CN102723283B - 双面三维线路芯片正装先蚀后封制造方法及其封装结构 - Google Patents
双面三维线路芯片正装先蚀后封制造方法及其封装结构 Download PDFInfo
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- CN102723283B CN102723283B CN201210189893XA CN201210189893A CN102723283B CN 102723283 B CN102723283 B CN 102723283B CN 201210189893X A CN201210189893X A CN 201210189893XA CN 201210189893 A CN201210189893 A CN 201210189893A CN 102723283 B CN102723283 B CN 102723283B
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- 238000004806 packaging method and process Methods 0.000 title claims abstract description 46
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 19
- 229910052751 metal Inorganic materials 0.000 claims abstract description 341
- 239000002184 metal Substances 0.000 claims abstract description 341
- 239000000758 substrate Substances 0.000 claims abstract description 215
- 239000004033 plastic Substances 0.000 claims abstract description 145
- 239000000463 material Substances 0.000 claims abstract description 109
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 62
- 229910052802 copper Inorganic materials 0.000 claims abstract description 50
- 239000010949 copper Substances 0.000 claims abstract description 50
- 238000000034 method Methods 0.000 claims abstract description 41
- 238000007747 plating Methods 0.000 claims abstract description 32
- 238000001465 metallisation Methods 0.000 claims abstract description 28
- 238000000576 coating method Methods 0.000 claims abstract description 24
- 238000005520 cutting process Methods 0.000 claims abstract description 22
- 239000011248 coating agent Substances 0.000 claims abstract description 18
- 238000009713 electroplating Methods 0.000 claims abstract description 18
- 238000003486 chemical etching Methods 0.000 claims abstract description 17
- 238000010079 rubber tapping Methods 0.000 claims abstract description 13
- 238000004140 cleaning Methods 0.000 claims abstract description 11
- 239000010410 layer Substances 0.000 claims description 112
- 239000005022 packaging material Substances 0.000 claims description 104
- 238000003384 imaging method Methods 0.000 claims description 36
- 238000002203 pretreatment Methods 0.000 claims description 26
- 239000000126 substance Substances 0.000 claims description 19
- 238000005530 etching Methods 0.000 claims description 14
- 230000003068 static effect Effects 0.000 claims description 14
- 230000003750 conditioning effect Effects 0.000 claims description 10
- 239000002356 single layer Substances 0.000 claims description 10
- 230000003647 oxidation Effects 0.000 claims description 8
- 238000007254 oxidation reaction Methods 0.000 claims description 8
- 229910003460 diamond Inorganic materials 0.000 claims description 5
- 239000010432 diamond Substances 0.000 claims description 5
- 239000012467 final product Substances 0.000 claims description 5
- 239000000047 product Substances 0.000 claims description 5
- 238000007789 sealing Methods 0.000 claims description 5
- 239000011265 semifinished product Substances 0.000 claims description 5
- 230000009286 beneficial effect Effects 0.000 abstract description 2
- 238000007781 pre-processing Methods 0.000 abstract description 2
- 238000012856 packing Methods 0.000 description 30
- 238000007772 electroless plating Methods 0.000 description 24
- 239000003822 epoxy resin Substances 0.000 description 21
- 229920000647 polyepoxide Polymers 0.000 description 21
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 18
- 238000005507 spraying Methods 0.000 description 18
- 238000000149 argon plasma sintering Methods 0.000 description 15
- 239000007788 liquid Substances 0.000 description 15
- 238000007704 wet chemistry method Methods 0.000 description 15
- 239000003365 glass fiber Substances 0.000 description 14
- ZBTDWLVGWJNPQM-UHFFFAOYSA-N [Ni].[Cu].[Au] Chemical compound [Ni].[Cu].[Au] ZBTDWLVGWJNPQM-UHFFFAOYSA-N 0.000 description 12
- 239000011889 copper foil Substances 0.000 description 12
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 12
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 9
- 229910052737 gold Inorganic materials 0.000 description 9
- 239000010931 gold Substances 0.000 description 9
- 229910052759 nickel Inorganic materials 0.000 description 9
- 238000007639 printing Methods 0.000 description 9
- 239000011521 glass Substances 0.000 description 8
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 7
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 6
- 239000000956 alloy Substances 0.000 description 6
- UIFOTCALDQIDTI-UHFFFAOYSA-N arsanylidynenickel Chemical compound [As]#[Ni] UIFOTCALDQIDTI-UHFFFAOYSA-N 0.000 description 6
- 238000007654 immersion Methods 0.000 description 6
- 239000007943 implant Substances 0.000 description 6
- -1 porpezite Chemical compound 0.000 description 6
- 239000007921 spray Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 4
- 229910000863 Ferronickel Inorganic materials 0.000 description 3
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 3
- 229910001128 Sn alloy Inorganic materials 0.000 description 3
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 3
- 229910045601 alloy Inorganic materials 0.000 description 3
- 239000004411 aluminium Substances 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 230000004888 barrier function Effects 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 3
- ORTQZVOHEJQUHG-UHFFFAOYSA-L copper(II) chloride Chemical compound Cl[Cu]Cl ORTQZVOHEJQUHG-UHFFFAOYSA-L 0.000 description 3
- 239000006071 cream Substances 0.000 description 3
- 230000029087 digestion Effects 0.000 description 3
- 239000003814 drug Substances 0.000 description 3
- 239000000945 filler Substances 0.000 description 3
- 229910052742 iron Inorganic materials 0.000 description 3
- FBAFATDZDUQKNH-UHFFFAOYSA-M iron chloride Chemical compound [Cl-].[Fe] FBAFATDZDUQKNH-UHFFFAOYSA-M 0.000 description 3
- KFZAUHNPPZCSCR-UHFFFAOYSA-N iron zinc Chemical compound [Fe].[Zn] KFZAUHNPPZCSCR-UHFFFAOYSA-N 0.000 description 3
- 239000004922 lacquer Substances 0.000 description 3
- 238000011112 process operation Methods 0.000 description 3
- 229910052709 silver Inorganic materials 0.000 description 3
- 239000004332 silver Substances 0.000 description 3
- 239000010936 titanium Substances 0.000 description 3
- 229910052719 titanium Inorganic materials 0.000 description 3
- 230000002411 adverse Effects 0.000 description 2
- 238000005538 encapsulation Methods 0.000 description 2
- 238000003912 environmental pollution Methods 0.000 description 2
- 239000011152 fibreglass Substances 0.000 description 2
- 238000005187 foaming Methods 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- 239000004020 conductor Substances 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000003628 erosive effect Effects 0.000 description 1
- 230000005496 eutectics Effects 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/93—Batch processes
- H01L24/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L24/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/93—Batch processes
- H01L2224/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L2224/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/0132—Binary Alloys
- H01L2924/01322—Eutectic Alloys, i.e. obtained by a liquid transforming into two solid phases
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/06—Polymers
- H01L2924/078—Adhesive characteristics other than chemical
- H01L2924/07802—Adhesive characteristics other than chemical not being an ohmic electrical conductor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing Of Printed Circuit Boards (AREA)
Abstract
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CN201210189893XA CN102723283B (zh) | 2012-06-09 | 2012-06-09 | 双面三维线路芯片正装先蚀后封制造方法及其封装结构 |
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CN201210189893XA CN102723283B (zh) | 2012-06-09 | 2012-06-09 | 双面三维线路芯片正装先蚀后封制造方法及其封装结构 |
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CN102723283A CN102723283A (zh) | 2012-10-10 |
CN102723283B true CN102723283B (zh) | 2013-10-09 |
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Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1190258A (zh) * | 1997-02-05 | 1998-08-12 | 华通电脑股份有限公司 | 球阵式集成电路封装方法及封装件 |
CN1691314A (zh) * | 2004-04-21 | 2005-11-02 | 美龙翔微电子科技(深圳)有限公司 | 倒装球栅阵列封装基板及其制作工艺 |
CN101299413A (zh) * | 2008-06-20 | 2008-11-05 | 日月光半导体制造股份有限公司 | 线路板制造工艺 |
CN101840901A (zh) * | 2010-04-30 | 2010-09-22 | 江苏长电科技股份有限公司 | 无基岛静电释放圈引线框结构及其生产方法 |
CN102005432A (zh) * | 2010-09-30 | 2011-04-06 | 江苏长电科技股份有限公司 | 四面无引脚封装结构及其封装方法 |
-
2012
- 2012-06-09 CN CN201210189893XA patent/CN102723283B/zh active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1190258A (zh) * | 1997-02-05 | 1998-08-12 | 华通电脑股份有限公司 | 球阵式集成电路封装方法及封装件 |
CN1691314A (zh) * | 2004-04-21 | 2005-11-02 | 美龙翔微电子科技(深圳)有限公司 | 倒装球栅阵列封装基板及其制作工艺 |
CN101299413A (zh) * | 2008-06-20 | 2008-11-05 | 日月光半导体制造股份有限公司 | 线路板制造工艺 |
CN101840901A (zh) * | 2010-04-30 | 2010-09-22 | 江苏长电科技股份有限公司 | 无基岛静电释放圈引线框结构及其生产方法 |
CN102005432A (zh) * | 2010-09-30 | 2011-04-06 | 江苏长电科技股份有限公司 | 四面无引脚封装结构及其封装方法 |
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Application publication date: 20121010 Assignee: Jiangsu Changjiang Electronics Technology Co., Ltd. Assignor: Xin Xin finance leasing (Tianjin) Co., Ltd. Contract record no.: 2017320010028 Denomination of invention: Etching-first and packaging-later manufacturing method for chip formal double-surface three-dimensional circuit and packaging structure of chip formal double-surface three-dimensional circuit Granted publication date: 20131009 License type: Exclusive License Record date: 20170508 |
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