JP5640257B2 - 量子効率測定方法および量子効率測定装置 - Google Patents

量子効率測定方法および量子効率測定装置 Download PDF

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Publication number
JP5640257B2
JP5640257B2 JP2010061804A JP2010061804A JP5640257B2 JP 5640257 B2 JP5640257 B2 JP 5640257B2 JP 2010061804 A JP2010061804 A JP 2010061804A JP 2010061804 A JP2010061804 A JP 2010061804A JP 5640257 B2 JP5640257 B2 JP 5640257B2
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excitation light
spectrum
integrator
quantum efficiency
window
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Japanese (ja)
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JP2011196735A (ja
JP2011196735A5 (https=
Inventor
祥宏 大澤
祥宏 大澤
大久保　和明
和明 大久保
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Otsuka Electronics Co Ltd
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Otsuka Electronics Co Ltd
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Priority to JP2010061804A priority Critical patent/JP5640257B2/ja
Priority to TW100105595A priority patent/TWI500912B/zh
Priority to US13/033,612 priority patent/US8415639B2/en
Priority to KR1020110023609A priority patent/KR101781219B1/ko
Priority to CN201110069976.0A priority patent/CN102192786B/zh
Publication of JP2011196735A publication Critical patent/JP2011196735A/ja
Publication of JP2011196735A5 publication Critical patent/JP2011196735A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/443—Emission spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/58—Photometry, e.g. photographic exposure meter using luminescence generated by light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0254—Spectrometers, other than colorimeters, making use of an integrating sphere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J2001/0481—Preset integrating sphere or cavity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N2021/6417—Spectrofluorimetric devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N2021/6463—Optics
    • G01N2021/6469—Cavity, e.g. ellipsoid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/065—Integrating spheres
    • G01N2201/0655—Hemispheres

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Spectrometry And Color Measurement (AREA)
JP2010061804A 2010-03-18 2010-03-18 量子効率測定方法および量子効率測定装置 Active JP5640257B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2010061804A JP5640257B2 (ja) 2010-03-18 2010-03-18 量子効率測定方法および量子効率測定装置
TW100105595A TWI500912B (zh) 2010-03-18 2011-02-21 量子效率測量方法、量子效率測量裝置以及積分器
US13/033,612 US8415639B2 (en) 2010-03-18 2011-02-24 Quantum efficiency measurement method, quantum efficiency measurement apparatus, and integrator
KR1020110023609A KR101781219B1 (ko) 2010-03-18 2011-03-17 양자 효율 측정 방법, 양자 효율 측정 장치 및 적분기
CN201110069976.0A CN102192786B (zh) 2010-03-18 2011-03-18 量子效率测量方法、量子效率测量装置和积分器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010061804A JP5640257B2 (ja) 2010-03-18 2010-03-18 量子効率測定方法および量子効率測定装置

Publications (3)

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JP2011196735A JP2011196735A (ja) 2011-10-06
JP2011196735A5 JP2011196735A5 (https=) 2013-04-04
JP5640257B2 true JP5640257B2 (ja) 2014-12-17

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US (1) US8415639B2 (https=)
JP (1) JP5640257B2 (https=)
KR (1) KR101781219B1 (https=)
CN (1) CN102192786B (https=)
TW (1) TWI500912B (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH066941B2 (ja) 1984-06-04 1994-01-26 ソロモン，フレッド・ディ− ソ−ラ−パワ−ポンプ組立体

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5491368B2 (ja) 2010-11-29 2014-05-14 浜松ホトニクス株式会社 量子収率測定装置及び量子収率測定方法
JP5491369B2 (ja) 2010-11-29 2014-05-14 浜松ホトニクス株式会社 量子収率測定装置
JP5760589B2 (ja) * 2011-03-30 2015-08-12 豊田合成株式会社 白色ｌｅｄ装置用蛍光体の蛍光スペクトルの測定方法及び測定装置
CN103477196B (zh) * 2011-10-13 2016-06-22 大塚电子株式会社 光学测量系统和光学测量方法
JP2014535056A (ja) * 2011-11-08 2014-12-25 ザ・トラスティーズ・オブ・コロンビア・ユニバーシティ・イン・ザ・シティ・オブ・ニューヨーク トモグラフィのデータを取り込むための同時多方向イメージングに向けたシステムと方法
JP6041691B2 (ja) * 2013-01-31 2016-12-14 大塚電子株式会社 測定装置および測定方法
JP5529305B1 (ja) 2013-02-04 2014-06-25 浜松ホトニクス株式会社 分光測定装置、及び分光測定方法
CN103344621B (zh) * 2013-07-03 2015-12-02 重庆大学 一种荧光量子效率测量装置及其测量方法
JP6279399B2 (ja) * 2014-05-23 2018-02-14 浜松ホトニクス株式会社 光計測装置及び光計測方法
JP6677651B2 (ja) * 2014-12-02 2020-04-08 浜松ホトニクス株式会社 分光測定装置および分光測定方法
JP6693694B2 (ja) * 2014-12-02 2020-05-13 浜松ホトニクス株式会社 分光測定装置および分光測定方法
CN104713647A (zh) * 2015-03-10 2015-06-17 张美英 光谱仪及光谱分析方法
JP6613063B2 (ja) 2015-07-07 2019-11-27 大塚電子株式会社 光学特性測定システム
JP6227068B1 (ja) * 2016-07-27 2017-11-08 浜松ホトニクス株式会社 試料容器保持部材、光計測装置及び試料容器配置方法
EP3526560A4 (en) * 2016-10-11 2020-07-08 Victoria Link Limited SPECTROMETER APPARATUS FOR MEASURING SPECTRUMS OF A LIQUID SAMPLE USING AN INTEGRATION CAVITY
JP2018179884A (ja) * 2017-04-19 2018-11-15 株式会社島津製作所 量子収率算出方法、分光蛍光光度計及び量子収率算出プログラム
CN107228849B (zh) * 2017-06-23 2019-04-26 厦门大学 白光led荧光粉变温光谱特性的透射式测试装置及方法
JP6856558B2 (ja) 2018-01-23 2021-04-07 浜松ホトニクス株式会社 光測定装置及び光測定方法
JP6856559B2 (ja) * 2018-01-23 2021-04-07 浜松ホトニクス株式会社 光測定装置及び光測定方法
CN118329783A (zh) * 2018-02-27 2024-07-12 圣安德鲁斯大学董事会 用于分析包含颗粒的液体样品的设备
CN111175627B (zh) * 2018-11-09 2023-04-07 固安鼎材科技有限公司 一种oled器件光电及量子效率测试系统
GB202001397D0 (en) 2020-01-31 2020-03-18 Odx Innovations Ltd Apparatus, system and method for measuring properties of a sample
CN111707369B (zh) * 2020-06-28 2024-04-12 中国计量大学 一种双光路分光测色仪及测色方法
DE102024127717A1 (de) * 2024-09-25 2026-03-26 Claas Selbstfahrende Erntemaschinen Gmbh Landwirtschaftliche Erntemaschine mit einer optischen Messeinrichtung

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05113386A (ja) * 1990-11-30 1993-05-07 Shimadzu Corp 光損失測定装置
JP3117565B2 (ja) * 1992-11-27 2000-12-18 松下電器産業株式会社 光束計
JP3287775B2 (ja) 1996-02-29 2002-06-04 松下電器産業株式会社 蛍光体の量子効率測定方法および測定装置
JP3247845B2 (ja) 1996-11-13 2002-01-21 松下電器産業株式会社 蛍光体の量子効率測定方法および装置
JP3266046B2 (ja) 1997-04-21 2002-03-18 松下電器産業株式会社 蛍光体の量子効率測定装置
JP3437140B2 (ja) * 2000-03-28 2003-08-18 株式会社島津製作所 赤外放射温度計
JP2002310902A (ja) * 2001-04-16 2002-10-23 Central Glass Co Ltd 波長選択性のある散乱光測定方法
DE10207610A1 (de) * 2002-02-22 2003-09-25 Rudolf Schwarte Verfahren und Vorrichtung zur Erfassung und Verarbeitung elektrischer und optischer Signale
JP4418731B2 (ja) * 2004-10-27 2010-02-24 日本放送協会 フォトルミネッセンス量子収率測定方法およびこれに用いる装置
JP5022587B2 (ja) * 2005-10-07 2012-09-12 富士フイルム株式会社 半導体レーザの駆動方法および装置、並びに補正パターンの導出方法および装置
WO2007122674A1 (ja) * 2006-04-12 2007-11-01 Panasonic Corporation 光学測定装置
JP2007298310A (ja) * 2006-04-27 2007-11-15 Sanyo Electric Co Ltd 光学装置
JP4452737B2 (ja) * 2007-10-25 2010-04-21 大塚電子株式会社 光束計および測定方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH066941B2 (ja) 1984-06-04 1994-01-26 ソロモン，フレッド・ディ− ソ−ラ−パワ−ポンプ組立体

Also Published As

Publication number Publication date
TW201135197A (en) 2011-10-16
JP2011196735A (ja) 2011-10-06
CN102192786A (zh) 2011-09-21
KR101781219B1 (ko) 2017-09-22
KR20110105349A (ko) 2011-09-26
CN102192786B (zh) 2014-10-29
TWI500912B (zh) 2015-09-21
US8415639B2 (en) 2013-04-09
US20110226961A1 (en) 2011-09-22

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