CN102192786B - 量子效率测量方法、量子效率测量装置和积分器 - Google Patents

量子效率测量方法、量子效率测量装置和积分器 Download PDF

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Publication number
CN102192786B
CN102192786B CN201110069976.0A CN201110069976A CN102192786B CN 102192786 B CN102192786 B CN 102192786B CN 201110069976 A CN201110069976 A CN 201110069976A CN 102192786 B CN102192786 B CN 102192786B
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mentioned
exciting light
spectrum
window
integrator
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CN102192786A (zh
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大泽祥宏
大久保和明
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Otsuka Electronics Co Ltd
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Otsuka Electronics Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/443Emission spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/58Photometry, e.g. photographic exposure meter using luminescence generated by light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0254Spectrometers, other than colorimeters, making use of an integrating sphere
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J2001/0481Preset integrating sphere or cavity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N2021/6417Spectrofluorimetric devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • G01N2021/6463Optics
    • G01N2021/6469Cavity, e.g. ellipsoid
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/065Integrating spheres
    • G01N2201/0655Hemispheres

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Spectrometry And Color Measurement (AREA)
CN201110069976.0A 2010-03-18 2011-03-18 量子效率测量方法、量子效率测量装置和积分器 Active CN102192786B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010061804A JP5640257B2 (ja) 2010-03-18 2010-03-18 量子効率測定方法および量子効率測定装置
JP2010-061804 2010-03-18

Publications (2)

Publication Number Publication Date
CN102192786A CN102192786A (zh) 2011-09-21
CN102192786B true CN102192786B (zh) 2014-10-29

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Country Status (5)

Country Link
US (1) US8415639B2 (https=)
JP (1) JP5640257B2 (https=)
KR (1) KR101781219B1 (https=)
CN (1) CN102192786B (https=)
TW (1) TWI500912B (https=)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4666376A (en) 1984-06-04 1987-05-19 Solomon Fred D Solar powered pump assembly
JP5491368B2 (ja) 2010-11-29 2014-05-14 浜松ホトニクス株式会社 量子収率測定装置及び量子収率測定方法
JP5491369B2 (ja) 2010-11-29 2014-05-14 浜松ホトニクス株式会社 量子収率測定装置
JP5760589B2 (ja) * 2011-03-30 2015-08-12 豊田合成株式会社 白色led装置用蛍光体の蛍光スペクトルの測定方法及び測定装置
CN103477196B (zh) * 2011-10-13 2016-06-22 大塚电子株式会社 光学测量系统和光学测量方法
JP2014535056A (ja) * 2011-11-08 2014-12-25 ザ・トラスティーズ・オブ・コロンビア・ユニバーシティ・イン・ザ・シティ・オブ・ニューヨーク トモグラフィのデータを取り込むための同時多方向イメージングに向けたシステムと方法
JP6041691B2 (ja) * 2013-01-31 2016-12-14 大塚電子株式会社 測定装置および測定方法
JP5529305B1 (ja) 2013-02-04 2014-06-25 浜松ホトニクス株式会社 分光測定装置、及び分光測定方法
CN103344621B (zh) * 2013-07-03 2015-12-02 重庆大学 一种荧光量子效率测量装置及其测量方法
JP6279399B2 (ja) * 2014-05-23 2018-02-14 浜松ホトニクス株式会社 光計測装置及び光計測方法
JP6677651B2 (ja) * 2014-12-02 2020-04-08 浜松ホトニクス株式会社 分光測定装置および分光測定方法
JP6693694B2 (ja) * 2014-12-02 2020-05-13 浜松ホトニクス株式会社 分光測定装置および分光測定方法
CN104713647A (zh) * 2015-03-10 2015-06-17 张美英 光谱仪及光谱分析方法
JP6613063B2 (ja) 2015-07-07 2019-11-27 大塚電子株式会社 光学特性測定システム
JP6227068B1 (ja) * 2016-07-27 2017-11-08 浜松ホトニクス株式会社 試料容器保持部材、光計測装置及び試料容器配置方法
EP3526560A4 (en) * 2016-10-11 2020-07-08 Victoria Link Limited SPECTROMETER APPARATUS FOR MEASURING SPECTRUMS OF A LIQUID SAMPLE USING AN INTEGRATION CAVITY
JP2018179884A (ja) * 2017-04-19 2018-11-15 株式会社島津製作所 量子収率算出方法、分光蛍光光度計及び量子収率算出プログラム
CN107228849B (zh) * 2017-06-23 2019-04-26 厦门大学 白光led荧光粉变温光谱特性的透射式测试装置及方法
JP6856558B2 (ja) 2018-01-23 2021-04-07 浜松ホトニクス株式会社 光測定装置及び光測定方法
JP6856559B2 (ja) * 2018-01-23 2021-04-07 浜松ホトニクス株式会社 光測定装置及び光測定方法
CN118329783A (zh) * 2018-02-27 2024-07-12 圣安德鲁斯大学董事会 用于分析包含颗粒的液体样品的设备
CN111175627B (zh) * 2018-11-09 2023-04-07 固安鼎材科技有限公司 一种oled器件光电及量子效率测试系统
GB202001397D0 (en) 2020-01-31 2020-03-18 Odx Innovations Ltd Apparatus, system and method for measuring properties of a sample
CN111707369B (zh) * 2020-06-28 2024-04-12 中国计量大学 一种双光路分光测色仪及测色方法
DE102024127717A1 (de) * 2024-09-25 2026-03-26 Claas Selbstfahrende Erntemaschinen Gmbh Landwirtschaftliche Erntemaschine mit einer optischen Messeinrichtung

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101287974A (zh) * 2006-04-12 2008-10-15 松下电器产业株式会社 光学测量装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05113386A (ja) * 1990-11-30 1993-05-07 Shimadzu Corp 光損失測定装置
JP3117565B2 (ja) * 1992-11-27 2000-12-18 松下電器産業株式会社 光束計
JP3287775B2 (ja) 1996-02-29 2002-06-04 松下電器産業株式会社 蛍光体の量子効率測定方法および測定装置
JP3247845B2 (ja) 1996-11-13 2002-01-21 松下電器産業株式会社 蛍光体の量子効率測定方法および装置
JP3266046B2 (ja) 1997-04-21 2002-03-18 松下電器産業株式会社 蛍光体の量子効率測定装置
JP3437140B2 (ja) * 2000-03-28 2003-08-18 株式会社島津製作所 赤外放射温度計
JP2002310902A (ja) * 2001-04-16 2002-10-23 Central Glass Co Ltd 波長選択性のある散乱光測定方法
DE10207610A1 (de) * 2002-02-22 2003-09-25 Rudolf Schwarte Verfahren und Vorrichtung zur Erfassung und Verarbeitung elektrischer und optischer Signale
JP4418731B2 (ja) * 2004-10-27 2010-02-24 日本放送協会 フォトルミネッセンス量子収率測定方法およびこれに用いる装置
JP5022587B2 (ja) * 2005-10-07 2012-09-12 富士フイルム株式会社 半導体レーザの駆動方法および装置、並びに補正パターンの導出方法および装置
JP2007298310A (ja) * 2006-04-27 2007-11-15 Sanyo Electric Co Ltd 光学装置
JP4452737B2 (ja) * 2007-10-25 2010-04-21 大塚電子株式会社 光束計および測定方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101287974A (zh) * 2006-04-12 2008-10-15 松下电器产业株式会社 光学测量装置

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
JP特开2001-281062A 2001.10.10
JP特开2002-310902A 2002.10.23
JP特开2009-103654A 2009.05.14
JP特开平9-292281A 1997.11.11

Also Published As

Publication number Publication date
TW201135197A (en) 2011-10-16
JP2011196735A (ja) 2011-10-06
JP5640257B2 (ja) 2014-12-17
CN102192786A (zh) 2011-09-21
KR101781219B1 (ko) 2017-09-22
KR20110105349A (ko) 2011-09-26
TWI500912B (zh) 2015-09-21
US8415639B2 (en) 2013-04-09
US20110226961A1 (en) 2011-09-22

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