CN102446477B - Liquid crystal module test device with display port (DP) interface and test method thereof - Google Patents
Liquid crystal module test device with display port (DP) interface and test method thereof Download PDFInfo
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Abstract
The invention discloses a liquid crystal module test device with a display port (DP) interface and a test method thereof, which relate to the test field of liquid crystal modules. The liquid crystal module test device with the DP interface comprises a power supply processing unit, a field programmable gate array signal processing unit and a central processing unit (CPU) control unit, wherein the power supply processing unit and the field programmable gate array signal processing unit are connected with one liquid crystal module test interface; the liquid crystal module test interface is connected with a liquid crystal module to be tested; the power supply processing unit comprises a power supply processing module and a light emitting diode (LED) driving module; the CPU control unit and the field programmable gate array signal processing unit are both connected with one DP coding module which outputs a signal to the liquid crystal module to be tested; and the field programmable gate array signal processing unit comprises a built-in signal module, a low-voltage differential signaling decoding module and a low-voltage differential signaling coding module. According to the test device and the test method, a low-voltage differential signaling (LVDS) interface and the DP interface are simultaneously provided, an external input test signal and a built-in test signal are simultaneously supported, and LED backlight driving output is provided.
Description
Technical field
The present invention relates to the field tests of liquid crystal module, is specifically a kind of liquid crystal module testing device with the DP interface and method of testing.
Background technology
LCD (Liquid Crystal Display, liquid crystal display) comprise LED (Light Emitting Diode, light emitting diode) backlight liquid crystal display and CCFL (Cold Cathode Fluorescent Lamp, cold cathode fluorescent lamp pipe) backlight liquid crystal display.LCD, particularly the LED-backlit liquid crystal display has frivolous, the plurality of advantages such as power consumption is low, radiation is little, screen flicker free, rich color, along with its technology reaches its maturity, the main product function admirable, the LED-backlit liquid crystal display has occupied increasing market share.The primary clustering of LCD is liquid crystal module (LCD Module), liquid crystal module interconnected signal adopts LVDS (Low-Voltage Differential Signaling, Low Voltage Differential Signal) or DP (DisplayPort, display interface) interface mode.The DP interface adds the support to the transmission of high definition audio signal in transmission video signal, support simultaneously higher resolution and refresh rate can directly drive panel, saves a large amount of circuit expense and space.
When liquid crystal module is produced, need to carry out strict test verification, the testing instruments of employing are liquid crystal module testing device.Progressively scale application due to the DP interface; proving installation has been proposed to new demand; need to support simultaneously generally the LVDS interface of application and progressively the DP interface of scale application at present; along with the mechanization degree of dull and stereotyped producer's product production line is more and more higher, also more and more higher to the requirement of liquid crystal module performance test apparatus simultaneously.
In the process to the liquid crystal module performance test, usually need to, according to the different different interface signal types of liquid crystal module switching, according to application scenario, need to switch outside input test signal source and built-in testing signal source simultaneously at present.Yet traditional liquid crystal module testing apparatus is due to the restriction of design architecture complexity and special chip use, function singleness, can only support the LVDS interface, can not support simultaneously LVDS interface and DP interface, can not support simultaneously outside input test signal source and built-in testing signal source, traditional liquid crystal module testing device does not have built-in liquid crystal module LED-backlit to drive, or needs additional new equipment to realize the conversion of interface, this not only wiring of class device, complicated operation, application scenario is single; Also may cause new equipment investment, the efficiency that greatly reduces test and produce, increased testing cost, and be unfavorable for to liquid crystal module is carried out reliable automatic test and changed the line of production fast.
Summary of the invention
For the defect that exists in prior art, the object of the present invention is to provide a kind of liquid crystal module testing device with the DP interface and method of testing, LVDS interface and DP interface can be provided simultaneously, support simultaneously outside input test signal and built-in testing signal, and can quick automatic switching; The LED-backlit driver output is provided, and the liquid crystal module testing device integrated level is high, saves testing cost, and is simple to operate, promotes testing efficiency and test fiduciary level, the production efficiency of enterprise and product percent of pass.
for reaching above purpose, the invention provides a kind of liquid crystal module testing device with the DP interface, comprise the power supply processing unit, the field programmable gate array signal processing unit, the CPU control module, the power supply processing unit is connected a liquid crystal module test interface jointly with the field programmable gate array signal processing unit, the liquid crystal module test interface connects LCD module under test, the power supply processing unit comprises the power supply processing module that is connected with the CPU control module and exports the LED driver module of liquid crystal module test interface to, the CPU control module, coding module of the DP to the LCD module under test output signal of the common connection of field programmable gate array signal processing unit, the field programmable gate array signal processing unit comprises the bist signal module that is connected with the CPU control module, receive the Low Voltage Differential Signal decoder module of external testing signal, and to the Low Voltage Differential Signal coding module of LCD module under test output signal.
On the basis of technique scheme, described power supply processing unit also comprises liquid crystal module power module and the device supply module that is used for powering, power supply processing module is regulated the required power supply of test, after liquid crystal module power module and the processing of LED driver module, exports to the liquid crystal module test interface.
On the basis of technique scheme, described CPU control module comprises picture signal processing module, CPU module, module Card read/write module and the man-machine interface that is connected successively, the CPU module is carried out initialization to whole system when powering on, read the parameter information of LCD module under test, the picture signal processing module connects described bist signal module, module Card read/write module connects the DP coding module, and LCD module under test information is write and compares.
On the basis of technique scheme, described man-machine interface connects outer computer or control end.
on the basis of technique scheme, described field programmable gate array signal processing unit also comprises the input buffer module that is connected with the Low Voltage Differential Signal decoder module, the bist signal cache module that is connected with the bist signal module, the detecting module that all is connected with input buffer module and bist signal cache module, the CPU control module sends graphical information to bist signal module and produces the built-in testing signal, the Low Voltage Differential Signal decoder module is decoded to the external testing signal that receives, through the input buffer module buffer memory, by detecting module, input buffer module and bist signal cache module are detected to processing.
On the basis of technique scheme, described CPU control module comprises the picture signal processing module, and picture signal processing module process graphics information is sent out in the bist signal module and produced the built-in testing signal according to the LCD module under test time sequence information.
on the basis of technique scheme, described field programmable gate array signal processing unit also comprises connected signal exchange module and signal processing module, input buffer module, the bist signal cache module all is connected the signal exchange module with detecting module, signal processing module connects respectively Low Voltage Differential Signal coding module and DP coding module, the signal exchange module is switched test signal automatically, and deliver to signal processing module and process, Low Voltage Differential Signal coding module and DP coding module are encoded to the signal of signal processing module, export the liquid crystal module test interface to.
The present invention also provides a kind of method of testing based on described liquid crystal module testing device, comprises step:
The CPU module reads the parameter information of LCD module under test, by power supply processing module, regulates the required power supply of test, after liquid crystal module power module and the processing of LED driver module, waits for LVDS test signal and the foundation of DP test signal;
Picture signal processing module process graphics information, send out in the bist signal module and produce the built-in testing signal, the Low Voltage Differential Signal decoder module is decoded to the external testing signal that receives, through the input buffer module buffer memory, by detecting module, input buffer module and bist signal cache module are detected to processing, the control signal Switching Module carries out hand-off process to test signal automatically, and the number of delivering letters processing module is carried out the signal processing;
Low Voltage Differential Signal coding module and DP coding module are encoded to the signal of signal processing module, set up LVDS test signal and DP test signal, export to the LCD module under test that the liquid crystal module test interface connects, the power supply processing module out-put supply is given described LCD module under test simultaneously, module Card read/write module writes and compares module information to be measured by the DP coding module, completes the LCD module under test information setting of dispatching from the factory.
On the basis of technique scheme, the control signal Switching Module judges whether the data of external testing signal are effective, if effectively, switches to the data of external testing signal; If invalid, switch to the built-in testing figure.
On the basis of technique scheme, described power supply processing module is processed outside input power filtering, when voltage is normal, start power supply, when electric current is normal, successively to LCD module under test power supply and backlight electric power sampling, while all being setting value, wait for LVDS test signal and the foundation of DP test signal, after test signal is set up, open liquid crystal module power module monitoring current and backlight electric power monitoring current, open the LED driver module, to the LCD module under test power supply, light module to be measured.
Beneficial effect of the present invention is:
1. the liquid crystal module testing device with the DP interface also comprises LVDS decoder module and LVDS coding module, and LVDS interface and DP interface are provided simultaneously, supports external testing signal and built-in testing signal, and can automatically switch fast;
2. the liquid crystal module testing device with the DP interface also comprises the LED driver module, provides the LED-backlit of LCD module under test to drive;
3. the integrated level with the liquid crystal module testing device of DP interface is high, realize the standalone feature module that existing design needs a plurality of complex proprietary chips to form, saved testing cost, simple to operate, testing efficiency and test fiduciary level have been promoted, the production efficiency of enterprise and product percent of pass.
The accompanying drawing explanation
Fig. 1 is the structured flowchart of the embodiment of the present invention with the liquid crystal module testing device of DP interface;
Fig. 2 is the method for testing process flow diagram of embodiment in Fig. 1;
Fig. 3 is the process flow diagram of power supply processing unit in Fig. 1.
Reference numeral:
Power supply processing unit 1, power supply processing module 11, liquid crystal module power module 12, LED driver module 13, device supply module 14;
FPGA signal processing unit 2, LVDS decoder module 21, input buffer module 22, bist signal module 23, bist signal module 23, bist signal cache module 24, detecting module 25, signal exchange module 26, signal processing module 27, LVDS coding module 28;
CPU control module 3, picture signal processing module 31, CPU module 32, module Card read/write module 33, man-machine interface 34;
DP coding module 4;
Liquid crystal module test interface 5.
Embodiment
Below in conjunction with drawings and Examples, the present invention is described in further detail.
As shown in Figure 1, the present invention comprises power supply processing unit 1, FPGA (Field-Programmable Gate Array with the liquid crystal module testing device of DP interface, field programmable gate array) signal processing unit 2, CPU control module 3, DP coding module 4, power supply processing unit 1, FPGA signal processing unit 2 and DP coding module 4 are connected to a liquid crystal module test interface 5, and liquid crystal module test interface 5 connects the LCD module under test (not shown).
Described power supply processing unit 1 comprises the power supply processing module 11 that outside input power filtering is processed, the liquid crystal module power module 12 that is connected with power supply processing module 11 respectively, LED driver module 13 and device supply module 14, the LCD module under test that liquid crystal module power module 12 output liquid crystal module power supplys connect to liquid crystal module test interface 5, the LCD module under test that LED driver module 13 output LED-backlit connect to liquid crystal module test interface 5.
Described CPU control module 3 comprises picture signal processing module 31, CPU module 32, module Card read/write module 33 and man-machine interface 34, CPU module 32 connects power supply processing module 11, module Card read/write module 33 connects DP coding module 4, and man-machine interface 34 connects outer computer or control end.
Described FPGA signal processing unit 2 comprises LVDS decoder module 21, input buffer module 22, bist signal module 23, bist signal cache module 24, detecting module 25, signal exchange module 26, signal processing module 27, LVDS coding module 28; LVDS decoder module 21 receives the external testing signal, connect successively input buffer module 22, detecting module 25 and bist signal cache module 24, bist signal module 23 is connected with picture signal processing module 31, input buffer module 22, detecting module 25 and bist signal cache module 24 all are connected signal exchange module 26, signal exchange module 26 is connected to LVDS coding module 28 by signal processing module 27, and LVDS coding module 28 provides the LVDS test signal to liquid crystal module test interface 5.
Described DP coding module 4 output DP test signals are to liquid crystal module test interface 5, and liquid crystal module test interface 5 all offers LCD module under test by DP test signal, LED-backlit, liquid crystal module power supply, LVDS test signal.
As depicted in figs. 1 and 2, the present invention, with the method for testing of the liquid crystal module testing device of DP interface, comprises step:
S101.CPU module 32 is carried out initialization to whole system when powering on.
S102.CPU module 32 reads in advance by the parameter information (as resolution, power supply etc.) of the LCD module under test of man-machine interface 34 inputs.
S103. common adjusting of power supply processing module 11 and CPU module 32 tested required power supply.
S104. judge whether power settings is normal, if undesired, return to S103 and continue to regulate power supply; If normal, enter S105.
S105., the LCD module under test sequential is set, and namely LCD module under test necessary signal sequence of when normal operation, set up the test signal sequential through 31 of picture signal processing modules in bist signal module 23;
S106. picture signal processing module 31 process graphics information, send out in bist signal module 23 and produce the built-in testing signal.
S107. bist signal cache module 24 produces the built-in testing figure.
The external testing signal of 21 pairs of receptions of S108.LVDS decoder module is decoded, and through input buffer module 22 buffer memorys, by 25 pairs of input buffer module 22 of detecting module and bist signal cache module 24, detects processing.
Whether the data that S109. judge the external testing signal are effective, if effectively, enter S110; If invalid, enter S111.
S110. control signal Switching Module 26 switches to the data of external testing signal.
S111. control signal Switching Module 26 switches to the built-in testing figure.
S112. data or the built-in testing figure of the external testing signal after 27 pairs of switchings of signal processing module are processed.
The signal of S113.LVDS coding module 28 and 4 pairs of signal processing modules 27 of DP coding module is encoded.
S114.LVDS coding module 28 and DP coding module 4 are opened LVDS and the DP test signal after coding, and liquid crystal module power module 12 and LED driver module 13 output liquid crystal module power supply and LED-backlit power supplys, light module to be measured.
S115. module Card read/write module 33 writes and compares by 4 pairs of module information to be measured of DP coding module, completes the LCD module under test information checking that dispatches from the factory.
S116. detect LCD module under test.
in the present embodiment, outside input power is direct current 24V power supply, power supply processing module 11 comprises power management chip, the overvoltage of realization to input power, under-voltage, overcurrent protection, two-way is electric current and voltage sample circuit and two-way voltage-regulating circuit independently independently, realize respectively the feedback of liquid crystal module power supply and backlight electric power, adjust and control, by the liquid crystal module power module, realize that DC-DC (DC/DC) conversion obtains needed 3V to the 12V direct supply of module work, by the LED driver module, realize that DC-DC (DC/DC) conversion obtains the common backlight electric power of 5V to 24V, by LED drive circuit, realize that 12 string LED constant current sources drive simultaneously, every crosstalk stream is 20 milliamperes, the highest 40V of driving voltage.
As shown in figures 1 and 3, the idiographic flow of power supply processing unit 1 is as follows:
S201. the 24V power supply is inputted in outside.
S202. 11 pairs of power filters of power supply processing module are processed.
S203. judge whether voltage is normal, if undesired, locked, wait for that voltage is normal, enter S204.
S204. whole liquid crystal module testing device is started to power supply.
S205. judge whether electric current is normal, if not, powered-down is supplied with, and changes S204 over to; If enter S206.
S206. the module power supply in 12 pairs of CPU modules 32 of power supply processing module 11 and liquid crystal module power module is sampled.
S207. judge whether voltage is that liquid crystal module power module 12 realizes that DC-DC (DC/DC) conversion obtains needed 3V to the 12V direct supply of module work, if not, change S206 over to.
S208. carry out the backlight electric power sampling.
S209. judge whether voltage is that LED driver module 13 realizes that DC-DC (DC/DC) conversion obtains the common backlight electric power of 5V to 24V, if not, change S208 over to.
S210. judge whether LVDS test signal and DP test signal are set up, if not, wait for LVDS test signal and the foundation of DP test signal.
S211. open simultaneously module power supply monitoring electric current and backlight electric power monitoring current.
S212. open LED driver module 13.
S213. supply power is given the LCD module under test that described liquid crystal module test interface 5 connects.
The present embodiment FPGA signal processing unit 2 utilizes the high velocity, low pressure differential interface of FPGA, receive the external testing signal, according to standard LVDS vision signal rule, from serial LVDS data, parsing demonstration information, data useful signal, horizontal-drive signal, vertical synchronizing signal, and demonstration information is carried out to the pointwise buffer memory, guarantee validity and the continuity of data.Pictorial information and module time sequence information that FPGA signal processing unit 2 sends by outside versabus according to picture signal processing module 31 simultaneously, set up demonstration information, data useful signal, horizontal-drive signal, the vertical synchronizing signal of close beta signal, and demonstration information is carried out to the pointwise buffer memory.Detecting module 25 is by extracting the effective information in input buffer module 22, to data analysis, whether judgement is current test valid data according to module information, if extract these valid data to signal processing module, otherwise extract the built-in testing signal data to signal processing module, realize the automatic switchover of testing source.Signal processing module 27 will show that information processes by the requirement of LVDS coding module 28 and DP coding module 4, and output 2 road Concurrent Display information, send respectively and LVDS coding module 28 and DP coding module 4.The demonstration information exchange that LVDS coding module 28 will receive is crossed standard LVDS vision signal rule encoding, by the high velocity, low pressure differential interface of FPGA, is sent, and realizes the output of LVDS test signal.The demonstration information that DP coding module 4 will receive is encoded according to the module physical interface information (demand pairs, speed) that module reads, and coding criterion is DisplayPort 1.1, realizes the output of DP test signal.
The present invention is not limited to above-mentioned embodiment, for those skilled in the art, under the premise without departing from the principles of the invention, can also make some improvements and modifications, within these improvements and modifications also are considered as protection scope of the present invention.The content that is not described in detail in this instructions belongs to the known prior art of professional and technical personnel in the field.
Claims (7)
1. liquid crystal module testing device with the DP interface, comprise power supply processing unit (1), field programmable gate array signal processing unit (2), CPU control module (3), power supply processing unit (1) is connected a liquid crystal module test interface (5) jointly with field programmable gate array signal processing unit (2), liquid crystal module test interface (5) connects LCD module under test, it is characterized in that: power supply processing unit (1) comprises the power supply processing module (11) that is connected with CPU control module (3) and the LED driver module (13) that exports liquid crystal module test interface (5) to, CPU control module (3), field programmable gate array signal processing unit (2) connects a coding module of the DP to the LCD module under test output signal (4) jointly, field programmable gate array signal processing unit (2) comprises the bist signal module (23) that is connected with CPU control module (3), receive the Low Voltage Differential Signal decoder module (21) of external testing signal, and to the Low Voltage Differential Signal coding module (28) of LCD module under test output signal,
described field programmable gate array signal processing unit (2) also comprises the input buffer module (22) that is connected with Low Voltage Differential Signal decoder module (21), the bist signal cache module (24) that is connected with bist signal module (23), the detecting module (25) that all is connected with input buffer module (22) and bist signal cache module (24), CPU control module (3) sends graphical information to bist signal module (23) and produces the built-in testing signal, Low Voltage Differential Signal decoder module (21) is decoded to the external testing signal that receives, through input buffer module (22) buffer memory, by detecting module (25), input buffer module (22) and bist signal cache module (24) are detected to processing,
described field programmable gate array signal processing unit (2) also comprises connected signal exchange module (26) and signal processing module (27), input buffer module (22), bist signal cache module (24) all is connected signal exchange module (26) with detecting module (25), signal processing module (27) connects respectively Low Voltage Differential Signal coding module (28) and DP coding module (4), signal exchange module (26) is switched test signal automatically, and deliver to signal processing module (27) and process, Low Voltage Differential Signal coding module (28) and DP coding module (4) are encoded to the signal of signal processing module (27), export liquid crystal module test interface (5) to.
2. the liquid crystal module testing device with the DP interface as claimed in claim 1, it is characterized in that: the device supply module (14) that described power supply processing unit (1) also comprises liquid crystal module power module (12) and is used for powering, power supply processing module (11) is regulated the required power supply of test, after liquid crystal module power module (12) and LED driver module (13) processing, exports to liquid crystal module test interface (5).
3. the liquid crystal module testing device with the DP interface as claimed in claim 1, it is characterized in that: described CPU control module (3) comprises the picture signal processing module (31) that is connected successively, CPU module (32), module Card read/write module (33) and man-machine interface (34), CPU module (32) is carried out initialization to whole system when powering on, read the parameter information of LCD module under test, picture signal processing module (31) connects described bist signal module (23), module Card read/write module (33) connects DP coding module (4), LCD module under test information is write and compares.
4. the liquid crystal module testing device with the DP interface as claimed in claim 1, it is characterized in that: described CPU control module (3) comprises picture signal processing module (31), picture signal processing module (31) process graphics information, send out in bist signal module (23) and produce the built-in testing signal according to the LCD module under test time sequence information.
5. based on the method for testing of the described liquid crystal module testing device of claim 1, it is characterized in that, comprise step:
CPU module (32) reads the parameter information of LCD module under test, by power supply processing module (11), regulate the required power supply of test, after liquid crystal module power module (12) and LED driver module (13) processing, wait for LVDS test signal and the foundation of DP test signal;
Picture signal processing module (31) process graphics information, send out in bist signal module (23) and produce the built-in testing signal, Low Voltage Differential Signal decoder module (21) is decoded to the external testing signal that receives, through input buffer module (22) buffer memory, by detecting module (25), input buffer module (22) and bist signal cache module (24) are detected to processing, control signal Switching Module (26) carries out hand-off process to test signal automatically, and the number of delivering letters processing module (27) is carried out the signal processing;
Low Voltage Differential Signal coding module (28) and DP coding module (4) are encoded to the signal of signal processing module (27), set up LVDS test signal and DP test signal, export to the LCD module under test that liquid crystal module test interface (5) connects, power supply processing module (11) out-put supply is given described LCD module under test simultaneously, module Card read/write module (33) writes and compares module information to be measured by DP coding module (4), completes the LCD module under test information setting of dispatching from the factory.
6. the method for testing of liquid crystal module testing device as claimed in claim 5, it is characterized in that: signal exchange module (26) judges whether the data of external testing signal are effective, if effectively, switches to the data of external testing signal; If invalid, switch to the built-in testing figure.
7. the method for testing of liquid crystal module testing device as claimed in claim 5, it is characterized in that: described power supply processing module (11) is processed outside input power filtering, when voltage is normal, start power supply, when electric current is normal, successively to LCD module under test power supply and backlight electric power sampling, while all being setting value, wait for LVDS test signal and the foundation of DP test signal, after test signal is set up, open liquid crystal module power supply (12) module monitors electric current and backlight electric power monitoring current, open LED driver module (4), to the LCD module under test power supply, light module to be measured.
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