CN110310586B - Hardware debugging method of TCONLESS board - Google Patents
Hardware debugging method of TCONLESS board Download PDFInfo
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- CN110310586B CN110310586B CN201910471050.0A CN201910471050A CN110310586B CN 110310586 B CN110310586 B CN 110310586B CN 201910471050 A CN201910471050 A CN 201910471050A CN 110310586 B CN110310586 B CN 110310586B
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Abstract
The invention provides a hardware debugging method of a TCONLESS board, wherein the hardware debugging method is applied to a liquid crystal screen, and the liquid crystal screen comprises the TCONLESS board and a driving board; the hardware debugging method comprises the steps of providing a debugging list, setting a debugging step in the debugging list, and debugging the TCONLESS board according to the debugging step. The invention has the beneficial effects that: the debugging list can enable an operator to debug the TCONLESS board according to debugging steps, so that the performance problem of the TCONLESS board can be checked at one time, the problem can be quickly positioned, repeated debugging is avoided, the resource and time cost is reduced, and the development progress is accelerated.
Description
Technical Field
The invention relates to the technical field of liquid crystal display testing, in particular to a hardware debugging method of a TCONLESS board.
Background
With the development of science and technology and economy, a liquid crystal television comprising a 4K_Tconless liquid crystal screen is provided; wherein, tconless panel (less logic control on the panel) liquid crystal screen is to remove the traditional TCON (Timing controller) module, which can reduce the production cost of the display screen. However, due to the difference of LCD screen control technologies of LCD TVs of various manufacturers, power supplies and control signals required by the 4K _TconlessLCD screen of each manufacturer are different, so that the debugging standards of the 4K _TconlessLCD screen of each manufacturer are also different, which brings great difficulty to the debugging and production of the 4K _TconlessLCD screen.
In the prior art, each manufacturer carries out different debugging schemes for the mainboard of each 4k _Tconlessliquid crystal screen, one-to-one debugging is needed, each 4k _Tconlessliquid crystal screen cannot be used universally, namely, unified debugging standards and procedures are not designed, the debugging and maintenance of the liquid crystal screen are difficult, and the debugging difficulty and the debugging time are increased.
Disclosure of Invention
In view of the above problems in the prior art, a hardware debugging method for a TCONLESS board is provided to avoid repeated debugging, thereby reducing resource and time costs and accelerating development progress.
The specific technical scheme is as follows:
a hardware debugging method of a TCONLESS board is applied to a liquid crystal screen, wherein the liquid crystal screen comprises the TCONLESS board and a driving board;
the hardware debugging method comprises the steps of providing a debugging list, setting a debugging step in the debugging list, and debugging the TCONLESS board according to the debugging step.
Preferably, the hardware debugging method includes the following steps:
step S1, sequentially detecting the voltage of each voltage source on the TCONLESS plate so as to check the short circuit condition of each voltage source;
s2, disconnecting the connection between the TCONLESS board and the driving board;
step S3, starting a power supply on the TCONLESS board;
s4, debugging power supply hardware parameters of a power supply management unit corresponding to each signal voltage on the TCONLESS board according to the signal voltages corresponding to different interfaces of the liquid crystal screen; and/or
Debugging the gamma power supply voltage corresponding to each gamma value on the TCONLESS board according to different gamma values of the liquid crystal screen; and/or
Debugging the main board power supply voltage corresponding to each main board hardware parameter on the TCONLESS board according to different main board hardware parameters of the TCONLESS board;
step S5, correcting each line scanning signal on the TCONLESS plate in sequence;
s6, connecting a connecting line between the TCONLESS board and the driving board;
s7, adjusting point-to-point signals of the TCONLESS board to enable the liquid crystal screen to normally display;
and S8, sequentially correcting parameters of each voltage source on the TCONLESS board and in each display mode of the liquid crystal screen.
Preferably, the hardware debugging method, wherein the step S4 specifically includes:
s41, detecting each power supply hardware parameter on the TCONLESS board, and comparing each power supply hardware parameter with a standard power supply hardware parameter to check inaccurate power supply hardware parameters; and/or
Detecting each gamma supply voltage on the TCONLESS board and comparing each gamma supply voltage with a standard gamma supply voltage to troubleshoot inaccurate gamma supply voltages; and/or
Detecting the power supply voltage of each mainboard on the TCONLESS board, and comparing the power supply voltage of each mainboard with the power supply voltage of a standard mainboard to check inaccurate power supply voltage of the mainboard;
s42, sequentially debugging to obtain each power supply hardware parameter and/or each gamma power supply voltage and/or each main board power supply voltage;
step S43, burning each power supply hardware parameter and/or each gamma power supply voltage and/or each main board power supply voltage obtained by debugging into a TCONLESS board;
step S44, powering off the TCONLESS board and restarting the TCONLESS board;
and S45, sequentially detecting each power supply hardware parameter and/or each gamma power supply voltage and/or each main board power supply voltage on the TCONLESS board so as to check unstable power supply hardware parameters and/or gamma power supply voltages and/or main board power supply voltages.
Preferably, the hardware debugging method is that the TCONLESS board is provided with a system-on-chip;
step S5 specifically includes:
step S51, starting the system-on-chip, and outputting a point-to-point signal of the mode screen by the system-on-chip;
step S52, each line scanning signal on the TCONLESS plate is corrected in turn according to the standard parameters.
Preferably, the hardware debugging method, wherein the line scan signal includes a level input signal and a level output signal.
Preferably, the hardware debugging method, wherein the point-to-point signal includes a data mapping signal and a control signal.
Preferably, the hardware debugging method is implemented, wherein the parameters of the voltage source in step S8 include ripple parameters and current parameters.
Preferably, the hardware debugging method further includes:
s9, correcting a first signal parameter of a point-to-point signal of a TCONLESS board in a high-speed oscilloscope connected with a liquid crystal screen;
wherein the first signal parameters of the point-to-point signal comprise amplitude and frequency.
Preferably, the hardware debugging method includes:
step S10, correcting a second signal parameter of a point-to-point signal of a TCONLESS plate of the liquid crystal display under electromagnetic compatibility;
wherein the second signal parameter comprises an amplitude.
The technical scheme has the following advantages or beneficial effects: the debugging list can enable an operator to debug the TCONLESS board according to debugging steps, so that the performance problem of the TCONLESS board can be checked at one time, the problem can be quickly positioned, repeated debugging is avoided, the resource and time cost is reduced, and the development progress is accelerated.
Drawings
Embodiments of the present invention will now be described more fully hereinafter with reference to the accompanying drawings. The drawings are, however, to be regarded as illustrative and explanatory only and are not restrictive of the scope of the invention.
FIG. 1 is a flow chart of a hardware debugging method according to an embodiment of the present invention;
FIG. 2 is a flowchart of step S4 of the hardware debugging method according to the embodiment of the present invention;
fig. 3 is a flowchart of step S5 of the hardware debugging method according to the embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that the embodiments and features of the embodiments may be combined with each other without conflict.
The invention is further described with reference to the following drawings and specific examples, which are not intended to be limiting.
The invention comprises a hardware debugging method of a TCONLESS board, which is applied to a liquid crystal screen, wherein the liquid crystal screen comprises the TCONLESS board and a driving board;
the hardware debugging method comprises the steps of providing a debugging list, setting a debugging step in the debugging list, and debugging the TCONLESS board according to the debugging step.
In the above embodiment, the TCONLESS board can be debugged according to the debugging steps through the debugging list, so that the performance problem of the TCONLESS board can be checked at one time, the problem can be quickly located, repeated debugging is avoided, the resource cost and the time cost are reduced, and the development progress is accelerated.
In the above embodiment, only a common operator is needed to debug the TCONLESS board according to the debugging list, so that a special debugging engineer is not needed to debug the TCONLESS board, and the labor cost is reduced.
Further, as a preferred embodiment, the debugging list may be a spreadsheet, such as an Excel table.
Further, in the above embodiment, as shown in fig. 1, the debugging method includes the following steps:
step S1, sequentially detecting the voltage of each voltage source on the TCONLESS plate to check the short circuit condition of each voltage source;
s2, disconnecting the TCONLESS board from the driving board (gate & source board);
step S3, starting a power supply on the TCONLESS board;
when step S3 is executed, it is necessary to determine whether the power supply on the TCONLESS board can be normally started, so as to avoid a test error caused by no power supply being started during testing, thereby reducing the debugging time.
S4, debugging power hardware parameters of a power management unit corresponding to each signal voltage on the TCONLESS board according to the signal voltages corresponding to different interfaces of the liquid crystal screen; and/or
Debugging the gamma power supply voltage corresponding to each gamma value on the TCONLESS board according to different gamma values of the liquid crystal screen; and/or
Debugging the main board power supply voltage corresponding to each main board hardware parameter on the TCONLESS board according to different main board hardware parameters of the TCONLESS board;
s5, sequentially correcting each line scanning signal on the TCONLESS plate;
s6, connecting a connecting line between the TCONLESS board and the driving board;
s7, adjusting point-to-point signals (P2P) of the TCONLESS board to enable the liquid crystal screen to normally display;
and S8, sequentially correcting the association on the TCONLESS board and the parameter of each voltage source in each display mode of the liquid crystal screen.
It should be noted that, before debugging the TCONLESS board, the connection between the TCONLESS board and the driver board needs to be disconnected, so as to avoid the driver board from being burned out, and further reduce the debugging cost.
The debugging of the TCONLESS board mainly refers to the calibration of each voltage on the TCONLESS board.
Further, as a preferred embodiment, the connection between the TCONLESS board and the driving board may be disconnected by disconnecting two FPC (Flexible Printed Circuit) screen lines in step S2.
Further, in the above embodiment, the screen specification is provided with a standard parameter corresponding to each debugging item in each debugging step.
Further, in the foregoing embodiment, as shown in fig. 2, step S4 specifically includes:
s41, detecting each power supply hardware parameter on the TCONLESS board, and comparing each power supply hardware parameter with a standard power supply hardware parameter to check inaccurate power supply hardware parameters; and/or
Detecting each gamma supply voltage on the TCONLESS board and comparing each gamma supply voltage with a standard gamma supply voltage to troubleshoot inaccurate gamma supply voltages; and/or
Detecting the power supply voltage of each mainboard on the TCONLESS board, and comparing the power supply voltage of each mainboard with the power supply voltage of a standard mainboard to check inaccurate power supply voltage of the mainboard;
wherein, through the aforesaid comparison to carry out a holistic investigation to TCONLESS board, thereby make operating personnel can know the whole condition of TCONLESS board, and then make things convenient for subsequent accurate debugging, and improve the debugging precision.
S42, sequentially debugging to obtain each power supply hardware parameter and/or each gamma power supply voltage and/or each main board power supply voltage;
step S43, burning each power supply hardware parameter and/or each gamma power supply voltage and/or each main board power supply voltage obtained by debugging into a TCONLESS board;
step S44, powering off the TCONLESS board and restarting the TCONLESS board;
and S45, sequentially detecting each power supply hardware parameter and/or each gamma power supply voltage and/or each main board power supply voltage on the TCONLESS board so as to check unstable power supply hardware parameters and/or gamma power supply voltages and/or main board power supply voltages.
The accuracy of the debugging is improved by the detection again in step S45.
Further, as a preferred embodiment, in step S42, each power hardware parameter and/or each gamma supply voltage and/or each motherboard supply voltage may be obtained through I2C command or Tool debugging in turn.
Further, as a preferred embodiment, in step S43, not only each power hardware parameter and/or each gamma supply voltage and/or each motherboard supply voltage obtained by debugging is burned into the TCONLESS board, but also a command for debugging I2C or a debugging code (code) of the TOOL can be saved.
Further, in the above embodiment, the TCONLESS board is provided with a system on chip;
as shown in fig. 3, step S5 specifically includes:
step S51, starting the system-on-chip, and outputting a point-to-point signal of the mode screen by the system-on-chip;
step S52, each line scanning signal on the TCONLESS plate is corrected in turn according to the standard parameters.
In step S51, it is necessary to confirm whether the system on chip can be normally started.
Further, in the above-described embodiment, the line scanning signal includes a level (levelshift) input signal and a level output signal.
Further, as a preferred embodiment, the line scan signal may be a Gate Driver on Array (GOA) drive signal;
step S52 may include the steps of:
step S521, welding to obtain each GOA-gate driving signal on the TCONLESS plate;
in step S522, the driving signal timing, the level input signal, and the level output signal in each line scanning signal on the TCONLESS board are sequentially corrected according to the standard parameters.
Further, in the above-described embodiment, the point-to-point signal includes a data map signal (datamap) and a control signal (control setting).
Further, as a preferred embodiment, the liquid crystal panel is lighted by adjusting the data mapping signal and the control signal in the point-to-point signal of the TCONLESS board, and after the liquid crystal panel is lighted, the power-on time and the power-off time of each corresponding voltage source can be corrected according to the standard power-on time and the standard power-off time of each voltage source, so that the liquid crystal panel can be normally displayed in each display mode associated with the liquid crystal panel.
Further, in the above-described embodiment, the parameters of the voltage source in step S8 include the ripple parameter and the current parameter.
Further, in the foregoing embodiment, as shown in fig. 1, the debugging method further includes:
s9, correcting a first signal parameter of a point-to-point signal of a TCONLESS board in a high-speed oscilloscope connected with a liquid crystal screen;
the first signal parameters of the point-to-point signal include amplitude and frequency.
Further, in the above embodiment, as shown in fig. 1, the debugging method includes:
step S10, correcting a second signal parameter of a point-to-point signal of a TCONLESS board of a liquid crystal screen under electromagnetic compatibility (EMC);
the second signal parameter comprises an amplitude, wherein the amplitude may be a spread spectrum amplitude.
While the invention has been described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes in form and detail may be made therein without departing from the spirit and scope of the invention.
Claims (7)
1. A hardware debugging method of a TCONLESS board is characterized by being applied to a liquid crystal screen, wherein the liquid crystal screen comprises the TCONLESS board and a driving board;
the hardware debugging method comprises the steps of providing a debugging list, wherein the debugging list is provided with a debugging step, and the TCONLESS board is debugged according to the debugging step;
the debugging method comprises the following steps:
step S1, sequentially detecting the voltage of each voltage source on the TCONLESS plate so as to check the short circuit condition of each voltage source;
step S2, disconnecting the TCONLESS board from the driving board;
step S3, starting a power supply on the TCONLESS board;
s4, debugging power supply hardware parameters of a power supply management unit corresponding to each signal voltage on the TCONLESS board according to the signal voltages corresponding to different interfaces of the liquid crystal screen; and/or
Debugging the gamma power supply voltage corresponding to each gamma value on the TCONLESS board according to different gamma values of the liquid crystal screen; and/or
Debugging the main board power supply voltage corresponding to each main board hardware parameter on the TCONLESS board according to different main board hardware parameters of the TCONLESS board;
s5, sequentially correcting each line scanning signal on the TCONLESS plate;
step S6, connecting a connecting line between the TCONLESS board and the driving board;
s7, adjusting the point-to-point signal of the TCONLESS board to enable the liquid crystal screen to normally display;
step S8, sequentially correcting the correlation on the TCONLESS board and the parameter of each voltage source in each display mode of the liquid crystal screen;
the TCONLESS board is provided with a system-on-chip;
the step S5 specifically includes:
step S51, starting the system-on-chip, wherein the system-on-chip outputs a point-to-point signal of a mode screen;
and S52, sequentially correcting each line scanning signal on the TCONLESS plate according to standard parameters.
2. The hardware debugging method of claim 1, wherein the step S4 specifically comprises:
step S41, detecting each power supply hardware parameter on the TCONLESS board, and comparing each power supply hardware parameter with a standard power supply hardware parameter to check the inaccurate power supply hardware parameter; and/or
Detecting each gamma supply voltage on the TCONLESS board and comparing each gamma supply voltage with a standard gamma supply voltage to troubleshoot inaccurate gamma supply voltages; and/or
Detecting the power supply voltage of each main board on the TCONLESS board, and comparing the power supply voltage of each main board with the power supply voltage of a standard main board to check inaccurate power supply voltage of the main board;
step S42, sequentially debugging to obtain each power supply hardware parameter and/or each gamma power supply voltage and/or each mainboard power supply voltage;
step S43, burning each power supply hardware parameter and/or each gamma power supply voltage and/or each main board power supply voltage obtained by debugging into the TCONLESS board;
step S44, the TCONLESS board is powered off and restarted;
step S45, sequentially detecting each power hardware parameter and/or each gamma power supply voltage and/or each motherboard power supply voltage on the TCONLESS board to investigate the unstable power hardware parameter and/or gamma power supply voltage and/or motherboard power supply voltage.
3. The hardware debugging method of claim 1, wherein the line scan signals comprise level input signals and level output signals.
4. The hardware debugging method of claim 1, wherein the point-to-point signals comprise data mapping signals and control signals.
5. The hardware debugging method of claim 1, wherein the parameters of the voltage source in the step S8 comprise ripple parameters and current parameters.
6. The hardware debugging method of claim 1, wherein the debugging method further comprises:
s9, correcting a first signal parameter of a point-to-point signal of the TCONLESS board in a high-speed oscilloscope connected with the liquid crystal screen;
wherein the first signal parameters of the point-to-point signal include amplitude and frequency.
7. The hardware debugging method of claim 6, wherein the debugging method comprises:
step S10, correcting a second signal parameter of a point-to-point signal of the TCONLESS plate of the liquid crystal screen under electromagnetic compatibility;
wherein the second signal parameter comprises an amplitude.
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| WO2021082302A1 (en) * | 2019-10-28 | 2021-05-06 | 海信视像科技股份有限公司 | Test device and test method |
| CN112750389A (en) * | 2019-10-31 | 2021-05-04 | 海信视像科技股份有限公司 | Testing device |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101783125A (en) * | 2010-03-04 | 2010-07-21 | 青岛海信电器股份有限公司 | Reference voltage adjusting device, method thereof and liquid crystal display |
| CN104064134A (en) * | 2014-05-30 | 2014-09-24 | 深圳市显创光电有限公司 | Effect debugging method for display screen |
| CN104361871A (en) * | 2014-11-07 | 2015-02-18 | 硅谷数模半导体（北京）有限公司 | Display screen debugging method, device and system |
| CN106228939A (en) * | 2016-07-29 | 2016-12-14 | 乐视控股（北京）有限公司 | LCD TV driving method, device and LCD TV drive circuit board |
| CN106611583A (en) * | 2017-02-24 | 2017-05-03 | 京东方科技集团股份有限公司 | Gamma voltage debugging method and device of electroluminescent display device |
| CN106710496A (en) * | 2017-01-18 | 2017-05-24 | 深圳市视显光电技术有限公司 | Device and method for online debugging of parameters of LCD logic board |
| CN106875905A (en) * | 2017-01-04 | 2017-06-20 | 京东方科技集团股份有限公司 | A kind of driving method of display panel, drive circuit and display device |
| CN206879010U (en) * | 2017-06-28 | 2018-01-12 | 四川长虹电器股份有限公司 | The universe point screen device of LCD TV TCONLESS plates |
| CN208045075U (en) * | 2018-03-31 | 2018-11-02 | 靖江天元爱尔瑞电子科技有限公司 | A kind of film liquid crystal display drive control circuit plate |
| CN109507563A (en) * | 2018-11-12 | 2019-03-22 | 晶晨半导体(上海)股份有限公司 | Mainboard detection method and system |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200819971A (en) * | 2006-10-27 | 2008-05-01 | Inventec Corp | Debugging method for a motherboard |
| KR101322119B1 (en) * | 2008-12-15 | 2013-10-25 | 엘지디스플레이 주식회사 | Liquid crystal display |
| CN105719587B (en) * | 2016-04-19 | 2019-03-12 | 深圳市华星光电技术有限公司 | Liquid crystal display panel detection system and method |
-
2019
- 2019-05-31 CN CN201910471050.0A patent/CN110310586B/en active Active
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101783125A (en) * | 2010-03-04 | 2010-07-21 | 青岛海信电器股份有限公司 | Reference voltage adjusting device, method thereof and liquid crystal display |
| CN104064134A (en) * | 2014-05-30 | 2014-09-24 | 深圳市显创光电有限公司 | Effect debugging method for display screen |
| CN104361871A (en) * | 2014-11-07 | 2015-02-18 | 硅谷数模半导体（北京）有限公司 | Display screen debugging method, device and system |
| CN106228939A (en) * | 2016-07-29 | 2016-12-14 | 乐视控股（北京）有限公司 | LCD TV driving method, device and LCD TV drive circuit board |
| CN106875905A (en) * | 2017-01-04 | 2017-06-20 | 京东方科技集团股份有限公司 | A kind of driving method of display panel, drive circuit and display device |
| CN106710496A (en) * | 2017-01-18 | 2017-05-24 | 深圳市视显光电技术有限公司 | Device and method for online debugging of parameters of LCD logic board |
| CN106611583A (en) * | 2017-02-24 | 2017-05-03 | 京东方科技集团股份有限公司 | Gamma voltage debugging method and device of electroluminescent display device |
| CN206879010U (en) * | 2017-06-28 | 2018-01-12 | 四川长虹电器股份有限公司 | The universe point screen device of LCD TV TCONLESS plates |
| CN208045075U (en) * | 2018-03-31 | 2018-11-02 | 靖江天元爱尔瑞电子科技有限公司 | A kind of film liquid crystal display drive control circuit plate |
| CN109507563A (en) * | 2018-11-12 | 2019-03-22 | 晶晨半导体(上海)股份有限公司 | Mainboard detection method and system |
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