CN102759793B - Reflecting double-slit interferometer - Google Patents
Reflecting double-slit interferometer Download PDFInfo
- Publication number
- CN102759793B CN102759793B CN201110104568.4A CN201110104568A CN102759793B CN 102759793 B CN102759793 B CN 102759793B CN 201110104568 A CN201110104568 A CN 201110104568A CN 102759793 B CN102759793 B CN 102759793B
- Authority
- CN
- China
- Prior art keywords
- semi
- glass
- slit
- mirror
- index glass
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
Abstract
The invention discloses a reflecting double-slit interferometer, mainly comprising a base plate, a light source, a lampshade, a semitransparent semireflecting mirror, a movable mirror, a fixed mirror, a non-reflecting film, a movable mirror plate, a fixed mirror plate, a guide rail, a threaded rod and a reading microscope. A monochromatic light irradiates on the fixed mirror and the movable mirror after being reflected by the semitransparent semireflecting mirror, the fixed mirror and the movable mirror are equivalent to the double slits, a gap between two reflectors is equivalent to a light blocking strip between the double slits, and the light reflected by the two reflectors can generate the interference effect as a transmission light, thus, the reflecting double-slit interferometer is formed, when the movable mirror moves and generates displacement on the guide rail, the width of the gap between the two reflectors varies, the space between interference fringes varies correspondingly, and the displacement of the movable mirror can be calculated accurately just by measuring the variation of the space between the interference fringes.
Description
Technical field
The present invention relates to a kind of reflective two-slit interference device.
Background technology
Young two-slit interference is a famous wave optics experiment, and it is that monochromatic optical wave is passed through a kind of interference effect forming after slit that two spacing are very little, this two-slit interference is called to transmission-type two-slit interference herein.That people are familiar with very much with transmission-type two-slit interference measurement device lambda1-wavelength, it is also feasible measuring micro-displacement with transmission-type double-slit interferometer in theory, and measuring accuracy is also very high, in fact because there is shield bars between transmission-type double slit, make double slit spacing very little, shield bars width just must be less, it is exactly the change amount of measuring shield bars width with two-slit interference effect measurement micro-displacement, but, want the just shield bars narrowed width between very little transmission-type double slit or broaden all very difficult of width own, Here it is difficultly so far sees the direct reason of measuring object micro-displacement with transmission-type double-slit interferometer.
Summary of the invention
In order to overcome the difficulty that shield bars width between double slit is too little, be difficult to directly measure with transmission-type double-slit interferometer object micro-displacement, the present invention has designed a kind of reflection-type double-slit interferometer, thereby can greatly expand the practicality of two-slit interference.
Reflection-type double-slit interferometer of the present invention, mainly comprise base plate, monochromatic source, lampshade, semi-permeable and semi-reflecting mirror, horizontal glass, index glass, non reflecting film, horizontal glass plate, index glass plate, guide rail, screw rod, screw bolt seat and reading microscope, monochromatic source, lampshade, semi-permeable and semi-reflecting mirror, guide rail, screw rod and reading microscope are all arranged on base plate, horizontal glass is fixed on horizontal glass plate, horizontal glass plate is fixed on guide rail, index glass is fixed on index glass plate, index glass plate and guide rail are slidably matched, on horizontal glass and index glass, post non reflecting film, on each mirror, stay a mirror surface, its width equals a slit width, monochromatic source is placed in lampshade, on lampshade, open a transmissive slit, a semi-permeable and semi-reflecting mirror is installed in the front of horizontal glass and index glass, horizontal glass face, index glass face is in same plane, become 45 degree with semi-transflective reflective minute surface, reading microscope is arranged on horizontal glass and index glass to the extended line of semi-permeable and semi-reflecting mirror and apart from horizontal glass, index glass 1.2m place.The transmissive slit that monochromatic light sees through on lampshade becomes 45 degree incidents with semi-permeable and semi-reflecting mirror, after semi-permeable and semi-reflecting mirror reflection, shine on horizontal glass and index glass, reflect again to reading microscope direction, form interference light, the spacing that can observe and measure interference fringe from reading microscope, just can calculate lambda1-wavelength according to two-slit interference principle.Horizontal glass and index glass are equivalent to double slit, article two, the space between reflective mirror is equivalent to the shield bars between double slit, article two, the light of reflective mirror reflection is as transmitted light, can produce interference effect, this has just formed reflection-type double-slit interferometer, in the time that index glass moves generation displacement on guide rail, article two, between reflective mirror, the width in space just changes, interference fringe spacing also produces respective change, measures the variable quantity of interference fringe spacing, just can accurately calculate the displacement of index glass.
The invention has the beneficial effects as follows and between double slit, do not have shield bars, index glass motion just can change double slit spacing, not only can measure the wavelength of incident light wave, also can accurately measure micro-displacement, around this principle the reflection-type double-slit interferometer of design has very large using value.
Brief description of the drawings
Below in conjunction with accompanying drawing, the invention will be further described
Fig. 1 is reflection-type double-slit interferometer theory structure schematic diagram.
Fig. 2 pastes the A of two reflective mirror minute surfaces of non reflecting film to view.
Fig. 3 is that B with the monochromatic source lampshade of slit is to view.
In figure, 1, base plate, 2, horizontal glass plate, 3, horizontal glass, 4, index glass, 5, index glass plate, 6, guide rail, 7, screw rod, 8, screw bolt seat, 9, rotor wheel, 10, monochromatic source, 11, transmissive slit, 12, lampshade, 13, incident light, 14, reading microscope seat, 15, reading microscope, 16, interference light, 17, semi-permeable and semi-reflecting mirror, 18, horizontal glass non reflecting film, 19, index glass non reflecting film.
Specific embodiments
In the drawings, horizontal glass (3) and index glass (4) are to be respectively attached to respectively and on completely reflecting mirror separately, to be reserved one little minute surface and form by horizontal glass non reflecting film (18) and index glass non reflecting film (19), the width of this little minute surface equals the width of a slit, horizontal glass (3) and index glass (4) are fixed on horizontal glass plate (2) and index glass plate (5) with glass cement respectively, horizontal glass plate (2) is fixed on guide rail (6), guide rail (6) is arranged on (1) on negative, index glass plate (5) is slidably matched with guide rail (6), screw bolt seat (8) is fixed on base (1), connecting rod (7) is connected with index glass plate (5) by screw bolt seat (8), rotor wheel (9) is fixed on connecting rod (7), a semi-permeable and semi-reflecting mirror (17) is installed in the front of horizontal glass (3) and index glass (4), horizontal glass face, index glass face is in same plane, become 45 degree with semi-permeable and semi-reflecting mirror (17) minute surface, reading microscope (14) is arranged on horizontal glass (3) and index glass (4) arrives on the extended line of semi-permeable and semi-reflecting mirror (17) and apart from horizontal glass (3), index glass (4) 1.2m place.Lampshade (12) is fixed on base, on lampshade, have a transmissive slit (11), monochromatic source (10) is contained in lampshade (12), incident light (13) shines the upper back reflection of semi-permeable and semi-reflecting mirror (17) by transmissive slit (11) and reflects on index glass and horizontal glass again, the reflected light of index glass and horizontal glass is just equivalent to the transmitted light from two slits, become interference light (16), reading microscope seat (14) is placed on negative, reading microscope (15) is arranged on reading microscope seat (14), apart from 1.2 meters of horizontal glass and index glass minute surfaces.
Claims (2)
1. a reflection-type double-slit interferometer, mainly comprise base plate, monochromatic source, lampshade, semi-permeable and semi-reflecting mirror, horizontal glass, index glass, non reflecting film, horizontal glass plate, index glass plate, guide rail, screw rod, screw bolt seat and reading microscope, monochromatic source, lampshade, semi-permeable and semi-reflecting mirror, guide rail, screw rod, screw bolt seat and reading microscope are all arranged on base plate, horizontal glass is fixed on horizontal glass plate, horizontal glass plate is fixed on guide rail, index glass is fixed on index glass plate, index glass plate and guide rail are slidably matched, on horizontal glass and index glass, post non reflecting film, on each mirror, stay a mirror surface, its width equals a slit width, monochromatic source is placed in lampshade, on lampshade, open a transmissive slit, a semi-permeable and semi-reflecting mirror is installed in the front of horizontal glass and index glass, horizontal glass face, index glass face is in same plane, become 45 degree with semi-transflective reflective minute surface, reading microscope is arranged on horizontal glass and index glass to the extended line of semi-permeable and semi-reflecting mirror and apart from horizontal glass, index glass 1.2m place,
it is characterized in thatthe transmissive slit that monochromatic light sees through on lampshade becomes 45 degree incidents with semi-permeable and semi-reflecting mirror, shine on horizontal glass and index glass, then reflect to reading microscope direction horizontal glass and index glass after semi-permeable and semi-reflecting mirror reflection
be equivalent to double slit, the space between two reflective mirrors is equivalent to the shield bars between double slit, two reflective mirrorsthe light of reflection, as transmitted light, can produce interference effect, forms interference light, can from reading microscope, observe and measure the spacing of interference fringe, just can calculate lambda1-wavelength according to two-slit interference principle, and this has just formed reflection-type double-slit interferometer.
2.
reflection-type double-slit interferometer according to claim 1, is characterized in thatin the time that index glass moves generation displacement on guide rail,
article two, between reflective mirror, the width in space just changes,interference fringe spacing also produces respective change, measures the variable quantity of interference fringe spacing, just can accurately calculate the displacement of index glass.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110104568.4A CN102759793B (en) | 2011-04-26 | 2011-04-26 | Reflecting double-slit interferometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110104568.4A CN102759793B (en) | 2011-04-26 | 2011-04-26 | Reflecting double-slit interferometer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102759793A CN102759793A (en) | 2012-10-31 |
| CN102759793B true CN102759793B (en) | 2014-08-27 |
Family
ID=47054297
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201110104568.4A Expired - Fee Related CN102759793B (en) | 2011-04-26 | 2011-04-26 | Reflecting double-slit interferometer |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102759793B (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA1213155A (en) * | 1983-08-11 | 1986-10-28 | Jean M. Theriault | Double-slit interferometer |
| CN2921800Y (en) * | 2006-06-09 | 2007-07-11 | 中国科学院上海光学精密机械研究所 | Accurate real-time measuring device of ultrashort pulse |
| CN101368849A (en) * | 2007-08-17 | 2009-02-18 | 北京理工大学 | Compact Fresnel two-sided mirror full reflection large visual field interference imaging optical spectrometer light path structure |
| CN101793553A (en) * | 2010-03-31 | 2010-08-04 | 中国科学院西安光学精密机械研究所 | Double-sided reflecting moving mirror interferometer |
| WO2011004692A1 (en) * | 2009-07-08 | 2011-01-13 | 太陽誘電株式会社 | Displacement measurement device using optical interferometer |
| CN202041720U (en) * | 2011-04-26 | 2011-11-16 | 四川大学 | Reflection-type double-slit interferometer |
-
2011
- 2011-04-26 CN CN201110104568.4A patent/CN102759793B/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA1213155A (en) * | 1983-08-11 | 1986-10-28 | Jean M. Theriault | Double-slit interferometer |
| CN2921800Y (en) * | 2006-06-09 | 2007-07-11 | 中国科学院上海光学精密机械研究所 | Accurate real-time measuring device of ultrashort pulse |
| CN101368849A (en) * | 2007-08-17 | 2009-02-18 | 北京理工大学 | Compact Fresnel two-sided mirror full reflection large visual field interference imaging optical spectrometer light path structure |
| WO2011004692A1 (en) * | 2009-07-08 | 2011-01-13 | 太陽誘電株式会社 | Displacement measurement device using optical interferometer |
| CN101793553A (en) * | 2010-03-31 | 2010-08-04 | 中国科学院西安光学精密机械研究所 | Double-sided reflecting moving mirror interferometer |
| CN202041720U (en) * | 2011-04-26 | 2011-11-16 | 四川大学 | Reflection-type double-slit interferometer |
Non-Patent Citations (4)
| Title |
|---|
| "光的衍射、干涉演示仪"的另一种自制方法;李敏聪;《物理通报》;20060831(第8期);第57-58页 * |
| 吴文敏等.基于菲涅尔双面镜的全反射成像光谱技术研究.《光学技术》.2006,第32卷(第3期),第431-433页. |
| 基于菲涅尔双面镜的全反射成像光谱技术研究;吴文敏等;《光学技术》;20060531;第32卷(第3期);第431-433页 * |
| 李敏聪."光的衍射、干涉演示仪"的另一种自制方法.《物理通报》.2006,(第8期),第57-58页. |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102759793A (en) | 2012-10-31 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN202041181U (en) | Device for measuring thickness of thin film | |
| CN101832821B (en) | Method and device for measuring laser wavelength based on bound wavelength | |
| CN101294850A (en) | Novel method and device for measuring ultra-short optical pulse spectrum phase | |
| CN103115698A (en) | Optical fiber Fabry-Perot (FP) temperature sensor filled with alcohol | |
| CN103439010A (en) | Wavelength measurement method and device based on laser synthesized wavelength interference principle | |
| CN104101487A (en) | Wave aberration measuring device and measuring method of optical system | |
| CN103075966B (en) | Displacement measurement system | |
| CN202041720U (en) | Reflection-type double-slit interferometer | |
| CN203069274U (en) | Laser interferometer optical path difference positioning system | |
| CN102759793B (en) | Reflecting double-slit interferometer | |
| CN103471742A (en) | Alcohol-filling-based high-sensitivity photonic crystal fiber temperature sensor | |
| CN201637492U (en) | Laser wavelength measuring device based on synthetic wavelength | |
| CN103674220B (en) | Vibration measuring system | |
| CN203148844U (en) | Device for measuring Young modulus of filament via Michelson interference method | |
| CN201917535U (en) | Device for measuring expansion coefficient of metal wire by single slit diffraction method | |
| Francis et al. | A mechanically stable laser diode speckle interferometer for surface contouring and displacement measurement | |
| CN103278105A (en) | Axicon surface shape and cone angle detection method | |
| CN103471724B (en) | Measure the lateral shear interferometer on non-axis symmetry corrugated | |
| CN104198435A (en) | Device and method for measuring group refractive index of photonic bandgap fibers based on frequency modulated continuous waves | |
| CN110672027B (en) | Fringe automatic processing device based on coherent gradient sensitive interference | |
| CN204808719U (en) | Interferometry experimental system | |
| CN203587245U (en) | Alcohol-filling-based high-sensitivity photonic crystal fiber temperature sensor | |
| CN203837660U (en) | Laser displacement measuring device | |
| CN203572450U (en) | Laser interference angle measurement optical path | |
| CN103196569B (en) | A kind of rotary process Fabry-Perot interference mirror is measured the method for optical maser wavelength |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140827 Termination date: 20150426 |
|
| EXPY | Termination of patent right or utility model |