CN201489794U - LCM testing device - Google Patents
LCM testing device Download PDFInfo
- Publication number
- CN201489794U CN201489794U CN2009201343198U CN200920134319U CN201489794U CN 201489794 U CN201489794 U CN 201489794U CN 2009201343198 U CN2009201343198 U CN 2009201343198U CN 200920134319 U CN200920134319 U CN 200920134319U CN 201489794 U CN201489794 U CN 201489794U
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- lcm
- proving installation
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- circuit
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Abstract
The utility model discloses an LCM testing device, which comprises a function test module, a storage module, a controller and a replaceable switching module, wherein the function test module and the storage module are respectively connected with the controller electrically; and an LCM to be tested is electrically connected with the controller through the switching module. In the LCM testing device provided by the utility model, because the replaceable switching module is adopted to test the LCM to be tested, when LCMs to be tested have different models, the type of the switching module is only required to be replaced to test the LCMs; while in the prior art, all LCM testing devices are required to be replaced so as to test the LCMs to be tested; therefore, the LCM testing cost is reduced to a certain extent, the maintenance of the testing device is relatively simple, and the testing efficiency can be improved to a certain extent in the testing process.
Description
[technical field]
The utility model relates to the proving installation of a kind of LCM.
[background technology]
The structure of LCM (LCD Module, LCD MODULE) partly is made of LED-backlit, Panel, FPC, TP etc. usually.For the production of a LCM product, the test of its LCM is a requisite process.At present, when the LCM to different model tests, generally can be subjected to the influence of factors such as interface, IC, connected mode backlight, TP function, OTP correction, therefore the LCM proving installation of design specialized is tested respectively.When the LCM product type more for a long time, then need a large amount of proving installations corresponding with it, thereby cause the increase of cost, and in the maintenance of proving installation, also increased trouble.
[utility model content]
The shortcoming that the utility model can only be tested the LCM product of single model at existing LCM proving installation provides a kind of LCM proving installation that the LCM product of different model is tested can realized.
The technical solution of the utility model is achieved in that a kind of LCM proving installation, comprise functional test module, memory module, controller and removable interconnecting module, described functional test module and memory module electrically connect with described controller respectively, and LCM to be measured electrically connects by described interconnecting module and described controller.
The LCM proving installation that the utility model provides, owing to adopted removable interconnecting module that LCM to be measured is tested, therefore when LCM to be measured has multiple different model, only need to realize test to this LCM by the type of changing interconnecting module, and do not need LCM to be measured to be tested with realization as changing all LCM proving installations in the prior art, therefore reduced the testing cost of LCM to a certain extent, and make the maintenance of proving installation become simple relatively, in the process of test, can also improve the efficient of test to a certain extent.
Feature of the present utility model and advantage will be elaborated in conjunction with Figure of description by embodiment.
[description of drawings]
The structural representation of a kind of embodiment of LCM proving installation that Fig. 1 provides for the utility model;
The structural representation of the another kind of embodiment of the LCM proving installation that Fig. 2 provides for the utility model;
The interconnecting module circuit diagram of a kind of embodiment of LCM proving installation that Fig. 3 provides for the utility model.
[embodiment]
In order to make the purpose of this utility model, technical scheme and advantage clearer,, the utility model is further elaborated below in conjunction with drawings and Examples.Should be appreciated that specific embodiment described herein only in order to explanation the utility model, and be not used in qualification the utility model.
With reference to Fig. 1, a kind of LCM proving installation, it is characterized in that, comprise functional test module 1, memory module 5, controller 2 and removable interconnecting module 3, described functional test module 1 and memory module 5 electrically connect with described controller 2 respectively, and LCM4 to be measured electrically connects by described interconnecting module 3 and described controller 2.According to a preferred embodiment of this utility model, the chip that described controller 2 comprises is the C8051F126 chip.Described memory module 5 is a Nand Flash storage chip, and the memory capacity size of described Nand Flash storage chip is preferably 16M.These those skilled in the art are not difficult to expect, for selecting for use of the chip of above-mentioned controller 2, be not limited only to the C8051F126 chip, the chip of a lot of models can be realized its identical functions, ARM microprocessor for example, for adopting different process chip, it is corresponding to different hardware circuits and software design.Equally, also can adopt other storage chip to substitute, not do one by one here and give unnecessary details for selecting for use of described memory module 5.
In concrete test process, in order to realize test to various models LCM 4 to be measured, guarantee the versatility of this LCM proving installation, according to a kind of embodiment of the present utility model, with reference to Fig. 2, described functional test module comprises: voltage generation circuit 11, backlight drive circuit 12, OTP correcting circuit 13, key circuit 14 and serial communication circuit 15, and be connected to described controller 2 respectively.
Below, do one respectively with regard to above-mentioned voltage generation circuit 11, backlight drive circuit 12, OTP correcting circuit 13, key circuit 14 and serial communication circuit 15 and simply introduce, as follows:
Voltage generation circuit 11, this circuit are used to the LCM4 to be measured with different I interface voltage that the IO interface voltage IOVCC of different sizes is provided.According to a kind of embodiment of the present utility model, can pass through 4 LDO (low dropout regulator, low pressure difference linear voltage regulator) produces 4 kinds of different big or small magnitudes of voltage, select the relevant voltage value by analog switch then, thereby by bidirectional bus signal transceiver (dual-supply bus transceiver), for example model is an74avc16t245, and then converts the IO interface output voltage of controller 2 to this magnitude of voltage standard.
Backlight drive circuit, this circuit are used to realize the backlight to LCM to be measured, the driving of LED lamp for example backlight.
OTP correcting circuit, this circuit are used for part LCM to be measured, and for example OTP (one time programe, the One Time Programmable) function of CSTN (ColorSTN, colorful display screen) module provides voltage.In a kind of embodiment that the utility model provides, because being used for the display effect of CSTN, proofreaies and correct by the OTP correcting circuit, by DAC (Digital to Analog Converter, digital to analog converter) the controlled continually varying magnitude of voltage of output uses this voltage amplification by amplifying circuit then for the OTP function.
Key circuit 14, this road circuit are used to realize the operation to this LCM proving installation, provide different instruction at this device duration of work to this device.Its main mode of operation is, thereby produces an interruption by each button of the circuit 14 that pushes button, and controller 2 detects the down state of button in interrupt service routine, and carries out corresponding order.
Serial communication circuit 15, this circuit are used for by this LCM proving installation of exterior PC updating maintenance, and for example editing and updating is stored in the LCM4 information to be measured among the Nand Flash.In the application of reality, for example, according to a kind of embodiment that the utility model provides, this serial communication circuit links to each other this LCM proving installation by standard EIA/TIA232 interface with exterior PC, realize data communication, and then realize the updating maintenance of exterior PC this device.
In an embodiment of this utility model, described LCM proving installation also comprises the EIA/TIA232 interface, one end of described serial communication circuit is connected with exterior PC by described EIA/TIA232 interface, and the other end of described serial communication circuit is connected with described controller 2, for example, the other end of described serial communication circuit 15 is connected with UART (full duplex asynchronous communication) interface of described controller 2.For above-described EIA/TIA232 interface, these those skilled in the art are not difficult to expect also having corresponding substitute products can reach and its identical functions and purpose, USB interface or the like for example, here not to give unnecessary details one by one.In the process of test, described memory module 5, the relevant information of having stored different model LCM4 to be measured in for example described Nand Flash storage chip, described serial communication circuit is connected with exterior PC by the EIA/TIA232 interface on the described controller 2, thereby can carry out updating maintenance to the LCM4 information to be measured that is stored in the memory module 5, thereby realize test job different model LCM4 to be measured.
With reference to Fig. 3, on the interconnecting module 3 described in the LCM proving installation that the utility model provides, include corresponding one by one pull-up resistor 31 and the pull down resistor 32 that links to each other of specific pin with described controller 2.Utilize this pull-up resistor 31 and pull down resistor 32, because its pin different with described controller 2 (for example described C8051F126 chip) connects, for example will pull into high level (logical one) on the resistance of an IO interface with a 100K ohm, or under pull into low level (logical zero), therefore logically described interconnecting module 3 can be arranged to the Different Logic state, 0101010101010101 logic for example, can think also that perhaps this interconnecting module 3 utilizes above-mentioned pull-up resistor and pull down resistor and the different annexation of described controller 2 pins, formed a specific hardware encoding, this hardware encoding is corresponding to the LCM4 to be measured of respective model.Owing in the process of test, the model of its LCM4 to be measured is not unique, therefore can make LCM proving installation and described LCM4 to be measured mate, and carry out the function corresponding test by changing the mode of described interconnecting module 3.
This LCM proving installation provides the function of testing the various indexs of LCM4 to be measured, and its design all is a software-controllable system.In actual applications, be connected with the correct of interface that described controller 2 carries by described interconnecting module 3, and cooperate correct software operation, thereby realization is towards the test of various dissimilar LCM4 to be measured.And, can realize the plug and play of interconnecting module 3 and controller 2, thereby, can effectively reduce the quantity of LCM proving installation, and then reduce cost with respect to prior art, make things convenient for management maintenance.
The LCM proving installation that the utility model provides, owing to adopted 3 couples of LCM4 to be measured of removable interconnecting module to test, therefore when LCM4 to be measured has multiple different model, only need to realize test to this LCM4 to be measured by the type of changing interconnecting module 3, and do not need LCM4 to be measured to be tested with realization as changing all LCM proving installations in the prior art, therefore reduced the testing cost of LCM to a certain extent, and make the maintenance of proving installation become simple relatively, in the process of test, can also improve the efficient of test to a certain extent.
The above only is preferred embodiment of the present utility model; not in order to restriction the utility model; all any modifications of within spirit of the present utility model and principle, being done, be equal to and replace and improvement etc., all should be included within the protection domain of the present utility model.
Claims (8)
1. LCM proving installation, it is characterized in that, comprise functional test module, memory module, controller and removable interconnecting module, described functional test module and memory module electrically connect with described controller respectively, and LCM to be measured electrically connects by described interconnecting module and described controller.
2. LCM proving installation according to claim 1 is characterized in that, described functional test module comprises voltage generation circuit, backlight drive circuit, OTP correcting circuit, key circuit and serial communication circuit, and is connected to described controller respectively.
3. LCM proving installation according to claim 2, it is characterized in that, described LCM proving installation also comprises the EIA/TIA232 interface, one end of described serial communication circuit is connected with described exterior PC by described EIA/TIA232 interface, and the other end of described serial communication circuit is connected with controller.
4. LCM proving installation according to claim 3 is characterized in that, the other end of described serial communication circuit links to each other with the UART interface of described controller.
5. LCM proving installation according to claim 1 is characterized in that described controller comprises the C8051F126 chip.
6. LCM proving installation according to claim 1 is characterized in that, described memory module is a Nand Flash storage chip.
7. LCM proving installation according to claim 6 is characterized in that, the memory capacity size of described Nand Flash storage chip is 16M.
8. LCM proving installation according to claim 1 is characterized in that, includes corresponding one by one pull-up resistor and the pull down resistor that links to each other of specific pin with described controller on the described interconnecting module.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009201343198U CN201489794U (en) | 2009-07-29 | 2009-07-29 | LCM testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009201343198U CN201489794U (en) | 2009-07-29 | 2009-07-29 | LCM testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201489794U true CN201489794U (en) | 2010-05-26 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN2009201343198U Expired - Lifetime CN201489794U (en) | 2009-07-29 | 2009-07-29 | LCM testing device |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102446477A (en) * | 2011-12-30 | 2012-05-09 | 武汉精测电子技术有限公司 | Liquid crystal module test device with display port (DP) interface and test method thereof |
| CN102654964A (en) * | 2012-05-08 | 2012-09-05 | 深圳市同兴达科技有限公司 | Programmable gate array testing board and programmable gate array testing system for liquid crystal display |
| CN104240627A (en) * | 2014-09-18 | 2014-12-24 | 深圳市显创光电有限公司 | Liquid-crystal display module testing device |
| CN104318882A (en) * | 2014-11-10 | 2015-01-28 | 京东方科技集团股份有限公司 | Display module testing equipment |
| CN104360185A (en) * | 2014-10-30 | 2015-02-18 | 惠州市创仕实业有限公司 | LCM (liquid crystal module) electric measurement function expansion device |
| CN104678790A (en) * | 2013-11-30 | 2015-06-03 | 无锡博一光电科技有限公司 | FPGA (Field Programmable Gate Array) control circuit for LCM (Liquid Crystal Display Module) burning |
-
2009
- 2009-07-29 CN CN2009201343198U patent/CN201489794U/en not_active Expired - Lifetime
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102446477A (en) * | 2011-12-30 | 2012-05-09 | 武汉精测电子技术有限公司 | Liquid crystal module test device with display port (DP) interface and test method thereof |
| CN102446477B (en) * | 2011-12-30 | 2013-11-20 | 武汉精测电子技术股份有限公司 | Liquid crystal module test device with display port (DP) interface and test method thereof |
| CN102654964A (en) * | 2012-05-08 | 2012-09-05 | 深圳市同兴达科技有限公司 | Programmable gate array testing board and programmable gate array testing system for liquid crystal display |
| CN102654964B (en) * | 2012-05-08 | 2016-04-06 | 深圳同兴达科技股份有限公司 | The programmable gate array test plate of liquid crystal display and programmable gate array test system |
| CN104678790A (en) * | 2013-11-30 | 2015-06-03 | 无锡博一光电科技有限公司 | FPGA (Field Programmable Gate Array) control circuit for LCM (Liquid Crystal Display Module) burning |
| CN104240627A (en) * | 2014-09-18 | 2014-12-24 | 深圳市显创光电有限公司 | Liquid-crystal display module testing device |
| CN104360185A (en) * | 2014-10-30 | 2015-02-18 | 惠州市创仕实业有限公司 | LCM (liquid crystal module) electric measurement function expansion device |
| CN104318882A (en) * | 2014-11-10 | 2015-01-28 | 京东方科技集团股份有限公司 | Display module testing equipment |
| WO2016074441A1 (en) * | 2014-11-10 | 2016-05-19 | 京东方科技集团股份有限公司 | Display module detection device |
| US10019920B2 (en) | 2014-11-10 | 2018-07-10 | Boe Technology Group Co., Ltd. | Display module detection device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| ASS | Succession or assignment of patent right |
Owner name: SHENZHEN BYD ELECTRONIC COMPONENT CO., LTD. Free format text: FORMER OWNER: BIYADI CO., LTD. Effective date: 20150901 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20150901 Address after: 518119 Guangdong province Shenzhen City Dapeng new Kwai town Yanan Road No. 1 building experimental Byd Co Patentee after: Shenzhen BYD Electronic Component Co., Ltd. Address before: 518118 Pingshan Road, Pingshan Town, Shenzhen, Guangdong, No. 3001, No. Patentee before: Biyadi Co., Ltd. |
|
| CX01 | Expiry of patent term |
Granted publication date: 20100526 |
|
| CX01 | Expiry of patent term |