CN113507318A - Automatic test system for timing parameters of QSFP28 optical module - Google Patents
Automatic test system for timing parameters of QSFP28 optical module Download PDFInfo
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- CN113507318A CN113507318A CN202110563276.0A CN202110563276A CN113507318A CN 113507318 A CN113507318 A CN 113507318A CN 202110563276 A CN202110563276 A CN 202110563276A CN 113507318 A CN113507318 A CN 113507318A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
- H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
- H04B10/0795—Performance monitoring; Measurement of transmission parameters
- H04B10/07953—Monitoring or measuring OSNR, BER or Q
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Abstract
The system comprises an oscilloscope, a low-speed signal switch chip, a high-speed signal switch and an upper computer, wherein a high-speed electric signal of a measured optical module is electrically connected to a first channel of the oscilloscope through the high-speed signal switch, an optical signal and a clock signal of the measured optical module are respectively connected to a second channel and a third channel of the oscilloscope, a low-speed control signal and an alarm signal of the measured optical module are electrically connected to a fourth channel of the oscilloscope through the low-speed signal switch chip, and the upper computer controls the low-speed signal switch chip and the high-speed signal switch to switch corresponding switch states, so that signals required by a test item enter a corresponding channel of the oscilloscope to perform automatic test. The invention can realize the automatic switching among the test items and output the data, the waveform and the error report of all the test items.
Description
Technical Field
The invention belongs to the field of optical module testing, and particularly relates to an automatic testing system for timing parameters of a QSFP28 optical module.
Background
The QSFP28 optical module is a mainstream 100G optical module in the market at present, provides parallel channels of 4 independent transmitting and receiving channels, increases the transmission rate from 25Gbps to 100Gbps, and has a smaller size than other 100G modules, so that the QSFP28 optical module receives more and more attention. The 100G QSFP28 optical module has evolved into several classes, each with different optical module standards and suitable for different transmission applications.
In the development stage of the QSFP28 optical module product, a designer needs to perform engineering verification on a designed sample to ensure that the design is error-free. The function design verification report plays an intuitive and important role in ensuring that the QSFP28 optical module reduces faults in practical application, and meanwhile, the MSA (multi source agreement) protocol ensures the interoperability of optical device products from different suppliers, for example, the MSA protocol (SFF-8679) has strict regulations on the time sequence of the QSFP28 module.
At present, measurement of relevant parameters of electrical and optical signal time sequences of an optical module specified by MSA (multi-address-acquisition) in the market is mostly manually completed item by manpower, optical module channels are manually switched, test circuits are replaced, a trigger signal jumps, and an oscilloscope is used for capturing instantaneous waveforms. Due to the fact that the QSFP28 series optical module has four channels, the measuring workload is four times of that of a single-channel module, test projects are multiple, time is consumed very much, the test projects are easy to be confused, requirements on test workers are extremely high, human errors are prone to occurring in the test process, and the test efficiency is low.
Disclosure of Invention
In view of the technical defects and technical drawbacks in the prior art, embodiments of the present invention provide an automated testing system for timing parameters of a QSFP28 optical module, which overcomes or at least partially solves the above problems, and the specific scheme is as follows:
the system comprises an oscilloscope, a low-speed signal switch chip, a high-speed signal switch and an upper computer, wherein a high-speed electric signal of a measured optical module is electrically connected to a first channel of the oscilloscope through the high-speed signal switch, an optical signal and a clock signal of the measured optical module are respectively connected to a second channel and a third channel of the oscilloscope, a low-speed control signal and an alarm signal of the measured optical module are electrically connected to a fourth channel of the oscilloscope through the low-speed signal switch chip, the oscilloscope, the low-speed signal switch chip and the high-speed signal switch chip are electrically connected with the upper computer, a control instruction of the upper computer is received, the upper computer controls the low-speed signal switch chip and the high-speed signal switch to switch corresponding switch states, and therefore signals required by test items enter corresponding channels of the oscilloscope to perform automatic testing.
Further, the oscilloscope comprises a configuration file, wherein the configuration file is used for configuring or modifying changeable factors of the oscilloscope, and the changeable factors comprise oscilloscope parameters, optical module measurement indexes, test items and data access.
Further, the system also comprises a retest module, wherein the retest module is used for changing the scale proportion of the oscilloscope when the optical module measurement index in the test item fails, and controlling the oscilloscope to conduct retest so as to eliminate the error of the oscilloscope.
Furthermore, each test item is a sub-VI, and the sub-VIs are not interfered with each other.
Furthermore, the number of the high-speed signal switches is three, and the high-speed signal switches are respectively a first high-speed signal switch, a second high-speed signal switch and a third high-speed signal switch, wherein a TX Input signal in the high-speed electrical signals is electrically connected with the third high-speed signal switch through the first high-speed signal switch and is electrically connected to the first channel of the oscilloscope through the third high-speed signal switch, and an RX Output signal in the high-speed electrical signals is electrically connected with the third high-speed signal switch through the second high-speed signal switch and is electrically connected to the first channel of the oscilloscope through the third high-speed signal switch.
The system further comprises a power supply and a test board, wherein the test board is a test board with a communication board function, the test board is provided with a high-speed signal, a low-speed signal and a power line interface and serves as a working carrier of the optical module, the optical module to be tested is inserted into the test board, and the power supply is electrically connected to the test board and used for supplying power to the optical module.
Further, the system further includes an error code meter, the error code meter is configured to provide a high-speed electrical signal, the measured optical module includes an optical module transmitter and an optical module receiver, the optical module transmitter is configured to convert the high-speed electrical signal into an optical signal, the optical module receiver is configured to convert the optical signal into the high-speed electrical signal, and the error code meter is further configured to receive the high-speed electrical signal and analyze a signal error of transmission and reception.
The system further comprises an optical splitter, wherein the optical splitter is used for splitting any one path of light of the tested light module into two paths of light, one path of light enters a second channel of the oscilloscope for testing, and the other path of light returns to the receiving end of the tested light module.
The system further comprises a plurality of wave splitters and a wave combiner, wherein the wave splitters are used for splitting the light emitted by the measured light module into multiple paths and respectively entering the multiple corresponding wave splitters, and the wave combiner is used for combining the paths split by the wave splitters into one path and returning the path to the receiving end of the measured light module.
The system further comprises an optical switch and a photoelectric converter, wherein the optical switch is used for switching the optical signals of the optical splitters to a second channel of the oscilloscope, and the photoelectric converter is used for converting the optical signals output by the optical switch into electric signals which can be detected by the oscilloscope and then transmitting the electric signals to the second channel of the oscilloscope.
The invention has the following beneficial effects:
according to the invention, an integrated test framework is built through each electric switch, each optical switch, each digital control analog electronic switch and the like, so that automatic switching among test items is realized, upper computer software (such as Labview) controls the BERT, the power supply, the oscilloscope and the module, the scale proportion of the oscilloscope is automatically adjusted by referring to corresponding index specifications specified by MSA (Multi-site automatic calibration) so as to provide multiple measurement opportunities to ensure the test reliability, and data, waveforms and error reports of all test items are output.
Drawings
Fig. 1 is a structural diagram of an automated testing system for timing parameters of a QSFP28 optical module according to an embodiment of the present invention;
in the figure: 1. the device comprises a power supply, 2, a test board, 3, an oscilloscope, 4, a measured optical module, 5, a low-speed signal switch chip, 6, a high-speed signal switch, 7, an error code detector, 8, an optical splitter, 9, a combiner, 10, a wave splitter, 11, an optical switch, 12 and a photoelectric converter.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the present invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
As shown in fig. 1, the system for automatically testing the time sequence parameters of the QSFP28 optical module provided in the embodiment of the present invention includes an oscilloscope 3, a low-speed signal switch chip 5, a high-speed signal switch 6, a power supply 1, a test board 2, an error code detector 7, an optical splitter 8, a wave splitter 10, a wave combiner 9, an optical switch 11, a photoelectric converter 12, and an upper computer, where the oscilloscope 3, the low-speed signal switch chip 5, the high-speed signal switch 6, the optical switch 11, and the measured optical module 4 are all in communication connection with the upper computer, and receive a control instruction of the upper computer.
The high-speed electric signal of the tested light module 4 is electrically connected to a first channel of the oscilloscope 3 through the high-speed signal switch 6, the optical signal and the clock signal of the tested light module 4 are respectively connected to a second channel and a third channel of the oscilloscope 3, the low-speed control and alarm signal of the tested light module 4 is electrically connected to a fourth channel of the oscilloscope 3 through the low-speed signal switch chip 5, the oscilloscope 3, the low-speed signal switch chip 5 and the high-speed signal switch 6 are all in communication connection with an upper computer, the control instruction of the upper computer is received, and the low-speed signal switch chip 5 and the high-speed signal switch 6 are controlled by the upper computer to switch corresponding switch states, so that the signal required by the test item enters the corresponding channel of the oscilloscope 3 to perform automatic test.
The high-speed signal switches 6 are three and are respectively a first high-speed signal switch, a second high-speed signal switch and a third high-speed signal switch, wherein a TX Input signal in the high-speed electrical signals is electrically connected with the third high-speed signal switch through the first high-speed signal switch and is electrically connected to a first channel of the oscilloscope 3 through the third high-speed signal switch, and an RX Output signal in the high-speed electrical signals is electrically connected with the third high-speed signal switch through the second high-speed signal switch and is electrically connected to the first channel of the oscilloscope 3 through the third high-speed signal switch; wherein the first, second and third high speed signal switches are respectively the E-Switch1, E-Switch2 and E-Switch3 shown in FIG. 1.
The test board 2 is a test board 2 with a communication board function, the test board 2 is provided with a high-speed signal, a low-speed signal and a power line interface and serves as a working carrier of the optical module, the measured optical module 4 is inserted into the test board 2, and the power supply 1 is electrically connected to the test board 2 and used for supplying power to the optical module;
the error code meter 7 is configured to provide a high-speed electrical signal, the measured optical module 4 includes an optical module transmitter and an optical module receiver, the optical module transmitter is configured to convert the high-speed electrical signal into an optical signal, the optical module receiver is configured to convert the optical signal into a high-speed electrical signal, and the error code meter 7 is further configured to receive the high-speed electrical signal sent by the optical module and analyze a signal error between the transmitting and the receiving.
The optical splitter 8 is configured to divide any one path of light of the measured light module 4 into two paths of light, where one path of light enters the second channel of the oscilloscope 3 for testing, and the other path of light loops back to the receiving end of the measured light module 4; the optical branching device 8 is provided with a plurality of optical branching devices 8, the branching device 10 is used for branching the light emitted by the measured optical module 4 into a plurality of paths and respectively entering the plurality of corresponding optical branching devices 8, and the wave combiner 9 is used for combining the paths branched by each optical branching device 8 into one path and looping back to the receiving end of the measured optical module 4;
the optical switch 11 is configured to switch optical signals of the plurality of optical splitters 8 to a second channel of the oscilloscope 3, and the photoelectric converter 12 is configured to convert the optical signals output by the optical switch 11 into electrical signals detectable by the oscilloscope 3 and transmit the electrical signals to the second channel of the oscilloscope 3.
In hardware (for example, a QSFP28 module test item specified by a protocol), as shown in a test frame diagram of fig. 1, a high-speed electrical signal of one of a TX channel and an RX channel is switched to enter a first channel of an oscilloscope 3 through a high-speed signal switch 6, an optical module light-emitting signal and a clock Signal (SCL) are respectively accessed to a second channel and a third channel of the oscilloscope 3, and an optical module low-speed control and alarm signal is switched to access to a fourth channel of the oscilloscope 3 through a low-speed signal switch chip 5 (i.e., an analog electrical switch chip, such as a CD 4051); thus, signals required by a specific test item can enter the channel of the oscilloscope 3 by switching the corresponding switch.
In terms of software, a universal software framework is built, and parameter measurement of different optical module types does not depend on the software framework. All changeable factors such as instrument parameters, module measurement indexes, test items, data access and the like can be modified in the configuration file; one test item is a child VI and is not interfered with each other; the invention also provides a multiple measurement opportunity concept, namely if one index fails to be measured, the scale proportion of the instrument is changed, and the like, and the measurement is carried out for N times, so that the errors of the instruments such as the oscilloscope 3 and the like are eliminated, and the reliability of the test result is ensured. Below is
The measurement procedure is briefly described by taking "Tx DisableAssert Time" as an example:
according to the protocol requirement, the Tx Disable assert Time refers to the Time that the corresponding register bit of the Tx Disable is controlled to be set to 1 until the Tx end light drops to below the normal value by 10%, the third channel of the oscilloscope 3 is connected with the SCL signal, the transient change Time of the Tx Disable value can be detected, the second channel of the oscilloscope 3 can detect the corresponding optical signal, the upper computer software controls the setting of the register value of the optical module, and controls the switching of the optical switch 11 and the waveform grabbing of the oscilloscope 3. Taking the Tx DisableAssert Time of the first optical module channel as an example, the specific steps are as follows:
1) the upper computer software controls the optical switch 11 to switch the light of the first optical module channel to enter the photoelectric converter 12, so that the light enters the second channel of the oscilloscope 3;
2) closing the first channel and the fourth channel of the display oscilloscope 3, opening the second channel and the third channel of the display oscilloscope 3, and setting parameters (Scale, Offset and the like) of the oscilloscope 3;
3) setting a trigger mode (normally, selecting the falling edge trigger of the second channel optical signal of the oscilloscope 3);
4) construct trigger condition (TXDiable register bit set to 1);
5) capturing waveform, measuring time sequence, and storing data
Specific test indexes and methods refer to SFF-8679, which is not described herein again.
The parameter measurement takes about 6s, which is much less than the manual measurement time (about 5 min).
In the embodiment, the high-efficiency full-automatic test of the design and verification of the optical module signal time sequence can be realized by controlling and selecting the corresponding oscilloscope 3 channel, and the test framework enables the module time sequence measurement to be simple, convenient and easy to realize, portable and good in verification reliability.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.
Claims (10)
1. An automatic test system for the time sequence parameters of a QSFP28 optical module is characterized in that, the system comprises an oscilloscope, a low-speed signal switch chip, a high-speed signal switch and an upper computer, wherein a high-speed electric signal of a measured optical module is electrically connected to a first channel of the oscilloscope through the high-speed signal switch, an optical signal and a clock signal of the measured optical module are respectively connected into a second channel and a third channel of the oscilloscope, a low-speed control signal and an alarm signal of the measured optical module are electrically connected to a fourth channel of the oscilloscope through the low-speed signal switch chip, the oscilloscope, the low-speed signal switch chip and the high-speed signal switch are electrically connected with the upper computer and receive the control instruction of the upper computer, the upper computer controls the low-speed signal switch chip and the high-speed signal switch to switch the corresponding switch state, therefore, signals required by the test items enter the corresponding channels of the oscilloscope for automatic test.
2. The QSFP28 optical module timing parameter automated test system according to claim 1, wherein the oscilloscope includes a configuration file for configuring or modifying oscilloscope variables including oscilloscope parameters, optical module measurement indicators, test items and data access.
3. The automatic test system of the QSFP28 optical module timing parameters according to claim 1, further comprising a retest module, wherein the retest module is used for changing the scale ratio of the oscilloscope when the optical module measurement index in the test item fails, and controlling the oscilloscope to conduct retest to eliminate the oscilloscope error.
4. The automated QSFP28 optical module timing parameter testing system according to claim 1, wherein each test item is a sub-VI, and the sub-VI do not interfere with each other.
5. The automatic test system for the timing parameters of the QSFP28 optical module according to claim 1, wherein the number of the high-speed signal switches is three, and the high-speed signal switches are respectively a first high-speed signal switch, a second high-speed signal switch and a third high-speed signal switch, a TX Input signal in the high-speed electrical signals is electrically connected with the third high-speed signal switch through the first high-speed signal switch and is electrically connected to the first channel of the oscilloscope through the third high-speed signal switch, and a RX Output signal in the high-speed electrical signals is electrically connected with the third high-speed signal switch through the second high-speed signal switch and is electrically connected to the first channel of the oscilloscope through the third high-speed signal switch.
6. The automatic test system of the timing parameters of the QSFP28 optical module according to claim 1, wherein the system further comprises a power supply and a test board, the test board is a test board with a communication board function, the test board has a high-speed signal interface, a low-speed signal interface, and a power line interface, and is used as a working carrier of the optical module, the optical module to be tested is inserted into the test board, and the power supply is electrically connected to the test board and is used for supplying power to the optical module.
7. The system for automated testing of QSFP28 optical module timing parameters of claim 1, further comprising an error detector configured to provide a high-speed electrical signal, wherein the optical module under test comprises an optical module transmitter configured to convert the high-speed electrical signal to an optical signal and an optical module receiver configured to convert the optical signal to a high-speed electrical signal, and wherein the error detector is further configured to receive the high-speed electrical signal and analyze transmitted and received signal errors.
8. The automatic test system for the timing parameters of the QSFP28 optical module of claim 1, wherein the system further comprises an optical splitter, the optical splitter being configured to split any one of the two lights of the measured optical module, wherein one of the two lights enters the second channel of the oscilloscope for testing, and the other light returns to the receiving end of the measured optical module.
9. The system for automatically testing the timing parameters of the QSFP28 optical module according to claim 8, wherein the system further comprises a plurality of optical splitters and a combiner, the optical splitters are configured to split light emitted by the measured optical module into multiple paths and enter the corresponding optical splitters respectively, and the combiner is configured to combine one of the multiple paths split by each optical splitter into one path and return the path to a receiving end of the measured optical module.
10. The automated QSFP28 optical module timing parameter testing system according to claim 9, further comprising an optical switch and an optical-to-electrical converter, wherein the optical switch is used for switching the optical signals of the plurality of optical splitters to the second channel of the oscilloscope, and the optical-to-electrical converter is used for converting the optical signals output by the optical switch into electrical signals detectable by the oscilloscope and then transmitting the electrical signals to the second channel of the oscilloscope.
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