CN102759793A - Reflecting double-slit interferometer - Google Patents
Reflecting double-slit interferometer Download PDFInfo
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- CN102759793A CN102759793A CN2011101045684A CN201110104568A CN102759793A CN 102759793 A CN102759793 A CN 102759793A CN 2011101045684 A CN2011101045684 A CN 2011101045684A CN 201110104568 A CN201110104568 A CN 201110104568A CN 102759793 A CN102759793 A CN 102759793A
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Abstract
The invention discloses a reflecting double-slit interferometer, mainly comprising a base plate, a light source, a lampshade, a semitransparent semireflecting mirror, a movable mirror, a fixed mirror, a non-reflecting film, a movable mirror plate, a fixed mirror plate, a guide rail, a threaded rod and a reading microscope. A monochromatic light irradiates on the fixed mirror and the movable mirror after being reflected by the semitransparent semireflecting mirror, the fixed mirror and the movable mirror are equivalent to the double slits, a gap between two reflectors is equivalent to a light blocking strip between the double slits, and the light reflected by the two reflectors can generate the interference effect as a transmission light, thus, the reflecting double-slit interferometer is formed, when the movable mirror moves and generates displacement on the guide rail, the width of the gap between the two reflectors varies, the space between interference fringes varies correspondingly, and the displacement of the movable mirror can be calculated accurately just by measuring the variation of the space between the interference fringes.
Description
Technical field
The present invention relates to a kind of reflective two-slit interference device.
Background technology
The Young two-slit interference is a famous wave optics experiment, and it is that monochromatic optical wave is passed through a kind of interference effect of forming behind the very little slit of two spacings, this two-slit interference is called the transmission-type two-slit interference here.With transmission-type two-slit interference measurement device lambda1-wavelength is that people are familiar with very much; It also is feasible measuring micro-displacement with the transmission-type double-slit interferometer in theory, and measuring accuracy is also very high, in fact because have shield bars between the transmission-type double slit; Make the double slit spacing very little; The shield bars width just must be littler, is exactly the change amount of measuring the shield bars width with two-slit interference effect measurement micro-displacement, still; Want that width own just the shield bars narrowed width between the very little transmission-type double slit or the very difficulty that broadens all Here it is difficultly so far sees direct reason of coming the Measuring Object micro-displacement with the transmission-type double-slit interferometer.
Summary of the invention
In order to overcome the difficulty that shield bars width between double slit is too little, be difficult to directly come with the transmission-type double-slit interferometer Measuring Object micro-displacement, the present invention has designed a kind of reflective double-slit interferometer, thereby can expand the practicality of two-slit interference greatly.
Reflective double-slit interferometer according to the invention mainly comprises base plate, monochromatic source, lampshade, semi-permeable and semi-reflecting mirror, horizontal glass, index glass, non reflecting film, horizontal glass plate, index glass plate, guide rail, screw rod, screw bolt seat and reading microscope, and monochromatic source, lampshade, semi-permeable and semi-reflecting mirror, guide rail, screw rod and reading microscope all are installed on the base plate; Horizontal glass is fixed on the horizontal glass plate, and the horizontal glass plate is fixed on the guide rail, and index glass is fixed on the index glass plate; Index glass plate and guide rail are slidingly matched; Post non reflecting film on horizontal glass and the index glass, stay a mirror surface on each mirror, its width equals a slit width; Monochromatic source places lampshade; Open a transmissive slit on the lampshade, a semi-permeable and semi-reflecting mirror is installed in the front of horizontal glass and index glass, and horizontal glass face, index glass face are in same plane; Become 45 degree with the semi-transflective reflective minute surface, reading microscope is installed in horizontal glass and index glass to the extended line of semi-permeable and semi-reflecting mirror and apart from horizontal glass, index glass 1.2m place.The transmissive slit that monochromatic light sees through on the lampshade becomes 45 degree incidents with semi-permeable and semi-reflecting mirror; Through shining after the semi-transflective reflective mirror reflection on horizontal glass and the index glass; Reflect again to the reading microscope direction; Form interference light, can from reading microscope, observe and measure the spacing of interference fringe, just can calculate lambda1-wavelength according to the two-slit interference principle.Horizontal glass and index glass are equivalent to double slit, and the space between two reflective mirrors is equivalent to the shield bars between the double slit, and the light of two reflective mirror reflections is the same as transmitted light; Can produce interference effect, this has just constituted reflective double-slit interferometer, when index glass moves the generation displacement on guide rail; Article two, the width in space just changes between the reflective mirror; The interference fringe spacing also produces respective change, measures the variable quantity of interference fringe spacing, just can accurately calculate the displacement of index glass.
The invention has the beneficial effects as follows and do not have shield bars between double slit; The index glass motion just can change the double slit spacing; Not only can measure the wavelength of incident light wave, also can accurately measure micro-displacement, around this principle the reflective double-slit interferometer of design has very big using value.
Description of drawings
Below in conjunction with accompanying drawing the present invention is described further
Fig. 1 is reflective double-slit interferometer theory structure synoptic diagram.
Fig. 2 pastes the A of two reflective mirror minute surfaces of non reflecting film to view.
Fig. 3 has the B of monochromatic source lampshade of slit to view.
Among the figure, 1, base plate, 2, the horizontal glass plate, 3, horizontal glass, 4, index glass; 5, index glass plate, 6, guide rail, 7, screw rod, 8, screw bolt seat, 9, rotor wheel; 10, monochromatic source, 11, transmissive slit, 12, lampshade, 13, incident light, 14, the reading microscope seat; 15, reading microscope, 16, interference light, 17, semi-permeable and semi-reflecting mirror, 18, the horizontal glass non reflecting film, 19, the index glass non reflecting film.
Specific embodiments
In the drawings; Horizontal glass (3) and index glass (4) are respectively to be attached to respectively by horizontal glass non reflecting film (18) and index glass non reflecting film (19) to reserve one little minute surface formation on the completely reflecting mirror separately; The width of this little minute surface equals the width of a slit; Horizontal glass (3) and index glass (4) are fixed on horizontal glass plate (2) and the index glass plate (5) with glass cement respectively, and horizontal glass plate (2) is fixed on the guide rail (6), and guide rail (6) is installed in (1) on the negative; Index glass plate (5) is slidingly matched with guide rail (6); Screw bolt seat (8) is fixed on base (1), and connecting rod (7) links to each other with index glass plate (5) through screw bolt seat (8), and rotor wheel (9) is fixed on the connecting rod (7); A semi-permeable and semi-reflecting mirror (17) is installed in the front of horizontal glass (3) and index glass (4); Horizontal glass face, index glass face become 45 degree with semi-permeable and semi-reflecting mirror (17) minute surface in same plane, reading microscope (14) is installed in horizontal glass (3) and index glass (4) arrives on the extended line of semi-permeable and semi-reflecting mirror (17) and apart from horizontal glass (3), index glass (4) 1.2m place.Lampshade (12) is fixed on the base; Have a transmissive slit (11) on the lampshade; Monochromatic source (10) is contained in the lampshade (12), and incident light (13) shines the last back reflection of semi-permeable and semi-reflecting mirror (17) through transmissive slit (11) and on index glass and horizontal glass, reflects again, and the reflected light of index glass and horizontal glass just is equivalent to the transmitted light from two slits; Become interference light (16); Reading microscope seat (14) places on the negative, and reading microscope (15) is installed in reading microscope seat (14), apart from 1.2 meters of horizontal glass and index glass minute surfaces.
Claims (2)
1. a reflective double-slit interferometer mainly comprises base plate, monochromatic source, lampshade, semi-permeable and semi-reflecting mirror, horizontal glass, index glass, non reflecting film, horizontal glass plate, index glass plate, guide rail, screw rod, screw bolt seat and reading microscope, it is characterized in that monochromatic source, lampshade, semi-permeable and semi-reflecting mirror, guide rail, screw rod, screw bolt seat and reading microscope all are installed on the base plate; Horizontal glass is fixed on the horizontal glass plate, and the horizontal glass plate is fixed on the guide rail, and index glass is fixed on the index glass plate; Index glass plate and guide rail are slidingly matched; Post non reflecting film on horizontal glass and the index glass, stay a mirror surface on each mirror, its width equals a slit width; Monochromatic source places lampshade; Open a transmissive slit on the lampshade, a semi-permeable and semi-reflecting mirror is installed in the front of horizontal glass and index glass, and horizontal glass face, index glass face are in same plane; Become 45 degree with the semi-transflective reflective minute surface, reading microscope is installed in horizontal glass and index glass to the extended line of semi-permeable and semi-reflecting mirror and apart from horizontal glass, index glass 1.2m place.
2. reflective double-slit interferometer according to claim 1 is characterized in that the transmissive slit that monochromatic light sees through on the lampshade becomes 45 degree incidents with semi-permeable and semi-reflecting mirror, through shining after the semi-transflective reflective mirror reflection on horizontal glass and the index glass; Reflect again to the reading microscope direction, form interference light, can from reading microscope, observe and measure the spacing of interference fringe; Just can calculate lambda1-wavelength according to the two-slit interference principle, horizontal glass and index glass are equivalent to double slit, and the space between two reflective mirrors is equivalent to the shield bars between the double slit; Article two, the light of reflective mirror reflection is the same as transmitted light; Can produce interference effect, this has just constituted reflective double-slit interferometer, when index glass moves the generation displacement on guide rail; Article two, the width in space just changes between the reflective mirror; The interference fringe spacing also produces respective change, measures the variable quantity of interference fringe spacing, just can accurately calculate the displacement of index glass.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201110104568.4A CN102759793B (en) | 2011-04-26 | 2011-04-26 | Reflecting double-slit interferometer |
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| CN201110104568.4A CN102759793B (en) | 2011-04-26 | 2011-04-26 | Reflecting double-slit interferometer |
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| CN102759793A true CN102759793A (en) | 2012-10-31 |
| CN102759793B CN102759793B (en) | 2014-08-27 |
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Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA1213155A (en) * | 1983-08-11 | 1986-10-28 | Jean M. Theriault | Double-slit interferometer |
| CN2921800Y (en) * | 2006-06-09 | 2007-07-11 | 中国科学院上海光学精密机械研究所 | Accurate real-time measuring device of ultrashort pulse |
| CN101368849A (en) * | 2007-08-17 | 2009-02-18 | 北京理工大学 | Compact Fresnel two-sided mirror full reflection large visual field interference imaging optical spectrometer light path structure |
| CN101793553A (en) * | 2010-03-31 | 2010-08-04 | 中国科学院西安光学精密机械研究所 | Double-sided reflecting movable mirror interferometer |
| WO2011004692A1 (en) * | 2009-07-08 | 2011-01-13 | 太陽誘電株式会社 | Displacement measurement device using optical interferometer |
| CN202041720U (en) * | 2011-04-26 | 2011-11-16 | 四川大学 | Reflection-type double-slit interferometer |
-
2011
- 2011-04-26 CN CN201110104568.4A patent/CN102759793B/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA1213155A (en) * | 1983-08-11 | 1986-10-28 | Jean M. Theriault | Double-slit interferometer |
| CN2921800Y (en) * | 2006-06-09 | 2007-07-11 | 中国科学院上海光学精密机械研究所 | Accurate real-time measuring device of ultrashort pulse |
| CN101368849A (en) * | 2007-08-17 | 2009-02-18 | 北京理工大学 | Compact Fresnel two-sided mirror full reflection large visual field interference imaging optical spectrometer light path structure |
| WO2011004692A1 (en) * | 2009-07-08 | 2011-01-13 | 太陽誘電株式会社 | Displacement measurement device using optical interferometer |
| CN101793553A (en) * | 2010-03-31 | 2010-08-04 | 中国科学院西安光学精密机械研究所 | Double-sided reflecting movable mirror interferometer |
| CN202041720U (en) * | 2011-04-26 | 2011-11-16 | 四川大学 | Reflection-type double-slit interferometer |
Non-Patent Citations (3)
| Title |
|---|
| 《物理通报》 20060831 李敏聪 "光的衍射、干涉演示仪"的另一种自制方法 第57-58页 , 第8期 * |
| 吴文敏等: "基于菲涅尔双面镜的全反射成像光谱技术研究", 《光学技术》 * |
| 李敏聪: ""光的衍射、干涉演示仪"的另一种自制方法", 《物理通报》 * |
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