JP2011141214A5 - - Google Patents

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Publication number
JP2011141214A5
JP2011141214A5 JP2010002481A JP2010002481A JP2011141214A5 JP 2011141214 A5 JP2011141214 A5 JP 2011141214A5 JP 2010002481 A JP2010002481 A JP 2010002481A JP 2010002481 A JP2010002481 A JP 2010002481A JP 2011141214 A5 JP2011141214 A5 JP 2011141214A5
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JP
Japan
Prior art keywords
electromagnetic wave
time waveform
waveform
wavelet
time
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JP2010002481A
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English (en)
Japanese (ja)
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JP5552321B2 (ja
JP2011141214A (ja
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Priority claimed from JP2010002481A external-priority patent/JP5552321B2/ja
Priority to JP2010002481A priority Critical patent/JP5552321B2/ja
Priority to US13/520,701 priority patent/US9104912B2/en
Priority to PCT/JP2010/007591 priority patent/WO2011083558A2/en
Priority to CN201080060768.8A priority patent/CN102696042B/zh
Priority to EP20100807494 priority patent/EP2521986A2/en
Publication of JP2011141214A publication Critical patent/JP2011141214A/ja
Publication of JP2011141214A5 publication Critical patent/JP2011141214A5/ja
Publication of JP5552321B2 publication Critical patent/JP5552321B2/ja
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Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2010002481A 2010-01-08 2010-01-08 電磁波の測定装置及び方法 Expired - Fee Related JP5552321B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2010002481A JP5552321B2 (ja) 2010-01-08 2010-01-08 電磁波の測定装置及び方法
EP20100807494 EP2521986A2 (en) 2010-01-08 2010-12-28 Apparatus and method for measuring electromagnetic wave
PCT/JP2010/007591 WO2011083558A2 (en) 2010-01-08 2010-12-28 Apparatus and method for measuring electromagnetic wave
CN201080060768.8A CN102696042B (zh) 2010-01-08 2010-12-28 用于测量电磁波的装置和方法
US13/520,701 US9104912B2 (en) 2010-01-08 2010-12-28 Apparatus and method for measuring electromagnetic wave

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010002481A JP5552321B2 (ja) 2010-01-08 2010-01-08 電磁波の測定装置及び方法

Publications (3)

Publication Number Publication Date
JP2011141214A JP2011141214A (ja) 2011-07-21
JP2011141214A5 true JP2011141214A5 (https=) 2013-02-21
JP5552321B2 JP5552321B2 (ja) 2014-07-16

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Family Applications (1)

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JP2010002481A Expired - Fee Related JP5552321B2 (ja) 2010-01-08 2010-01-08 電磁波の測定装置及び方法

Country Status (5)

Country Link
US (1) US9104912B2 (https=)
EP (1) EP2521986A2 (https=)
JP (1) JP5552321B2 (https=)
CN (1) CN102696042B (https=)
WO (1) WO2011083558A2 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6133112B2 (ja) * 2013-04-11 2017-05-24 Ntn株式会社 転がり軸受の診断装置および転がり軸受の診断方法
DE112017007750T5 (de) * 2017-08-22 2020-04-02 Hitachi High-Technologies Corporation Ferninfrarot-Spektralvorrichtung und Ferninfrarot-Spektralverfahren
WO2024111794A1 (ko) * 2022-11-22 2024-05-30 삼성전자 주식회사 시간 평균 sar 모드를 수행하는 전자 장치 및 전자 장치의 동작 방법

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3040651B2 (ja) * 1994-02-23 2000-05-15 三菱重工業株式会社 信号処理装置
JP2735064B2 (ja) * 1996-01-31 1998-04-02 日本電気株式会社 波形解析装置
US5939721A (en) * 1996-11-06 1999-08-17 Lucent Technologies Inc. Systems and methods for processing and analyzing terahertz waveforms
JP2004101510A (ja) * 2002-07-15 2004-04-02 Tochigi Nikon Corp パルス光を用いた分光計測方法および装置
US7738111B2 (en) * 2006-06-27 2010-06-15 Lawrence Livermore National Security, Llc Ultrafast chirped optical waveform recording using referenced heterodyning and a time microscope
US8067739B2 (en) * 2007-06-22 2011-11-29 Canon Kabushiki Kaisha Photoconductive element for generation and detection of terahertz wave
US7746400B2 (en) * 2007-07-31 2010-06-29 Aptina Imaging Corporation Method, apparatus, and system providing multi-column shared readout for imagers
JP5371293B2 (ja) 2007-08-31 2013-12-18 キヤノン株式会社 テラヘルツ波に関する情報を取得するための装置及び方法
JP4975001B2 (ja) * 2007-12-28 2012-07-11 キヤノン株式会社 波形情報取得装置及び波形情報取得方法
WO2009084712A1 (en) 2007-12-28 2009-07-09 Canon Kabushiki Kaisha Waveform information acquisition apparatus and method
JP2009300109A (ja) * 2008-06-10 2009-12-24 Sony Corp テラヘルツ波測定方法及びテラヘルツ分光装置
JP5238370B2 (ja) 2008-06-18 2013-07-17 藤森工業株式会社 ディスプレイ用前面板および前面板用の積層フィルムの製造方法
US20110184654A1 (en) * 2008-09-17 2011-07-28 Opticul Diagnostics Ltd. Means and Methods for Detecting Bacteria in an Aerosol Sample
JP5623061B2 (ja) * 2008-12-12 2014-11-12 キヤノン株式会社 検査装置及び検査方法
US20110068268A1 (en) * 2009-09-18 2011-03-24 T-Ray Science Inc. Terahertz imaging methods and apparatus using compressed sensing
JP5596982B2 (ja) * 2010-01-08 2014-10-01 キヤノン株式会社 電磁波の測定装置及び方法

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