CN102301445B - 通过蚀刻来制造元件的方法 - Google Patents
通过蚀刻来制造元件的方法 Download PDFInfo
- Publication number
- CN102301445B CN102301445B CN200880132719.3A CN200880132719A CN102301445B CN 102301445 B CN102301445 B CN 102301445B CN 200880132719 A CN200880132719 A CN 200880132719A CN 102301445 B CN102301445 B CN 102301445B
- Authority
- CN
- China
- Prior art keywords
- etching
- etching mask
- sub area
- conductive line
- line structure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000005530 etching Methods 0.000 title claims abstract description 125
- 238000000034 method Methods 0.000 title claims abstract description 29
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 21
- 239000000463 material Substances 0.000 claims abstract description 40
- 239000000758 substrate Substances 0.000 claims abstract description 35
- 230000004888 barrier function Effects 0.000 claims abstract description 26
- 238000000576 coating method Methods 0.000 claims description 42
- 239000011248 coating agent Substances 0.000 claims description 40
- 239000004020 conductor Substances 0.000 claims description 7
- 238000007689 inspection Methods 0.000 claims description 2
- 239000012799 electrically-conductive coating Substances 0.000 abstract 4
- 238000012423 maintenance Methods 0.000 abstract 1
- 230000008569 process Effects 0.000 description 10
- 238000005452 bending Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 229910052802 copper Inorganic materials 0.000 description 3
- 239000010949 copper Substances 0.000 description 3
- 230000009471 action Effects 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 239000004411 aluminium Substances 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- 239000004820 Pressure-sensitive adhesive Substances 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 210000000988 bone and bone Anatomy 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000005672 electromagnetic field Effects 0.000 description 1
- 230000003628 erosive effect Effects 0.000 description 1
- 239000010410 layer Substances 0.000 description 1
- 230000004807 localization Effects 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F1/00—Etching metallic material by chemical means
- C23F1/02—Local etching
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F1/00—Etching metallic material by chemical means
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/02—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
- H05K3/06—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed chemically or electrolytically, e.g. by photo-etch process
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/02—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
- H05K3/06—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed chemically or electrolytically, e.g. by photo-etch process
- H05K3/061—Etching masks
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/16—Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor
- H05K1/165—Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor incorporating printed inductors
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09209—Shape and layout details of conductors
- H05K2201/09654—Shape and layout details of conductors covering at least two types of conductors provided for in H05K2201/09218 - H05K2201/095
- H05K2201/09781—Dummy conductors, i.e. not used for normal transport of current; Dummy electrodes of components
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/11—Treatments characterised by their effect, e.g. heating, cooling, roughening
- H05K2203/1184—Underetching, e.g. etching of substrate under conductors or etching of conductor under dielectrics; Means for allowing or controlling underetching
Abstract
Description
Claims (8)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/FI2008/050741 WO2010070186A1 (en) | 2008-12-15 | 2008-12-15 | Method for manufacturing a component by etching |
Publications (2)
Publication Number | Publication Date |
---|---|
CN102301445A CN102301445A (zh) | 2011-12-28 |
CN102301445B true CN102301445B (zh) | 2014-06-04 |
Family
ID=42268357
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN200880132719.3A Expired - Fee Related CN102301445B (zh) | 2008-12-15 | 2008-12-15 | 通过蚀刻来制造元件的方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US8448874B2 (zh) |
KR (1) | KR101555232B1 (zh) |
CN (1) | CN102301445B (zh) |
WO (1) | WO2010070186A1 (zh) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI662385B (zh) | 2010-06-11 | 2019-06-11 | 日商理光股份有限公司 | 容器及影像形成裝置 |
US8950681B2 (en) | 2011-11-07 | 2015-02-10 | Blackberry Limited | Universal integrated circuit card apparatus and related methods |
USD691610S1 (en) | 2011-11-07 | 2013-10-15 | Blackberry Limited | Device smart card |
USD786222S1 (en) * | 2016-05-26 | 2017-05-09 | Avery Dennison Retail Information Services, Llc | Antenna design |
KR20180072034A (ko) | 2016-12-20 | 2018-06-29 | 단국대학교 산학협력단 | 계단실과 본 건물의 사이를 활용한 감쇠시스템 |
USD840983S1 (en) * | 2017-10-20 | 2019-02-19 | Avery Dennison Retail Information Services, Llc | RFID inlay |
USD840380S1 (en) * | 2017-12-06 | 2019-02-12 | Avery Dennison Retail Information Services, Llc | RFID inlay |
US11443160B2 (en) | 2019-09-18 | 2022-09-13 | Sensormatic Electronics, LLC | Systems and methods for laser tuning and attaching RFID tags to products |
US10970613B1 (en) | 2019-09-18 | 2021-04-06 | Sensormatic Electronics, LLC | Systems and methods for providing tags adapted to be incorporated with or in items |
CN110781995A (zh) * | 2019-10-30 | 2020-02-11 | 浙江悦和科技有限公司 | 反应器皿的制造方法及反应器皿 |
CN110764032B (zh) * | 2019-11-14 | 2021-08-20 | 中国原子能科学研究院 | 用于光泵磁力仪的射频薄膜 |
US11055588B2 (en) | 2019-11-27 | 2021-07-06 | Sensormatic Electronics, LLC | Flexible water-resistant sensor tag |
US11755874B2 (en) | 2021-03-03 | 2023-09-12 | Sensormatic Electronics, LLC | Methods and systems for heat applied sensor tag |
US11869324B2 (en) | 2021-12-23 | 2024-01-09 | Sensormatic Electronics, LLC | Securing a security tag into an article |
CN116273760B (zh) * | 2022-09-07 | 2024-02-23 | 中国飞机强度研究所 | 一种导电传感器涂布方法 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1734478A (zh) * | 2004-08-13 | 2006-02-15 | 富士通株式会社 | 射频标识标签及其制造方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61251035A (ja) | 1985-04-29 | 1986-11-08 | Mitsubishi Electric Corp | 半導体製造装置 |
JPS63236319A (ja) * | 1987-03-24 | 1988-10-03 | Nec Corp | 半導体装置の製造方法 |
JPH0814029B2 (ja) | 1990-06-27 | 1996-02-14 | 日立電線株式会社 | エッチング用マスクパターン及び配線パターンの製造方法 |
AU762495B2 (en) * | 1998-08-14 | 2003-06-26 | 3M Innovative Properties Company | Application for a radio frequency identification system |
CA2338522C (en) * | 1998-08-14 | 2009-04-07 | 3M Innovative Properties Company | Radio frequency identification systems applications |
US7120987B2 (en) * | 2003-08-05 | 2006-10-17 | Avery Dennison Corporation | Method of making RFID device |
JP2005157022A (ja) * | 2003-11-27 | 2005-06-16 | Elpida Memory Inc | 補助パターン付きマスクの製造方法 |
JP4787572B2 (ja) * | 2005-08-25 | 2011-10-05 | 株式会社日立製作所 | 無線icタグ、及び無線icタグの製造方法 |
JP4026080B2 (ja) * | 2006-02-24 | 2007-12-26 | オムロン株式会社 | アンテナ、およびrfidタグ |
JP2007228326A (ja) * | 2006-02-24 | 2007-09-06 | Omron Corp | ループアンテナ、およびrfidタグ |
-
2008
- 2008-12-15 CN CN200880132719.3A patent/CN102301445B/zh not_active Expired - Fee Related
- 2008-12-15 US US13/139,565 patent/US8448874B2/en not_active Expired - Fee Related
- 2008-12-15 WO PCT/FI2008/050741 patent/WO2010070186A1/en active Application Filing
- 2008-12-15 KR KR1020117016190A patent/KR101555232B1/ko not_active IP Right Cessation
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1734478A (zh) * | 2004-08-13 | 2006-02-15 | 富士通株式会社 | 射频标识标签及其制造方法 |
Also Published As
Publication number | Publication date |
---|---|
US20110253794A1 (en) | 2011-10-20 |
US8448874B2 (en) | 2013-05-28 |
KR20120002520A (ko) | 2012-01-05 |
WO2010070186A1 (en) | 2010-06-24 |
KR101555232B1 (ko) | 2015-09-23 |
CN102301445A (zh) | 2011-12-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
ASS | Succession or assignment of patent right |
Owner name: SMARTRAC IP B.V. Free format text: FORMER OWNER: UPM RFID OY Effective date: 20130122 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20130122 Address after: Amsterdam Applicant after: Smartrac IP BV Address before: Finland peel Cara Applicant before: UPM RFID Ltd |
|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20170503 Address after: Amsterdam Patentee after: Simatelake Investment Co. Ltd. Address before: Amsterdam Patentee before: Smartrac IP BV |
|
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140604 Termination date: 20171215 |