CN101556757A - Test circuit of display driving circuit - Google Patents
Test circuit of display driving circuit Download PDFInfo
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- CN101556757A CN101556757A CNA200810088645XA CN200810088645A CN101556757A CN 101556757 A CN101556757 A CN 101556757A CN A200810088645X A CNA200810088645X A CN A200810088645XA CN 200810088645 A CN200810088645 A CN 200810088645A CN 101556757 A CN101556757 A CN 101556757A
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Abstract
The invention relates to a test circuit for testing a display driving circuit. The display driving circuit receives test data which comprise a reference voltage generating circuit, a subtraction circuit and a judging unit, wherein the reference voltage generating circuit is used for receiving the test data to output accurate reference voltage; the subtraction circuit is used for receiving the accurate reference voltage and is coupled with one special connection pin of a plurality of output connection pins of the display driving circuit to subtract the accurate reference voltage from the voltage of the special connection tub to obtain error voltage; and the judging unit is used for comparing the error voltage and error reference voltage to judge if the display driving circuit passes a test.
Description
Technical field
The present invention relates to a kind of technology of integrated circuit testing, and particularly relate to a kind of test circuit of circuit of display driving.
Background technology
Flat-panel screens, for example: LCD (LCD) is widely used in recent years.LCD has that consumed power is low, volume is little, in light weight, advantage such as resolution is high, color saturation is high and life of product is long, thereby the LCD screen and the LCD TV (LCD TV) that are used in mobile computer or desktop PC widely wait and the closely bound up electronic product of living.Wherein, the driving circuit of LCD influences the key element of LCD quality and cost especially.
Can regular event in order to ensure LCD, liquid crystal display drive circuit must be done test when grouping.At present, liquid crystal display drive circuit, for example: source driving chip, when the grouping test, can do chip probe (Chip Probe is called for short CP) test.When source driving chip being done the chip probe test, because it is quite accurate that the aanalogvoltage exported of source driving chip needs, so this source driving chip of test needs very accurately costliness the simulation test board test the voltage of the pin of each source driving chip.
Therefore, along with the LCD size is increasing, the output stitch quantity of source driving chip is more and more, under the also more and more heavier situation of the workload of chip probe test, develops and cheaply and fast that test circuit has seemed very urgent to replace expensive tester table.
Summary of the invention
One of purpose of the present invention is to provide a kind of test circuit, in order to test a circuit of display driving.
Another object of the present invention is to provide a kind of test circuit, in order to lower the chip testing cost.
The present invention proposes a kind of test circuit, and in order to test a circuit of display driving, wherein circuit of display driving receives a test data.This test circuit comprises a generating circuit from reference voltage, a subtraction circuit and a judging unit.Generating circuit from reference voltage acceptance test data are exported a correct reference voltage according to this.Subtraction circuit couples a plurality of output connecting pins specific pin wherein of circuit of display driving, receives correct reference voltage, subtracts each other with correct reference voltage in order to the voltage with specific pin to obtain error voltage.Judging unit is made comparisons error voltage and error reference voltage, to judge that whether display driver circuit is by test.
According to the described test circuit of preferred embodiment of the present invention, comprise that also one selects circuit, it is coupled between circuit of display driving and this subtraction circuit, in order to from above-mentioned output connecting pin, a selection output connecting pin wherein is as specific pin, to be electrically connected to a selecting side, wherein subtraction circuit couples specific pin by the selecting side.
The present invention proposes a kind of test circuit, and in order to test a circuit of display driving, wherein circuit of display driving receives a test data.Test circuit comprises generating circuit from reference voltage, a plurality of subtraction circuit and judging unit.Generating circuit from reference voltage is exported correct reference voltage according to this in order to the acceptance test data.A plurality of subtraction circuits couple a plurality of specific pin in a plurality of output connecting pins of circuit of display driving, and receive correct reference voltage, obtain a plurality of error voltages in order to respectively the voltage of above-mentioned specific pin is subtracted each other with correct reference voltage.Judging unit is in order to make comparisons above-mentioned error voltage and error reference voltage, to judge that whether display driver circuit is by test.
According to the test circuit of the described circuit of display driving of preferred embodiment of the present invention, also comprise a plurality of selection circuit.Above-mentioned selection circuit is coupled between circuit of display driving and the subtraction circuit, in order to from above-mentioned output connecting pin, selection a part of output connecting pin wherein is as above-mentioned specific pin, to be electrically connected to a plurality of selecting sides respectively, wherein above-mentioned subtraction circuit couples above-mentioned specific pin by above-mentioned selecting side.
The present invention produces a correct reference voltage because of utilizing generating circuit from reference voltage according to test data, and makes the output connecting pin of display driver circuit export the voltage corresponding with test data to display driver circuit this test data; Next, subtraction circuit subtracts each other back generation error voltage with the voltage and the above-mentioned correct reference voltage of the output connecting pin of display driver circuit, afterwards error voltage and default voltage is made comparisons.Therefore, the test circuit of implementing according to spirit of the present invention more than the tester table of known costliness to come cheaply many.So the present invention can reach known expensive tester table effect same with few cost.
For above and other objects of the present invention, feature and advantage can be become apparent, preferred embodiment cited below particularly, and be described with reference to the accompanying drawings as follows.
Description of drawings
Fig. 1 shows the circuit diagram of the circuit of display driving test circuit of the embodiment of the invention.
Fig. 2 shows the circuit diagram of the circuit of display driving test circuit of another embodiment of the present invention.
Fig. 3 shows the circuit diagram of the circuit of display driving test circuit of further embodiment of this invention.
Fig. 4 shows the circuit diagram of the circuit of display driving test circuit of yet another embodiment of the invention.
The reference numeral explanation
101,201,301,401: generating circuit from reference voltage
102,202,302,402: subtraction circuit
103,203: select circuit
104,204,305,405: judging unit
105: circuit of display driving
24: comparer
25: logic gate
303,403: the first selection circuit
304,404: the second selection circuit
Embodiment
Fig. 1 shows the circuit diagram of the circuit of display driving test circuit of the embodiment of the invention.Please refer to Fig. 1, this test circuit comprises generating circuit from reference voltage 101, subtraction circuit 102, selects circuit 103 and judging unit 104.In addition, spirit of the present invention has for convenience of description shown a circuit of display driving 105 in this embodiment earlier and has been coupled to test circuit by a socket (not shown).In order to make those skilled in the art can implement the present invention, and understand spirit of the present invention, this earlier hypothesis circuit of display driving 105 are source electrode drivers of LCD.And be assumed to be the running that the basis begins to illustrate above-mentioned test circuit with above-mentioned.
At first, during beginning test source driver 105, test data D can be transferred to source electrode driver 105 and generating circuit from reference voltage 101.Source electrode driver 105 can reflect the voltage of corresponding this test data D according to this test data D in its each output pin position.Generating circuit from reference voltage 101 also can produce a correct reference voltage Vref corresponding and correct with test data 1 and give subtraction circuit 102 according to above-mentioned test data D.In addition, generating circuit from reference voltage 101 also can produce an error reference voltage Vref 2 and give judging unit 104.The effect of this error reference voltage Vref 2 will illustrate below.
Next, the signal of selecting circuit 103 meetings to be passed out according to reference voltage generator 101, from a plurality of output connecting pins of selecting source electrode driver 105, select wherein an output connecting pin as a specific pin, and selected specific pin is electrically connected to the selecting side of selecting circuit 103, so that this specific pin is electrically connected to subtraction circuit 102.Subtraction circuit 102 is in order to deduct above-mentioned correct reference voltage Vref 1 with the voltage on this specific pin.It is the voltage corresponding and the most correct with test data that correct reference voltage Vref 1 can be considered, and is referred to as error voltage Verr so two voltages subtract each other resulting voltage.
Next, subtraction circuit 102 can be given judging unit 104 with this error voltage Verr.Judging unit 104 is in order to make comparisons this error voltage Verr and above-mentioned error reference voltage Vref 2.It should be noted that, because the voltage difference between the output connecting pin of circuit of display driving 105 is very little, so judging unit 104 is in the process of more above-mentioned two voltages, can amplify the difference value between error voltage Verr and the error reference voltage Vref 2, to judge that according to the difference value after amplifying whether display driver circuit 105 is by test.At this, the max value of error that error reference voltage Vref 2 visual source electrode drivers for this reason 105 can be allowed to.If error voltage Verr is bigger than above-mentioned error reference voltage Vref 2, represent that then voltage and correct reference voltage Vref 2 differences that above-mentioned specific pin is exported are too big, so judging unit 104 will output signal inform that this source electrode driver 105 can't be by test.
Though the foregoing description provides a kind of test circuit, it will be appreciated by those skilled in the art that error reference voltage Vref 2 might not be produced by generating circuit from reference voltage 101.In another embodiment, also can be a voltage of importing from the outside.Mainly be that this error reference voltage Vref 2 is to change according to the specification of determinand 105.In addition, selecting circuit 103 is not to be necessary member.In another embodiment, also can cancel the existence of selecting circuit, as long as all connect subtraction circuit 102 and cooperate judging unit 104 and generating circuit from reference voltage 101 also can realize same effect at the pin of each determinand 105.So the present invention should only not be limited to the foregoing description.
Fig. 2 is the circuit diagram of the circuit of display driving test circuit of another embodiment of the present invention.Please refer to Fig. 2, this test circuit comprises generating circuit from reference voltage 201, a plurality of subtraction circuit 202, a plurality of selection circuit 203 and judging unit 204.The difference that this embodiment and Fig. 1 embodiment are bigger is: the circuit of Fig. 1 has only a subtraction circuit 102 and to select circuit 103, present embodiment has a plurality of selection circuit 203 and a plurality of subtraction circuit 202, these select circuit to be responsible for many group of pins of circuit of display driving 105 respectively, and the corresponding above-mentioned selection circuit 203 of subtraction circuit 202 difference.This embodiment is owing to be that output connecting pin with circuit of display driving 105 is divided into many groups, utilizes respectively to select circuit 203 and a plurality of subtraction circuit 202 to do test, so present embodiment can be finished test faster than Fig. 1 embodiment again.
In addition, the decision circuitry 204 of this embodiment comprises a plurality of comparers 24 and a logic gate 25.Among this embodiment, the number of comparer 24 is to cooperate the number of subtraction circuit 202 to dispose.The negative terminal of each comparer 24 receives error voltage Verr, and the anode of comparer receives error reference voltage Vref 2.If the positive saturation voltage of arbitrary comparer 24 outputs, expression error reference voltage Vref 2 be greater than error voltage Verr, the voltage conforms specification exported of source electrode driver 105 just; If the negative saturation voltage of comparer output, expression error reference voltage Vref 2 be less than error voltage Verr, just the voltage exported of source electrode driver 105 falls short of specifications.Because display driver circuit 105 represents that just display driver circuit is faulty materials as long as the voltage that any one pin is exported falls short of specifications,, logic gate 25 implements so can utilizing with door (AND GATE) inclusive NAND door (NAND GATE).All the other principle of operation are all identical with Fig. 1 embodiment, so do not repeat them here.
Fig. 3 is the circuit diagram of the circuit of display driving test circuit of further embodiment of this invention.Please refer to Fig. 3, this test circuit comprises generating circuit from reference voltage 301, subtraction circuit 302, the first selection circuit 303, second selection circuit 304 and the judging unit 305.The difference that this embodiment and Fig. 1 embodiment are bigger is: the circuit of Fig. 1 has only one to select circuit 103, and received two input signals of subtraction circuit 102 are respectively from selecting circuit 103 and generating circuit from reference voltage 101.And in Fig. 2 embodiment, test circuit comprises that first selects circuit 303 and second to select circuit 304, and subtraction circuit 302 two received input signals select circuit 303 and second to select circuit 304 from first respectively.
At this, first selects circuit 303 and second to select circuit 304 to have the selecting side that is electrically connected to subtraction circuit 302 respectively.By this, first signal of selecting circuit 303 meetings to be transmitted according to generating circuit from reference voltage 301, from the part output connecting pin of selecting source electrode driver 105, a selection output connecting pin wherein is as the first specific pin.And select the selecting side of circuit 303 can be electrically connected to its first selected specific pin, be electrically connected to this first specific pin to cause subtraction circuit 302.Similarly, second signal of selecting circuit 304 also can be passed out according to generating circuit from reference voltage 301 from the part output connecting pin of selecting source electrode driver 105, selects wherein an output connecting pin as the second specific pin.And select the selecting side of circuit 304 can be electrically connected to its second selected specific pin, be electrically connected to this second specific pin to cause subtraction circuit 302.
Generally speaking, judge whether a source electrode driver 105 is up to specification, whether its output voltage accurately is not most important factor of judgment, but under the same pixel data, whether difference is very little for the output voltage of each pin.So present embodiment is after selecting circuit 303 and second to select circuit 304 to obtain from the voltage on the first specific pin and the second specific pin by first, subtraction circuit 302 is in order to subtracting each other the voltage on the first specific pin and the second specific pin, and will subtract each other resulting voltage and be referred to as error voltage Verr.
Next, with Fig. 1 embodiment similarly, generating circuit from reference voltage 301 also can produce an error reference voltage Vref 2 and give judging unit 305.The max value of error that these error reference voltage Vref 2 visual source electrode drivers for this reason 105 can be allowed to.At this, judging unit 305 is in order to compare this error reference voltage Vref 2 with above-mentioned error voltage Verr.When above-mentioned error voltage Verr ratio error reference voltage Vref 2 big, represent that then the voltage difference between the above-mentioned first specific pin and the second specific pin is excessive, so judging unit 305 will output signal inform that this source electrode driver 105 can't be by test.All the other principle of operation are all similar to Fig. 1 embodiment, so do not repeat them here.
Fig. 4 is the circuit diagram of the circuit of display driving test circuit of yet another embodiment of the invention.Please refer to Fig. 4, this test circuit comprises generating circuit from reference voltage 401, a plurality of subtraction circuit 402, the first selection circuit 403, a plurality of second selection circuit 404 and judging unit 405.The difference that this embodiment and Fig. 3 embodiment are bigger is: the circuit of Fig. 3 has only one second to select a circuit 304 and a subtraction circuit 302, present embodiment has a plurality of second to select circuit 404 and a plurality of subtraction circuit 402, these second selection circuit are responsible for many group of pins of circuit of display driving 105 respectively, and the corresponding above-mentioned selection circuit 404 of subtraction circuit 402 difference.This embodiment has continued the spirit of Fig. 2 embodiment, just utilizes the mode that the output connecting pin of circuit of display driving 105 is divided into many groups, the working time of reducing test circuit.
In addition, the described decision circuitry of the decision circuitry 406 of this embodiment and Fig. 2 embodiment 204 is similar.In this embodiment, decision circuitry 406 comprises a plurality of comparers 46 and a logic gate 47.Wherein, each comparer 46 all can compare its received error voltage Verr and error reference voltage Vref 2, and the difference value that will compare gained produces a logic determines signal after amplifying according to this.Afterwards, logic gate 47 will receive the logic determines signal from each comparer 46, and to work as the logic determines signal that is received not be when all being a particular logic state, judge that then display driver circuit 105 is faulty materials.
For example, if when error voltage Verr greater than error reference voltage Vref 2, when just the voltage exported of source electrode driver 105 fell short of specifications, comparer 46 can the negative saturation voltage of output, otherwise, 46 positive saturation voltages of output of comparer.Because display driver circuit 105 is as long as the voltage that any one pin is exported falls short of specifications, just represent that display driver circuit 105 is faulty materials, as long as so the negative saturation voltage of a comparer 46 outputs is arranged, logic gate 47 will judge that display driver circuit 105 is faulty materials.All the other principle of operation are all identical with above-mentioned each embodiment, so do not repeat them here.
In sum, the present invention produces a correct reference voltage because of utilizing generating circuit from reference voltage according to test data, and makes the output connecting pin of display driver circuit export the voltage corresponding with test data to display driver circuit this test data; Next, subtraction circuit subtracts each other back generation error voltage with the voltage and the above-mentioned correct reference voltage of the output connecting pin of display driver circuit, afterwards error voltage and default voltage is made comparisons.Therefore, the test circuit of implementing according to spirit of the present invention more than the simulation test board of known costliness to come cheaply many.So the present invention can reach known expensive tester table effect same with few cost.
Though the present invention discloses as above with preferred embodiment; but it is not in order to qualification the present invention, those skilled in the art, under the premise without departing from the spirit and scope of the present invention; when can doing some changes and modification, so protection scope of the present invention should be as the criterion with claim of the present invention.
Claims (18)
1. test circuit, in order to test a circuit of display driving, this circuit of display driving receives a test data, and this test circuit comprises:
One generating circuit from reference voltage in order to receive this test data, is exported a correct reference voltage according to this;
One subtraction circuit receives this correct reference voltage, couples a plurality of output connecting pins specific pin wherein of this circuit of display driving, subtracts each other with this correct reference voltage in order to voltage that will this specific pin to obtain an error voltage; And
One judging unit is in order to make comparisons this error voltage and an error reference voltage, to judge that whether this display driver circuit is by test.
2. the test circuit of circuit of display driving as claimed in claim 1 also comprises:
One selects circuit, be coupled between this circuit of display driving and this subtraction circuit,, select this specific pin of output connecting pin conduct wherein in order to from described output connecting pin, to be electrically connected to a selecting side, wherein this subtraction circuit couples this specific pin by this selecting side.
3. the test circuit of circuit of display driving as claimed in claim 2, wherein this generating circuit from reference voltage is also in order to controlling this selection circuit, couples this selecting side with one of them that determines described output connecting pin.
4. the test circuit of circuit of display driving as claimed in claim 1, wherein this generating circuit from reference voltage is also in order to produce this error reference voltage.
5. test circuit, in order to test a circuit of display driving, this circuit of display driving receives a test data, and this test circuit comprises:
One generating circuit from reference voltage in order to receive this test data, is exported a correct reference voltage according to this;
A plurality of subtraction circuits receive this correct reference voltage, couple a plurality of specific pin in a plurality of output connecting pins of this circuit of display driving, obtain a plurality of error voltages in order to respectively the voltage of described specific pin is subtracted each other with this correct reference voltage; And
One judging unit is in order to make comparisons a described error voltage and an error reference voltage, to judge that whether this display driver circuit is by test.
6. the test circuit of circuit of display driving as claimed in claim 5 also comprises:
A plurality of selection circuit, be coupled between this circuit of display driving and the described subtraction circuit, in order to from described output connecting pin, selection a part of output connecting pin wherein is as described specific pin, to be electrically connected to a plurality of selecting sides respectively, wherein said subtraction circuit couples described specific pin by described selecting side.
7. the test circuit of circuit of display driving as claimed in claim 6, wherein this generating circuit from reference voltage is also in order to controlling each described selection circuit, couples this selecting side with one of them that determines described output connecting pin.
8. the test circuit of circuit of display driving as claimed in claim 5, wherein this generating circuit from reference voltage is also in order to produce this error reference voltage.
9. the test circuit of circuit of display driving as claimed in claim 5, wherein this judging unit comprises:
A plurality of comparers respectively in order to described error voltage and this error reference voltage are made comparisons, and are exported a plurality of logic determines signals respectively according to this; And
One logic gate receives a plurality of logic determines signals, is not all to be a particular logic state when described logic determines signal, judges that then this display driver circuit is faulty materials.
10. test circuit, in order to test a circuit of display driving, this circuit of display driving receives a test data, and this test circuit comprises:
One subtraction circuit couples a plurality of output connecting pins one first specific pin and one second specific pin wherein of this circuit of display driving, subtracts each other in order to the voltage with this first specific pin and this second specific pin to obtain an error voltage;
One generating circuit from reference voltage in order to receiving this test data, and is exported an error reference voltage according to this; And
One judging unit is in order to make comparisons this error voltage and this error reference voltage, to judge that whether this display driver circuit is by test.
11. the test circuit of circuit of display driving as claimed in claim 10, wherein this subtraction circuit also amplifies this error voltage.
12. the test circuit of circuit of display driving as claimed in claim 10 also comprises:
One first selects circuit, has one first selecting side that couples this subtraction circuit, and in order to from the described output connecting pin of part, a selection output connecting pin wherein is as this first specific pin, and this first selecting side is electrically connected to this first specific pin; And
One second selects circuit, has one second selecting side that couples this subtraction circuit, and in order to from the described output connecting pin of part, a selection output connecting pin wherein is as this second specific pin, and this second selecting side is electrically connected to this first specific pin.
13. the test circuit of circuit of display driving as claimed in claim 12, wherein this generating circuit from reference voltage also first is selected circuit and this second selection circuit in order to control this, with determine described output connecting pin wherein two couple this first selecting side and this second selecting side respectively.
14. a test circuit, in order to test a circuit of display driving, this circuit of display driving receives a test data, and this test circuit comprises:
A plurality of subtraction circuits, couple the one first specific pin and a plurality of second specific pin in a plurality of output connecting pins of this circuit of display driving, obtain a plurality of error voltages in order to respectively the voltage of the voltage of the described second specific pin and this first specific pin is subtracted each other;
One generating circuit from reference voltage in order to receiving this test data, and is exported an error reference voltage according to this; And
One judging unit is in order to make comparisons described error voltage and this error reference voltage, to judge that whether this display driver circuit is by test.
15. the test circuit of circuit of display driving as claimed in claim 14, wherein said subtraction circuit also amplify this corresponding error voltage respectively.
16. the test circuit of circuit of display driving as claimed in claim 14 also comprises:
One first selects circuit, has one first selecting side, and in order to from the described output connecting pin of part, a selection output connecting pin wherein is as this first specific pin, to be electrically connected to this first selecting side; And
A plurality of second selects circuit, has a plurality of second selecting sides, in order to from the described output connecting pin of part, selects wherein a part of output connecting pin as the described second specific pin, being electrically connected to described second selecting side respectively,
Wherein said subtraction circuit couples this first specific pin by this first selecting side, and couples the described second specific pin by described second selecting side.
17. the test circuit of circuit of display driving as claimed in claim 16, wherein this generating circuit from reference voltage is also selected circuit in order to control this first selection circuit and described second, to determine the coupling mode of described output connecting pin and this first selecting side, described second selecting side.
18. the test circuit of circuit of display driving as claimed in claim 14, wherein this judging unit comprises:
A plurality of comparers respectively in order to described error voltage and this error reference voltage are made comparisons, and are exported a plurality of logic determines signals according to this; And
One logic gate receives a plurality of logic determines signals, when described logic determines signal is not when all being a particular logic state, judges that then this display driver circuit is faulty materials.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA200810088645XA CN101556757A (en) | 2008-04-10 | 2008-04-10 | Test circuit of display driving circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA200810088645XA CN101556757A (en) | 2008-04-10 | 2008-04-10 | Test circuit of display driving circuit |
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| CN101556757A true CN101556757A (en) | 2009-10-14 |
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| CNA200810088645XA Pending CN101556757A (en) | 2008-04-10 | 2008-04-10 | Test circuit of display driving circuit |
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102339581A (en) * | 2011-09-28 | 2012-02-01 | 深圳市华星光电技术有限公司 | Virtual load board and testing system and testing method for liquid crystal display control panel |
| CN102540058A (en) * | 2011-12-31 | 2012-07-04 | 杭州士兰微电子股份有限公司 | Device for testing plasma scanning driver ic |
| CN103389455A (en) * | 2013-08-09 | 2013-11-13 | 友达光电（苏州）有限公司 | Detection system and detection method of driver chip |
| CN103576008A (en) * | 2012-07-19 | 2014-02-12 | 鸿富锦精密工业（深圳）有限公司 | Electronic device capable of indicating hardware fault through sound, and method |
| CN105741783A (en) * | 2014-12-24 | 2016-07-06 | 乐金显示有限公司 | Display device and driving method |
| CN106841993A (en) * | 2017-02-16 | 2017-06-13 | 长沙云涯电子科技有限责任公司 | A kind of LCD detection means and method |
| CN109581196A (en) * | 2018-12-26 | 2019-04-05 | 北京无线电计量测试研究所 | A kind of chip and detection method comprising process corner detection circuit |
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2008
- 2008-04-10 CN CNA200810088645XA patent/CN101556757A/en active Pending
Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN102339581B (en) * | 2011-09-28 | 2014-04-09 | 深圳市华星光电技术有限公司 | Virtual load board and testing system and testing method for liquid crystal display control panel |
| CN102339581A (en) * | 2011-09-28 | 2012-02-01 | 深圳市华星光电技术有限公司 | Virtual load board and testing system and testing method for liquid crystal display control panel |
| CN102540058A (en) * | 2011-12-31 | 2012-07-04 | 杭州士兰微电子股份有限公司 | Device for testing plasma scanning driver ic |
| CN102540058B (en) * | 2011-12-31 | 2014-01-08 | 杭州士兰微电子股份有限公司 | Device for testing plasma scanning driver ic |
| CN103576008A (en) * | 2012-07-19 | 2014-02-12 | 鸿富锦精密工业（深圳）有限公司 | Electronic device capable of indicating hardware fault through sound, and method |
| CN103389455B (en) * | 2013-08-09 | 2015-11-11 | 友达光电（苏州）有限公司 | The detection system of driving chip and detection method |
| CN103389455A (en) * | 2013-08-09 | 2013-11-13 | 友达光电（苏州）有限公司 | Detection system and detection method of driver chip |
| CN105741783A (en) * | 2014-12-24 | 2016-07-06 | 乐金显示有限公司 | Display device and driving method |
| US9858862B2 (en) | 2014-12-24 | 2018-01-02 | Lg Display Co., Ltd. | Display device and method for driving the display device |
| CN105741783B (en) * | 2014-12-24 | 2018-12-25 | 乐金显示有限公司 | The driving method of display device and display device |
| CN106841993A (en) * | 2017-02-16 | 2017-06-13 | 长沙云涯电子科技有限责任公司 | A kind of LCD detection means and method |
| CN106841993B (en) * | 2017-02-16 | 2019-09-06 | 泰州镭昇光电科技有限公司 | A kind of LCD detection device and method |
| CN109581196A (en) * | 2018-12-26 | 2019-04-05 | 北京无线电计量测试研究所 | A kind of chip and detection method comprising process corner detection circuit |
| WO2020134673A1 (en) * | 2018-12-26 | 2020-07-02 | 北京无线电计量测试研究所 | Chip comprising process corner detection circuit and detection method |
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Application publication date: 20091014 |