CN102027603B - 沉积有机材料的方法 - Google Patents
沉积有机材料的方法 Download PDFInfo
- Publication number
- CN102027603B CN102027603B CN2008801088120A CN200880108812A CN102027603B CN 102027603 B CN102027603 B CN 102027603B CN 2008801088120 A CN2008801088120 A CN 2008801088120A CN 200880108812 A CN200880108812 A CN 200880108812A CN 102027603 B CN102027603 B CN 102027603B
- Authority
- CN
- China
- Prior art keywords
- substrate
- deposition
- gaseous material
- gas
- reactive
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45544—Atomic layer deposition [ALD] characterized by the apparatus
- C23C16/45548—Atomic layer deposition [ALD] characterized by the apparatus having arrangements for gas injection at different locations of the reactor for each ALD half-reaction
- C23C16/45551—Atomic layer deposition [ALD] characterized by the apparatus having arrangements for gas injection at different locations of the reactor for each ALD half-reaction for relative movement of the substrate and the gas injectors or half-reaction reactor compartments
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45553—Atomic layer deposition [ALD] characterized by the use of precursors specially adapted for ALD
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/54—Apparatus specially adapted for continuous coating
- C23C16/545—Apparatus specially adapted for continuous coating for coating elongated substrates
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D1/00—Processes for applying liquids or other fluent materials
- B05D1/60—Deposition of organic layers from vapour phase
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D2252/00—Sheets
- B05D2252/02—Sheets of indefinite length
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/861618 | 2007-09-26 | ||
| US11/861,618 | 2007-09-26 | ||
| US11/861,618 US7858144B2 (en) | 2007-09-26 | 2007-09-26 | Process for depositing organic materials |
| PCT/US2008/010801 WO2009042051A2 (en) | 2007-09-26 | 2008-09-17 | Process for depositing organic materials |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102027603A CN102027603A (zh) | 2011-04-20 |
| CN102027603B true CN102027603B (zh) | 2013-11-20 |
Family
ID=40377691
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2008801088120A Expired - Fee Related CN102027603B (zh) | 2007-09-26 | 2008-09-17 | 沉积有机材料的方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7858144B2 (enExample) |
| EP (1) | EP2210270B1 (enExample) |
| JP (1) | JP2011506758A (enExample) |
| CN (1) | CN102027603B (enExample) |
| WO (1) | WO2009042051A2 (enExample) |
Families Citing this family (38)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11136667B2 (en) * | 2007-01-08 | 2021-10-05 | Eastman Kodak Company | Deposition system and method using a delivery head separated from a substrate by gas pressure |
| US7789961B2 (en) * | 2007-01-08 | 2010-09-07 | Eastman Kodak Company | Delivery device comprising gas diffuser for thin film deposition |
| US20080166880A1 (en) * | 2007-01-08 | 2008-07-10 | Levy David H | Delivery device for deposition |
| US8398770B2 (en) * | 2007-09-26 | 2013-03-19 | Eastman Kodak Company | Deposition system for thin film formation |
| US8211231B2 (en) * | 2007-09-26 | 2012-07-03 | Eastman Kodak Company | Delivery device for deposition |
| US20110206909A1 (en) * | 2008-10-31 | 2011-08-25 | Sundew Technologies Llc | Coatings for suppressing metallic whiskers |
| WO2010065695A2 (en) | 2008-12-04 | 2010-06-10 | Veeco Instruments Inc. | Chemical vapor deposition flow inlet elements and methods |
| US9090971B2 (en) * | 2009-05-11 | 2015-07-28 | The Regents Of The University Of Colorado, A Body Corporate | Ultra-thin metal oxide and carbon-metal oxide films prepared by atomic layer deposition (ALD) |
| JP5096437B2 (ja) * | 2009-09-28 | 2012-12-12 | 株式会社ジャパンディスプレイイースト | 有機el表示装置 |
| US9176377B2 (en) | 2010-06-01 | 2015-11-03 | Inpria Corporation | Patterned inorganic layers, radiation based patterning compositions and corresponding methods |
| FI20105908A0 (fi) * | 2010-08-30 | 2010-08-30 | Beneq Oy | Laite |
| JP5966618B2 (ja) * | 2012-05-28 | 2016-08-10 | 東京エレクトロン株式会社 | 成膜方法 |
| KR101435100B1 (ko) * | 2012-06-20 | 2014-08-29 | 주식회사 엠티에스나노테크 | 원자층 증착 장치 |
| DE102012214411B4 (de) | 2012-08-14 | 2022-05-25 | Osram Oled Gmbh | Vorrichtung und verfahren zum herstellen hermetisch dichter kavitäten |
| US20140206137A1 (en) * | 2013-01-23 | 2014-07-24 | David H. Levy | Deposition system for thin film formation |
| TW201435132A (zh) * | 2013-02-22 | 2014-09-16 | Applied Materials Inc | 包含SiOC的膜的催化性原子層沉積 |
| KR102075528B1 (ko) * | 2013-05-16 | 2020-03-03 | 삼성디스플레이 주식회사 | 증착장치, 유기발광 디스플레이 장치 제조방법 및 유기발광 디스플레이 장치 |
| LT3003286T (lt) | 2013-05-24 | 2022-08-10 | Nanexa Ab | Kietųjų nanodalelių su neorganine danga gamybos būdas ir jų naudojimas |
| US9310684B2 (en) | 2013-08-22 | 2016-04-12 | Inpria Corporation | Organometallic solution based high resolution patterning compositions |
| SG11201600923YA (en) | 2013-08-30 | 2016-03-30 | Iucf Hyu | Substrate structure and method of manufacturing same |
| CN103510074A (zh) * | 2013-10-25 | 2014-01-15 | 南京大学 | 基于ald技术的复合无机-有机杂化物薄膜的制备方法 |
| CN106211763B (zh) * | 2014-03-25 | 2019-08-27 | 住友金属矿山株式会社 | 包覆焊料材料及其制造方法 |
| JP6604974B2 (ja) * | 2014-06-12 | 2019-11-13 | ビーエーエスエフ コーティングス ゲゼルシャフト ミット ベシュレンクテル ハフツング | 可撓性有機−無機積層体を製造する方法 |
| EP3155142B1 (en) * | 2014-06-13 | 2021-04-21 | BASF Coatings GmbH | Process for producing organic-inorganic laminates |
| GB201412201D0 (en) * | 2014-07-09 | 2014-08-20 | Isis Innovation | Two-step deposition process |
| JP6420706B2 (ja) * | 2015-04-07 | 2018-11-07 | 信越化学工業株式会社 | 太陽電池用パッシベーション膜形成方法及び太陽電池用パッシベーション膜形成装置 |
| CA2987938C (en) * | 2015-06-01 | 2023-09-26 | Pneumaticoat Technologies Llc | Nano-engineered coatings for anode active materials, cathode active materials, and solid-state electrolytes and methods of making batteries containing nano-engineered coatings |
| KR102420015B1 (ko) * | 2015-08-28 | 2022-07-12 | 삼성전자주식회사 | Cs-ald 장치의 샤워헤드 |
| US10865477B2 (en) * | 2016-02-08 | 2020-12-15 | Illinois Tool Works Inc. | Method and system for the localized deposit of metal on a surface |
| CN106086812B (zh) * | 2016-07-20 | 2018-08-03 | 南京航空航天大学 | 一种金属表面防腐蚀耐磨损的复合涂层及其制备方法 |
| US10400332B2 (en) * | 2017-03-14 | 2019-09-03 | Eastman Kodak Company | Deposition system with interlocking deposition heads |
| US12006570B2 (en) * | 2017-08-31 | 2024-06-11 | Uchicago Argonne, Llc | Atomic layer deposition for continuous, high-speed thin films |
| CN108448006B (zh) * | 2018-03-29 | 2021-01-22 | 京东方科技集团股份有限公司 | 封装结构、电子装置以及封装方法 |
| US10673046B2 (en) * | 2018-04-13 | 2020-06-02 | GM Global Technology Operations LLC | Separator for lithium metal based batteries |
| GB2585077A (en) | 2019-06-28 | 2020-12-30 | Nanexa Ab | Apparatus |
| WO2021059332A1 (ja) * | 2019-09-24 | 2021-04-01 | 株式会社Kokusai Electric | 基板処理装置、半導体装置の製造方法およびプログラム |
| US20220359332A1 (en) * | 2021-05-09 | 2022-11-10 | Spts Technologies Limited | Temporary passivation layer on a substrate |
| CN115821229A (zh) * | 2022-11-25 | 2023-03-21 | 江苏微导纳米科技股份有限公司 | 一种用于沉积薄膜的方法和设备以及薄膜 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4413022A (en) * | 1979-02-28 | 1983-11-01 | Canon Kabushiki Kaisha | Method for performing growth of compound thin films |
| CN1990492A (zh) * | 2005-10-07 | 2007-07-04 | 气体产品与化学公司 | 用于金属硅氮化物、氧化物或氮氧化物的ALD/CVD的Ti、Ta、Hf、Zr及相关金属硅氨化物 |
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| US6337102B1 (en) * | 1997-11-17 | 2002-01-08 | The Trustees Of Princeton University | Low pressure vapor phase deposition of organic thin films |
| US6316098B1 (en) * | 1998-03-27 | 2001-11-13 | Yissum Research Development Company Of The Hebrew University Of Jerusalem | Molecular layer epitaxy method and compositions |
| US6783849B2 (en) | 1998-03-27 | 2004-08-31 | Yissum Research Development Company Of The Hebrew University Of Jerusalem | Molecular layer epitaxy method and compositions |
| US7476420B2 (en) * | 2000-10-23 | 2009-01-13 | Asm International N.V. | Process for producing metal oxide films at low temperatures |
| FI118014B (fi) * | 2000-10-23 | 2007-05-31 | Asm Int | Menetelmä alumiinioksidiohutkalvojen valmistamiseksi matalissa lämpötiloissa |
| KR20030057133A (ko) * | 2001-12-28 | 2003-07-04 | 삼성전자주식회사 | 금속 패턴 형성용 유기금속 전구체 및 이를 이용한 금속패턴 형성방법 |
| US7067439B2 (en) * | 2002-06-14 | 2006-06-27 | Applied Materials, Inc. | ALD metal oxide deposition process using direct oxidation |
| US20050084610A1 (en) | 2002-08-13 | 2005-04-21 | Selitser Simon I. | Atmospheric pressure molecular layer CVD |
| US6821563B2 (en) | 2002-10-02 | 2004-11-23 | Applied Materials, Inc. | Gas distribution system for cyclical layer deposition |
| JP4108633B2 (ja) | 2003-06-20 | 2008-06-25 | シャープ株式会社 | 薄膜トランジスタおよびその製造方法ならびに電子デバイス |
| JP2005089781A (ja) * | 2003-09-12 | 2005-04-07 | Mitsui Eng & Shipbuild Co Ltd | 薄膜形成装置 |
| US20070190247A1 (en) | 2004-05-18 | 2007-08-16 | Mecharonics Co., Ltd. | Method for forming organic light-emitting layer |
| JP4363365B2 (ja) * | 2004-07-20 | 2009-11-11 | 株式会社デンソー | カラー有機elディスプレイおよびその製造方法 |
| NO20045674D0 (no) * | 2004-12-28 | 2004-12-28 | Uni I Oslo | Thin films prepared with gas phase deposition technique |
| CN1937175B (zh) * | 2005-09-20 | 2012-10-03 | 中芯国际集成电路制造(上海)有限公司 | 用于半导体器件的使用大气压的材料原子层沉积的方法 |
| US20070077349A1 (en) * | 2005-09-30 | 2007-04-05 | Eastman Kodak Company | Patterning OLED device electrodes and optical material |
| EP1994555A4 (en) * | 2006-03-10 | 2009-12-16 | Advanced Tech Materials | PRECURSOR COMPOSITIONS FOR STORING ATOMIC LAYERS AND CHEMICAL PREVENTION OF TITANIUM, LANTHANATE AND DIELECTRIC TANTALATE FILMS |
| US7456429B2 (en) * | 2006-03-29 | 2008-11-25 | Eastman Kodak Company | Apparatus for atomic layer deposition |
| US20080100202A1 (en) * | 2006-11-01 | 2008-05-01 | Cok Ronald S | Process for forming oled conductive protective layer |
| US7722422B2 (en) * | 2007-05-21 | 2010-05-25 | Global Oled Technology Llc | Device and method for improved power distribution for a transparent electrode |
| US7572686B2 (en) * | 2007-09-26 | 2009-08-11 | Eastman Kodak Company | System for thin film deposition utilizing compensating forces |
| US8133555B2 (en) * | 2008-10-14 | 2012-03-13 | Asm Japan K.K. | Method for forming metal film by ALD using beta-diketone metal complex |
-
2007
- 2007-09-26 US US11/861,618 patent/US7858144B2/en not_active Expired - Fee Related
-
2008
- 2008-09-17 JP JP2010526899A patent/JP2011506758A/ja active Pending
- 2008-09-17 EP EP08833728.2A patent/EP2210270B1/en not_active Not-in-force
- 2008-09-17 CN CN2008801088120A patent/CN102027603B/zh not_active Expired - Fee Related
- 2008-09-17 WO PCT/US2008/010801 patent/WO2009042051A2/en not_active Ceased
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4413022A (en) * | 1979-02-28 | 1983-11-01 | Canon Kabushiki Kaisha | Method for performing growth of compound thin films |
| CN1990492A (zh) * | 2005-10-07 | 2007-07-04 | 气体产品与化学公司 | 用于金属硅氮化物、氧化物或氮氧化物的ALD/CVD的Ti、Ta、Hf、Zr及相关金属硅氨化物 |
Non-Patent Citations (1)
| Title |
|---|
| Matti Putkonen等.Atomic layer deposition of polyimide thin films.《Journal of Chemistry》.2006,第17卷(第7期), * |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2009042051A2 (en) | 2009-04-02 |
| EP2210270A2 (en) | 2010-07-28 |
| WO2009042051A3 (en) | 2010-11-18 |
| EP2210270B1 (en) | 2017-05-17 |
| JP2011506758A (ja) | 2011-03-03 |
| US7858144B2 (en) | 2010-12-28 |
| US20090081883A1 (en) | 2009-03-26 |
| CN102027603A (zh) | 2011-04-20 |
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Legal Events
| Date | Code | Title | Description |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20131120 Termination date: 20200917 |