CN104280572A - ATE test channel designing method - Google Patents
ATE test channel designing method Download PDFInfo
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- CN104280572A CN104280572A CN201310292364.7A CN201310292364A CN104280572A CN 104280572 A CN104280572 A CN 104280572A CN 201310292364 A CN201310292364 A CN 201310292364A CN 104280572 A CN104280572 A CN 104280572A
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Abstract
The invention discloses an ATE test channel designing method. The method comprises the steps that in an ATE test head, based on conventional test channels, an independent switch is additionally arranged corresponding to each test channel;, one or more sampling terminals which can be connected with a measuring instrument probe in a hung mode are additionally arranged on an ATE load board; one end of each independent switch is connected with the corresponding test channel through a signal wire, and the other end of each independent switch is connected with the corresponding sampling terminal through a signal wire. According to the ATE test channels designed based on the method, the channels to be tested can be selected through on/off of the switches, and therefore the measuring instrument probe can be in fixed physical connection with the load board; accordingly, the efficiency of connection establishment between an external measuring instrument and test channels and the measuring efficiency are greatly enhanced, the difficulty of engineering commissioning is lowered, and the signal integrity and the physical integrity of the channels in the load board are ensured.
Description
Technical field
The present invention relates to test of semiconductor integrated circuit field, particularly relate to a kind of method for designing of ATE test channel.
Background technology
In use ATE(ATE (automatic test equipment)) carry out the IC product testing procedure development phase, often need to use external equipment, as oscillograph etc., the actual signal waveform of observation fc-specific test FC passage.Existing scheme is the load board(load board at ATE) be above the reserved monitoring end points of each test channel, when certain fc-specific test FC passage waveform observed by needs, more manual by test end points corresponding with special modality for oscilloprobe connect after measure.
As shown in Figure 1, the figure illustrates the common structure of ATE test channel, CHx(x in figure is positive integer, represent test channel sequence number, lower same) any one test channel of acute pyogenic infection of finger tip (channel), outside ATE equipment, test channel is by Load Board(load board) with DUT(device under test) be connected.Inner at ATE, by K switch 1x, test channel is connected with test and comparison circuit and driving circuit, realizes comparison and the driving of test signal.Another path of test channel is by K switch 2x, the PMU(Parameter Measurement Unit of choice for use ATE, parameter measurement unit) DUT is carried out to the accurate measurement of electrical quantity.Above-mentioned K1x, K2x switch and test channel CHx have relevance one to one, and the cut-off/close of switch controls by the needs of test procedure according to test event, to reach fc-specific test FC object.
Above-mentioned be designed to each passage the property surveyed can provide possibility outward, but, in actual applications, oscilloprobe has difficulties with the connection of test end points, often need by after on test end points, welding wire carries out outer drawing, be connected could realize with probe again, so just bring very big inconvenience to practical application, even can affect function and the characteristic of Load board.At other ATE boards, because Load Board is in a relative closure body environment, passage also can be caused to draw line cannot be realized, and the demand of external monitoring passage cannot meet.
Summary of the invention
The technical problem to be solved in the present invention is to provide a kind of ATE test channel method for designing, and it can realize the effective monitoring of external surveying instrument to any test channel signal of ATE easily.
For solving the problems of the technologies described above, ATE test channel method for designing of the present invention, in ATE measuring head, on conventionally test channel base, increases an independent switch respectively corresponding to every bar test channel; In ATE load board, increasing by more than one pop one's head in the sampling terminal mounted with surveying instrument; One end of described independent switch is connected with corresponding test channel by signal wire, and the other end is connected with sampling terminal by signal wire.
Compared with the existing method for designing of ATE test channel, ATE test channel method for designing of the present invention has the following advantages and beneficial effect:
1. surveying instrument probe is fixing with the physical connection of Load Board, namely probe only needs to be connected with the external sampling terminal of fixed position on Load Board, the selection of test channel to be measured is realized by ATE test procedure gauge tap completely, therefore, not need as classic method the frequent changes physical connection with the difference of passage to be measured, so just substantially increase external surveying instrument and any test channel connects, carries out the efficiency measured, reduce engineering debug difficulty, thus also improve relevant project development efficiency.
2. owing to not needing by carrying out soldered wires to realize the connection with external probe to the test channel on Load Board as classic method, therefore, it is possible to the destruction to the channel signal integrality on Load Board and physical integrity avoiding bringing due to external measurement.
Accompanying drawing explanation
Fig. 1 is the common structure schematic diagram of the test channel of ATE tester.
Fig. 2 is the structural representation of the ATE test channel of the embodiment of the present invention.
Fig. 3 is a kind of feasible shape and structure schematic diagram of the sampling terminal in Fig. 2.
Fig. 4 is another feasible shape and structure schematic diagram of the sampling terminal in Fig. 2.
Fig. 5 is the installation site schematic diagram of the sampling terminal in Fig. 2.
Fig. 6 is the method for testing schematic diagram of the ATE test channel of Fig. 2 structure.
Fig. 7 is structure and the method for testing schematic diagram of the ATE test channel of another embodiment of the present invention.
Embodiment
Understand more specifically for having technology contents of the present invention, feature and effect, now in conjunction with illustrated embodiment, details are as follows:
As shown in Figure 2, the ATE test channel of embodiment of the present invention design, conventionally test channel C Hx(x in ATE measuring head (Test Head) is positive integer, represent test channel sequence number, lower with) basis on, corresponding to every bar test channel add respectively one independent of test channel CHx, the K switch 3x of PLC technology; In addition, the Load Board(load board be connected with measuring head) on, being provided with one can pop one's head in the external sampling terminal Strobe CH mounted with external surveying instrument.
Described K switch 3x one end is connected by signal wire with test channel CHx, and the other end is connected by signal wire with the external sampling terminal Strobe CH on Load Board, thus between test channel with external sampling terminal, sets up electric signal be connected.
Described external sampling terminal has public property, and namely multiple test channel can by the control of switch, and timesharing is set up electric signal with external sampling terminal and is connected.The profile of sampling terminal can be designed as the structures such as hook or bar shape, realizes mounting reliably to facilitate the probe of the external surveying instrument with routine.Fig. 3 and Fig. 4 lists two kinds of project organizations of sampling terminal.The installation site of sampling terminal, can according to Load Board real space layout on a test head, sampling terminal is arranged on most convenient operation personnel from the contact of tester external hand and by the position of probe with its mounting.Under normal circumstances, this position is positioned at the edge of Load Board, as shown in Figure 5.
When applying, when needing the signal observing arbitrary test channel, only need external surveying instrument to be articulated on public external sampling terminal Strobe CH, then test procedure is passed through, the K3 of the object test channel association for observation is closed, K3 non-object test channel associated disconnects, and just can set up external surveying instrument and be connected with the unique of object test channel, realize external surveying instrument and access the measurement of object test channel.Such as, as shown in Figure 6, when see the signal of CH2 test channel, K switch 32 corresponding for CH2 test channel closed, the switch that other passages are corresponding disconnects, and just can set up external surveying instrument and be connected with the unique of CH2 test channel.
Above-mentioned ATE test channel structure is only the embodiment of a kind of foundation structure of the present invention, on this basis, suitably can increase the quantity of external sampling terminal, to observe multiple test channel simultaneously.Part or all of test channel can share one or more external sampling terminal.
In the embodiment of another expansion structure of the present invention, as shown in Figure 7, ATE system is provided with two public external sampling terminals on Load Board, is respectively Strobe CH1 and Strobe CH2.External surveying instrument realizes measuring access to while two different test channel respectively by Strobe CH1 and Strobe CH2.Such as, the situation of external surveying instrument to test channel CH3 and CH6 access is shown in Fig. 7, by ATE test procedure, K switch 33 corresponding for CH3 and K switch 36 corresponding to CH6 are closed, the switch that other passages are corresponding disconnects, and just can realize externally measured instrument and access while CH3 and CH6 channel signal.
Claims (6)
1.ATE test channel method for designing, is characterized in that, in ATE measuring head, on conventionally test channel base, increases an independent switch respectively corresponding to every bar test channel; In ATE load board, increasing by more than one pop one's head in the sampling terminal mounted with surveying instrument; One end of described independent switch is connected with corresponding test channel by signal wire, and the other end is connected with sampling terminal by signal wire.
2. method according to claim 1, is characterized in that, the disconnection of described independent switch and closedly independently to be controlled by ATE test procedure.
3. method according to claim 1, is characterized in that, the quantity of described sampling terminal is more than 2.
4. method according to claim 1, is characterized in that, many test channel share 1 sampling terminal, and controlled by independent switch, timesharing and sampling terminal are set up electric signal and be connected.
5. method according to claim 1, is characterized in that, the structure of described sampling terminal comprises hook or bar shape structure.
6. method according to claim 1, is characterized in that, described sampling terminal is arranged on the edge of load board.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310292364.7A CN104280572A (en) | 2013-07-12 | 2013-07-12 | ATE test channel designing method |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310292364.7A CN104280572A (en) | 2013-07-12 | 2013-07-12 | ATE test channel designing method |
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| CN104280572A true CN104280572A (en) | 2015-01-14 |
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| CN201310292364.7A Pending CN104280572A (en) | 2013-07-12 | 2013-07-12 | ATE test channel designing method |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105403792A (en) * | 2015-12-10 | 2016-03-16 | 中国航空工业集团公司西安飞机设计研究所 | Solid state power distribution device reset function testing system and testing method |
| CN107102273A (en) * | 2017-06-30 | 2017-08-29 | 上海华虹宏力半导体制造有限公司 | ATE power supply test passage expansion structures and its test application process |
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| CN202453479U (en) * | 2011-12-29 | 2012-09-26 | 天津市润垦科技发展有限公司 | Battery protection board testing device based on PCI (Peripheral Component Interconnect) bus structure |
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| US20060236180A1 (en) * | 2001-09-28 | 2006-10-19 | Inapac, Inc. | Integrated circuit testing module including command driver |
| US20050246603A1 (en) * | 2004-05-03 | 2005-11-03 | Markus Rottacker | Pin coupler for an integrated circuit tester |
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