CN211505748U - Detection device of display module - Google Patents

Detection device of display module Download PDF

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Publication number
CN211505748U
CN211505748U CN201922484188.2U CN201922484188U CN211505748U CN 211505748 U CN211505748 U CN 211505748U CN 201922484188 U CN201922484188 U CN 201922484188U CN 211505748 U CN211505748 U CN 211505748U
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display module
module
test
testing
substrate
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芮志强
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Suzhou HYC Technology Co Ltd
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Suzhou HYC Technology Co Ltd
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Abstract

The utility model discloses a display module assembly's detection device. The detection device of the display module comprises an operation box, a PG test module and a substrate; the substrate comprises a storage unit and a product connector, and the storage unit is used for storing the display module test parameters corresponding to the substrate; the product connector is used for being connected with the display module to be detected; the operation box comprises a control unit and a connection interface, the control unit is connected with the PG testing module through the connection interface, the PG testing module is connected with the substrate through the backplane connector, the storage unit is connected with the control unit through the PG testing module, and the control unit outputs a control signal to the PG testing module according to the testing parameters of the display module; the PG test module is used for forming a test signal according to the control signal and outputting the test signal to the substrate through the backplane connector; the substrate is used for outputting the test signal to the display module to be detected. Not only improved detection efficiency, reduced the degree of difficulty that detects display module assembly moreover.

Description

Detection device of display module
Technical Field
The embodiment of the utility model provides a relate to and detect technical field, especially relate to a display module assembly's detection device.
Background
The existing detection equipment for the display module is the detection equipment for customizing the display module in the factory assembly line production. When the display module assemblies of different types are detected, the display module assemblies of different types need to be connected with detection equipment through different interfaces, so that the detection of the display module assemblies of different types is realized. Because the types of the display module are numerous, the interfaces set by the detection equipment of the display module are more, and the interfaces are not uniform. When detecting the display module assembly, need select corresponding interface according to the type of display module assembly, it is more complicated that the display module assembly is connected with check out test set. In addition, the display module of different grade type corresponds different test parameters, when detecting display module, needs set up its test parameter that corresponds according to display module's type, and is not only loaded down with trivial details, and the professional that needs to be familiar with check out test set up moreover and just can guarantee test parameter and display module's matching correct rate, has increaseed the degree of difficulty that detects display module.
SUMMERY OF THE UTILITY MODEL
The utility model provides a detection apparatus for display module assembly to improve display module assembly's detection device's detection efficiency, reduced the detection degree of difficulty.
In a first aspect, an embodiment of the present invention provides a detection apparatus for a display module, including an operation box, a PG test module, and a substrate;
the substrate comprises a storage unit and a product connector, and the storage unit is used for storing the display module test parameters corresponding to the substrate; the product connector is used for being connected with the display module to be detected;
the operation box comprises a control unit and a connection interface, the control unit is connected with the PG testing module through the connection interface, the PG testing module is connected with the substrate through a backplane connector, the storage unit is connected with the control unit through the PG testing module, and the control unit outputs a control signal to the PG testing module according to the testing parameters of the display module; the PG test module is used for forming a test signal according to the control signal and outputting the test signal to the substrate through the backplane connector; the substrate is used for outputting the test signal to the display module to be detected.
Optionally, the memory cell is an eeprom.
Optionally, the control unit comprises:
the parameter reading subunit is in communication connection with the substrate through the PG testing module and is used for reading the testing parameters of the display module in the storage unit on the substrate;
and the parameter output subunit is connected with the parameter reading subunit and the PG testing module, and is used for forming a control signal according to the display module testing parameters acquired by the parameter reading subunit and outputting the control signal to the PG testing module.
Optionally, the control unit is a central processing unit.
Optionally, the operation box further comprises a display unit;
the display unit is connected with the parameter reading subunit and used for displaying the test parameters of the display module read by the parameter reading subunit.
Optionally, the operation box further comprises an input unit;
the input unit is connected with the parameter output subunit and the display unit, and is used for inputting preset parameters; the parameter output subunit forms a control signal according to the preset parameter; the display unit is used for displaying the preset parameters input by the input unit.
Optionally, the input unit is connected to the storage unit through the PG testing module, and the storage unit is configured to store the preset parameter.
Optionally, the input unit includes a key input subunit and/or a touch input subunit.
Optionally, the detection apparatus further comprises an extension module; the connecting interface is a type-C interface; the type-C interface comprises at least two types; one of the type-C interfaces is connected with the PG testing module, and the other type-C interfaces are connected with the expansion module.
Optionally, the PG test module further comprises a battery and a power adapter, wherein the battery is used for providing power for the PG test module; the power adapter is connected with the battery and used for charging the battery.
The utility model discloses technical scheme, the operation box includes the control unit and connects the interface, and the base plate includes memory cell and product connector. The control unit is connected with the PG testing module through the connecting interface, the PG testing module is connected with the substrate through the backplane connector, and the storage unit is connected with the control unit through the PG testing module. The control unit can directly read the test parameters of the display module to be detected stored in the storage unit, so that the corresponding test parameters do not need to be set according to the type of the display module to be detected, the complicated process of setting the corresponding test parameters can be saved, the detection efficiency is improved, the professional requirements of setting the corresponding test parameters are reduced, and the difficulty of detecting the display module is reduced.
Drawings
Fig. 1 is a schematic structural diagram of a detection apparatus for a display module according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of an operation box provided by the present invention;
fig. 3 is a schematic structural diagram of another detection apparatus for a display module according to the present invention.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.
Fig. 1 is a schematic structural diagram of a detection apparatus for a display module according to an embodiment of the present invention. As shown in fig. 1, the inspection apparatus includes an operation cartridge 110, a PG test module 120, and a substrate 140; the substrate 140 includes a storage unit 141 and a product connector 142, and the storage unit 142 is used for storing the display module test parameters corresponding to the substrate 140; the product connector 142 is used for connecting with the display module 150 to be detected; the operation box 110 includes a control unit 111 and a connection interface 112, the control unit 111 is connected to the PG testing module 120 through the connection interface 112, the PG testing module 120 is connected to the substrate 140 through the backplane connector 130, the storage unit 141 is connected to the control unit 111 through the PG testing module 120, and the control unit 111 outputs a control signal to the PG testing module 120 according to the display module testing parameters; the PG test module 120 is configured to form a test signal according to the control signal and output the test signal to the substrate 140 through the backplane connector 130; the substrate 140 is used for outputting the test signal to the display module 150 to be tested.
Specifically, the PG test module 120 is a detection PG based on an operating system, and may be, for example, an ARM linx operating system. The PG test module 120 may output a test signal. For example, when detecting a small-sized display module, the PG test module 120 may output the MIPI signal and a power signal and a functional pin signal corresponding to the MIPI signal. The power signal may include VCI, VDDI, VSP, VSN, AVDD and backlight, and the functional pin signal may include bit, I2And C, an IO pin signal such as SPI. The test signal output by the PG test module 120 is output to the board 140 through the backplane connector 130.
The substrate 140 and the display module 150 to be detected may be directly connected by a Flexible Flat Cable (FFC) connector or a Flexible Printed Circuit (FPC) connector. The substrates 140 correspond to the types of the display modules 150 to be detected one by one. That is, different display modules 150 to be tested correspond to different types of substrates 140. When the display module 150 to be detected is detected, the corresponding substrate 140 is selected, so that the product connector 142 on the substrate 140 is connected with the display module 150 to be detected. The storage unit 141 on the substrate 140 stores the display module testing parameters corresponding to the substrate 140, which are the testing parameters of the display module 150 to be tested. When the display module 150 to be detected is detected, the control unit 111 obtains the test parameters in the storage unit 141 through the PG test module 120, and forms a control signal according to the test parameters, and transmits the control signal to the PG test module 120 through the connection interface 112, and the PG test module forms a test signal corresponding to the test parameters according to the control signal, so that the display module 150 to be detected can be directly tested.
In the above process, the control unit 111 in the operation box 110 can directly read the test parameters of the to-be-detected display module 150 stored in the storage unit 141, so that the corresponding test parameters do not need to be set according to the type of the to-be-detected display module 150, the tedious process of setting the corresponding test parameters can be saved, the detection efficiency is improved, the professional requirements of setting the corresponding test parameters are reduced, and the difficulty of detecting the display module is reduced. On the other hand, the connection interface 112 used between the operation box 110 and the PG testing module 120 may be an interface with a high-speed transmission function, such as a type-C interface or a USB3.0 interface, so as to increase the signal transmission rate between the operation box 110 and the PG testing module 120.
It should be noted that, in order to ensure the signal transmission rate of the backplane connector 130, a TE high-speed backplane connector may be selected. In addition, the PG test module 120 may further include a USB interface, which may be a USB3.0 interface and may be connected to a storage medium, an upper computer, and the like. Other alternate interfaces, such as a network interface and a debug interface, may also be provided on the operation box 110. The network interface may be connected to a network line for providing a network signal to the detection device. The debug interface is used to access the debug signal, thereby implementing debugging of the operation box 110.
According to the technical scheme, the operation box comprises a control unit and a connection interface, and the substrate comprises a storage unit and a product connector. The control unit is connected with the PG testing module through the connecting interface, the PG testing module is connected with the substrate through the backplane connector, and the storage unit is connected with the control unit through the PG testing module. The control unit can directly read the test parameters of the display module to be detected stored in the storage unit, so that the corresponding test parameters do not need to be set according to the type of the display module to be detected, the complicated process of setting the corresponding test parameters can be saved, the detection efficiency is improved, the professional requirements of setting the corresponding test parameters are reduced, and the difficulty of detecting the display module is reduced.
On the basis of the technical scheme, the detection device further comprises an expansion module. The connecting interfaces are type-C interfaces, and the number of the type-C interfaces is at least two; one type-C interface is connected with the PG testing module, and the other type-C interfaces are connected with the extension module.
Specifically, the type-C interface can realize not only positive and negative insertion and reduce the connection difficulty between the operation box 110 and the PG test module 120, but also can realize a high-speed transmission function and convert other types of interfaces, such as DP, VGA, 232, DB9, and the like, so that the connection of more types of interfaces can be adapted, the setting of interfaces on the detection device can be reduced, and the connection difficulty of the detection device is reduced. In addition, the type-C interfaces are arranged to include at least two, one type-C interface is connected with the PG testing module and used for achieving the basic testing function of the detection device, and the other type-C interfaces can achieve external expansion interfaces such as DP, VGA, USB and the like, so that the external expansion interfaces are connected with the expansion module to increase the functions of the detection device.
On the basis of the above technical solutions, the control unit includes:
and the parameter reading subunit is in communication connection with the substrate through the PG testing module and is used for reading the testing parameters of the display module in the storage unit on the substrate.
And the parameter output subunit is connected with the parameter reading subunit and the PG testing module and is used for forming a control signal according to the display module testing parameters acquired by the parameter reading subunit and outputting the control signal to the PG testing module.
Specifically, in the detection process, the PG test module is connected with the operation box through the connection interface after being powered on, and the parameter reading subunit in the operation box reads the test parameters of the to-be-detected display module stored on the storage unit on the substrate through the PG test module and transmits the test parameters to the parameter output subunit. And the parameter output subunit forms a control signal according to the test parameter and transmits the control signal to the PG test module through the connection interface. The PG test module forms a test signal corresponding to the display module to be detected according to the control signal, for example, a detection picture signal. And output to the base plate through the back panel connector, output to the display module assembly that awaits measuring through the product connector on the base plate, wait to detect the display module assembly and show according to test signal to the detection that realizes waiting to detect the display module assembly. After the detection is finished, the PG test module can be subjected to power-off finishing test. In the above-mentioned testing process, the operation box directly reads the test parameter that waits to detect the display module assembly on the base plate, need not to set up the corresponding test parameter according to the type that waits to detect the display module assembly, not only can practice thrift the loaded down with trivial details process that sets up the corresponding test parameter, has improved detection efficiency, has reduced the professional requirement that sets up the corresponding test parameter moreover, has reduced the degree of difficulty that detects the display module assembly.
It should be noted that the test signal may include a plurality of detection pictures, and during the switching process of different detection pictures, manual switching may be selected, or automatic switching may be selected.
Illustratively, the control Unit is a Central Processing Unit (CPU).
Fig. 2 is a schematic structural diagram of an operation box provided by the present invention. As shown in fig. 2, the operation box includes a control unit 111 and a connection interface 112, and further includes a display unit 113. The display unit 113 is connected to the parameter reading subunit 114, and is configured to display the display module test parameters read by the parameter reading subunit 114.
Specifically, the display unit 113 may be a display. The display unit 113 is connected with the parameter reading subunit 114, after the parameter reading subunit 114 obtains the test parameters of the display module to be detected, the test parameters of the display module to be detected are output to the display unit 113, and the display unit 113 displays the test parameters of the display module to be detected, so that a tester can conveniently check whether the test parameters are matched with the display module to be detected.
With continued reference to fig. 2, the operation box further includes an input unit 115; the input unit 115 is connected with the parameter output subunit 116 and the display unit 113, and the input unit 115 is used for inputting preset parameters; the parameter output subunit 116 forms a control signal according to preset parameters; the display unit 113 is used for displaying preset parameters input by the input unit 115.
Specifically, when the display module to be detected is a new type of display module, the corresponding storage unit of the substrate does not have corresponding test parameters. The test parameters can be edited by the input unit 115 for detection at this time. The preset parameters are the testing parameters of the display module to be tested. The specific process is as follows: the PG test module is connected with the operation box through the connection interface after being electrified, the display unit 113 of the operation box enters an upper computer interface, test parameters of the display module to be detected are input through the input unit 115 and are transmitted to the parameter output subunit 116 of the control unit 111, and the parameter output subunit 116 forms a control signal according to the test parameters and outputs the control signal to the PG test module through the connection interface. The PG test module forms a test signal corresponding to the display module to be detected according to the control signal, the test signal is output to the substrate through the backplane connector, the test signal is output to the display module to be detected through the product connector on the substrate, and the display module to be detected displays according to the test signal, so that the detection of the display module to be detected is realized.
On the basis of the technical scheme, the input unit is connected with the storage unit through the PG testing module, and the storage unit is used for storing preset parameters.
Specifically, after the input unit inputs the test signal of the display module to be tested, the test signal can be transmitted to the storage unit on the substrate for storage through the PG test module. When the display module of the same type is detected again, the control unit can directly read the preset parameters stored in the storage unit on the substrate through the PG testing module, form control signals according to the preset parameters, control the PG testing module to form testing signals matched with the display module, and detect the display module.
According to the process, the preset parameters are stored through the storage unit, and the substrate matched with the new type of display module is formed. When the display module assembly of the same type is detected again, the operation box can directly read the test parameters on the substrate, the corresponding test parameters do not need to be set according to the type of the display module assembly to be detected, the complicated process of setting the corresponding test parameters can be saved, the detection efficiency is improved, the professional requirement of setting the corresponding test parameters is reduced, and the difficulty of detecting the display module assembly is reduced.
In addition, the memory cell is an electrically erasable rewritable read-only memory.
Specifically, an Electrically Erasable-Erasable programmable read-Only Memory (EEPROM) is a semiconductor Memory device that can be electronically rewritten many times, and existing information can be erased and edited again. In the detection process, when the test parameters of the display module to be detected change, the corresponding test parameters can be input through the input unit of the operation box, the existing test parameters in the storage unit are edited again, and therefore the test parameters of the display module to be detected can be updated. And can be directly read in the subsequent use, thereby realizing the flexible operation of the detection process.
On the basis of the above technical solution, the input unit may include a key input subunit and/or a touch input subunit. The key input subunit may be an input device such as a keyboard, and the touch input subunit may be a device such as a touch display panel. The key input subunit can be in communication connection with the display unit, and the touch input subunit can be integrated on the display unit.
In addition, the input unit may include a key input subunit or a touch input subunit, and the input unit may include both the key input subunit and the touch input subunit. When the input unit comprises the touch input subunit, the display unit has a touch function.
The operation box may further comprise a battery for supplying power to the operation box. When the operation box is connected with the host, the operation box can also obtain the power supply of the host through the PG test module to provide the power supply for the operation box.
Fig. 3 is a schematic structural diagram of another detection apparatus for a display module according to the present invention. As shown in fig. 3, the PG test module 120 further includes a battery 121 and a power adapter 122, where the battery 121 is used to provide power for the PG test module 120; the power adapter 122 is connected to the battery 121 for charging the battery 121.
Specifically, when there is no external power source, the battery 121 may provide power for the PG test module 120, so as to facilitate detection of the display module after power failure, and to enable out-of-band detection. In addition, the PG test module 120 further includes a power adapter 122, and the power adapter 122 is connected to the battery 121. When the power adapter 122 is connected to an external power source, the external power source can charge the battery 121 through the power adapter 122.
It should be noted that the foregoing is only a preferred embodiment of the present invention and the technical principles applied. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail with reference to the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the scope of the present invention.

Claims (10)

1. The detection device for the display module is characterized by comprising an operation box, a PG test module and a substrate;
the substrate comprises a storage unit and a product connector, and the storage unit is used for storing the display module test parameters corresponding to the substrate; the product connector is used for being connected with the display module to be detected;
the operation box comprises a control unit and a connection interface, the control unit is connected with the PG testing module through the connection interface, the PG testing module is connected with the substrate through a backplane connector, the storage unit is connected with the control unit through the PG testing module, and the control unit outputs a control signal to the PG testing module according to the testing parameters of the display module; the PG test module is used for forming a test signal according to the control signal and outputting the test signal to the substrate through the backplane connector; the substrate is used for outputting the test signal to the display module to be detected.
2. The apparatus of claim 1, wherein the memory unit is an EEPROM.
3. The apparatus for detecting the display module according to claim 1, wherein the control unit comprises:
the parameter reading subunit is in communication connection with the substrate through the PG testing module and is used for reading the testing parameters of the display module in the storage unit on the substrate;
and the parameter output subunit is connected with the parameter reading subunit and the PG testing module, and is used for forming a control signal according to the display module testing parameters acquired by the parameter reading subunit and outputting the control signal to the PG testing module.
4. The apparatus for detecting the display module according to claim 3, wherein the control unit is a CPU.
5. The detecting device for the display module according to claim 3, wherein the operation box further comprises a display unit;
the display unit is connected with the parameter reading subunit and used for displaying the test parameters of the display module read by the parameter reading subunit.
6. The detecting device for the display module according to claim 5, wherein the operation box further comprises an input unit;
the input unit is connected with the parameter output subunit and the display unit, and is used for inputting preset parameters; the parameter output subunit forms a control signal according to the preset parameter; the display unit is used for displaying the preset parameters input by the input unit.
7. The apparatus for detecting a display module according to claim 6, wherein the input unit is connected to the storage unit through the PG testing module, and the storage unit is used for storing the preset parameters.
8. The apparatus of claim 6, wherein the input unit comprises a key input subunit and/or a touch input subunit.
9. The apparatus for detecting the display module according to claim 1, further comprising an expansion module; the connecting interface is a type-C interface; the type-C interface comprises at least two types; one of the type-C interfaces is connected with the PG testing module, and the other type-C interfaces are connected with the expansion module.
10. The apparatus for detecting a display module according to claim 1, wherein the PG test module further comprises a battery and a power adapter, the battery is used for providing power for the PG test module; the power adapter is connected with the battery and used for charging the battery.
CN201922484188.2U 2019-12-30 2019-12-30 Detection device of display module Active CN211505748U (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112562553A (en) * 2020-11-26 2021-03-26 中国兵器装备集团自动化研究所 Test system and test method of liquid crystal control module

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112562553A (en) * 2020-11-26 2021-03-26 中国兵器装备集团自动化研究所 Test system and test method of liquid crystal control module

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