CN102479673A - 硅化钛阻挡层的制作方法 - Google Patents
硅化钛阻挡层的制作方法 Download PDFInfo
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- CN102479673A CN102479673A CN2010105562223A CN201010556222A CN102479673A CN 102479673 A CN102479673 A CN 102479673A CN 2010105562223 A CN2010105562223 A CN 2010105562223A CN 201010556222 A CN201010556222 A CN 201010556222A CN 102479673 A CN102479673 A CN 102479673A
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- titanium silicide
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CN2010105562223A CN102479673A (zh) | 2010-11-24 | 2010-11-24 | 硅化钛阻挡层的制作方法 |
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CN2010105562223A CN102479673A (zh) | 2010-11-24 | 2010-11-24 | 硅化钛阻挡层的制作方法 |
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CN102479673A true CN102479673A (zh) | 2012-05-30 |
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CN2010105562223A Pending CN102479673A (zh) | 2010-11-24 | 2010-11-24 | 硅化钛阻挡层的制作方法 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107818947A (zh) * | 2017-09-26 | 2018-03-20 | 杰华特微电子(杭州)有限公司 | 一种半导体器件及其制造方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20010048130A1 (en) * | 2000-05-25 | 2001-12-06 | Nec Corporation | Semiconductor device |
CN1327269A (zh) * | 2000-03-28 | 2001-12-19 | 株式会社东芝 | 固体摄像器件及其制造方法 |
CN1728346A (zh) * | 2004-07-14 | 2006-02-01 | 台湾积体电路制造股份有限公司 | 具有阻隔保护层的基板及形成阻隔保护层于基板上的方法 |
CN101286476A (zh) * | 2007-04-12 | 2008-10-15 | 上海宏力半导体制造有限公司 | 单一氧化硅层作为掺杂遮蔽层与金属硅化物阻挡层的方法 |
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2010
- 2010-11-24 CN CN2010105562223A patent/CN102479673A/zh active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1327269A (zh) * | 2000-03-28 | 2001-12-19 | 株式会社东芝 | 固体摄像器件及其制造方法 |
US20010048130A1 (en) * | 2000-05-25 | 2001-12-06 | Nec Corporation | Semiconductor device |
CN1728346A (zh) * | 2004-07-14 | 2006-02-01 | 台湾积体电路制造股份有限公司 | 具有阻隔保护层的基板及形成阻隔保护层于基板上的方法 |
CN101286476A (zh) * | 2007-04-12 | 2008-10-15 | 上海宏力半导体制造有限公司 | 单一氧化硅层作为掺杂遮蔽层与金属硅化物阻挡层的方法 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107818947A (zh) * | 2017-09-26 | 2018-03-20 | 杰华特微电子(杭州)有限公司 | 一种半导体器件及其制造方法 |
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C06 | Publication | ||
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Owner name: SHANGHAI HUAHONG GRACE SEMICONDUCTOR MANUFACTURING Free format text: FORMER OWNER: HUAHONG NEC ELECTRONICS CO LTD, SHANGHAI Effective date: 20140108 |
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C41 | Transfer of patent application or patent right or utility model | ||
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Free format text: CORRECT: ADDRESS; FROM: 201206 PUDONG NEW AREA, SHANGHAI TO: 201203 PUDONG NEW AREA, SHANGHAI |
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TA01 | Transfer of patent application right |
Effective date of registration: 20140108 Address after: 201203 Shanghai city Zuchongzhi road Pudong New Area Zhangjiang hi tech Park No. 1399 Applicant after: Shanghai Huahong Grace Semiconductor Manufacturing Corporation Address before: 201206, Shanghai, Pudong New Area, Sichuan Road, No. 1188 Bridge Applicant before: Shanghai Huahong NEC Electronics Co., Ltd. |
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C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20120530 |