CN102696042B - 用于测量电磁波的装置和方法 - Google Patents

用于测量电磁波的装置和方法 Download PDF

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Publication number
CN102696042B
CN102696042B CN201080060768.8A CN201080060768A CN102696042B CN 102696042 B CN102696042 B CN 102696042B CN 201080060768 A CN201080060768 A CN 201080060768A CN 102696042 B CN102696042 B CN 102696042B
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CN
China
Prior art keywords
wavelet
waveform
time waveform
terahertz electromagnetic
electromagnetic wave
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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CN201080060768.8A
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English (en)
Chinese (zh)
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CN102696042A (zh
Inventor
盐田道德
尾内敏彦
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Canon Inc
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Canon Inc
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Publication of CN102696042A publication Critical patent/CN102696042A/zh
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2218/00—Aspects of pattern recognition specially adapted for signal processing
    • G06F2218/02—Preprocessing
    • G06F2218/04—Denoising
    • G06F2218/06—Denoising by applying a scale-space analysis, e.g. using wavelet analysis

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Data Mining & Analysis (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Evolutionary Biology (AREA)
  • Evolutionary Computation (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Artificial Intelligence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CN201080060768.8A 2010-01-08 2010-12-28 用于测量电磁波的装置和方法 Expired - Fee Related CN102696042B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2010002481A JP5552321B2 (ja) 2010-01-08 2010-01-08 電磁波の測定装置及び方法
JP2010-002481 2010-01-08
PCT/JP2010/007591 WO2011083558A2 (en) 2010-01-08 2010-12-28 Apparatus and method for measuring electromagnetic wave

Publications (2)

Publication Number Publication Date
CN102696042A CN102696042A (zh) 2012-09-26
CN102696042B true CN102696042B (zh) 2015-11-25

Family

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CN201080060768.8A Expired - Fee Related CN102696042B (zh) 2010-01-08 2010-12-28 用于测量电磁波的装置和方法

Country Status (5)

Country Link
US (1) US9104912B2 (https=)
EP (1) EP2521986A2 (https=)
JP (1) JP5552321B2 (https=)
CN (1) CN102696042B (https=)
WO (1) WO2011083558A2 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6133112B2 (ja) * 2013-04-11 2017-05-24 Ntn株式会社 転がり軸受の診断装置および転がり軸受の診断方法
DE112017007750T5 (de) * 2017-08-22 2020-04-02 Hitachi High-Technologies Corporation Ferninfrarot-Spektralvorrichtung und Ferninfrarot-Spektralverfahren
WO2024111794A1 (ko) * 2022-11-22 2024-05-30 삼성전자 주식회사 시간 평균 sar 모드를 수행하는 전자 장치 및 전자 장치의 동작 방법

Citations (4)

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Publication number Priority date Publication date Assignee Title
US5939721A (en) * 1996-11-06 1999-08-17 Lucent Technologies Inc. Systems and methods for processing and analyzing terahertz waveforms
JP2004101510A (ja) * 2002-07-15 2004-04-02 Tochigi Nikon Corp パルス光を用いた分光計測方法および装置
CN101377406A (zh) * 2007-08-31 2009-03-04 佳能株式会社 用于获得与太赫兹波有关的信息的设备和方法
WO2009084712A1 (en) * 2007-12-28 2009-07-09 Canon Kabushiki Kaisha Waveform information acquisition apparatus and method

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JP3040651B2 (ja) * 1994-02-23 2000-05-15 三菱重工業株式会社 信号処理装置
JP2735064B2 (ja) * 1996-01-31 1998-04-02 日本電気株式会社 波形解析装置
US7738111B2 (en) * 2006-06-27 2010-06-15 Lawrence Livermore National Security, Llc Ultrafast chirped optical waveform recording using referenced heterodyning and a time microscope
US8067739B2 (en) * 2007-06-22 2011-11-29 Canon Kabushiki Kaisha Photoconductive element for generation and detection of terahertz wave
US7746400B2 (en) * 2007-07-31 2010-06-29 Aptina Imaging Corporation Method, apparatus, and system providing multi-column shared readout for imagers
JP4975001B2 (ja) * 2007-12-28 2012-07-11 キヤノン株式会社 波形情報取得装置及び波形情報取得方法
JP2009300109A (ja) * 2008-06-10 2009-12-24 Sony Corp テラヘルツ波測定方法及びテラヘルツ分光装置
JP5238370B2 (ja) 2008-06-18 2013-07-17 藤森工業株式会社 ディスプレイ用前面板および前面板用の積層フィルムの製造方法
US20110184654A1 (en) * 2008-09-17 2011-07-28 Opticul Diagnostics Ltd. Means and Methods for Detecting Bacteria in an Aerosol Sample
JP5623061B2 (ja) * 2008-12-12 2014-11-12 キヤノン株式会社 検査装置及び検査方法
US20110068268A1 (en) * 2009-09-18 2011-03-24 T-Ray Science Inc. Terahertz imaging methods and apparatus using compressed sensing
JP5596982B2 (ja) * 2010-01-08 2014-10-01 キヤノン株式会社 電磁波の測定装置及び方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5939721A (en) * 1996-11-06 1999-08-17 Lucent Technologies Inc. Systems and methods for processing and analyzing terahertz waveforms
JP2004101510A (ja) * 2002-07-15 2004-04-02 Tochigi Nikon Corp パルス光を用いた分光計測方法および装置
CN101377406A (zh) * 2007-08-31 2009-03-04 佳能株式会社 用于获得与太赫兹波有关的信息的设备和方法
WO2009084712A1 (en) * 2007-12-28 2009-07-09 Canon Kabushiki Kaisha Waveform information acquisition apparatus and method

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
Optical discrimination and classification of THz Spectra in the wavelet domain;Roberto等;《OPTICS EXPRESS》;20030616;第11卷(第12期);1462-1473 *
the what,how, and why of wavelet shrinkage denoising;Carl Taswell;《Computing in Science and Engineering》;20060630;12-19 *

Also Published As

Publication number Publication date
US20120280128A1 (en) 2012-11-08
CN102696042A (zh) 2012-09-26
US9104912B2 (en) 2015-08-11
WO2011083558A3 (en) 2011-08-18
WO2011083558A2 (en) 2011-07-14
JP5552321B2 (ja) 2014-07-16
EP2521986A2 (en) 2012-11-14
JP2011141214A (ja) 2011-07-21

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Termination date: 20161228