CN103777386A - LCM (Liquid Crystal Display Module) testing machine - Google Patents
LCM (Liquid Crystal Display Module) testing machine Download PDFInfo
- Publication number
- CN103777386A CN103777386A CN201410054857.1A CN201410054857A CN103777386A CN 103777386 A CN103777386 A CN 103777386A CN 201410054857 A CN201410054857 A CN 201410054857A CN 103777386 A CN103777386 A CN 103777386A
- Authority
- CN
- China
- Prior art keywords
- module
- chip microcomputer
- lcm
- negative pressure
- data buffering
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 40
- 239000004973 liquid crystal related substance Substances 0.000 title abstract description 16
- 230000003139 buffering effect Effects 0.000 claims abstract description 25
- 238000012545 processing Methods 0.000 claims abstract description 11
- 230000007704 transition Effects 0.000 claims description 3
- 238000006243 chemical reaction Methods 0.000 abstract 2
- 210000001503 joint Anatomy 0.000 abstract 2
- 238000013500 data storage Methods 0.000 abstract 1
- 238000000370 laser capture micro-dissection Methods 0.000 abstract 1
- 238000001514 detection method Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- 238000003556 assay Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000006386 memory function Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Images
Abstract
An LCM (Liquid Crystal Display Module) testing machine comprises a central processing module, a negative pressure control module, a butt joint module and a calling module, wherein the central processing module comprises a single chip microcomputer, a storage and a data buffering module, which are connected with each other in pairs; the negative pressure control module is used for converting the input positive pressure into negative pressure, and connected with a to-be-tested LCM; the butt joint module comprises a 20 pin output module and a 26 pin output module which are connected in parallel; the 20 pin output module or the 26 pin output module is respectively and correspondingly connected with pins of the to-be-tested LCM; the calling module comprises a model calling unit and an A/D conversion circuit which are connected with the single chip microcomputer, and a control display screen connected with the single chip microcomputer through the A/D conversion circuit. Through the arrangement of the data buffering module connected with the single chip microcomputer and the storage for data storage, the testing of various models of LCMs is realized, and programs of various product models are directly called after being written, so that the operation of workers is facilitated, and the testing efficiency is improved greatly.
Description
Technical field
The present invention relates to a kind of testing tool, relate in particular to a kind of LCM test machine.
Background technology
Liquid crystal calling module is to be " Liquid Crystal Display Module ", be called for short " LCM ", it is a kind of assembly that liquid crystal display device, web member, integrated circuit, PCB wiring board, backlight, structural member are assembled together, liquid crystal display device only has the electric field signal of driving circuit is applied on ITO conductive electrode, could realize the demonstration of display device, therefore, LCM couples together the electric field signal of the conductive electrode of liquid crystal display part and driving circuit, thereby realizes the content of the demonstration needing.
Along with the fast development of information industry, supporting liquid crystal calling module demand is anxious to be increased, and particularly the ratio of single color LCD module, CSTN Liquid Crystal Module, TFT Liquid Crystal Module also increases gradually.General all relative complex of module detection method, content measurement is single, conventionally use Micro Controller Unit (MCU) driving calling module, for the parameter such as function electric current and backlight pressure drop of testing product, also need to increase electric current, the instrument such as voltage table or multimeter, its principle of work is: Micro Controller Unit (MCU) driving LCM shows, multimeter is serially connected in and on testing jig, monitors LCM working current, operator need see display effect on one side, whether observe electric current on one side exceeds standard, if only need to detect whole module dissipation electric current also more relatively easily, but if check main, when secondary screen and static current of lcd backlight, just need to divide to detect respectively this three electric currents with multimeter three times, and need to see display effect while detecting every while see whether curent change exceeds standard, there is following problem in this detection mode: 1) assay is unreliable, many by subjective judgement, easily undetected, erroneous judgement, 2) inefficiency: different product must be changed different single-chip microcomputer testing jigs, writes new driver.And, the corresponding test procedure of a LCM product and a test machine, test different products at every turn and all need on test machine, pour into corresponding test procedure, can test liquid crystal module, when test products, parameter cannot directly regulate, and also cannot intuitively read parameter.
Summary of the invention
The object of this invention is to provide a kind of LCM test machine, improve existing testing efficiency, solved an existing problem that LCM test machine cannot be tested multiple LCM product.
The technical solution adopted for the present invention to solve the technical problems is: a kind of LCM test machine, comprises central processing module, the negative pressure control module that is electrically connected with central processing module, to connection module and calling module.
Central processing module comprises between two connected single-chip microcomputer, storer and data buffering module mutually; Described single-chip microcomputer, for transferring the program of storer, is controlled the work of data buffering module, and is received data buffering module, storer feedack; Described data buffering module is for the driver of read memory, and with connection module is in series; The signal output part of described storer is connected with the signal input part of data buffering module.Negative pressure control module is used for malleation input to be converted to negative pressure, and is connected with LCM to be measured, and the output terminal of this negative pressure control module connects the input end of single-chip microcomputer, and the input end of negative pressure control module connects the output terminal of single-chip microcomputer.Connection module is comprised to two 20pin output modules that are connected in parallel and 26pin output module, this 20pin output module or 26pin output module respectively with the corresponding connection of pin of LCM to be measured.Calling module comprises the model call unit and the A/D change-over circuit that are connected with single-chip microcomputer, and the control display screen being connected with single-chip microcomputer by described A/D change-over circuit; The input end of described single-chip microcomputer is connected with the output terminal of A/D change-over circuit.
For fear of plug single-chip microcomputer IC, cause single-chip microcomputer IC to damage, LCM test machine also comprises the compiled online module being connected with single-chip microcomputer.
In order to facilitate regulation voltage, LCM test machine also comprises the manual voltage regulation unit being connected with single-chip microcomputer.
Further, data buffering module comprises three SN74HC245 chips, by digital signal by inner V
cClogic level transition is V
ddmodule logic working voltage level, thus drive LCM to be measured.
Beneficial effect of the present invention: because single-chip microcomputer itself has abundant expanding function, the data buffering module being connected with single-chip microcomputer by setting and the storer of storage data, realize the test to Multiple Type LCM, the program of multiple product types writes directly to be called afterwards, facilitate employee's operation, and greatly improve detection efficiency.Cost aspect, the single-chip microcomputer IC amount of money used of existing common test machine consumption in 1 year is far longer than the manufacturing cost of LCM test machine of the present invention.Operating aspect, the present invention has storer and data buffering module, memory space is improved greatly, although existing LCM test machine also has memory function, but also need setup parameter after calling model, it is very inconvenient to operate, and the present invention can detect single color LCD module, CSTN Liquid Crystal Module, TFT Liquid Crystal Module, has contained the product test of all modules.
Accompanying drawing explanation
Below with reference to drawings and Examples, the present invention is described in detail.
Fig. 1 is system chart of the present invention.
Fig. 2 is structure principle chart of the present invention.
Fig. 3 is data buffering module shown in Fig. 2 and the circuit theory diagrams to connection module.
Fig. 4 is the circuit theory diagrams of single-chip microcomputer shown in Fig. 2 and A/D change-over circuit.
Fig. 5 is the FB(flow block) of control software of the present invention.
Embodiment
Embodiment, as shown in Fig. 1 to 2, LCM test machine in this preferred embodiment, comprises central processing module 1, the negative pressure control module 2 that is electrically connected with central processing module, to connection module 3 and calling module 4.
Central processing module 1 comprises between two connected single-chip microcomputer 11, storer 12 and data buffering module 13 mutually; Described single-chip microcomputer 11, for transferring the program of storer, is controlled the work of data buffering module, and is received data buffering module, storer feedack; Described data buffering module 13 is for the driver of read memory 12, and with connection module is in series; The signal output part of described storer 12 is connected with the signal input part of data buffering module 13.
Negative pressure control module 2 is for malleation input is converted to negative pressure, and is connected with LCM to be measured, and the output terminal of this negative pressure control module connects the input end of single-chip microcomputer, the output terminal of the input end connection single-chip microcomputer of negative pressure control module.
Connection module 3 is comprised to two 20pin output modules 31 that are connected in parallel and 26pin output module 32, this 20pin output module 31 or 26pin output module 32 respectively with the corresponding connection of pin of LCM to be measured.
For fear of plug single-chip microcomputer IC, cause single-chip microcomputer IC to damage, LCM test machine also comprises the compiled online module 5 being connected with single-chip microcomputer.
In order to facilitate regulation voltage, LCM test machine also comprises the manual voltage regulation unit 6 being connected with single-chip microcomputer.
As shown in Figure 3, data buffering module comprises three SN74HC245 chips, by the driver of read memory, and by digital signal by inner V
cClogic level transition is V
ddmodule logic working voltage level, thus drive LCM to be measured.
As shown in Figure 4, single-chip microcomputer adopts ATMEGA64, is responsible for controlling the running of coordinating whole test machine.The model of storer is AT24C1024, and A/D change-over circuit adopts U8(SN74HC164).The present invention is take single-chip microcomputer as core, control program leaves in storer, A/D change-over circuit is circumscribed with 132*64 matrix liquid-crystal display screen, can read intuitively product type for transferring, and provide the required voltage of LCM to be measured by negative pressure control module, data buffering module and connection module is reached to driving effect.
As shown in Figure 5, employee can proceed as follows: first opening power, select the product type of LCM to be measured, by confirming that part confirms, by LCM test board access 20pin output module to be measured or 26pin output module place, test board is fixed on testing jig and starts to test.When detection, directly call by selection product type, really accomplish a tractor serves several purposes, and store the detection mode of various modes, as pen section (short in size) module, graphic dot matrix module, character pattern module, graphic dot matrix-COB, can detect to single color LCD module, CSTN Liquid Crystal Module, TFT Liquid Crystal Module the above product test of substantially containing all modules.
Principle of work of the present invention is as follows: the product type of selecting LCM to be measured by model call unit, single-chip microcomputer receives these data and obtains corresponding digital quantity through A/D change-over circuit, makes to control on display screen, to demonstrate product type, IC model, magnitude of voltage, current value, power values, U
led, I
led.When operation, only need transfer product type.On the other hand, single-chip microcomputer produces required Vdd (logic working voltage), Vled (backlight operating voltage), the If (constant current source that backlight driver is used) of LCM by negative pressure control module, and by data buffering module with to connection module, drive LCM to be measured, obtain test result.
Claims (4)
1. a LCM test machine, comprises central processing module, it is characterized in that: also comprise the negative pressure control module that is electrically connected with described central processing module, to connection module and calling module;
Described central processing module comprises between two connected single-chip microcomputer, storer and data buffering module mutually; Described single-chip microcomputer, for transferring the program of storer, is controlled the work of data buffering module, and is received data buffering module, storer feedack; Described data buffering module is for the driver of read memory, and with connection module is in series; The signal output part of described storer is connected with the signal input part of data buffering module;
Described negative pressure control module is used for malleation input to be converted to negative pressure, and is connected with LCM to be measured, and the output terminal of this negative pressure control module connects the input end of single-chip microcomputer, and the input end of negative pressure control module connects the output terminal of single-chip microcomputer;
Described connection module is comprised to two 20pin output modules that are connected in parallel and 26pin output module, this 20pin output module or 26pin output module respectively with the corresponding connection of pin of LCM to be measured;
Described calling module comprises the model call unit and the A/D change-over circuit that are connected with single-chip microcomputer, and the control display screen being connected with single-chip microcomputer by described A/D change-over circuit; The input end of described single-chip microcomputer is connected with the output terminal of A/D change-over circuit.
2. LCM test machine as claimed in claim 1, is characterized in that: also comprise the compiled online module being connected with described single-chip microcomputer.
3. LCM test machine as claimed in claim 1, is characterized in that: also comprise the manual voltage regulation unit being connected with described single-chip microcomputer.
4. the LCM test machine as described in claims 1 to 3 any one, is characterized in that: described data buffering module comprises three SN74HC245 chips, and by digital signal by inner V
cclogic level transition is V
ddmodule logic working voltage level, thus drive LCM to be measured.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410054857.1A CN103777386B (en) | 2014-02-18 | 2014-02-18 | LCM (Liquid Crystal Display Module) testing machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410054857.1A CN103777386B (en) | 2014-02-18 | 2014-02-18 | LCM (Liquid Crystal Display Module) testing machine |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103777386A true CN103777386A (en) | 2014-05-07 |
| CN103777386B CN103777386B (en) | 2017-02-22 |
Family
ID=50569815
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410054857.1A Active CN103777386B (en) | 2014-02-18 | 2014-02-18 | LCM (Liquid Crystal Display Module) testing machine |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103777386B (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104318882A (en) * | 2014-11-10 | 2015-01-28 | 京东方科技集团股份有限公司 | Display module testing equipment |
| CN107515350A (en) * | 2017-08-24 | 2017-12-26 | 蚌埠高华电子股份有限公司 | A kind of LCM test control systems based on capacitance monitoring |
| CN107817386A (en) * | 2017-09-15 | 2018-03-20 | 北方电子研究院安徽有限公司 | A kind of CCD wafers test device for insulation resistance |
| CN112735309A (en) * | 2020-12-04 | 2021-04-30 | 安徽金视界光电科技有限公司 | STN liquid crystal display OTP (one time programmable) burning instrument and burning method |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1519568A (en) * | 2003-01-24 | 2004-08-11 | 胜华科技股份有限公司 | Base of hand operated cam for fina test of liquid crystal module (LCM) |
| JP2009008857A (en) * | 2007-06-27 | 2009-01-15 | Idec Corp | Explosion-proof type liquid crystal display device |
| CN202171929U (en) * | 2011-05-31 | 2012-03-21 | 贺术春 | LCM module group test system |
| CN202794388U (en) * | 2012-08-30 | 2013-03-13 | 亚世光电股份有限公司 | On-line assembling testing integrating system for liquid crystal module (LCM) |
| US20130207986A1 (en) * | 2012-02-14 | 2013-08-15 | Mediatek Inc. | Method and device for accessing buffer of display |
-
2014
- 2014-02-18 CN CN201410054857.1A patent/CN103777386B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1519568A (en) * | 2003-01-24 | 2004-08-11 | 胜华科技股份有限公司 | Base of hand operated cam for fina test of liquid crystal module (LCM) |
| JP2009008857A (en) * | 2007-06-27 | 2009-01-15 | Idec Corp | Explosion-proof type liquid crystal display device |
| CN202171929U (en) * | 2011-05-31 | 2012-03-21 | 贺术春 | LCM module group test system |
| US20130207986A1 (en) * | 2012-02-14 | 2013-08-15 | Mediatek Inc. | Method and device for accessing buffer of display |
| CN202794388U (en) * | 2012-08-30 | 2013-03-13 | 亚世光电股份有限公司 | On-line assembling testing integrating system for liquid crystal module (LCM) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104318882A (en) * | 2014-11-10 | 2015-01-28 | 京东方科技集团股份有限公司 | Display module testing equipment |
| WO2016074441A1 (en) * | 2014-11-10 | 2016-05-19 | 京东方科技集团股份有限公司 | Display module detection device |
| US10019920B2 (en) | 2014-11-10 | 2018-07-10 | Boe Technology Group Co., Ltd. | Display module detection device |
| CN107515350A (en) * | 2017-08-24 | 2017-12-26 | 蚌埠高华电子股份有限公司 | A kind of LCM test control systems based on capacitance monitoring |
| CN107817386A (en) * | 2017-09-15 | 2018-03-20 | 北方电子研究院安徽有限公司 | A kind of CCD wafers test device for insulation resistance |
| CN112735309A (en) * | 2020-12-04 | 2021-04-30 | 安徽金视界光电科技有限公司 | STN liquid crystal display OTP (one time programmable) burning instrument and burning method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103777386B (en) | 2017-02-22 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101719356B (en) | Programming method for programming EDID simultaneously on liquid crystal display multiinterface | |
| CN203134316U (en) | LED full color screen system and detection circuit thereof | |
| CN107797050A (en) | A kind of method of location-server mainboard electrifying timing sequence abnormal state | |
| CN202600083U (en) | Device and system for testing flexible circuit board assembly | |
| CN103792498A (en) | Automatic power supply testing method | |
| CN206179483U (en) | LCD module's test keysets | |
| CN103777386A (en) | LCM (Liquid Crystal Display Module) testing machine | |
| CN203950531U (en) | Card extender | |
| CN203133220U (en) | Circuit board on-line test tool allowing CPU to be automatically pluggable | |
| CN201489794U (en) | LCM testing device | |
| CN203522710U (en) | Signal converter multifunctional detection apparatus | |
| CN101556757A (en) | Test circuit of display driving circuit | |
| CN103389933A (en) | Test card and electronic test device with same | |
| CN211826336U (en) | Automatic PCB detection platform system | |
| CN203191662U (en) | Liquid crystal display module test system | |
| CN203825319U (en) | LCM (liquid crystal module) tester | |
| CN203479945U (en) | Aviation plug port testing apparatus | |
| CN104021748A (en) | LED display screen dead point detecting system | |
| CN101165508A (en) | Electronic component simulated fixture and power supply abnormity detection method | |
| CN204695300U (en) | A kind of computer software testing device | |
| CN203232677U (en) | Liquid crystal display test circuit | |
| CN203561989U (en) | Converter board and computer | |
| CN112492246A (en) | Novel DP and HDMI signal source equipment | |
| CN206002802U (en) | A kind of testing host of liquid crystal display device module | |
| CN205003406U (en) | Multi -functional LCD screen test machine |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: LCM (Liquid Crystal Display Module) testing machine Effective date of registration: 20190605 Granted publication date: 20170222 Pledgee: Xiuning Qiyun Financing Guarantee Co.,Ltd. Pledgor: ANHUI GOLDEN VISION OPTOELECTRONICS TECHNOLOGY Co.,Ltd. Registration number: 2019340000288 |
|
| PE01 | Entry into force of the registration of the contract for pledge of patent right | ||
| PC01 | Cancellation of the registration of the contract for pledge of patent right |
Granted publication date: 20170222 Pledgee: Xiuning Qiyun Financing Guarantee Co.,Ltd. Pledgor: ANHUI GOLDEN VISION OPTOELECTRONICS TECHNOLOGY Co.,Ltd. Registration number: 2019340000288 |