CN207019624U - A kind of dual wavelength superhet interferes real-time displacement measuring system - Google Patents
A kind of dual wavelength superhet interferes real-time displacement measuring system Download PDFInfo
- Publication number
- CN207019624U CN207019624U CN201720602510.5U CN201720602510U CN207019624U CN 207019624 U CN207019624 U CN 207019624U CN 201720602510 U CN201720602510 U CN 201720602510U CN 207019624 U CN207019624 U CN 207019624U
- Authority
- CN
- China
- Prior art keywords
- wavelength
- polarization
- polarized light
- beam splitter
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000006073 displacement reaction Methods 0.000 title claims abstract description 21
- 230000009977 dual effect Effects 0.000 title abstract description 5
- 230000010287 polarization Effects 0.000 claims abstract description 35
- 238000005259 measurement Methods 0.000 claims abstract description 34
- 230000005540 biological transmission Effects 0.000 claims description 6
- 238000005305 interferometry Methods 0.000 abstract description 7
- 238000000034 method Methods 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000001427 coherent effect Effects 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
Abstract
本实用新型公开了一种双波长超外差干涉实时位移测量系统。系统由两个波长差为Δλ的激光器、三个偏振分光棱镜、四个分光棱镜、两个声光调制器、四个四分之一波片、五个平面反射镜、三个偏振片、一个超窄带滤波片、两个大带宽的跨阻抗光电探测器、两个低带宽的高灵敏度光电探测器、一个参考反射镜、一个被测反射镜组成。本实用新型利用双波长产生的合成波长干涉信号提升系统的测量量程,使得系统的测量量程远大于单波长干涉的量程,可以直接测量合成波长的相位,实现实时测量,同时利用超窄带滤波片采得单波长干涉信号,在扩大测量量程的同时保证单波长干涉测量的精度。
The utility model discloses a dual-wavelength superheterodyne interference real-time displacement measurement system. The system consists of two lasers with a wavelength difference of Δλ, three polarization beamsplitters, four beamsplitters, two acousto-optic modulators, four quarter-wave plates, five plane mirrors, three polarizers, one It consists of an ultra-narrowband filter, two transimpedance photodetectors with large bandwidth, two high-sensitivity photodetectors with low bandwidth, a reference reflector and a measured reflector. The utility model utilizes the synthesized wavelength interference signal generated by dual wavelengths to increase the measuring range of the system, so that the measuring range of the system is much larger than that of the single-wavelength interference, and the phase of the synthesized wavelength can be directly measured to realize real-time measurement. Obtain a single-wavelength interference signal, and ensure the accuracy of single-wavelength interferometry while expanding the measurement range.
Description
技术领域technical field
本实用新型涉及一种位移测量系统,特别涉及了一种双波长超外差干涉实时位移测量系统。The utility model relates to a displacement measurement system, in particular to a dual-wavelength superheterodyne interference real-time displacement measurement system.
背景技术Background technique
常见的单波长激光干涉位移测量系统拥有纳米级的位移测量精度,但是由于激光单波长通常为1μm左右,因此其干涉信号的周期只有数百纳米,限制了其测量量程。位移测量系统需要增加周期计数才可以准确记录相位变化,一旦位移变化较为迅速或者遇到台阶等较大的绝对位移变化,就会出现相位模糊。Common single-wavelength laser interferometric displacement measurement systems have nanoscale displacement measurement accuracy, but since the single wavelength of laser is usually about 1 μm, the period of its interference signal is only hundreds of nanometers, which limits its measurement range. The displacement measurement system needs to increase the cycle count to accurately record the phase change. Once the displacement changes rapidly or encounters a large absolute displacement change such as steps, phase ambiguity will appear.
为了解决单波长激光干涉的量程问题,Tilford等人最早提出了采用双波长构造一种合成波长来扩大测量系统量程的方法(C.R.Tilford,Appl.Opt.16,1857(1977).)。两束波长分别为λ1和λ2的激光可以合成波长为λ1λ2/(λ1-λ2)的干涉信号,当λ1和λ2比较接近时,合成波长远大于单波长,这样就可以大大扩展干涉位移测量系统的量程。但是随着测量量程的扩大,双波长干涉测量同样面临了两个新的问题:1.基于合成波长的干涉测量精度会下降,2.求合成波长相位时往往需要对单波长依次测量再求解,难以实现实时快速的测量。之后几十年双波长干涉位移测量取得了很大的发展,如专利号为02112079.X的专利“双波长纳米精度实时干涉测量仪”加入了双路正弦调制和信号处理器,保证了较高的测量精度,但是其通过温度调制激光波长等调制手段稳定性较差,很难达到理论精度;Dandliker等人提出的超外差干涉法通过(R.Dandliker,R.Thalmann,and D.Prongue,Opt.Lett.13,339(1988))对不同波长的两束激光加入不同的频移可以实现合成波长的实时测量,但是仍然没有解决合成波长测量精度下降的问题。In order to solve the range problem of single-wavelength laser interference, Tilford et al. first proposed a method of using dual wavelengths to construct a synthetic wavelength to expand the range of the measurement system (CRTilford, Appl. Opt.16, 1857 (1977).). Two beams of laser light with wavelengths λ 1 and λ 2 can synthesize an interference signal with a wavelength of λ 1 λ 2 /(λ 1 -λ 2 ), when λ 1 and λ 2 are relatively close, the synthesized wavelength is much larger than the single wavelength, thus The measuring range of the interferometric displacement measurement system can be greatly expanded. However, with the expansion of the measurement range, dual-wavelength interferometry also faces two new problems: 1. The accuracy of interferometry based on the synthesized wavelength will decrease. It is difficult to realize real-time and fast measurement. In the following decades, the dual-wavelength interferometric displacement measurement has made great progress. For example, the patent No. 02112079. The measurement accuracy is high, but the stability of modulation methods such as temperature modulation laser wavelength is poor, and it is difficult to achieve theoretical accuracy; the superheterodyne interferometry proposed by Dandliker et al. Opt. Lett.13, 339 (1988)) adding different frequency shifts to two laser beams with different wavelengths can realize real-time measurement of the synthesized wavelength, but it still does not solve the problem of the decline in the measurement accuracy of the synthesized wavelength.
现有技术无法很好地同时解决双波长干涉带来的两个问题,满足大量程高精度的实时干涉测量需求。Existing technologies cannot solve the two problems caused by dual-wavelength interference at the same time, and meet the needs of large-scale and high-precision real-time interferometry.
实用新型内容Utility model content
本实用新型针对上述问题,提出了一种双波长超外差干涉实时位移测量系统,融合了合成波长干涉、单波长干涉、超外差干涉的优点,实现了大量程高精度的实时位移测量。Aiming at the above problems, the utility model proposes a dual-wavelength superheterodyne interference real-time displacement measurement system, which combines the advantages of synthetic wavelength interference, single-wavelength interference, and superheterodyne interference, and realizes a large range of high-precision real-time displacement measurement.
本实用新型通过以下技术方案实现。The utility model is realized through the following technical solutions.
主要由两个波长差为Δλ的激光器、三个偏振分光棱镜、四个分光棱镜、两个声光调制器、四个四分之一波片、五个平面反射镜、三个偏振片、一个超窄带滤波片、两个大带宽的跨阻抗光电探测器、两个低带宽的高灵敏度光电探测器、一个参考反射镜、一个被测反射镜、信号处理电路和上位机组成;It mainly consists of two lasers with a wavelength difference of Δλ, three polarization beamsplitters, four beamsplitters, two acousto-optic modulators, four quarter-wave plates, five plane mirrors, three polarizers, one Composed of ultra-narrowband filters, two large-bandwidth transimpedance photodetectors, two low-bandwidth high-sensitivity photodetectors, a reference reflector, a measured reflector, a signal processing circuit and a host computer;
两个激光器发出两束不同波长的激光,每束激光分别经过各自的四分之一波片后入射到偏振分光棱镜分为水平偏振和垂直偏振的两路:其中水平偏振的一路依次经过声光调制器和反射镜后反射,垂直偏振的一路经过反射镜后反射,两个反射镜各自的反射光入射到分光棱镜合束输出,合束光含有频率不同且偏振方向不同的两路输出光;The two lasers emit two beams of laser light with different wavelengths. Each laser beam passes through its own quarter-wave plate and then enters the polarization beam splitter. The modulator and the reflector are reflected, and the vertically polarized path is reflected after passing through the reflector. The reflected light of the two reflectors is incident on the splitter prism for beam combining output. The beam combining light contains two output lights with different frequencies and different polarization directions;
两路输出光入射到第三分光棱镜合束并发生分束:分束后的一部分光经过第一偏振片到达第一光电探测器,作为双波长超外差干涉的参考信号;分束后的另一部分光入射到第三偏振分光棱镜发生反射和透射,分成垂直偏振和水平偏振的两路;The two output lights are incident on the third beam-splitting prism for beam combining and splitting: a part of the beam-splitting light passes through the first polarizer and reaches the first photodetector as a reference signal for dual-wavelength superheterodyne interference; The other part of the light is incident on the third polarizing beamsplitter prism for reflection and transmission, and is divided into two paths of vertical polarization and horizontal polarization;
经第三偏振分光棱镜反射出的一路垂直偏振的光经过第四四分之一波片被参考反射镜反射后再次经过第四四分之一波片变为水平偏振光并回到第三偏振分光棱镜;经第三偏振分光棱镜透射出的一路水平偏振的光经过第三四分之一波片被被测反射镜反射后再次经过第三四分之一波片变为垂直偏振光并回到第三偏振分光棱镜,被测反射镜固定在被测物表面;The vertically polarized light reflected by the third polarization beam splitter passes through the fourth quarter-wave plate and is reflected by the reference mirror, and then passes through the fourth quarter-wave plate to become horizontally polarized light and returns to the third polarization Dichroic prism; the horizontally polarized light transmitted by the third polarizing beam splitting prism passes through the third quarter-wave plate and is reflected by the mirror under test, and then passes through the third quarter-wave plate to become vertically polarized light and returns to To the third polarizing beam splitter, the measured reflector is fixed on the surface of the measured object;
回到第三偏振分光棱镜的两路激光在第三偏振分光棱镜合束后入射到第四分光棱镜,发生反射和透射分束;透射的一部分经过第二偏振片被第二光电探测器接收作为双波长超外差干涉的测量信号;反射的一部分经过超窄带滤波片后再经第三偏振片被第三光电探测器接收,第四光电探测器置于第三光电探测器旁;第一、第二光电探测器和第三、第四光电探测器均经信号处理电路连接到上位机。The two laser beams returned to the third polarizing beam splitter are incident on the fourth beam splitting prism after the third polarizing beam splitting prism combines beams, and reflection and transmission beam splitting occurs; a part of the transmission passes through the second polarizer and is received by the second photodetector as The measurement signal of dual-wavelength superheterodyne interference; part of the reflection passes through the ultra-narrow-band filter and then is received by the third photodetector through the third polarizer, and the fourth photodetector is placed next to the third photodetector; the first, Both the second photodetector and the third and fourth photodetectors are connected to the host computer through a signal processing circuit.
本实用新型的第一光电探测器、第二光电探测器为两个大带宽的跨阻抗光电探测器,第三光电探测器、第四光电探测器为两个低带宽的高灵敏度光电探测器,灵敏度大于0.1V/nW。The first photodetector and the second photodetector of the utility model are two large-bandwidth transimpedance photodetectors, the third photodetector and the fourth photodetector are two low-bandwidth high-sensitivity photodetectors, The sensitivity is greater than 0.1V/nW.
信号处理电路包括有自混频器、带通滤波器、相关测相器、跟随器和差分放大电路。所述的信号处理电路具体包括第一低噪声放大器、第二低噪声放大器、第一自混频器、第二自混频器、第一带通滤波器、第二带通滤波器、第一相关测相器、模数转换模块、差分放大器和第二相关测相器;第一光电探测器依次经第一低噪声放大器、第一自混频器和第一带通滤波器连接到第一相关测相器,第二光电探测器依次经第二低噪声放大器、第二自混频器、第二带通滤波器连接到第一相关测相器,第三光电探测器和第四光电探测器均依次经差分放大器连接到第二相关测相器,第一相关测相器和第二相关测相器均经模数转换模块连接到上位机。The signal processing circuit includes a self-mixer, a band-pass filter, a correlation phase detector, a follower and a differential amplifier circuit. The signal processing circuit specifically includes a first low noise amplifier, a second low noise amplifier, a first self-mixer, a second self-mixer, a first bandpass filter, a second bandpass filter, a first A correlation phase detector, an analog-to-digital conversion module, a differential amplifier and a second correlation phase detector; the first photodetector is sequentially connected to the first low noise amplifier, the first self-mixer and the first bandpass filter A correlation phase detector, the second photodetector is connected to the first correlation phase detector, the third photodetector and the fourth photodetector through the second low noise amplifier, the second self-mixer, and the second bandpass filter in turn The detectors are all connected to the second relative phase detector through the differential amplifier in turn, and both the first relative phase detector and the second relative phase detector are connected to the host computer through the analog-to-digital conversion module.
所述的两个激光器发出不同波长的激光,两束激光的波长差为Δλ。波长差为Δλ小于5nm,大于2nm。The two lasers emit laser light with different wavelengths, and the wavelength difference between the two laser beams is Δλ. The wavelength difference is Δλ less than 5nm and greater than 2nm.
所述的两个激光器发出的光为不同波长的线偏振光,经过四分之一波片后变为两束圆偏振光,每束圆偏振光经过偏振分光棱镜后分别分束为两束偏振方向互相垂直的线偏振光。The light emitted by the two lasers is linearly polarized light of different wavelengths, which becomes two beams of circularly polarized light after passing through a quarter-wave plate, and each beam of circularly polarized light is split into two beams of polarized light after passing through a polarization beam splitter prism. Linearly polarized light with directions perpendicular to each other.
所述的两个声光调制器的调制频率不同。The modulation frequencies of the two acousto-optic modulators are different.
具体实施中,两个声光调制器调制频率f1和f2分别为100MHz和100.01MHz,两者差频为10kHz。In a specific implementation, the modulation frequencies f 1 and f 2 of the two acousto-optic modulators are 100 MHz and 100.01 MHz respectively, and the difference frequency between the two is 10 kHz.
所述的第一、第二光电探测器的带宽大于声光调制器的调制频率。The bandwidth of the first and second photodetectors is greater than the modulation frequency of the acousto-optic modulator.
所述的超窄带滤波片的中心波长与两个激光器发出的两束光中较小的波长相同。The central wavelength of the ultra-narrow-band filter is the same as the smaller wavelength of the two beams of light emitted by the two lasers.
具体实施中,两个激光器发出的光为波长为632.8nm和635nm的线偏振光。超窄带滤波片的中心波长为632.8nm,半高全宽为1nm。In a specific implementation, the light emitted by the two lasers is linearly polarized light with wavelengths of 632.8 nm and 635 nm. The central wavelength of the ultra-narrowband filter is 632.8nm, and the full width at half maximum is 1nm.
所述的第三、第四光电探测器放置位置紧邻且朝向相同,以实现与环境光的差分。The third and fourth photodetectors are positioned close to each other and facing the same direction, so as to realize the difference from ambient light.
与现有技术相比,本实用新型的有益效果是:Compared with the prior art, the beneficial effects of the utility model are:
1、本实用新型利用合成波长扩大测量系统的量程,使测量系统的量程扩大为合成波长的二分之一,并且通过合理地选取双波长使得测量系统的量程保持在合理范围。1. The utility model uses the synthetic wavelength to expand the measuring range of the measuring system, so that the measuring range of the measuring system is expanded to one-half of the synthetic wavelength, and the measuring range of the measuring system is kept within a reasonable range by rationally selecting dual wavelengths.
2、本实用新型利用单波长干涉信号保证测量系统的测量精度,使得测量系统能够在扩大测量量程的同时保证纳米级的精度。2. The utility model uses single-wavelength interference signals to ensure the measurement accuracy of the measurement system, so that the measurement system can ensure nanometer-level accuracy while expanding the measurement range.
附图说明Description of drawings
图1是本实用新型的系统示意图;Fig. 1 is the system schematic diagram of the present utility model;
图中:激光器1、激光器2、第一四分之一波片3、第二四分之一波片4、第一偏振分光棱镜5、第二偏振分光棱镜6、第一声光调制器7、第二声光调制器8、第一反射镜9、第二反射镜10、第三反射镜11、第四反射镜12、第一分光棱镜13、第二分光棱镜14、第五反射镜15、第三分光棱镜16、第一偏振片17、第一光电探测器18、第三偏振分光棱镜19、第三四分之一波片20、被测反射镜21、被测物22、第四四分之一波片23、参考反射镜24、第二偏振片25、第四分光棱镜26、第二光电探测器27、超窄带滤波片28、第三偏振片29、第三光电探测器30、第四光电探测器31。In the figure: laser 1, laser 2, first quarter wave plate 3, second quarter wave plate 4, first polarization beam splitter 5, second polarization beam splitter 6, first acousto-optic modulator 7 , the second acousto-optic modulator 8, the first reflector 9, the second reflector 10, the third reflector 11, the fourth reflector 12, the first dichroic prism 13, the second dichroic prism 14, the fifth reflector 15 , the third beam-splitting prism 16, the first polarizer 17, the first photodetector 18, the third polarization beam-splitting prism 19, the third quarter-wave plate 20, the measured mirror 21, the measured object 22, the fourth Quarter-wave plate 23, reference mirror 24, second polarizer 25, fourth dichroic prism 26, second photodetector 27, ultra-narrow band filter 28, third polarizer 29, third photodetector 30 , the fourth photodetector 31 .
具体实施方式detailed description
以下结合具体实施例进行进一步的说明。Further description will be given below in conjunction with specific examples.
本实用新型为实现大量程高精度的实时位移测量,提供了一种双波长超外差干涉测量系统,该系统包括波长为λ1=632.8nm的激光器1、波长为λ2=635nm的激光器2、第一四分之一波片3、第二四分之一波片4、第一偏振分光棱镜5、第二偏振分光棱镜6、第一声光调制器7、第二声光调制器8、第一反射镜9、第二反射镜10、第三反射镜11、第四反射镜12、第一分光棱镜13、第二分光棱镜14、第五反射镜15、第三分光棱镜16、第一偏振片17、第一光电探测器18、第三偏振分光棱镜19、第三四分之一波片20、被测反射镜21、被测物22、第四四分之一波片23、参考反射镜24、第二偏振片25、第四分光棱镜26、第二光电探测器27、超窄带滤波片28、第三偏振片29、第三光电探测器30、第四光电探测器31。The utility model provides a dual-wavelength superheterodyne interferometry system for realizing large-scale and high-precision real-time displacement measurement. The system includes a laser 1 with a wavelength of λ 1 =632.8nm and a laser 2 with a wavelength of λ 2 =635nm , the first quarter wave plate 3, the second quarter wave plate 4, the first polarizing beam splitting prism 5, the second polarizing beam splitting prism 6, the first acousto-optic modulator 7, the second acousto-optic modulator 8 , the first reflector 9, the second reflector 10, the third reflector 11, the fourth reflector 12, the first dichroic prism 13, the second dichroic prism 14, the fifth reflector 15, the third dichroic prism 16, the first dichroic prism A polarizer 17, a first photodetector 18, a third polarization splitter prism 19, a third quarter-wave plate 20, a measured mirror 21, an object to be measured 22, a fourth quarter-wave plate 23, Reference mirror 24 , second polarizer 25 , fourth dichroic prism 26 , second photodetector 27 , ultra-narrowband filter 28 , third polarizer 29 , third photodetector 30 , fourth photodetector 31 .
本实用新型的具体测量原理描述如下:The concrete measurement principle of the utility model is described as follows:
如图1所示,激光器1和激光器2分别发出波长为λ1=632.8nm和λ2=635nm的线偏振光,其中波长λ1的线偏振光为经过第一四分之一波片3后变成第一圆偏振光,波长为λ2经过第二四分之一波片4后变成第二圆偏振光,第一、第二圆偏振光分别经过第一偏振分光棱镜5、第二偏振分光棱镜6分束。As shown in Figure 1, laser 1 and laser 2 respectively emit linearly polarized light with wavelengths of λ 1 =632.8nm and λ 2 =635nm, wherein the linearly polarized light of wavelength λ 1 is after passing through the first quarter-wave plate 3 Become the first circularly polarized light, the wavelength is that lambda 2 becomes the second circularly polarized light after passing through the second quarter-wave plate 4, and the first and second circularly polarized light pass through the first polarizing beam splitter prism 5, the second polarized light respectively Polarizing beam splitting prism 6 splits the beam.
第一圆偏振光分束为第一水平偏振光和第一垂直偏振光,第一水平偏振光通过第一声光调制器7引入f1=100MHz的频移,后经第一反射镜9与经过第三反射镜11的第一垂直偏振光在第一分光棱镜13处合束,此时第一水平偏振光的频率为v1+f1,第一垂直偏振光的频率为v1,其中v1为λ1对应的光频率。The first circularly polarized light is split into the first horizontally polarized light and the first vertically polarized light, and the first horizontally polarized light is introduced into a frequency shift of f 1 =100MHz by the first acousto-optic modulator 7, and then passes through the first mirror 9 and The first vertically polarized light passing through the third reflector 11 is combined at the first dichroic prism 13. At this time, the frequency of the first horizontally polarized light is v 1 +f 1 , and the frequency of the first vertically polarized light is v 1 , where v 1 is the optical frequency corresponding to λ 1 .
第二圆偏振光分束为第二水平偏振光和第二垂直偏振光,第二水平偏振光经第二声光调制器8和第二反射镜10后在第二分光棱镜14与经第四反射镜12反射的第二垂直偏振光合束,此时第二水平偏振光的频率为v2+f2,第二垂直偏振光的频率为v2,其中f2=100.01MHz,v2为λ2对应的光频率。The second circularly polarized light is split into the second horizontally polarized light and the second vertically polarized light, and the second horizontally polarized light passes through the second acousto-optic modulator 8 and the second reflector 10, and passes through the second dichroic prism 14 and the fourth The second vertically polarized light reflected by the mirror 12 is combined, at this time, the frequency of the second horizontally polarized light is v 2 +f 2 , and the frequency of the second vertically polarized light is v 2 , where f 2 =100.01MHz, and v 2 is λ 2 corresponds to the optical frequency.
第一水平偏振光、第一垂直偏振光、第二水平偏振光和第二垂直偏振光四束激光在第三分光棱镜16处合束分束;其中一部分光强经过第一偏振片17,第一偏振片17将四束不同偏振的激光变为偏振态相同的线偏振光,其中频率为v1和v1+f1的两束激光相干叠加,频率为v2和v2+f2的两束激光相干叠加,形成双波长超外差干涉的参考信号被第一光电探测器18接收。The first horizontally polarized light, the first vertically polarized light, the second horizontally polarized light and the second vertically polarized light four laser beams are combined and split at the third dichroic prism 16; where part of the light intensity passes through the first polarizer 17, the second A polarizer 17 converts four laser beams with different polarizations into linearly polarized light with the same polarization state, wherein the two laser beams with frequencies v1 and v1 + f1 are coherently superimposed, and the laser beams with frequencies v2 and v2 + f2 The two laser beams are coherently superimposed to form a reference signal of dual-wavelength superheterodyne interference, which is received by the first photodetector 18 .
分束后的另四束激光经过第三偏振分光棱镜19再次分束,其中透射的第一水平偏振光和第二水平偏振光经过第三四分之一波片20后分别变为第三圆偏振光和第四圆偏振光垂直入射到被测反射镜21上反射,再次经过第三四分之一波片20变为第三垂直偏振光和第四垂直偏振光被第三偏振分光棱镜19反射,其中被测反射镜21固连在被测物22上;反射的第一垂直偏振光和第二垂直偏振光经过第四四分之一波片23后被参考反射镜24反射,再次经过第四四分之一波片23后变为第三水平偏振光和第四水平偏振光透过第三偏振分光棱镜19;其中第三垂直偏振光、第四垂直偏振光、第三水平偏振光和第四水平偏振光的频率分别为v1+f1、v2+f2、v1、v2,这四束激光经过第四分光棱镜26分束为两部分;一部分经过第二偏振片25发生相干叠加,形成双波长超外差干涉的测量信号被第二光电探测器27接收。双波长超外差干涉的参考信号和被测信号后续被解算出包含位移信息的相位变化值,相位变化值以合成波长λs为基准,因此具有大量程和相对较低的精度。The other four laser beams after beam splitting are split again by the third polarization beam splitter prism 19, wherein the transmitted first horizontally polarized light and the second horizontally polarized light become the third circle respectively after passing through the third quarter-wave plate 20. The polarized light and the fourth circularly polarized light are vertically incident on the measured reflector 21 and reflected, and pass through the third quarter-wave plate 20 again to become the third vertically polarized light and the fourth vertically polarized light by the third polarization beam splitter prism 19 Reflection, wherein the measured mirror 21 is fixedly connected to the measured object 22; the reflected first vertically polarized light and the second vertically polarized light are reflected by the reference mirror 24 after passing through the fourth quarter-wave plate 23, and then passed through After the fourth quarter-wave plate 23, the third horizontally polarized light and the fourth horizontally polarized light pass through the third polarization splitter prism 19; wherein the third vertically polarized light, the fourth vertically polarized light, and the third horizontally polarized light and the frequencies of the fourth horizontally polarized light are respectively v 1 +f 1 , v 2 +f 2 , v 1 , v 2 , and the four laser beams are split into two parts by the fourth beam splitter 26; one part passes through the second polarizer 25 undergoes coherent superposition, and the measurement signal forming dual-wavelength superheterodyne interference is received by the second photodetector 27 . The reference signal and the measured signal of dual-wavelength superheterodyne interference are subsequently solved to obtain the phase change value containing displacement information. The phase change value is based on the synthetic wavelength λ s , so it has a large range and relatively low precision.
另一部分经过超窄带滤波片28只留下频率为v1+f1、v1的第三垂直偏振光和第四水平偏振光,这两束激光的波长都在λ1附近,因此可以通过超窄带滤波片28,超窄带滤波片的中心波长为632.8nm,半高全宽为1nm。经过超窄带滤波片28的第三垂直偏振光和第四水平偏振光再经过第三偏振片29,发生相干叠加,形成单波长干涉信号被第三光电探测器30接收。The other part passes through the ultra-narrow-band filter 28 to leave only the third vertically polarized light and the fourth horizontally polarized light whose frequencies are v 1 +f 1 and v 1. The wavelengths of these two laser beams are all around λ 1 , so they can pass through Narrowband filter 28, the central wavelength of the ultra-narrowband filter is 632.8nm, and the full width at half maximum is 1nm. The third vertically polarized light and the fourth horizontally polarized light passing through the ultra-narrowband filter 28 pass through the third polarizer 29 to undergo coherent superposition to form a single-wavelength interference signal that is received by the third photodetector 30 .
第四光电探测器31接收到环境光信号,用来与单波长干涉信号差分消除环境光的影响。单波长干涉信号和环境关信号后续解算出包含位移信息的相位变化值,相位变化值以单波长λ1为基准,因此具有高精度。The fourth photodetector 31 receives the ambient light signal and uses it to make a difference from the single-wavelength interference signal to eliminate the influence of the ambient light. The single-wavelength interference signal and the environment-related signal are subsequently solved to calculate the phase change value containing displacement information. The phase change value is based on the single wavelength λ1, so it has high precision.
本实用新型利用双波长产生的合成波长干涉信号提升系统的测量量程,使得系统的测量量程远大于单波长干涉的量程,并采用超外差干涉法对输出信号进行解调滤波,可以直接测量合成波长的相位,实现实时测量,同时利用超窄带滤波片采得单波长干涉信号,在扩大测量量程的同时保证单波长干涉测量的精度。The utility model utilizes the synthesized wavelength interference signal generated by dual wavelengths to increase the measuring range of the system, so that the measuring range of the system is far greater than the measuring range of single wavelength interference, and uses the superheterodyne interference method to demodulate and filter the output signal, which can directly measure the synthesized The phase of the wavelength realizes real-time measurement. At the same time, the ultra-narrow-band filter is used to collect single-wavelength interference signals, which ensures the accuracy of single-wavelength interferometry while expanding the measurement range.
本实用新型已通过实施例进行了描述,任何熟悉此技术的人士皆可在不违背本实用新型的精神及范畴下,对上述实施例进行修饰或改变。因此,举凡所属技术领域中具有通常知识者在未脱离本实用新型所揭示的精神与技术思想下所完成的一切等效修饰或改变,仍应由本实用新型的权利要求所涵盖。The utility model has been described through the embodiments, and anyone familiar with the technology can modify or change the above embodiments without departing from the spirit and scope of the utility model. Therefore, all equivalent modifications or changes made by those with ordinary knowledge in the technical field without departing from the spirit and technical ideas disclosed in the utility model should still be covered by the claims of the utility model.
Claims (5)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201720602510.5U CN207019624U (en) | 2017-05-26 | 2017-05-26 | A kind of dual wavelength superhet interferes real-time displacement measuring system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201720602510.5U CN207019624U (en) | 2017-05-26 | 2017-05-26 | A kind of dual wavelength superhet interferes real-time displacement measuring system |
Publications (1)
Publication Number | Publication Date |
---|---|
CN207019624U true CN207019624U (en) | 2018-02-16 |
Family
ID=61476714
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201720602510.5U Active CN207019624U (en) | 2017-05-26 | 2017-05-26 | A kind of dual wavelength superhet interferes real-time displacement measuring system |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN207019624U (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109855743A (en) * | 2019-01-04 | 2019-06-07 | 北方工业大学 | Device and method for measuring large-size optical plane by dual-frequency laser heterodyne interferometric phase |
CN112737693A (en) * | 2020-12-25 | 2021-04-30 | 新沂市锡沂高新材料产业技术研究院有限公司 | Fundamental order radial polarization laser multiplexing equipment for large-capacity space communication |
CN113865479A (en) * | 2021-09-02 | 2021-12-31 | 浙江理工大学 | Multi-wavelength interference absolute distance measurement device and method based on frequency division multiplexing |
-
2017
- 2017-05-26 CN CN201720602510.5U patent/CN207019624U/en active Active
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109855743A (en) * | 2019-01-04 | 2019-06-07 | 北方工业大学 | Device and method for measuring large-size optical plane by dual-frequency laser heterodyne interferometric phase |
CN112737693A (en) * | 2020-12-25 | 2021-04-30 | 新沂市锡沂高新材料产业技术研究院有限公司 | Fundamental order radial polarization laser multiplexing equipment for large-capacity space communication |
CN112737693B (en) * | 2020-12-25 | 2022-06-07 | 新沂市锡沂高新材料产业技术研究院有限公司 | Fundamental order radial polarization laser multiplexing equipment for large-capacity space communication |
CN113865479A (en) * | 2021-09-02 | 2021-12-31 | 浙江理工大学 | Multi-wavelength interference absolute distance measurement device and method based on frequency division multiplexing |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN107192336B (en) | Dual-wavelength superheterodyne interference wide-range high-precision real-time displacement measurement system and method | |
CN102853771B (en) | Miniaturized high-speed ultra-precise laser difference interference measuring method and device | |
WO2021017098A1 (en) | Differential laser interferometric nanometer displacement measurement apparatus and method employing sinusoidal phase modulation | |
CN104897270B (en) | Michelson heterodyne laser vialog based on monophone light modulation and polarization spectro | |
CN101832821B (en) | Method and device for measuring laser wavelength based on bound wavelength | |
US7675628B2 (en) | Synchronous frequency-shift mechanism in Fizeau interferometer | |
JPH0198902A (en) | Optical interference length measurement device | |
CN102889853B (en) | Spectral synchronous phase-shift common-path interference microscopic-detection device and detection method | |
CN104655290A (en) | Fizeau dual-wavelength laser tuning phase-shifting interference testing device and testing method thereof | |
CN207019624U (en) | A kind of dual wavelength superhet interferes real-time displacement measuring system | |
CN102944169A (en) | Simultaneous polarization phase-shifting interferometer | |
CN104713494B (en) | The dual wavelength tuning interference testing device and method of Fourier transformation phase shift calibration | |
CN103439010A (en) | Wavelength measurement method and device based on laser synthesized wavelength interference principle | |
US20100134801A1 (en) | Synchronous frequency-shift mechanism in fizeau interferometer | |
CN102853770B (en) | Based on laser heterodyne interference measurement method and the device of little frequency difference and beam separation | |
CN104880244A (en) | Anti-polarization-aliasing Michelson heterodyne laser vibration measuring instrument based on single acousto-optic modulation and non-polarization beamsplitting | |
CN102865820B (en) | Light path compensation based laser heterodyne interference measurement method and light path compensation based laser heterodyne interference measurement device | |
CN102914259A (en) | Interference detection device based on light-splitting synchronous phase shifting and detection method | |
CN110806184A (en) | A dual measurement mode interferometric device and its measurement method | |
CN110319939A (en) | Polarize the short-coherence light source system and experimental method of phase shift combination PZT phase shift | |
JPH0339605A (en) | Optical surface shape measuring instrument | |
CN114046732A (en) | A method and system for simultaneous measurement of multi-degree-of-freedom geometric errors using laser | |
CN201637492U (en) | A Laser Wavelength Measuring Device Based on Synthetic Wavelength | |
CN104990619B (en) | Michelson heterodyne laser vialog based on dual-acousto-optic modulation and depolarization light splitting | |
CN104049248A (en) | Superheterodyne and heterodyne combined type optical-aliasing-resistance laser ranging device and method |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
GR01 | Patent grant | ||
GR01 | Patent grant |