-08 2019-01-23 公立大学法人大阪府立大学 光伝導素子、テラヘルツ波発生装置、テラヘルツ波検出装置、テラヘルツ波発生方法およびテラヘルツ波検出方法
US11804839B1 (en) * 2020-01-28 2023-10-31 Government Of The United States As Represented By The Secretary Of The Air Force Integrated trigger photoconductive semiconductor switch

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2359716A (en) * 2000-02-28 2001-08-29 Toshiba Res Europ Ltd A terahertz imaging apparatus with phase comparison
US6348683B1 (en) * 1998-05-04 2002-02-19 Massachusetts Institute Of Technology Quasi-optical transceiver having an antenna with time varying voltage
JP2005317669A (ja) * 2004-04-27 2005-11-10 Research Foundation For Opto-Science & Technology テラヘルツ波発生装置及びそれを用いた計測装置
JP2009210422A (ja) * 2008-03-04 2009-09-17 Sony Corp プローブ装置及びテラヘルツ分光装置
US20110080329A1 (en) * 2006-03-29 2011-04-07 Rwth Aachen University Thz Antenna Array, System and Method for Producing a THz Antenna Array

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3919344B2 (ja) * 1998-07-27 2007-05-23 浜松ホトニクス株式会社 テラヘルツ波発生装置
JP2004055626A (ja) * 2002-07-16 2004-02-19 Nippon Telegr & Teleph Corp <Ntt> パルス幅制御装置並びにそれを用いたＴＨｚ電磁波発生装置及び発生方法
JP2006010319A (ja) 2004-06-22 2006-01-12 Matsushita Electric Ind Co Ltd テラヘルツ電磁波発生・検出装置
JP2007324310A (ja) * 2006-05-31 2007-12-13 Osaka Univ 電磁波発生装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6348683B1 (en) * 1998-05-04 2002-02-19 Massachusetts Institute Of Technology Quasi-optical transceiver having an antenna with time varying voltage
GB2359716A (en) * 2000-02-28 2001-08-29 Toshiba Res Europ Ltd A terahertz imaging apparatus with phase comparison
JP2005317669A (ja) * 2004-04-27 2005-11-10 Research Foundation For Opto-Science & Technology テラヘルツ波発生装置及びそれを用いた計測装置
US20110080329A1 (en) * 2006-03-29 2011-04-07 Rwth Aachen University Thz Antenna Array, System and Method for Producing a THz Antenna Array
JP2009210422A (ja) * 2008-03-04 2009-09-17 Sony Corp プローブ装置及びテラヘルツ分光装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104236721A (zh) * 2013-06-05 2014-12-24 精工爱普生株式会社 太赫兹波检测装置、照相机、成像装置以及测量装置
CN104236722A (zh) * 2013-06-05 2014-12-24 精工爱普生株式会社 太赫兹波检测装置、照相机、图像装置以及测量装置
CN103368042A (zh) * 2013-07-05 2013-10-23 中国科学院半导体研究所 基于半导体超短脉冲激光器的太赫兹源设备
CN104868345A (zh) * 2014-02-24 2015-08-26 精工爱普生株式会社 光导天线、拍摄装置、成像装置以及测量装置

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JP5765086B2 (ja) 2015-08-19
US20120326036A1 (en) 2012-12-27
JP2013007679A (ja) 2013-01-10
US8859970B2 (en) 2014-10-14

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Application publication date: 20121226