CN101902272A - Optical transceiver module SFP tester - Google Patents
Optical transceiver module SFP tester Download PDFInfo
- Publication number
- CN101902272A CN101902272A CN2010102195538A CN201010219553A CN101902272A CN 101902272 A CN101902272 A CN 101902272A CN 2010102195538 A CN2010102195538 A CN 2010102195538A CN 201010219553 A CN201010219553 A CN 201010219553A CN 101902272 A CN101902272 A CN 101902272A
- Authority
- CN
- China
- Prior art keywords
- optical transceiver
- transceiver module
- sfp
- circuit board
- interface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Monitoring And Testing Of Transmission In General (AREA)
Abstract
The invention discloses an optical transceiver module SFP tester, which comprises a testing circuit board, a programmable power supply, an oscilloscope, an error rate analyzer, modular optical switches S1 and S2, and a PC host. An optical transceiver module SFP is arranged on the testing circuit board; the optical switch S1 is connected with the circuit board; and the testing circuit board is connected with the programmable power supply, the error rate analyzer and the PC host. One end of the oscilloscope is connected with the circuit board through the modular optical switch S2; and the other end of the oscilloscope is respectively connected with the error rate analyzer and the PC host. The optical transceiver module SFP tester can test the photoelectric properties of eight paths of optical transceiver module SFP, greatly saves the testing time, and saves the testing equipment. Therefore, the optical transceiver module SFP tester reduces the testing cost and is easy for realizing mass production.
Description
Technical field
The present invention relates to the optical transceiver module SFP testing equipment, specifically be meant a kind of instrument that can detect a plurality of optical transceiver module SFPs.
Background technology
Optical transceiver module SFP is the interface device of photosignal conversion, and it has characteristics such as miniaturization, standardization, hot-swappable and self diagnosis.The technology of optical transceiver module SFP realizes that difficulty is bigger, must consider complicated problems such as signal integrity, reliability, stability and electromagnetic interference, so need before dispatching from the factory optical transceiver module SFP is carried out multinomial testing evaluation.At present the tester that uses in the research and development of optical transceiver module SFP and production process can only be tested an optical transceiver module SFP at every turn, and testing efficiency is low, is not easy to large-scale production.
Summary of the invention
The problem that the present invention need solve provides a kind of optical transceiver module SFP tester that can test simultaneously a plurality of optical transceiver module SFPs.
To achieve these goals, the present invention designs a kind of optical transceiver module SFP tester, it comprises testing circuit board, programmable power supply able to programme, oscilloscope, Bit Error Rate Analyzer, modular optical switch S 1, S2 and computer PC main frame, optical transceiver module SFP is placed on the testing circuit board, optical switch S1 is connected with circuit board, testing circuit board is connected with programmable power supply able to programme, Bit Error Rate Analyzer and computer PC main frame, an oscillographic end is connected with circuit board by modular optical switch S 2, and the oscillographic other end is connected with the PC main frame with Bit Error Rate Analyzer respectively.
Described computer PC main frame, programmable power supply able to programme, oscilloscope, Bit Error Rate Analyzer are respectively arranged with the GPIB control card, and the GPIB control card on the computer PC main frame is connected with GPIB control card on programmable power supply able to programme, oscilloscope, the Bit Error Rate Analyzer by the GPIB cable respectively.
As preferred version of the present invention: can test simultaneously to eight optical transceiver module SFPs, this scheme is such realization: testing circuit board comprises eight optical transceiver module SFP electrical connection interface J0, J1, J2, J3, J4, J5, J6, J7, a pair of high frequency difference frequency sub-signal input SMA interface TX+, TX-, a pair of high frequency difference frequency sub-signal output SMA interface RX+, RX-, two 8 * 1 multipath high-speed electric switch chip U2, U3,16 current monitoring chips, a MCU controller and a usb communication interface, described eight optical transceiver module SFP electrical connection interfaces respectively with two 8 * 1 multipath high-speed electric switch chip U2, U3 connects, one of them 8 * 1 multipath high-speed electric switch chip U2 and MCU controller and high frequency difference frequency sub-signal output SMA interface RX+, RX-connects, another 8 * 1 multipath high-speed electric switch chip U3 and MCU controller and high frequency difference frequency sub-signal input SMA interface TX+, TX-connects, high frequency difference frequency sub-signal output SMA interface RX+, RX-and high frequency difference frequency sub-signal input SMA interface TX+, TX-is connected with Bit Error Rate Analyzer by cable respectively, described MCU controller is connected with usb communication interface J8, and usb communication interface J8 is connected with computer PC main frame.
Described MCU controller is connected with high frequency difference frequency sub-signal input SMA interface TX current detection module with high frequency difference frequency sub-signal input SMA interface RX current detection module respectively.
Two 8 * 1 multipath high-speed electric switch chips in the optical transceiver module SFP tester of the present invention can have been realized the switching between eight road SFP optical transceiver modules.The electric current precise monitoring function of eight road SFP optical transceiver modules that described 16 current monitoring chips are perfect.The MCU controller can have been integrated control, current monitoring information processing, module parameter data acquisition and the usb communication function of high speed electric switch.
Optical transceiver module SFP tester of the present invention has been realized simultaneously the photoelectric properties of eight road optical transceiver module SFPs being tested on a testing circuit board, perfect especially electric current precise monitoring function, saved the testing time, saved testing equipment, reduce testing cost, be easy to carry out large-scale production.
Optical transceiver module SFP tester of the present invention is especially in optical transceiver module SFP research and development and production test procedure, to carry out the property at high and low temperature experiment to module, need the data parameters of test module on several temperature point, and high low temperature experimental box heats up and cooling and be stabilized in certain temperature spot and all need the regular hour, traditional optical transceiver module SFP tester, once can only test an optical transceiver module SFP, needs are finished the high low temperature test of eight optical transceiver module SFPs, the temperature of whole high low temperature experimental box rises and descends and also will repeat eight times, and is very time-consuming.Optical transceiver module SFP tester of the present invention, available a set of equipment is once finished the test of eight SFP optical transceiver modules, has saved the testing time greatly, has saved testing equipment, thereby has reduced cost; On the other hand, in the production process of product, use optical transceiver module SFP tester of the present invention, be easier to realize large-scale production.
Description of drawings:
Fig. 1 is an optical transceiver module SFP tester theory of constitution block diagram of the present invention.
Embodiment
For the ease of those skilled in the art's understanding, structural principle of the present invention is described in further detail below in conjunction with specific embodiment and accompanying drawing:
As shown in Figure 1, disclosed the system principle block diagram of this optical transceiver module SFP tester.It comprises testing circuit board, programmable power supply able to programme, oscilloscope, Bit Error Rate Analyzer, modular optical switch S 1, S2 and computer PC main frame, optical transceiver module SFP is placed on the testing circuit board, optical switch S1 is connected with circuit board, testing circuit board is connected with programmable power supply able to programme, Bit Error Rate Analyzer and computer PC main frame, an oscillographic end is connected with circuit board by modular optical switch S 2, and the oscillographic other end is connected with the PC main frame with Bit Error Rate Analyzer respectively.
Described computer PC main frame, programmable power supply able to programme, oscilloscope, Bit Error Rate Analyzer are respectively arranged with the GPIB control card, and the GPIB control card on the computer PC main frame is connected with GPIB control card on programmable power supply able to programme, oscilloscope, the Bit Error Rate Analyzer by the GPIB cable respectively.
The present invention can test simultaneously to eight optical transceiver module SFPs, this scheme is such realization: testing circuit board comprises eight optical transceiver module SFP electrical connection interface J0, J1, J2, J3, J4, J5, J6, J7, a pair of high frequency difference frequency sub-signal input SMA interface TX+, TX-, a pair of high frequency difference frequency sub-signal output SMA interface RX+, RX-, two 8 * 1 multipath high-speed electric switch chip U2, U3,16 current monitoring chip (not shown), a MCU controller and a usb communication interface, described eight optical transceiver module SFP electrical connection interfaces respectively with two 8 * 1 multipath high-speed electric switch chip U2, U3 connects, one of them 8 * 1 multipath high-speed electric switch chip U2 and MCU controller and high frequency difference frequency sub-signal output SMA interface RX+, RX-connects, another 8 * 1 multipath high-speed electric switch chip U3 and MCU controller and high frequency difference frequency sub-signal input SMA interface TX+, TX-connects, high frequency difference frequency sub-signal output SMA interface RX+, RX-and high frequency difference frequency sub-signal input SMA interface TX+, TX-is connected with Bit Error Rate Analyzer by cable respectively, described MCU controller is connected with usb communication interface J8, and usb communication interface J8 is connected with computer PC main frame.
Described MCU controller is connected with high frequency difference frequency sub-signal input SMA interface TX current detection module with high frequency difference frequency sub-signal input SMA interface RX current detection module respectively.
It is C8051F340 that MCU controller U1 described in the present invention can select model for use, and the model that two 8 * 1 multipath high-speed electric switch chip U2, U3 select for use is VSC3208, and the model of selecting for use of 16 current monitoring chips is MAX4070.
Wherein, the electrical connection interface J0 of optical transceiver module SFP, J1, J2, J3, J4, J5, J6 and J7, eight tested SFP optical transceiver modules 0 are used to peg graft, SFP optical transceiver module 1, SFP optical transceiver module 2, SFP optical transceiver module 3, SFP optical transceiver module 4, SFP optical transceiver module 5, SFP optical transceiver module 6, SFP optical transceiver module 7 has a pair of high frequency difference frequency sub-signal input terminal on each interface, a pair of high frequency difference frequency sub-signal lead-out terminal, module connection status detection terminal MOD_ABS, the transmitting terminal power supply terminal, transmitting terminal faulty indication terminal TX_Fault, terminal TX_Disable is forbidden in transmitting terminal output, the receiving terminal power supply terminal, Received Loss Of Signal monitoring terminal RX_LOS, I2C serial communication terminal.
Wherein, a pair of high frequency difference frequency sub-signal input SMA interface TX+, TX-, this interface is connected with a pair of high speed input terminal of one 8 * 1 multipath high-speed electric switch chip U3, and the input electrical signal of transmitting terminal is provided for the SFP optical transceiver module by the high speed electric switch.
Wherein, a pair of high frequency difference frequency sub-signal output SMA interface RX+, RX-, this interface is connected with a pair of high-speed output end of another 8 * 1 multipath high-speed electric switch chip U2, and the signal of telecommunication that the light signal that receives for SFP optical transceiver module receiving terminal by the high speed electric switch changes into provides output interface.
Wherein, two 8 * 1 multipath high-speed electric switch chip U2 and U3, the a pair of high-speed-differential lead-out terminal of one of them 8 * 1 multipath high-speed electric switch chip U2 is connected to the high frequency difference frequency sub-signal lead-out terminal that a pair of high frequency difference frequency sub-signal output SMA interface RX+, RX-, eight pairs of high-speed-differential input terminals are connected to described eight SFP electrical connection interfaces respectively, the switching when realizing test receiving terminal parameter between the disparate modules; The a pair of high-speed-differential input terminal of another 8 * 1 multipath high-speed electric switch chip U3 is connected to the high frequency difference frequency sub-signal input terminal that a pair of high frequency difference frequency sub-signal input SMA interface TX+, TX-, eight pairs of high-speed-differential lead-out terminals are connected to described eight SFP electrical connection interfaces respectively, switching when realizing test transmitting terminal parameter between the disparate modules, the I2C serial communication terminal of two high speed electric switches is connected to the I2C serial communication terminal of MCU controller U1.
Wherein, in 16 current monitoring chips, be connected in series a sampling resistor between the transmitting terminal power supply terminal of each SFP electrical connection interface and the DC power supply, each sampling resistor two ends connects the in-phase input end and the inverting input of a current monitoring chip respectively, is used for monitoring the electric current of the SFP module transmitting terminal of surveying; Also be connected in series a sampling resistor between the receiving terminal power supply terminal of each SFP electrical connection interface and the DC power supply, each sampling resistor two ends connects the in-phase input end and the inverting input of a current monitoring chip respectively, is used for monitoring the electric current of the SFP module receiving terminal of surveying.
Wherein, a MCU controller U1, A/D conversion input terminal is connected to the output of 16 current monitoring chips respectively, and the serial communication terminal is connected to the serial communication terminal of two 8 * 1 multipath high-speed electric switch chip U2 and U3 respectively, and the usb communication terminal is connected to usb communication interface J8.
Wherein, a usb communication interface J8 is connected to the USB terminal of MCU controller U1, is used to realize the communication between testing circuit board and the PC main frame.
Operation principle of the present invention: connect eight road SFP optical receiving-transmitting module test systems, high-speed-differential input interface TX+ with test board, TX-and high-speed-differential output interface RX+, RX-is connected to the Data Out+ of Bit Error Rate Analyzer respectively with coaxial cable, Data Out-and Data In+, Data In-interface, the usb communication interface of test board links to each other with the PC main frame by the USB connecting line, after checking that the connection of whole test system circuit is entirely true, at eight SFP electrical connection interface J0, J1, J2, J3, J4, J5, J6 and J7 plug tested SFP optical transceiver module respectively, the receiving terminal of SFP optical transceiver module is connected to light source by one 8 * 1 modular optical switch S 1, the transmitting terminal of SFP optical transceiver module is connected to oscillographic light input signal interface by one 8 * 1 modular optical switch S 2, circuit board powers on, computer PC main frame sends instruction, pass to MCU controller U1 by usb communication interface J8, by two high speed electric switch chip U2 of MCU controller U1 control and U3, register in two speed-sensitive switch chips is provided with, determine the channel selecting of speed-sensitive switch, realize the switching between the different tested modules.After the speed-sensitive switch passage is selected, selected optical transceiver module SFP transmitting terminal electric current and arrival current can be respectively obtained by the transmitting terminal current monitoring chip of correspondence and arrival current chip monitoring, pass to MCU controller U1, after the processing of MCU controller, be sent to the PC main frame by the usb communication interface, realize electric current precise monitoring function; And module connection status signal MOD_ABS, the transmitting terminal fault indication signal TX_Fault of tested SFP optical transceiver module, transmitting terminal output inhibit signal TX_Disable, Received Loss Of Signal monitor signal RX_LOS receive the I/O mouth of MCU controller U1 by terminal corresponding on the SFP electrical connection interface, be sent to the PC main frame by the usb communication interface again, thereby realized using the function of eight SFP optical transceiver modules of a cover test system and test.
Claims (4)
1. optical transceiver module SFP tester, it is characterized in that: described tester comprises testing circuit board, programmable power supply able to programme, oscilloscope, Bit Error Rate Analyzer, modular optical switch S 1, S2 and PC main frame, optical transceiver module SFP is placed on the testing circuit board, optical switch S1 is connected with circuit board, testing circuit board is connected with programmable power supply able to programme, Bit Error Rate Analyzer and computer PC main frame, an oscillographic end is connected with circuit board by modular optical switch S 2, and the oscillographic other end is connected with the PC main frame with Bit Error Rate Analyzer respectively.
2. optical transceiver module SFP tester according to claim 1, it is characterized in that: described PC main frame, programmable power supply able to programme, oscilloscope, Bit Error Rate Analyzer are respectively arranged with the GPIB control card, and the GPIB control card on the PC main frame is connected with GPIB control card on programmable power supply able to programme, oscilloscope, the Bit Error Rate Analyzer by the GPIB cable respectively.
3. optical transceiver module SFP tester according to claim 1 and 2, it is characterized in that: described testing circuit board comprises eight optical transceiver module SFP electrical connection interface J0, J1, J2, J3, J4, J5, J6, J7, a pair of high frequency difference frequency sub-signal input SMA interface TX+, TX-, a pair of high frequency difference frequency sub-signal output SMA interface RX+, RX-, two 8 * 1 multipath high-speed electric switch chip U2, U3,16 current monitoring chips, a MCU controller and a usb communication interface, described eight optical transceiver module SFP electrical connection interfaces respectively with two 8 * 1 multipath high-speed electric switch chip U2, U3 connects, one of them 8 * 1 multipath high-speed electric switch chip U2 and MCU controller and high frequency difference frequency sub-signal output SMA interface RX+, RX-connects, another 8 * 1 multipath high-speed electric switch chip U3 and MCU controller and high frequency difference frequency sub-signal input SMA interface TX+, TX-connects, high frequency difference frequency sub-signal output SMA interface RX+, RX-and high frequency difference frequency sub-signal input SMA interface TX+, TX-is connected with Bit Error Rate Analyzer by cable respectively, described MCU controller is connected with usb communication interface J8, and usb communication interface J8 is connected with computer PC main frame.
4. optical transceiver module SFP tester according to claim 3 is characterized in that: described MCU controller is connected with high frequency difference frequency sub-signal input SMA interface TX current detection module with high frequency difference frequency sub-signal input SMA interface RX current detection module respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010102195538A CN101902272A (en) | 2010-07-07 | 2010-07-07 | Optical transceiver module SFP tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010102195538A CN101902272A (en) | 2010-07-07 | 2010-07-07 | Optical transceiver module SFP tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN101902272A true CN101902272A (en) | 2010-12-01 |
Family
ID=43227503
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010102195538A Pending CN101902272A (en) | 2010-07-07 | 2010-07-07 | Optical transceiver module SFP tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101902272A (en) |
Cited By (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102098186A (en) * | 2010-12-17 | 2011-06-15 | 武汉电信器件有限公司 | QSFP (Quad Small Form-factor Pluggable) module detecting system and detecting method |
| CN102299739A (en) * | 2011-07-29 | 2011-12-28 | 深圳市国扬通信股份有限公司 | Test method for SFP (small form-factor pluggable) module and test terminal thereof |
| CN102346222A (en) * | 2011-06-09 | 2012-02-08 | 迈普通信技术股份有限公司 | Device, system and method for testing output electrical signals of optical interfaces |
| CN102953808A (en) * | 2012-11-30 | 2013-03-06 | 中国人民解放军后勤工程学院 | Power takeoff device for oxygen-rich auxiliary combustion device of engine |
| CN103532618A (en) * | 2013-10-25 | 2014-01-22 | 武汉邮电科学研究院 | Device and method for testing error code of optical module |
| CN104280572A (en) * | 2013-07-12 | 2015-01-14 | 上海华虹宏力半导体制造有限公司 | ATE test channel designing method |
| CN104333415A (en) * | 2014-09-26 | 2015-02-04 | 武汉光迅科技股份有限公司 | Multi-channel automatic test method used for testing optical modules and system thereof |
| CN104506350A (en) * | 2014-12-18 | 2015-04-08 | 姜斯平 | Gigabit Ethernet switching device |
| CN105049113A (en) * | 2015-06-17 | 2015-11-11 | 武汉光迅科技股份有限公司 | Active optical module multi-channel automatic test system and method |
| CN107645100A (en) * | 2017-08-01 | 2018-01-30 | 杭州乐荣电线电器有限公司 | A kind of test matching plug-in unit for being used to test dual density QSFP interfaces |
| CN108155936A (en) * | 2018-01-03 | 2018-06-12 | 成都航天通信设备有限责任公司 | A kind of multichannel comprehensive data-link test optical fiber terminal and test method |
| WO2018171389A1 (en) * | 2017-03-23 | 2018-09-27 | 厦门优迅高速芯片有限公司 | Automatic testing device and method for optical transceiver chips |
| CN109000889A (en) * | 2018-06-21 | 2018-12-14 | 青岛海信宽带多媒体技术有限公司 | A kind of detection method and device of optical module deterioration |
| CN110474680A (en) * | 2019-07-31 | 2019-11-19 | 武汉联胜光电技术有限公司 | A kind of active optical cable Air conduct measurement control card and detection method |
| CN111123447A (en) * | 2018-10-30 | 2020-05-08 | 富士通光器件株式会社 | Optical transceiver, optical transceiver module using the same, and method for testing optical transceiver |
| CN111241021A (en) * | 2020-01-07 | 2020-06-05 | 吴丁伢 | Multi-channel split error code instrument |
| CN113507318A (en) * | 2021-05-24 | 2021-10-15 | 武汉联特科技股份有限公司 | Automatic test system for timing parameters of QSFP28 optical module |
| CN113985750A (en) * | 2021-09-30 | 2022-01-28 | 中国兵器工业集团第二一四研究所苏州研发中心 | Interface circuit board level integrated circuit board |
| CN114050875A (en) * | 2021-09-30 | 2022-02-15 | 中国兵器工业集团第二一四研究所苏州研发中心 | MAX3232 type RS-232 signal transceiver verification board |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101110641A (en) * | 2007-08-08 | 2008-01-23 | 中兴通讯股份有限公司 | Loopback optical receiving-transmitting module and its testing device and method |
| US20090028574A1 (en) * | 2007-07-23 | 2009-01-29 | Gerald L. Dybsetter | Self-testing optical transceiver |
| CN201742409U (en) * | 2010-04-26 | 2011-02-09 | 东莞市铭普实业有限公司 | Test circuit board for PON optical transceiver module |
-
2010
- 2010-07-07 CN CN2010102195538A patent/CN101902272A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20090028574A1 (en) * | 2007-07-23 | 2009-01-29 | Gerald L. Dybsetter | Self-testing optical transceiver |
| CN101110641A (en) * | 2007-08-08 | 2008-01-23 | 中兴通讯股份有限公司 | Loopback optical receiving-transmitting module and its testing device and method |
| CN201742409U (en) * | 2010-04-26 | 2011-02-09 | 东莞市铭普实业有限公司 | Test circuit board for PON optical transceiver module |
Cited By (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102098186A (en) * | 2010-12-17 | 2011-06-15 | 武汉电信器件有限公司 | QSFP (Quad Small Form-factor Pluggable) module detecting system and detecting method |
| CN102346222A (en) * | 2011-06-09 | 2012-02-08 | 迈普通信技术股份有限公司 | Device, system and method for testing output electrical signals of optical interfaces |
| CN102299739B (en) * | 2011-07-29 | 2015-08-12 | 深圳市国扬通信股份有限公司 | SFP module test method and test terminal |
| CN102299739A (en) * | 2011-07-29 | 2011-12-28 | 深圳市国扬通信股份有限公司 | Test method for SFP (small form-factor pluggable) module and test terminal thereof |
| CN102953808A (en) * | 2012-11-30 | 2013-03-06 | 中国人民解放军后勤工程学院 | Power takeoff device for oxygen-rich auxiliary combustion device of engine |
| CN104280572A (en) * | 2013-07-12 | 2015-01-14 | 上海华虹宏力半导体制造有限公司 | ATE test channel designing method |
| CN103532618A (en) * | 2013-10-25 | 2014-01-22 | 武汉邮电科学研究院 | Device and method for testing error code of optical module |
| CN103532618B (en) * | 2013-10-25 | 2016-08-17 | 武汉邮电科学研究院 | optical module error code testing device |
| CN104333415A (en) * | 2014-09-26 | 2015-02-04 | 武汉光迅科技股份有限公司 | Multi-channel automatic test method used for testing optical modules and system thereof |
| CN104333415B (en) * | 2014-09-26 | 2017-06-09 | 武汉光迅科技股份有限公司 | A kind of multichannel automatic test approach and system for testing optical module |
| CN104506350A (en) * | 2014-12-18 | 2015-04-08 | 姜斯平 | Gigabit Ethernet switching device |
| CN105049113A (en) * | 2015-06-17 | 2015-11-11 | 武汉光迅科技股份有限公司 | Active optical module multi-channel automatic test system and method |
| CN105049113B (en) * | 2015-06-17 | 2017-09-15 | 武汉光迅科技股份有限公司 | A kind of active light module multichannel automatization test system and method |
| WO2018171389A1 (en) * | 2017-03-23 | 2018-09-27 | 厦门优迅高速芯片有限公司 | Automatic testing device and method for optical transceiver chips |
| CN107645100A (en) * | 2017-08-01 | 2018-01-30 | 杭州乐荣电线电器有限公司 | A kind of test matching plug-in unit for being used to test dual density QSFP interfaces |
| CN107645100B (en) * | 2017-08-01 | 2019-05-03 | 杭州乐荣电线电器有限公司 | A kind of test matching plug-in unit for testing dual density QSFP interface |
| CN108155936A (en) * | 2018-01-03 | 2018-06-12 | 成都航天通信设备有限责任公司 | A kind of multichannel comprehensive data-link test optical fiber terminal and test method |
| CN108155936B (en) * | 2018-01-03 | 2023-05-26 | 成都航天通信设备有限责任公司 | Multi-channel comprehensive data link optical fiber testing method |
| CN109000889A (en) * | 2018-06-21 | 2018-12-14 | 青岛海信宽带多媒体技术有限公司 | A kind of detection method and device of optical module deterioration |
| CN111123447A (en) * | 2018-10-30 | 2020-05-08 | 富士通光器件株式会社 | Optical transceiver, optical transceiver module using the same, and method for testing optical transceiver |
| CN111123447B (en) * | 2018-10-30 | 2021-08-13 | 富士通光器件株式会社 | Optical transceiver, optical transceiver module using the same, and method for testing optical transceiver |
| CN110474680A (en) * | 2019-07-31 | 2019-11-19 | 武汉联胜光电技术有限公司 | A kind of active optical cable Air conduct measurement control card and detection method |
| CN110474680B (en) * | 2019-07-31 | 2024-06-07 | 武汉联胜光电技术有限公司 | Active optical cable channel detection control card and detection method |
| CN111241021A (en) * | 2020-01-07 | 2020-06-05 | 吴丁伢 | Multi-channel split error code instrument |
| CN113507318A (en) * | 2021-05-24 | 2021-10-15 | 武汉联特科技股份有限公司 | Automatic test system for timing parameters of QSFP28 optical module |
| CN113507318B (en) * | 2021-05-24 | 2022-11-15 | 武汉联特科技股份有限公司 | Automatic test system for time sequence parameters of QSFP28 optical module |
| CN113985750A (en) * | 2021-09-30 | 2022-01-28 | 中国兵器工业集团第二一四研究所苏州研发中心 | Interface circuit board level integrated circuit board |
| CN114050875A (en) * | 2021-09-30 | 2022-02-15 | 中国兵器工业集团第二一四研究所苏州研发中心 | MAX3232 type RS-232 signal transceiver verification board |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101902272A (en) | Optical transceiver module SFP tester | |
| CN103731206B (en) | The test device of optical module communication bit error rates and sensitivity | |
| CN103678212B (en) | Based on the general-purpose interface detection device of VPX framework | |
| CN108923850B (en) | Parallel multi-channel optical module testing device for 40Gbs, 100Gbs and 120Gbs | |
| CN104579461A (en) | SFP tester for optical transceiver module | |
| CN104198918A (en) | Testing system for small-lot production of high-speed and -precision ADC (analog to digital converter) chips | |
| CN201397230Y (en) | SFP light receiving-emitting module test evaluation circuit board | |
| CN203014839U (en) | 10 G error detector based on high-speed transceiver chip | |
| CN103390884B (en) | Power detecting control device and electric power supply control system | |
| CN110609183A (en) | IVI technology-based identification module and automatic test system of complete machine | |
| CN103532618A (en) | Device and method for testing error code of optical module | |
| CN209387775U (en) | Optical module monitoring device of aging | |
| CN208508940U (en) | A kind of QSFP28 optical module test device and system | |
| CN108055075B (en) | Optical module temperature cycle test system and method | |
| CN202256540U (en) | Testing device for cable socket | |
| CN212258965U (en) | Automatic test system of radio frequency module | |
| CN201742409U (en) | Test circuit board for PON optical transceiver module | |
| CN203434992U (en) | Networking protocol serial port test device | |
| CN105589026A (en) | Large switch matrix testing device | |
| CN101311740A (en) | Electronic assembly test system | |
| CN209375654U (en) | The test macro of optical module | |
| CN208508939U (en) | A kind of the optical module test device and system of full rate four-way | |
| CN216531324U (en) | Optical module testing arrangement | |
| CN202721677U (en) | Multi-channel test device applied to optical transceiver module | |
| CN110850128A (en) | On-site automatic test system bus for marine instrument |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C53 | Correction of patent of invention or patent application | ||
| CB02 | Change of applicant information |
Address after: 523000 Guangdong Province, Dongguan City Shek Pai Zhenmiao edge Shajing Village Road nine Applicant after: Dongguan Mentech Optical & Magnetic Co., Ltd. Address before: 523000 Guangdong Province, Dongguan City Shek Pai Zhenmiao edge Shajing Village Road nine Applicant before: Dongguan Mentech Electronic Co., Ltd. |
|
| COR | Change of bibliographic data |
Free format text: CORRECT: APPLICANT; FROM: DONGGUAN MENTECH INDUSTRIAL CO., LTD. TO: DONGGUAN MENTECH OPTICAL + MAGNETIC CO., LTD. |
|
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20101201 |