CN208188289U - A kind of test macro of circuit power consumption - Google Patents
A kind of test macro of circuit power consumption Download PDFInfo
- Publication number
- CN208188289U CN208188289U CN201820500383.2U CN201820500383U CN208188289U CN 208188289 U CN208188289 U CN 208188289U CN 201820500383 U CN201820500383 U CN 201820500383U CN 208188289 U CN208188289 U CN 208188289U
- Authority
- CN
- China
- Prior art keywords
- test
- display screen
- module
- switch circuit
- terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 322
- 238000001514 detection method Methods 0.000 claims abstract description 82
- 238000005520 cutting process Methods 0.000 claims description 5
- 230000007547 defect Effects 0.000 abstract description 10
- 238000010586 diagram Methods 0.000 description 8
- 238000000034 method Methods 0.000 description 5
- 230000002093 peripheral effect Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000003044 adaptive effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000008707 rearrangement Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000012353 t test Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
The utility model discloses a kind of test macro of circuit power consumption, the system comprises: test resistance module, current detection module and processing module.The output end of the test macro connection terminal test mainboard of circuit power consumption is connected with the input terminal of display screen to be measured, pass through the current data between the continuous acquisition terminal testing host of the test macro of circuit power consumption and display screen to be measured, and the current data of acquisition is fed back to terminal test mainboard and is judged, determine the circuit power consumption of display screen to be measured with the presence or absence of defect.The utility model solves and can not carry out integrated testability to the circuit power consumption of intelligent terminal complete machine in the prior art, to not can determine that the problem of whether the integrated circuit power consumption between display screen and mainboard on intelligent terminal meets the requirements, it realizes and the circuitry power consumption of intelligent terminal is accurately tested, avoid the circuit power consumption for influencing intelligent terminal complete machine due to display screen circuit power consumption defect.
Description
Technical Field
The embodiment of the utility model provides a relate to circuit technical field, especially relate to a test system of circuit consumption.
Background
At present, when the circuit power consumption of a terminal is tested, the power consumption of a main board circuit of the terminal can only be tested independently, for example, the power consumption of the main board circuit of the terminal is tested independently by using an external program control power supply through a clamp. Because the assembly of parts such as the mainboard of most terminals, display screen all adopts the flip-chip order, is about to the assembly of display screen and puts and install at last step, and most terminals all adopt the built-in battery that can't dismantle to make the unable connection terminal's of display screen at terminal controllable power, and then can't test the circuit consumption of terminal display screen alone.
Aiming at the circuit power consumption test process of the terminal in the prior art, the inventor finds that at least the following defects exist: because the circuit power consumption of the terminal display screen cannot be tested in the prior art, whether the display screen has defects or not cannot be determined, and whether the whole circuit power consumption between the terminal display screen and the terminal mainboard meets the requirements or not cannot be determined. If the circuit power consumption of the terminal display screen does not meet the requirements, certain defects exist, the circuit power consumption of the whole terminal can be caused to be problematic, and therefore the standby time of the terminal is shortened.
SUMMERY OF THE UTILITY MODEL
The utility model provides a test system of circuit consumption to realize the circuit consumption of accurate test terminal display screen, avoid influencing the complete machine circuit consumption at terminal because the circuit consumption defect problem of display screen.
The embodiment of the utility model provides a test system of circuit consumption, the system includes: the device comprises a test resistance module, a current detection module and a processing module; wherein,
the input end of the test resistance module is connected with the output end of the terminal test mainboard, and the output end of the test resistance module is connected with the input end of the display screen to be tested; the test resistor module is used for transmitting the voltage output by the terminal test mainboard to the display screen to be tested;
the first end of the current detection module is connected with the input end of the test resistance module, the second end of the current detection module is connected with the output end of the test resistance module, and the third end of the current detection module is connected with the input end of the processing module; the current detection module is used for acquiring first-class current data passing through the test resistance module and outputting the first-class current data to the processing module;
the output end of the processing module is connected with the input end of the terminal test main board; the processing module is used for converting the first type of current data into second type of current data and outputting the second type of current data to the terminal test mainboard.
Further, the test resistance module includes: the device comprises a first test resistor, a second test resistor, a third test resistor and a fourth test resistor; wherein,
the first test resistor is used for transmitting a first voltage output by a first voltage output end of the terminal test mainboard to a first voltage input end of the display screen to be tested;
the second test resistor is used for transmitting a second voltage output by a second voltage output end of the terminal test mainboard to a second voltage input end of the display screen to be tested;
the third test resistor is used for transmitting a third voltage output by a third voltage output end of the terminal test mainboard to a third voltage input end of the display screen to be tested;
and the fourth test resistor is used for transmitting a fourth voltage output by a fourth voltage output end of the terminal test mainboard to a fourth voltage input end of the display screen to be tested.
Further, the current detection module includes: a first current detection unit, a second current detection unit, a third current detection unit and a fourth current detection unit; wherein,
the first current detection unit is used for acquiring first current data passing through the test resistor module and outputting the first current data to the processing module;
the second current detection unit is used for acquiring second current data passing through the test resistance module and outputting the second current data to the processing module;
the third current detection unit is used for acquiring third current data passing through the test resistance module and outputting the third current data to the processing module;
the fourth current detection unit is used for acquiring fourth current data passing through the test resistance module and outputting the fourth current data to the processing module;
the first type of current data includes first current data, second current data, third current data, and fourth current data.
Further, the first current detection unit, the second current detection unit, the third current detection unit and the fourth current detection unit all adopt an INA220 current detection chip; the first type of current data is I2C bus data.
Further, the processing module is a microcontroller of the STM32 family.
Further, the system further comprises: a first display screen connector and a second display screen connector; wherein,
the first display screen connector is used for connecting the input end of the testing resistance module with the output end of the terminal testing mainboard, and the second display screen connector is used for connecting the output end of the testing resistance module with the input end of the display screen to be tested.
Further, the system further comprises: a first type of switch module;
the first type switch module is respectively connected with the output end of the test resistance module and the input end of the display screen to be tested and is used for cutting off a power supply circuit between the terminal test mainboard and the display screen to be tested when the test of the display screen to be tested is completed.
Further, the first type of switch module includes: the first switch circuit is connected with the first switch circuit and the second switch circuit; wherein,
the mechanical switch circuit is respectively connected with the first switch circuit, the second switch circuit, the third switch circuit and the fourth switch circuit, and is used for generating a low level signal and outputting the low level signal to the first switch circuit, the second switch circuit, the third switch circuit and the fourth switch circuit;
the first switch circuit is used for switching off a first voltage power supply circuit between a first voltage output end of the terminal test mainboard and a first voltage input end of the display screen to be tested according to the low level signal;
the second switch circuit is used for switching off a second voltage power supply circuit between a second voltage output end of the terminal test mainboard and a second voltage input end of the display screen to be tested according to the low level signal;
the third switch circuit is used for switching off a third voltage power supply circuit between a third voltage output end of the terminal test mainboard and a third voltage input end of the display screen to be tested according to the low level signal;
and the fourth switch circuit is used for cutting off a fourth voltage power supply circuit between a fourth voltage output end of the terminal test mainboard and a fourth voltage input end of the display screen to be tested according to the low level signal.
Further, the first type switch module further includes: and the switch indicating circuit is matched with the mechanical switch circuit.
Further, the first type switch module further includes: the first discharge circuit is matched with the first switch circuit, the second discharge circuit is matched with the second switch circuit, the third discharge circuit is matched with the third switch circuit, and the fourth discharge circuit is matched with the fourth switch circuit.
The utility model provides a test system of circuit consumption, the system includes: the device comprises a test resistance module, a current detection module and a processing module. The circuit power consumption testing system is connected with the output end of the terminal testing mainboard and the input end of the display screen to be tested, the terminal testing mainboard and the display screen to be tested are established into a complete terminal host through the circuit power consumption testing system, then current data between the terminal testing mainboard and the display screen to be tested are continuously collected through the circuit power consumption testing system, the collected current data are fed back to the terminal testing mainboard to be judged, and whether the circuit power consumption of the display screen to be tested has defects or not is determined. The utility model provides an among the prior art can't carry out the whole test to the circuit consumption of intelligent terminal complete machine to can not confirm the problem that whether whole circuit consumption between display screen on the intelligent terminal and the mainboard meets the requirements, realized carrying out accurate test to intelligent terminal's complete machine circuit consumption, avoided influencing the circuit consumption of intelligent terminal complete machine because display screen circuit consumption defect.
Drawings
Fig. 1 is a schematic structural diagram of a circuit power consumption testing system according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a circuit power consumption testing system according to a second embodiment of the present invention;
fig. 3 is a schematic structural diagram of a circuit power consumption testing system according to a third embodiment of the present invention;
fig. 4 is a schematic circuit diagram of a first type of switch module in a circuit power consumption testing system according to a third embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.
Example one
Fig. 1 is the embodiment of the utility model provides a test system's of circuit consumption structural schematic diagram, the embodiment of the utility model provides a can be applied to in the scene of test terminal display screen circuit consumption. Referring to fig. 1, the circuit power consumption test system 10 may include: the testing device comprises a testing resistance module 101, a current detection module 102 and a processing module 103; wherein,
the input end of the test resistance module 101 is connected with the output end of the terminal test main board 20, and the output end of the test resistance module 101 is connected with the input end of the display screen 30 to be tested; the test resistor module 101 is used for transmitting the voltage output by the terminal test main board 20 to the display screen 30 to be tested;
a first end of the current detection module 102 is connected with an input end of the test resistance module 101, a second end of the current detection module 102 is connected with an output end of the test resistance module 101, and a third end of the current detection module 102 is connected with an input end of the processing module 103; the current detection module 102 is configured to obtain first-class current data passing through the test resistor module 101, and output the first-class current data to the processing module 103;
the output end of the processing module 103 is connected with the input end of the terminal test main board 20; the processing module 103 is configured to convert the first type of current data into second type of current data, and output the second type of current data to the terminal test motherboard 20.
In this embodiment, the terminal test motherboard 20 may be a motherboard of a terminal such as a mobile phone, a tablet computer, and a computer, and the display screen 30 to be tested may be a display screen matched with the terminal test motherboard 20. Any display screen that needs to be tested and matches with the terminal test motherboard 20 may be used as the display screen 30 to be tested.
In this embodiment, referring to fig. 1, the terminal test main board 20 may output a controllable voltage, the controllable voltage output by the terminal test main board 20 may be connected to the input end of the test resistor module 101 through the output end of the terminal test main board 20, the controllable voltage output by the terminal test main board 20 is transmitted to the test resistor module 101, and then the controllable voltage is transmitted to the display screen 30 to be tested through the connection between the output end of the test resistor module 101 and the input end of the display screen 30 to be tested. At this time, a circuit connection relationship is established between the terminal test motherboard 20 and the display screen 30 to be tested, and a stable circuit working environment can be provided for the display screen 30 to be tested through the controllable voltage provided by the terminal test motherboard 10, so that the display screen 30 to be tested can normally work according to the voltage provided by the terminal test motherboard 10. When testing the power consumption of the display screen 30 to be tested, the current detection module 102 added in the circuit power consumption test system 10 may be used to detect the circuit power consumption of the test resistance module 101, and whether the circuit power consumption of the display screen 30 to be tested is normal or not may be reflected according to the circuit power consumption of the test circuit module 101.
In this embodiment, referring to fig. 1, the specific operation process of the current detection module 102 is as follows: the first end of the current detection module 102 is connected to the input end of the test circuit module 101, and the second end of the current detection module is connected to the output end of the test circuit module 101, so that the voltage output by the terminal test main board 20 generates an instantaneous current through the test circuit module 101. At this time, the current detection module 102 may detect a voltage difference between the test resistor modules 101, further calculate an instantaneous current flowing through the test resistor modules 101, and obtain first-class current data of the test resistor modules 101. The third end of the current detection module 102 may be connected to an input end of the processing module 103, so that the first type of current data acquired by the current detection module 102 may be transmitted to the processing module 103 for processing and analysis. The processing module 103 may convert the first type of current data into second type of current data, and output the second type of current data to the terminal test motherboard 20, so that the terminal test motherboard 20 compares the obtained second type of current data with the pre-stored standard current data, and determines whether the circuit power consumption of the display screen 30 to be tested meets the requirement. When the comparison result of the second type current data and the prestored standard current data meets the condition, the circuit power consumption condition of the display screen to be tested is normal, and at the moment, the Pass can be displayed on the display screen to be tested; when the comparison result of the second type current data and the pre-stored standard current data does not meet the condition, the circuit power consumption condition of the display screen to be tested is abnormal, and Fail can be displayed on the display screen to be tested.
The utility model provides a test system of circuit consumption, the system includes: the device comprises a test resistance module, a current detection module and a processing module. The circuit power consumption testing system is connected with the output end of the terminal testing mainboard and the input end of the display screen to be tested, the terminal testing mainboard and the display screen to be tested are established into a complete terminal host through the circuit power consumption testing system, then current data between the terminal testing mainboard and the display screen to be tested are continuously collected through the circuit power consumption testing system, the collected current data are fed back to the terminal testing mainboard to be judged, and whether the circuit power consumption of the display screen to be tested has defects or not is determined. The utility model provides an among the prior art can't carry out the whole test to the circuit consumption of intelligent terminal complete machine to can not confirm the problem that whether whole circuit consumption between display screen on the intelligent terminal and the mainboard meets the requirements, realized carrying out accurate test to intelligent terminal's complete machine circuit consumption, avoided influencing the circuit consumption of intelligent terminal complete machine because display screen circuit consumption defect.
Example two
Fig. 2 is a schematic structural diagram of a test system of circuit power consumption provided by the second embodiment of the present invention, which is optimized on the basis of the second embodiment, as shown in fig. 2, the test system 10 of circuit power consumption may include: the testing device comprises a testing resistance module 101, a current detection module 102 and a processing module 103; wherein, the test resistance module 101 includes: a first test resistance 1011, a second test resistance 1012, a third test resistance 1013, and a fourth test resistance 1014.
The first test resistor 1011 is configured to transmit a first voltage output by the first voltage output end of the terminal test motherboard 20 to a first voltage input end of the display screen 30 to be tested; the second test resistor 1012 is configured to transmit a second voltage output by the second voltage output end of the terminal test motherboard 20 to a second voltage input end of the display screen 30 to be tested; the third test resistor 1013 is configured to transmit a third voltage output by the third voltage output end of the terminal test main board 20 to the third voltage input end of the display screen 30 to be tested; the fourth test resistor 1014 is configured to transmit a fourth voltage output by the fourth voltage output end of the terminal test main board 20 to a fourth voltage input end of the display screen 30 to be tested.
A first end of the current detection module 102 is connected with an input end of the test resistance module 101, a second end of the current detection module 102 is connected with an output end of the test resistance module 101, and a third end of the current detection module 102 is connected with an input end of the processing module 103; the current detection module 102 is configured to obtain first-class current data passing through the test resistor module 101, and output the first-class current data to the processing module 103;
the output end of the processing module 103 is connected with the input end 202 of the terminal test main board 20; the processing module 103 is configured to convert the first type of current data into second type of current data, and output the second type of current data to the terminal test motherboard 20.
In this embodiment, referring to fig. 2, the terminal test main board 20 may output a controllable voltage of the display screen 30 to be tested, and the terminal test main board 20 may output VDD3.1V voltage, VBAT voltage, VDD2.8V voltage and VLED voltage of the backlight circuit. The test resistor module 101 includes a first test resistor 1011, a second test resistor 1012, a third test resistor 1013, and a fourth test resistor 1014, and the input end of the corresponding test resistor module 101 may include four input interfaces, which are a first voltage input interface, a second voltage input interface, a third voltage input interface, and a fourth voltage input interface, respectively. The four voltages output by the terminal test motherboard 20 may be input to the first test resistor 1011, the second test resistor 1012, the third test resistor 1013, and the fourth test resistor 1014 according to different voltage input interfaces in the test resistor module 101. The output end of the test resistor module 101 may include four output interfaces, which are a first voltage output interface, a second voltage output interface, a third voltage output interface, and a fourth voltage output interface. Then, the four paths of voltages can be transmitted to the first voltage input terminal, the second voltage input terminal, the third voltage input terminal and the fourth voltage input terminal of the display screen 30 to be tested through the first test resistor 1011, the second test resistor 1012, the third test resistor 1013 and the fourth test resistor 1014, so as to provide adaptive voltages to the display screen 30 to be tested, so that the display screen 30 to be tested can normally operate.
Illustratively, the first voltage output end of the terminal test motherboard 20 is connected to the first voltage input interface of the input end of the first test resistor 1011, the first voltage output interface of the output end of the first test resistor 1011 is connected to the first voltage input end of the display screen 30 to be tested, and VDD3.1V voltage output by the first voltage output end of the terminal test motherboard 20 can be transmitted to the display screen 30 to be tested through the first test resistor 1011. A second voltage output end of the terminal test motherboard 20 is connected to a second voltage input interface of an input end of the second test resistor 1012, a second voltage output interface of an output end of the second test resistor 1012 is connected to a second voltage input end of the display screen 30 to be tested, and the VBAT voltage output by the second voltage output end of the terminal test motherboard 20 can be transmitted to the display screen 30 to be tested through the second test resistor 1012. The third voltage output end of the terminal test motherboard 20 is connected to the third voltage input interface of the input end of the third test resistor 1013, the third voltage output interface of the output end of the third test resistor 1013 is connected to the third voltage input end of the display screen 30 to be tested, and VDD2.8V voltage output by the third voltage output end of the terminal test motherboard 20 can be transmitted to the display screen 30 to be tested through the third test resistor 1013. A fourth voltage output end of the terminal test motherboard 20 is connected to a fourth voltage input interface of an input end of the fourth test resistor 1014, a fourth voltage output interface of an output end of the fourth test resistor 1014 is connected to a fourth voltage input end of the display screen 30 to be tested, and a backlight circuit VLED voltage output by the fourth voltage output end of the terminal test motherboard 20 can be transmitted to the display screen 30 to be tested through the fourth test resistor 1014. It should be noted that the VDD3.1V voltage, the VBAT voltage, the VDD2.8V voltage, or the backlight circuit VLED voltage may be set according to the actual situation, and is not limited herein.
In this embodiment, referring to fig. 2, in the process of transmitting the four paths of voltages, the voltage dividing function of the first test resistor 1011, the second test resistor 1012, the third test resistor 1013, and the fourth test resistor 1014 may enable voltage differences to be generated between the input end and the output end of the first test resistor 1011, the second test resistor 1012, the third test resistor 1013, and the fourth test resistor 1014, so as to generate an instantaneous current. Whether the current consumption of the current to-be-tested display screen meets the requirement or not can be determined by analyzing the current flowing through the first test resistor 1011, the second test resistor 1012, the third test resistor 1013 and the fourth test resistor 1014. The first type current data may be obtained by calculating instantaneous currents flowing through the first test resistor 1011, the second test resistor 1012, the third test resistor 1013, and the fourth test resistor 1014.
On the basis of the above embodiments, the current detection module 102 may include: a first current detection unit 1021, a second current detection unit 1022, a third current detection unit 1023, and a fourth current detection unit 1024; the first current detection unit 1021 is used for acquiring first current data passing through the test resistance module 101 and outputting the first current data to the processing module 103; the second current detection unit 1022 is configured to obtain second current data passing through the test resistor module 101, and output the second current data to the processing module 103; the third current detection unit 1023 is used for acquiring third current data passing through the test resistor module 101 and outputting the third current data to the processing module 10; the fourth current detection unit 1024 is configured to obtain fourth current data passing through the test resistance module 101, and output the fourth current data to the processing module 103; the first type of current data includes first current data, second current data, third current data, and fourth current data.
In this embodiment, referring to fig. 2, a first end of the first current detecting unit 1021 is connected to the first voltage input interface of the input end of the test resistance module 101, a second end of the first current detecting unit 1021 is connected to the first voltage output interface of the output end of the test resistance module 101, and the first current detecting unit 1021 is configured to obtain first current data passing through the test resistance module 101 and output the first current data from a third end of the first current detecting unit 1021 to the processing module 103. A first end of the second current detecting unit 1022 is connected to the second voltage input interface of the input end of the testing resistor module 101, a second end of the second current detecting unit 1022 is connected to the second voltage output interface of the output end of the testing resistor module 101, and the second current detecting unit 1022 is configured to obtain second current data passing through the testing resistor module 101, and output the second current data from a third end of the second current detecting unit 1022 to the processing module 103. The first end of the third current detection unit 1023 is connected to the third voltage input interface of the input end of the test resistor module 101, the second end of the third current detection unit 1023 is connected to the third voltage output interface of the output end of the test resistor module 101, and the third current detection unit 1023 is configured to obtain third current data passing through the test resistor module 101 and output the third current data to the processing module 103 from the third end of the third current detection module 1023. The first end of the fourth current detection unit 1024 is connected to the fourth voltage input interface at the input end of the test resistance module 101, the second end of the fourth current detection unit 1024 is connected to the fourth voltage output interface at the output end of the test resistance module 101, and the fourth current detection unit 1024 is configured to obtain fourth current data passing through the test resistance module 101 and output the fourth current data to the processing module 103 from the third end of the fourth current detection unit 1024.
In the present embodiment, referring to fig. 2, the first type of current data includes first current data, second current data, third current data, and fourth current data. Optionally, the first current detecting unit 1021, the second current detecting unit 1022, the third current detecting unit 1023, and the fourth current detecting unit 1024 may all adopt an INA220 current detecting chip. Specifically, the third terminal of the first current detection unit 1021 may include a first clock interface and a first control interface. The third terminal of the second current detection unit 1022 may include a second clock interface and a second control interface. The third terminal of the third current detection unit 1023 may include a third clock interface and a third control interface. The third terminal of the fourth current detecting unit 1024 may include a fourth clock interface and a fourth control interface. The reason why the third terminals of the first current detecting unit 1021, the second current detecting unit 1022, the third current detecting unit 1023, and the fourth current detecting unit 1024 each include two interfaces is that: the first type of current data output by the third terminals of the first current detecting unit 1021, the second current detecting unit 1022, the third current detecting unit 1023 and the fourth current detecting unit 1024 is I2C bus data, and the I2C bus data includes clock data and control data, so that two connecting wires are required for transmitting the I2C bus data, one transmitting the clock data, and the other transmitting the control data.
In this embodiment, there are four voltages, which are VDD3.1V voltage, VBAT voltage, VDD2.8V voltage and VLED voltage, on the display screen 30 to be tested, and the current consumption of the four voltages all satisfy the SPEC requirement, which indicates that the display screen 30 to be tested is a qualified product and meets the product requirement. In order to obtain the current consumption of the four voltages in the circuit, the test resistor module 101 for connecting the terminal test motherboard 20 and the display screen 30 to be tested is added between the terminal test motherboard and the display screen 30 to be tested in the embodiment, and the four voltages generate the first type of current data after passing through the test resistor module 101. The first type of current data may include four paths of current data, which are the first current data, the second current data, the third current data, and the fourth current data, respectively. Based on the above situation, the four paths of current data may be processed by the processing module 103 and then transmitted to the terminal test motherboard 20, and the terminal test motherboard 20 compares the four paths of current data with the pre-stored four paths of standard current data to determine whether the display screen 30 to be tested is qualified.
In this embodiment, the processing module 103 may be a microcontroller of the STM32 family, such as an STM32F103ZET6 control chip. In addition, when the STM32F103ZET6 control chip is used as the processing module 103 of the present embodiment, a peripheral circuit needs to be provided. Wherein the peripheral circuit may include a 12M crystal and a 32.768K crystal.
On the basis of the above embodiment, optionally, the test system 10 for circuit power consumption may further include: a first display screen connector and a second display screen connector; the first display screen connector is used for connecting the input end of the testing resistance module and the output end of the terminal testing mainboard, and the second display screen connector is used for connecting the output end of the testing resistance module and the input end of the display screen to be tested.
In this embodiment, referring to fig. 2, the first display screen connector may include an VDD3.1V voltage interface, a VBAT voltage interface, a VDD2.8V voltage interface, or a backlight circuit VLED voltage interface, and may further include a display screen control interface and a MIPI signal interface. The first display screen connector can be divided into two parts, one part is arranged at the output end of the terminal test main board 20, the other part is arranged at the input end of the test resistance module 101, corresponding connecting lines are connected between the two parts, and the terminal test main board 20 and the test resistance module 101 can be connected through the first display screen connector at the moment.
In this embodiment, referring to fig. 2, the second display screen connector may include an VDD3.1V voltage interface, a VBAT voltage interface, a VDD2.8V voltage interface, or a backlight circuit VLED voltage interface, and may further include a display screen control interface and a MIPI signal interface. The second display screen connector can be divided into two parts, one part is arranged at the output end of the test resistance module 101, the other part is arranged at the input end of the display screen 30 to be tested, and the display screen 30 to be tested and the test resistance module 101 can be connected through the second display screen connector at the moment. The terminal test main board 20, the test resistor module 101 and the display screen 30 to be tested can be connected based on the first display screen connector and the second display screen connector.
On the basis of the above embodiment, optionally, the test system 10 for circuit power consumption may further include: a serial-to-USB module 104 and a USB interface 105.
In this embodiment, referring to fig. 2, the second type of current data output by the processing module 103 is serial data, and a serial-to-USB module 104 and a USB interface 105 may be added between the terminal test motherboard 20 and the processing module 103 to facilitate transmitting the serial data to the terminal test motherboard 20. The second type current data can be converted from the serial data type to the USB data type by the serial-to-USB module, and then transmitted to the terminal test motherboard 20 through the USB interface 105. Optionally, the serial-to-USB module 104 may employ a CH340G serial-to-USB conversion chip. The processing module 103 outputs second current data, and a serial port transmission mode is transmitted to the serial port to USB module 104, the serial port to USB module 104 converts the second current data in a serial port data form into corresponding USB signals, and then transmits the corresponding USB signals to the terminal test mainboard 20 through a USB cable, the terminal test mainboard 20 can compare the obtained four paths of current data with four paths of standard data pre-stored in the system, if the current data exceed the pre-stored data, the condition of the current data with power consumption problems can be displayed on the screen of the display screen 30 to be tested, and if the power consumption of the four paths of current data is within the pre-stored data value, the display screen will display that the power consumption is normal.
On the basis of the above embodiment, optionally, the test system 10 for circuit power consumption may further include: and testing the system end power supply module. The test system-side power supply module may be connected to the processing module 103 and the current detection module 102, and configured to provide an adapted voltage to the processing module 103 and the current detection module 102, so that the processing module 103 and the current detection module 102 operate normally.
EXAMPLE III
Fig. 3 is a schematic structural diagram of a circuit power consumption testing system according to a third embodiment of the present invention, which is optimized based on the third embodiment of the present invention, as shown in fig. 3, the circuit power consumption testing system 10 may include the test resistor module 101, the current detection module 102, and the processing module 103 in the above embodiments, and may further include the first type switch module 106; wherein,
the first switch module 106 is connected to the output end of the test resistor module 101 and the input end of the display screen 30 to be tested, and is configured to cut off a power supply circuit between the terminal test motherboard 20 and the display screen 30 to be tested when the test on the display screen 30 to be tested is completed.
In the present embodiment, four power sources of the display screen 30 to be tested are provided by the terminal test motherboard 20. Because the time for turning on and off the terminal test motherboard 20 is too long, in the test process of the display screen 30 to be tested, in order to improve the production efficiency, the terminal test motherboard 20 is turned off when each display screen 30 to be tested cannot be tested, and then the terminal test motherboard 20 is turned on after a new display screen 30 to be tested is replaced, so that the production efficiency is very low. In addition, after each display screen 30 to be tested is tested, if the terminal test main board 20 is not turned off, the four power supplies provided for the display screen 30 to be tested cannot be disconnected, and the display screen 30 to be tested is plugged and pulled out without turning off the power supplies (in a charged state), so that the display screen 30 to be tested has a risk of burning out. To solve this problem, the present embodiment adds a first type switch module 106 to the circuit power consumption test system 10. After each display screen 30 to be tested is tested, the power supply circuit between the terminal test main board 20 and the display screen 30 to be tested is cut off through the first switch module 106, at this time, the display screen 30 to be tested is in an uncharged state, and the terminal test main board 20 does not need to be shut down.
On the basis of the above embodiments, optionally, the first type switch module 106 may include: a mechanical switching circuit 1060, a first switching circuit 1061, a second switching circuit 1062, a third switching circuit 1063, and a fourth switching circuit 1064.
In this embodiment, referring to fig. 3, the mechanical switch circuit 1060 is connected to the first switch circuit 1061, the second switch circuit 1062, the third switch circuit 1063, and the fourth switch circuit 1064, respectively, for generating a low-level signal and outputting the low-level signal to the first switch circuit 1061, the second switch circuit 1062, the third switch circuit 1063, and the fourth switch circuit 1064. Specifically, the mechanical switch circuit 1060 may receive an action command issued by a user, and when the user closes a mechanical switch of the mechanical switch circuit 1060, the mechanical switch circuit 1060 may generate a low-level signal; when the user opens the mechanical switch of the mechanical switching circuit 1060, the mechanical switching circuit 1060 may be caused to generate a high level signal. The mechanical switch circuit 1060 may then simultaneously transmit the generated high-level signal or low-level signal from the output terminal of the mechanical switch circuit 1060 to the third terminal of the first switch circuit 1061, the third terminal of the second switch circuit 1062, the third terminal of the third switch circuit 1063, and the third terminal of the fourth switch circuit 1064.
In this embodiment, referring to fig. 3, the first switch circuit 1061 is configured to switch off the first voltage supply circuit between the first voltage output terminal of the terminal test motherboard 20 and the first voltage input terminal of the display screen 30 to be tested according to the low level signal. Specifically, the third terminal of the first switch circuit 1061 may receive a low level signal or a high level signal sent by the mechanical switch circuit 1060, and when the third terminal of the first switch circuit 1061 receives the low level signal, the first voltage supply circuit between the first voltage output terminal of the terminal test motherboard 20, the first switch circuit 1061, and the first voltage input terminal of the display screen 30 to be tested is cut off, and no power is supplied to the display screen 30 to be tested any more; when the third terminal of the first switch circuit 1061 receives the high level signal, the first voltage supply circuit between the first voltage output terminal of the terminal test motherboard 20, the first switch circuit 1061 and the first voltage input terminal of the display screen 30 to be tested is restored and maintained. The second switch circuit 1062 is configured to switch off the second voltage supply circuit between the second voltage output end of the terminal test motherboard 20 and the second voltage input end of the display screen 30 to be tested according to the low level signal. Specifically, the third terminal of the second switch circuit 1062 may receive a low level signal or a high level signal sent by the mechanical switch circuit 1060, and when the third terminal of the second switch circuit 1062 receives the low level signal, the second voltage supply circuit between the second voltage output terminal 201b of the terminal test motherboard 20, the second switch circuit 1062, and the second voltage input terminal 301b of the display screen 30 to be tested is cut off, and no power is supplied to the display screen 30 to be tested any more; when the third terminal of the second switch circuit 1062 receives the high level signal, the second voltage supply circuit between the second voltage output terminal of the terminal test motherboard 20, the second switch circuit 1062 and the first voltage input terminal of the display screen 30 to be tested is restored and maintained. The third switch circuit 1063 is configured to switch off the third voltage supply circuit between the third voltage output end of the terminal test motherboard 20 and the third voltage input end of the display screen 30 to be tested according to the low level signal. Specifically, the third terminal of the third switch circuit 1063 may receive a low level signal or a high level signal sent by the mechanical switch circuit 1060, and when the third terminal of the third switch circuit 1063 receives the low level signal, the third voltage supply circuit between the third voltage output terminal of the terminal test motherboard 20, the third switch circuit 1063, and the third voltage input terminal of the display screen 30 to be tested is cut off, and no power is supplied to the display screen 30 to be tested any more; when the third terminal 1063c of the third switch circuit 1063 receives the high level signal, the third voltage supply circuit between the third voltage output terminal of the terminal test motherboard 20, the third switch circuit 1063 and the third voltage input terminal of the display screen 30 to be tested is restored and maintained. And the fourth switch circuit 1063 is configured to switch off the fourth voltage supply circuit between the fourth voltage output end of the terminal test motherboard 20 and the fourth voltage input end of the display screen 30 to be tested according to the low level signal. Specifically, the third end of the fourth switch circuit 1064 may receive a low level signal or a high level signal sent by the mechanical switch circuit 1060, and when the third end of the fourth switch circuit 1064 receives the low level signal, the fourth voltage supply circuit between the fourth voltage output end of the terminal test motherboard 20, the fourth switch circuit 1064, and the fourth voltage input end of the display screen 30 to be tested is cut off, and no power is supplied to the display screen 30 to be tested any more; when the third terminal of the fourth switch circuit 1064 receives the high level signal, the fourth voltage supply circuit between the fourth voltage output terminal of the terminal test motherboard 20, the fourth switch circuit 1064 and the fourth voltage input terminal of the display screen 30 to be tested is recovered and maintained.
On the basis of the above embodiment, optionally, the first type switch module 106 may further include: a first discharge circuit 1065 matched with the first switch circuit 1061, a second discharge circuit 1066 matched with the second switch circuit 1062, a third discharge circuit 1067 matched with the third switch circuit 1063, and a fourth discharge circuit 1068 matched with the fourth switch circuit 1064.
In this embodiment, fig. 4 is a schematic circuit diagram of a first type of switch module in a test system of circuit power consumption provided by the third embodiment of the present invention. Referring to fig. 4, the mechanical switch circuit 1060 may include a mechanical switch J3 and a resistor R11, and an output terminal of the mechanical switch circuit 1060 may be simultaneously connected to a third terminal of the first switch circuit 1061, a third terminal of the second switch circuit 1062, a third terminal of the third switch circuit 1063, and a third terminal of the fourth switch circuit 1064. The mechanical switch 1060 may simultaneously transmit a low level signal for cutting off the power supply circuit between the terminal test main board 20 and the display screen 30 to be tested to the first switch circuit 1061, the second switch circuit 1062, the third switch circuit 1063, and the fourth switch circuit 1064.
In this embodiment, referring to fig. 3 and 4, the first switch circuit 1061, the second switch circuit 1062, the third switch circuit 1063, and the fourth switch circuit 1064 respectively control whether to transmit the first voltage, the second voltage, the third voltage, and the fourth voltage output by the terminal test main board 20 to the display screen 30 to be tested. It should be noted that the terminal test main board 20 may output VDD3.1V voltage, VBAT voltage, VDD2.8V voltage and the backlight circuit VLED voltage, but which of the four voltages is transmitted through the first switch circuit 1061, the second switch circuit 1062, the third switch circuit 1063 and the fourth switch circuit 1064 may be determined according to actual situations.
In this embodiment, referring to fig. 4, since the components and the operation principle used by the first switch circuit 1061, the second switch circuit 1062, the third switch circuit 1063 and the fourth switch circuit 1064 are the same in this embodiment, the first switch circuit 1061 is taken as an example to explain the operation principle of the first switch circuit 1061 in this embodiment. The method comprises the following steps: assuming that the first switch circuit 1061 inputs the VBAT voltage (i.e., the first terminal PI-IN of the first switch circuit 1061 inputs the VBAT voltage), when the mechanical switch J3 IN the mechanical switch circuit 1060 is IN a conducting state, the signal at the output terminal P0 of the mechanical switch circuit 1060 is pulled to a low level, so that the mechanical switch circuit 1060 generates a low level signal. Since the output terminal of the mechanical switch circuit 1060 is connected to the third terminal of the first switch circuit 1061 (i.e., the P0 of the first switch circuit 1061 is connected to the P0 of the mechanical switch circuit), the base of the transistor Q1 in the first switch circuit 1061 receives a low level signal, so that the transistor Q1 is in an open state, at this time, the gate of the MOS transistor T1 and the base of the transistor Q4 are pulled up to the VBAT voltage through the resistor R9 of 100K, thereby controlling the source and the drain of the MOS transistor T1 to be in an off state, and thus the first switch circuit 1061 cuts off the supply circuit of the VBAT voltage between the terminal test main board 20 and the display screen 30 to be tested. Therefore, the test operation under the uncharged condition can be ensured only by pressing the mechanical switch J3 when the display screen 30 to be tested is replaced, and the display screen 30 to be tested is ensured not to be burnt out. On the contrary, when the mechanical switch circuit 1060 generates a high level signal, the source and the drain of the MOS transistor T1 can be controlled to be in a conducting state, and the VBAT voltage output by the terminal test main board 20 can be transmitted to the display screen 30 to be tested. The second switch circuit 1062, the third switch circuit 1063, and the fourth switch circuit 1064 operate on the same principle as the first switch circuit 1061. It should be noted that, in the first type of switch module in fig. 4, a mechanical switch circuit 1060, a first switch circuit 1061, a first discharge circuit 1065, a second switch circuit 1062, a second discharge circuit 1066, a third switch circuit 1063, a third discharge circuit 1067, a fourth switch circuit 1064, a fourth discharge circuit 1068, and a switch indication circuit 1069 are shown. In fig. 4, the P0 of the mechanical switch circuit 1060, the P0 of the first switch circuit 1061, the P0 of the second switch circuit 1062, the P0 of the third switch circuit 1063, and the P0 of the fourth switch circuit 1064 are connected as connection points between the respective circuits, and the connection relationships among the mechanical switch circuit 1060, the first switch circuit 1061, the second switch circuit 1062, the third switch circuit 1063, and the fourth switch circuit 1064 are shown.
In this embodiment, after the power supply circuit of the idea between the terminal test motherboard 20 and the display screen 30 to be tested is cut off by the first switch circuit 1061, the second switch circuit 1062, the third switch circuit 1063, and the fourth switch circuit 1064, a certain amount of charges still exist in the display screen 30 to be tested and peripheral circuits around the display screen 30 to be tested. In order to avoid the influence of the left charges on the test result and protect the display screen 30 to be tested, a discharge circuit may be added after the first switch circuit 1061, the second switch circuit 1062, the third switch circuit 1063 and the fourth switch circuit 1064, respectively. Optionally, the first type switch module 106 includes: a first discharge circuit 1065 matched with the first switch circuit 1061, a second discharge circuit 1066 matched with the second switch circuit 1062, a third discharge circuit 1067 matched with the third switch circuit 1063, and a fourth discharge circuit 1068 matched with the fourth switch circuit 1064. The 1k resistor can be connected to the ground through the first discharge circuit 1065, the second discharge circuit 1066, the third discharge circuit 1067 and the fourth discharge circuit 1068 for discharging, so that the second terminal P1-OUT of the first switch circuit 1061, the second terminal P2-OUT of the second switch circuit 1062, the second terminal P3-OUT of the third switch circuit 1063 and the second terminal P4-OUT of the fourth switch circuit 1064 are always at a low level. Just so guaranteed that just pressing mechanical switch J3 can operate under the uncharged condition when changing the display screen, guarantee that the display screen is not burnt out.
On the basis of the above embodiment, optionally, the first type switch module 106 further includes: a switch indication circuit 1069 matched to the mechanical switching circuit. Specifically, referring to fig. 4, an input terminal P0 of the switch indication circuit 1069 is connected to an output terminal P0 of the mechanical switch circuit 1060, and is used for prompting a user whether to cut off the power supply circuit between the terminal test main board 20 and the display screen 30 to be tested.
On the basis of the foregoing embodiment, optionally, because the first-type switch module 106 is added in this embodiment, the second display screen connector in the test system 10 for circuit power consumption may be disposed between the first-type switch module 106 and the display screen 30 to be tested, and is used to connect the output end of the first-type switch module 106 and the input end of the display screen 30 to be tested.
In this embodiment, referring to fig. 3, after the first type switch module 106 is added, the first display screen connector may connect the output end 201 of the terminal test main board 20 and the input end of the test resistor module 101, the output end of the test resistor module 101 is connected to the first end of the first type switch module 106, and the second end of the first type switch module 106 is connected to the input end 301 of the display screen 30 to be tested through the second display screen connector. The terminal test main board 20, the test resistor module 101, the first switch module 106 and the display screen 30 to be tested can be connected based on the first display screen connector and the second display screen connector.
On the basis of the above embodiment, referring to fig. 3, the test system 10 for circuit power consumption may further include: and a second type of switch module. The second type of switch module is a mechanical switch circuit, and is used for controlling the USB interface 105 to be turned on and off, so as to control data transmission.
It should be noted that the foregoing is only a preferred embodiment of the present invention and the technical principles applied. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail with reference to the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the scope of the present invention.
Claims (10)
1. A system for testing power consumption of a circuit, the system comprising: the device comprises a test resistance module, a current detection module and a processing module; wherein,
the input end of the test resistance module is connected with the output end of the terminal test mainboard, and the output end of the test resistance module is connected with the input end of the display screen to be tested; the test resistor module is used for transmitting the voltage output by the terminal test mainboard to the display screen to be tested;
the first end of the current detection module is connected with the input end of the test resistance module, the second end of the current detection module is connected with the output end of the test resistance module, and the third end of the current detection module is connected with the input end of the processing module; the current detection module is used for acquiring first-class current data passing through the test resistance module and outputting the first-class current data to the processing module;
the output end of the processing module is connected with the input end of the terminal test main board; the processing module is used for converting the first type of current data into second type of current data and outputting the second type of current data to the terminal test mainboard.
2. The system of claim 1, wherein the test resistance module comprises: the device comprises a first test resistor, a second test resistor, a third test resistor and a fourth test resistor; wherein,
the first test resistor is used for transmitting a first voltage output by a first voltage output end of the terminal test mainboard to a first voltage input end of the display screen to be tested;
the second test resistor is used for transmitting a second voltage output by a second voltage output end of the terminal test mainboard to a second voltage input end of the display screen to be tested;
the third test resistor is used for transmitting a third voltage output by a third voltage output end of the terminal test mainboard to a third voltage input end of the display screen to be tested;
and the fourth test resistor is used for transmitting a fourth voltage output by a fourth voltage output end of the terminal test mainboard to a fourth voltage input end of the display screen to be tested.
3. The system of claim 1, wherein the current detection module comprises: a first current detection unit, a second current detection unit, a third current detection unit and a fourth current detection unit; wherein,
the first current detection unit is used for acquiring first current data passing through the test resistor module and outputting the first current data to the processing module;
the second current detection unit is used for acquiring second current data passing through the test resistance module and outputting the second current data to the processing module;
the third current detection unit is used for acquiring third current data passing through the test resistance module and outputting the third current data to the processing module;
the fourth current detection unit is used for acquiring fourth current data passing through the test resistance module and outputting the fourth current data to the processing module;
the first type of current data includes first current data, second current data, third current data, and fourth current data.
4. The system of claim 3, wherein the first current detection unit, the second current detection unit, the third current detection unit and the fourth current detection unit all adopt an INA220 current detection chip; the first type of current data is I2C bus data.
5. The system of claim 1, wherein the processing module is a microcontroller of the STM32 family.
6. The system of claim 1, further comprising: a first display screen connector and a second display screen connector; wherein,
the first display screen connector is used for connecting the input end of the testing resistance module with the output end of the terminal testing mainboard, and the second display screen connector is used for connecting the output end of the testing resistance module with the input end of the display screen to be tested.
7. The system of claim 1, further comprising: a first type of switch module;
the first type switch module is respectively connected with the output end of the test resistance module and the input end of the display screen to be tested and is used for cutting off a power supply circuit between the terminal test mainboard and the display screen to be tested when the test of the display screen to be tested is completed.
8. The system of claim 7, wherein the first type of switch module comprises: the first switch circuit is connected with the first switch circuit and the second switch circuit; wherein,
the mechanical switch circuit is respectively connected with the first switch circuit, the second switch circuit, the third switch circuit and the fourth switch circuit, and is used for generating a low level signal and outputting the low level signal to the first switch circuit, the second switch circuit, the third switch circuit and the fourth switch circuit;
the first switch circuit is used for switching off a first voltage power supply circuit between a first voltage output end of the terminal test mainboard and a first voltage input end of the display screen to be tested according to the low level signal;
the second switch circuit is used for switching off a second voltage power supply circuit between a second voltage output end of the terminal test mainboard and a second voltage input end of the display screen to be tested according to the low level signal;
the third switch circuit is used for switching off a third voltage power supply circuit between a third voltage output end of the terminal test mainboard and a third voltage input end of the display screen to be tested according to the low level signal;
and the fourth switch circuit is used for cutting off a fourth voltage power supply circuit between a fourth voltage output end of the terminal test mainboard and a fourth voltage input end of the display screen to be tested according to the low level signal.
9. The system of claim 8, wherein the first type of switch module further comprises: and the switch indicating circuit is matched with the mechanical switch circuit.
10. The system of claim 8, wherein the first type of switch module further comprises: the first discharge circuit is matched with the first switch circuit, the second discharge circuit is matched with the second switch circuit, the third discharge circuit is matched with the third switch circuit, and the fourth discharge circuit is matched with the fourth switch circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820500383.2U CN208188289U (en) | 2018-04-08 | 2018-04-08 | A kind of test macro of circuit power consumption |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820500383.2U CN208188289U (en) | 2018-04-08 | 2018-04-08 | A kind of test macro of circuit power consumption |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208188289U true CN208188289U (en) | 2018-12-04 |
Family
ID=64436692
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820500383.2U Active CN208188289U (en) | 2018-04-08 | 2018-04-08 | A kind of test macro of circuit power consumption |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN208188289U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112379765A (en) * | 2020-11-12 | 2021-02-19 | 浪潮商用机器有限公司 | Circuit power consumption monitoring system, server and circuit power consumption monitoring method |
| CN114994402A (en) * | 2021-09-02 | 2022-09-02 | 北京荣耀终端有限公司 | Terminal module power consumption testing device, method and system |
-
2018
- 2018-04-08 CN CN201820500383.2U patent/CN208188289U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112379765A (en) * | 2020-11-12 | 2021-02-19 | 浪潮商用机器有限公司 | Circuit power consumption monitoring system, server and circuit power consumption monitoring method |
| CN114994402A (en) * | 2021-09-02 | 2022-09-02 | 北京荣耀终端有限公司 | Terminal module power consumption testing device, method and system |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN109031091B (en) | Interface test method, test system and test fixture | |
| US9560217B2 (en) | Adapters, terminal devices, USB connection devices and charging stations | |
| CN208188289U (en) | A kind of test macro of circuit power consumption | |
| US9979207B2 (en) | Transmission device and control method thereof | |
| CN113064052A (en) | Chip aging test circuit and chip aging test system | |
| CN104809088A (en) | Connecting device and control chip and control method thereof | |
| CN103107693A (en) | Testing power supply device | |
| CN114039400B (en) | Electronic equipment | |
| CN110659238A (en) | Data communication system | |
| CN110824337A (en) | Method and device for high-temperature test of SOC chip | |
| CN115525099B (en) | Terminal equipment and method for detecting keyboard access | |
| CN112948186B (en) | Detection device and detection method of interface signal | |
| CN214375036U (en) | Mobile device test system | |
| TWI418974B (en) | Dynamic adjustment circuit and computer system having the same | |
| CN103176100A (en) | Method and device for detecting whether storage battery is normally connected in UPS (uninterrupted power supply) or not | |
| CN106597085B (en) | Power consumption testing method, device and system | |
| CN109992551B (en) | USB C-type interface information reading method and information reading circuit | |
| CN103365735A (en) | Transmission interface and method for determining transmission signal | |
| CN104679123A (en) | Mainboard and data burning method thereof | |
| CN101241387A (en) | Direct-current power supply system and its sequence control device | |
| TW201644145A (en) | Mobile electronic device and control method of power supply thereof | |
| CN215005823U (en) | USB speed switching detection device | |
| CN217560794U (en) | Illuminance conventional test and point inspection calibration automatic switching device and test system | |
| CN110568341A (en) | System for automatically testing welding state of IO (input/output) interface function of PCBA (printed circuit board assembly) mainboard | |
| CN104991183B (en) | A kind of test method for JYJC monitoring unit cpu motherboards |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 518108 No. 39 Zhulongtian Road, Paddy Field Community, Shiyan Street, Baoan District, Shenzhen City, Guangdong Province Patentee after: Shenzhen Huiye Wulian Technology Co., Ltd. Address before: 518108 No. 39 Zhulongtian Road, Paddy Field Community, Shiyan Street, Baoan District, Shenzhen City, Guangdong Province Patentee before: Shenzhen Huiye Communications Technologies Co., Ltd. |
|
| CP01 | Change in the name or title of a patent holder | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20200201 Address after: 404100 no.6-4, Zongbao Avenue, Shapingba District, Chongqing Patentee after: Chongqing Huiye Communication Technology Co., Ltd Address before: 518108 Guangdong city of Shenzhen province Baoan District Shiyan Street Community wish Dragon Road No. 39 in paddy field Patentee before: Shenzhen Huiye Wulian Technology Co., Ltd. |
|
| TR01 | Transfer of patent right | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 404100 no.6-4, Zongbao Avenue, Shapingba District, Chongqing Patentee after: Chongqing Huiye IOT Technology Co.,Ltd. Address before: 404100 no.6-4, Zongbao Avenue, Shapingba District, Chongqing Patentee before: Chongqing Huiye Communication Technology Co.,Ltd. |
|
| CP01 | Change in the name or title of a patent holder |