CN102428567B - 在硅片正面上形成栅极的方法 - Google Patents

在硅片正面上形成栅极的方法 Download PDF

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Publication number
CN102428567B
CN102428567B CN201080022316.0A CN201080022316A CN102428567B CN 102428567 B CN102428567 B CN 102428567B CN 201080022316 A CN201080022316 A CN 201080022316A CN 102428567 B CN102428567 B CN 102428567B
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China
Prior art keywords
metal paste
weight
glass frit
paste
silver
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CN201080022316.0A
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English (en)
Chinese (zh)
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CN102428567A (zh
Inventor
R·D·安德森
K·W·杭
高世铭
G·劳迪辛奥
林政男
吴隽夔
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Sun Paster Co ltd
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EI Du Pont de Nemours and Co
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    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C8/00Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
    • C03C8/02Frit compositions, i.e. in a powdered or comminuted form
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F10/00Individual photovoltaic cells, e.g. solar cells
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/20Electrodes
    • H10F77/206Electrodes for devices having potential barriers
    • H10F77/211Electrodes for devices having potential barriers for photovoltaic cells
    • H10F77/215Geometries of grid contacts
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C8/00Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
    • C03C8/02Frit compositions, i.e. in a powdered or comminuted form
    • C03C8/10Frit compositions, i.e. in a powdered or comminuted form containing lead
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C8/00Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
    • C03C8/24Fusion seal compositions being frit compositions having non-frit additions, i.e. for use as seals between dissimilar materials, e.g. glass and metal; Glass solders
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01BCABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B1/00Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
    • H01B1/14Conductive material dispersed in non-conductive inorganic material
    • H01B1/16Conductive material dispersed in non-conductive inorganic material the conductive material comprising metals or alloys
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/20Electrodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/20Electrodes
    • H10F77/206Electrodes for devices having potential barriers
    • H10F77/211Electrodes for devices having potential barriers for photovoltaic cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

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  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Photovoltaic Devices (AREA)
  • Conductive Materials (AREA)
  • Sustainable Development (AREA)
  • Sustainable Energy (AREA)
CN201080022316.0A 2009-05-20 2010-05-20 在硅片正面上形成栅极的方法 Active CN102428567B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US17988509P 2009-05-20 2009-05-20
US61/179,885 2009-05-20
PCT/US2010/035522 WO2010135496A1 (en) 2009-05-20 2010-05-20 Process of forming a grid electrode on the front-side of a silicon wafer

Publications (2)

Publication Number Publication Date
CN102428567A CN102428567A (zh) 2012-04-25
CN102428567B true CN102428567B (zh) 2015-01-07

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Application Number Title Priority Date Filing Date
CN201080022316.0A Active CN102428567B (zh) 2009-05-20 2010-05-20 在硅片正面上形成栅极的方法

Country Status (7)

Country Link
US (2) US8486826B2 (enExample)
EP (1) EP2433304A1 (enExample)
JP (1) JP5898065B2 (enExample)
KR (1) KR101322072B1 (enExample)
CN (1) CN102428567B (enExample)
TW (1) TWI504011B (enExample)
WO (1) WO2010135496A1 (enExample)

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CN102365689A (zh) * 2009-03-30 2012-02-29 E.I.内穆尔杜邦公司 金属浆料及其在硅太阳能电池生产中的用途
EP2433304A1 (en) * 2009-05-20 2012-03-28 E. I. du Pont de Nemours and Company Process of forming a grid electrode on the front-side of a silicon wafer
CN102479883A (zh) * 2009-11-27 2012-05-30 无锡尚德太阳能电力有限公司 太阳电池正面电极的形成方法
US20110240124A1 (en) * 2010-03-30 2011-10-06 E.I. Du Pont De Nemours And Company Metal pastes and use thereof in the production of silicon solar cells
EP2657979B1 (en) * 2010-12-24 2017-08-30 Shin-Etsu Chemical Co., Ltd. Method for manufacturing solar cell element
CA2833375A1 (en) 2011-04-18 2012-10-26 Diamir, Llc Methods of using mirna from bodily fluids for early detection and monitoring of mild cognitive impairment (mci) and alzheimer's disease (ad)
JP6027171B2 (ja) * 2011-07-04 2016-11-16 株式会社日立製作所 封着用ガラスフリット、封着用ガラスペースト、導電性ガラスペースト、およびそれらを利用した電気電子部品
CN103165689B (zh) * 2011-12-12 2015-10-28 茂迪股份有限公司 太阳能电池及其制造方法
JP5583196B2 (ja) * 2011-12-21 2014-09-03 パナソニック株式会社 薄膜太陽電池およびその製造方法
CN103171260A (zh) * 2011-12-23 2013-06-26 昆山允升吉光电科技有限公司 一种太阳能电池电极的配套网板及其印刷方法
EP2839510A4 (en) * 2012-04-18 2015-12-02 Heraeus Precious Metals North America Conshohocken Llc PROCESS FOR PRINTING SOLAR CELL CONTACTS
KR101396444B1 (ko) * 2013-05-06 2014-05-22 한화케미칼 주식회사 태양전지의 전극의 제조방법 및 이를 이용한 태양전지
TW201511300A (zh) * 2013-09-11 2015-03-16 Inst Nuclear Energy Res Atomic Energy Council 具有摻雜矽或硼原子之鋁金屬電極之製備方法
KR20150035189A (ko) 2013-09-27 2015-04-06 엘지전자 주식회사 태양 전지
KR101859017B1 (ko) * 2015-12-02 2018-05-17 삼성에스디아이 주식회사 전극 형성 방법, 이로부터 제조된 전극 및 태양 전지
CN105590663B (zh) * 2016-01-07 2017-09-22 清华大学 无铅无铋导电银浆、银栅线的制备方法及硅太阳能电池
JP6810986B2 (ja) * 2016-07-14 2021-01-13 アートビーム株式会社 太陽電池および太陽電池の製造方法
CN110337423A (zh) 2017-03-24 2019-10-15 贺利氏贵金属北美康舍霍肯有限责任公司 用于导电膏组合物的低蚀刻和非接触式玻璃
CN108110087B (zh) * 2017-12-20 2019-12-17 江苏日托光伏科技股份有限公司 一种低线宽mwt硅太阳能电池的制备方法
US20190280133A1 (en) 2018-03-09 2019-09-12 Heraeus Precious Metals North America Conshohocken Llc Seed layer for improved contact on a silicon wafer
KR102576589B1 (ko) * 2018-09-05 2023-09-08 상라오 징코 솔라 테크놀러지 디벨롭먼트 컴퍼니, 리미티드 태양 전지 및 이를 포함하는 태양 전지 패널
CN109539604B (zh) * 2019-01-17 2020-05-29 河北道荣新能源科技有限公司 薄膜光伏发电耦合选择性吸收涂层结构
CN109631353B (zh) * 2019-01-17 2020-05-08 河北道荣新能源科技有限公司 薄膜光伏发电耦合选择性吸收涂层制法及其集热管制法
US20210257505A1 (en) * 2020-02-18 2021-08-19 Dupont Electronics, Inc. Solar cell and method for manufacturing the same
JP2021022735A (ja) * 2020-09-21 2021-02-18 アートビーム株式会社 太陽電池および太陽電池の製造方法

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US5279682A (en) * 1991-06-11 1994-01-18 Mobil Solar Energy Corporation Solar cell and method of making same

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US5178685A (en) * 1991-06-11 1993-01-12 Mobil Solar Energy Corporation Method for forming solar cell contacts and interconnecting solar cells
JP4121928B2 (ja) * 2003-10-08 2008-07-23 シャープ株式会社 太陽電池の製造方法
US7462304B2 (en) * 2005-04-14 2008-12-09 E.I. Du Pont De Nemours And Company Conductive compositions used in the manufacture of semiconductor device
JP5118044B2 (ja) * 2006-08-31 2013-01-16 信越半導体株式会社 半導体基板並びに電極の形成方法及び太陽電池の製造方法
JP5091161B2 (ja) 2006-12-26 2012-12-05 京セラ株式会社 太陽電池素子及び太陽電池素子の製造方法
US8236598B2 (en) * 2007-08-31 2012-08-07 Ferro Corporation Layered contact structure for solar cells
TW200926210A (en) * 2007-09-27 2009-06-16 Murata Manufacturing Co Ag electrode paste, solar battery cell, and process for producing the solar battery cell
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Also Published As

Publication number Publication date
CN102428567A (zh) 2012-04-25
JP2012527780A (ja) 2012-11-08
US8486826B2 (en) 2013-07-16
US20100294359A1 (en) 2010-11-25
WO2010135496A1 (en) 2010-11-25
KR101322072B1 (ko) 2013-10-28
TW201110398A (en) 2011-03-16
US20130276881A1 (en) 2013-10-24
KR20120012989A (ko) 2012-02-13
US9054239B2 (en) 2015-06-09
EP2433304A1 (en) 2012-03-28
TWI504011B (zh) 2015-10-11
JP5898065B2 (ja) 2016-04-06

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C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
TR01 Transfer of patent right

Effective date of registration: 20201229

Address after: Delaware, USA

Patentee after: DuPont Electronics

Address before: Delaware, USA

Patentee before: E.I. Nemours DuPont

TR01 Transfer of patent right
TR01 Transfer of patent right

Effective date of registration: 20210425

Address after: Delaware, USA

Patentee after: Sun paster Co.,Ltd.

Address before: Delaware, USA

Patentee before: DuPont Electronics

TR01 Transfer of patent right
EE01 Entry into force of recordation of patent licensing contract

Application publication date: 20120425

Assignee: Jiangsu SOTE Electronic Material Co.,Ltd.

Assignor: Sun paster Co.,Ltd.

Contract record no.: X2021990000521

Denomination of invention: Method of forming gate on front surface of silicon wafer

Granted publication date: 20150107

License type: Common License

Record date: 20210826

EE01 Entry into force of recordation of patent licensing contract