CN102170828B - 射线照相成像系统 - Google Patents
射线照相成像系统 Download PDFInfo
- Publication number
- CN102170828B CN102170828B CN200980138395.9A CN200980138395A CN102170828B CN 102170828 B CN102170828 B CN 102170828B CN 200980138395 A CN200980138395 A CN 200980138395A CN 102170828 B CN102170828 B CN 102170828B
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- signal
- radiation
- exposure
- imaging
- image capturing
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- 238000003384 imaging method Methods 0.000 title claims abstract description 132
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Images
Classifications
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20184—Detector read-out circuitry, e.g. for clearing of traps, compensating for traps or compensating for direct hits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/243—Modular detectors, e.g. arrays formed from self contained units
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/148—Charge coupled imagers
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Medical Informatics (AREA)
- Biomedical Technology (AREA)
- Public Health (AREA)
- Pathology (AREA)
- Radiology & Medical Imaging (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Heart & Thoracic Surgery (AREA)
- Surgery (AREA)
- Animal Behavior & Ethology (AREA)
- General Health & Medical Sciences (AREA)
- Optics & Photonics (AREA)
- Veterinary Medicine (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Biophysics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008-255484 | 2008-09-30 | ||
JP2008255484A JP5137770B2 (ja) | 2008-09-30 | 2008-09-30 | 放射線画像撮影システム |
PCT/JP2009/066820 WO2010038710A1 (ja) | 2008-09-30 | 2009-09-28 | 放射線画像撮影システム |
Publications (2)
Publication Number | Publication Date |
---|---|
CN102170828A CN102170828A (zh) | 2011-08-31 |
CN102170828B true CN102170828B (zh) | 2014-06-04 |
Family
ID=42073474
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN200980138395.9A Expired - Fee Related CN102170828B (zh) | 2008-09-30 | 2009-09-28 | 射线照相成像系统 |
Country Status (5)
Country | Link |
---|---|
US (1) | US20120001082A1 (ko) |
JP (1) | JP5137770B2 (ko) |
KR (1) | KR101232674B1 (ko) |
CN (1) | CN102170828B (ko) |
WO (1) | WO2010038710A1 (ko) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20110095192A1 (en) * | 2009-10-26 | 2011-04-28 | Johnson Kurtis F | Method to increase dynamic range of segmented non-linear devices |
KR101251744B1 (ko) * | 2011-04-13 | 2013-04-05 | 엘지이노텍 주식회사 | Wdr 픽셀 어레이, 이를 포함하는 wdr 이미징 장치 및 그 구동방법 |
KR101241553B1 (ko) * | 2011-04-13 | 2013-03-11 | 엘지이노텍 주식회사 | Wdr 픽셀 어레이, 이를 포함하는 wdr 이미징 장치 및 그 구동방법 |
US8680473B2 (en) * | 2011-10-31 | 2014-03-25 | Bruker Axs, Inc. | Multiply-sampled CMOS sensor for X-ray diffraction measurements with corrections for non-ideal sensor behavior |
JP6129517B2 (ja) * | 2012-11-06 | 2017-05-17 | 東芝メディカルシステムズ株式会社 | X線診断装置及び制御プログラム |
CN103750850B (zh) * | 2013-11-20 | 2016-12-07 | 江苏康众数字医疗设备有限公司 | 一种光信号探测器的自动同步方法及装置 |
CN103973989B (zh) * | 2014-04-15 | 2017-04-05 | 北京理工大学 | 获取高动态图像的方法及系统 |
JP6491434B2 (ja) | 2014-08-12 | 2019-03-27 | キヤノン株式会社 | 放射線撮像装置及び放射線検出システム |
JP6435154B2 (ja) * | 2014-10-14 | 2018-12-05 | 株式会社ジョブ | 光子計数型検出器 |
CN105763817B (zh) * | 2016-03-14 | 2020-01-14 | 天逸瑞狮(苏州)口腔医疗科技股份有限公司 | 一种影像扫描系统 |
KR101896802B1 (ko) * | 2016-12-08 | 2018-09-10 | 서울시립대학교 산학협력단 | 논리회로가 적용된 디지털 출력을 갖는 이미지 센서 모듈을 이용한 라돈 검출 시스템 및 검출방법 |
EP3499869B1 (en) * | 2017-10-20 | 2022-05-04 | Shenzhen Goodix Technology Co., Ltd. | Pixel sensing module and image capturing device |
WO2020061015A1 (en) | 2018-09-18 | 2020-03-26 | Hologic, Inc. | Systems and methods for mitigating imaging artifacts |
WO2022059950A1 (ko) * | 2020-09-17 | 2022-03-24 | 엘지전자 주식회사 | 엑스선 촬영 장치 및 그것의 제어방법 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN86105398A (zh) * | 1985-11-26 | 1987-06-03 | 株式会社岛津制作所 | 放射线摄影装置 |
CN1765327A (zh) * | 2004-10-25 | 2006-05-03 | 西门子公司 | 产生多重能量图像的断层造影设备及其方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4300046A (en) * | 1978-07-12 | 1981-11-10 | Diagnostic Information, Inc. | Panel type X-ray image intensifier tube and radiographic camera system |
JPH0444476A (ja) * | 1990-06-12 | 1992-02-14 | Toshiba Corp | X線テレビ装置 |
JP2703416B2 (ja) * | 1991-03-29 | 1998-01-26 | シャープ株式会社 | インターライン転送型ccd撮像装置の駆動方法 |
JPH05292404A (ja) * | 1992-04-09 | 1993-11-05 | Hitachi Denshi Ltd | テレビジョンカメラ |
US5422670A (en) * | 1992-08-31 | 1995-06-06 | Sony Corporation | Control circuit for a solid state imaging device which allows a high speed object to be detected |
US5693948A (en) * | 1995-11-21 | 1997-12-02 | Loral Fairchild Corporation | Advanced CCD-based x-ray image sensor system |
DE69939814D1 (de) * | 1998-12-22 | 2008-12-11 | Koninkl Philips Electronics Nv | Vorrichtung und verfahren zur erzeugung des bildes eines gegenstandes aus einer mehrzahl von bildern |
US6842502B2 (en) * | 2000-02-18 | 2005-01-11 | Dilliam Beaumont Hospital | Cone beam computed tomography with a flat panel imager |
US7274771B2 (en) * | 2005-05-03 | 2007-09-25 | General Electric Company | Methods and systems for controlling exposure for medical imaging devices |
JP2008182330A (ja) * | 2007-01-23 | 2008-08-07 | Fujifilm Corp | 固体撮像装置の検査装置及び検査方法、並びに固体撮像装置 |
-
2008
- 2008-09-30 JP JP2008255484A patent/JP5137770B2/ja not_active Expired - Fee Related
-
2009
- 2009-09-28 WO PCT/JP2009/066820 patent/WO2010038710A1/ja active Application Filing
- 2009-09-28 KR KR1020117007353A patent/KR101232674B1/ko active IP Right Grant
- 2009-09-28 US US12/998,159 patent/US20120001082A1/en not_active Abandoned
- 2009-09-28 CN CN200980138395.9A patent/CN102170828B/zh not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN86105398A (zh) * | 1985-11-26 | 1987-06-03 | 株式会社岛津制作所 | 放射线摄影装置 |
CN1765327A (zh) * | 2004-10-25 | 2006-05-03 | 西门子公司 | 产生多重能量图像的断层造影设备及其方法 |
Non-Patent Citations (3)
Title |
---|
JP平4-44476A 1992.02.14 |
JP特开2008-182330A 2008.08.07 |
JP特开平5-292404A 1993.11.05 |
Also Published As
Publication number | Publication date |
---|---|
KR101232674B1 (ko) | 2013-02-13 |
JP5137770B2 (ja) | 2013-02-06 |
JP2010082254A (ja) | 2010-04-15 |
US20120001082A1 (en) | 2012-01-05 |
KR20110047272A (ko) | 2011-05-06 |
CN102170828A (zh) | 2011-08-31 |
WO2010038710A1 (ja) | 2010-04-08 |
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Legal Events
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140604 Termination date: 20190928 |