CN102486939B - 存储器的联合测试行动组测试方法和装置 - Google Patents
存储器的联合测试行动组测试方法和装置 Download PDFInfo
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- CN102486939B CN102486939B CN201010581307.7A CN201010581307A CN102486939B CN 102486939 B CN102486939 B CN 102486939B CN 201010581307 A CN201010581307 A CN 201010581307A CN 102486939 B CN102486939 B CN 102486939B
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- 238000012360 testing method Methods 0.000 title claims abstract description 185
- 230000015654 memory Effects 0.000 title claims abstract description 50
- 238000000034 method Methods 0.000 title claims abstract description 26
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- 230000006870 function Effects 0.000 claims description 10
- 238000009434 installation Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 14
- 230000008569 process Effects 0.000 description 8
- 238000004891 communication Methods 0.000 description 6
- 238000013461 design Methods 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
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- KHPCPRHQVVSZAH-UHFFFAOYSA-N trans-cinnamyl beta-D-glucopyranoside Natural products OC1C(O)C(O)C(CO)OC1OCC=CC1=CC=CC=C1 KHPCPRHQVVSZAH-UHFFFAOYSA-N 0.000 description 1
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CN201010581307.7A CN102486939B (zh) | 2010-12-06 | 2010-12-06 | 存储器的联合测试行动组测试方法和装置 |
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CN201010581307.7A CN102486939B (zh) | 2010-12-06 | 2010-12-06 | 存储器的联合测试行动组测试方法和装置 |
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CN102486939A CN102486939A (zh) | 2012-06-06 |
CN102486939B true CN102486939B (zh) | 2014-08-13 |
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CN106653098B (zh) * | 2017-01-04 | 2020-06-16 | 盛科网络(苏州)有限公司 | 针对逻辑和cpu均可读写存储器的测试方法 |
CN109884517B (zh) * | 2019-03-21 | 2021-04-30 | 浪潮商用机器有限公司 | 一种待测芯片及测试系统 |
CN113190437B (zh) * | 2021-04-21 | 2024-05-10 | 西安广和通无线软件有限公司 | 无线模组的时序分析方法、装置、计算机设备和存储介质 |
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CN1369714A (zh) * | 2001-07-18 | 2002-09-18 | 中国人民解放军第二炮兵工程学院技术开发中心 | 大规模集成电路边界扫描测试系统 |
CN101145402A (zh) * | 2007-10-26 | 2008-03-19 | 中兴通讯股份有限公司 | 一种闪存存储器子卡测试装置及方法 |
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US5793776A (en) * | 1996-10-18 | 1998-08-11 | Samsung Electronics Co., Ltd. | Structure and method for SDRAM dynamic self refresh entry and exit using JTAG |
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CN1369714A (zh) * | 2001-07-18 | 2002-09-18 | 中国人民解放军第二炮兵工程学院技术开发中心 | 大规模集成电路边界扫描测试系统 |
CN101145402A (zh) * | 2007-10-26 | 2008-03-19 | 中兴通讯股份有限公司 | 一种闪存存储器子卡测试装置及方法 |
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JP特开平10-134597A 1998.05.22 |
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