CN2938129Y - Tin interconnection detection circuit, open-circuit detection circuit and welding quiality detection circuit - Google Patents
Tin interconnection detection circuit, open-circuit detection circuit and welding quiality detection circuit Download PDFInfo
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- CN2938129Y CN2938129Y CN 200620131215 CN200620131215U CN2938129Y CN 2938129 Y CN2938129 Y CN 2938129Y CN 200620131215 CN200620131215 CN 200620131215 CN 200620131215 U CN200620131215 U CN 200620131215U CN 2938129 Y CN2938129 Y CN 2938129Y
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Abstract
The utility model provides a detection circuit for continuous tin electrodeposits detection, incomplete circuit detection and welding quality detection. Compared to circuits which only have a connector assembly and join circuit, a simple circuit composed of electronic components is adopted to add voltage of different electric potential through the adjacent pins of the connector on the detected circuit board; and an indicator light is used to indicate whether the electric potential is the same or not between adjacent pins. In this way incomplete circuit detection and welding quality detection are conducted, reaching the purpose of continuous tin electrodeposits detection. Compared with the prior art, the utility model uses special detecting instrument to conduct welding quality detection, thereby greatly reducing detection cost. Furthuremore when the utility model is applied to detect a circuit board which is only provided with a connector assembly and join circuit, placement of the circuit board is not limited to the working environment, so electrification waiting is avoided, thus shortening detection time and improving detection efficiency and no harm is caused to the working environment.
Description
Technical field
The utility model relates to the detection technique field of circuit board welding technology quality, be meant especially to the connector on the circuit that has only connector and connection line detect a kind ofly connect the tin testing circuit, to a kind of open detection circuit and a kind of welding quality testing circuit of this circuit board.
Background technology
At present, to the detection of circuit board soldering tin processing quality, adopt special-purpose instrument and equipment and environment to realize usually.Implementation method has multiple, for example: adopt automatic X-ray check (AXI) technology or automatic checkout equipment (ATE) or wireline inspection (ICT) checkout equipment to the welding quality detect.
Above-mentioned several detection method has his own strong points to the detection of different defectives, often is used in process of production, complements each other.These detection meanss are used for the veneer intensive to components and parts, that circuit is complicated and carry out technology and detect advantageous, but for the ball bearing made using plate that has only some sockets and connection line, use in above these means of testing one or more to come whether to exist between the pin of the connector on the testing circuit plate to connect tin, whether circuit board opens a way, obviously cost too high, also have the low problem of relative efficiency, even have certain hidden danger.
Specifically for instance, just there are some problems in above-mentioned detection method for the card extender shown in Fig. 3 a, the 3b.Shown in Fig. 3 a, have only J1, J2, four sockets of J3, J4 on this card extender, wherein socket J1 is connected with socket J3, and socket J2 is connected with socket J4, shown in Fig. 3 b.Here the function of card extender mainly is by socket J1 and J3, and socket J2 and J4 form two data and signalling channel, play the interface conversion effect.Whether can this card extender operate as normal depend on to exist between the socket pin of this card extender and connect tin and whether the connector two ends exist open circuit, yet with three kinds of above detection meanss detect such one simple in structure, device rareness, but fine and closely woven and various card extender some problems below concrete existence of pin:
At first, the principle of AXI technology and the problem of existence are described:
The AXI technology is a kind of technology detection means commonly used in the electronic product process, as shown in Figure 1, its principle is the characteristics strong to the receptivity of X ray according to heavy metal lead, utilize radioscopy to make plate, separate into picture, use various algorithms to check gray scale, the change of shape of solder joint image, judge the defective of solder joint, for example scolding tin is not enough or excessive, and those solder joints of with the naked eye can't see particularly are as the solder joint of BGA encapsulation.
Problem:
1, AXI testing cost height.An AXI equipment needs special X-ray machine, computer equipment, and supporting connecting gear, cost an arm and a leg, life-span is limited, is mainly used to veneer intensive to components and parts, that a large amount of BGA are arranged and checks that it is too high now to detect the certain cost of the card extender that has only four connectors with this equipment.
2, AXI is not electro-detection, and is limited to the detectability of rosin joint and open circuit.Therefore, can not entirely accurate judge that failure welding or rosin joint come.
3, on the reaction velocity, concerning card extender, device is few, and the time that the time ratio of turnover checkout equipment detects is many, also is a kind of waste to detecting resource.
Then, the principle of ATE technology and the problem of existence are described:
The ATE technology is placed on tested card extender plate between testing tool plate and the application mainboard as shown in Figure 2, uses mainboard and links to each other with computing machine.After above-mentioned each plate powered on, by the operate as normal whether of the ATE trace routine testing circuit in the computing machine, thereby it was qualified to judge whether tested card extender plate welds, and is a kind of abstract means of testing.
Problem:
1, the discovery to problem has hysteresis quality: if exist key pin to connect tin, then environment is damaged.
2, testing result is indeterminate: after card extender detects problem, can not know specifically which device goes wrong.
3, testing environment had invisible damageability: testing environment, here the cost that refers to testing tool plate and application mainboard is than higher, but behind a large amount of detection card extenders, can cause the plug problem on the one hand, damage joint, on the other hand to the frequent power-on and power-off of environment, also can be influential to the life-span of environment.
4, detection efficiency is low: because the environment electrifying startup could detect, and plate of every survey, powering on all needs 3 minutes time, greatly reduces detection efficiency like this,
Then, the principle of ICT technology and the problem of existence are described:
The ICT detection technique, by developing the detection anchor clamps of a cover circuit-under-test plate special use, and write the relevant detection program, then tested card extender is placed on ICT and detects on the board to detect whether have manufacturing deficiencies such as open circuit, short circuit, components and parts dislocation, Short Item in the decision circuitry.
The problem that exists:
1, cost of development height: this detection method all needs to develop the special-purpose anchor clamps of a cover for every kind of circuit-under-test plate, develops a sleeve clamp specially in order to detect the card extender that has only four sockets, and obviously cost is too high.
2, testing cost height: carry out because use anchor clamps to carry out to place it in when ICT detects on the board of ICT, be commonly used to Key Circuit plate, complex circuit board are detected.Detect with this class ball bearing made using plate of this expensive device object card extender, obviously caused the wasting of resources, make the detection cost too high.
In a word, for the circuit board that has only connector and connection line, the welding technology detection method of prior art has the cost height, diminish problems such as test environment and testing efficiency be low.
The utility model content
In view of this, the purpose of this utility model is to provide a kind of tin testing circuit, a kind of open detection circuit and a kind of welding quality testing circuit of connecting, and can reduce the cost that the welding technology to the circuit that has only connector and connection line detects.
For reaching the purpose of the cost that reduction detects the welding technology of the circuit that has only connector and connection line, the utility model at first provides a kind of tin testing circuit that connects, be used for the connector on the circuit that has only connector and connecting line is detected, this circuit comprises: power module, high level p-wire, low level test line and Lian Xi pilot lamp;
Described power module produces high level signal and low level signal, and exports to high level p-wire and low level test line respectively; The varying level p-wire links to each other with the adjacent pin of tested connector respectively;
The described tin pilot lamp that connects is arranged between high level p-wire, the low level test line, indicates whether to have adjacent pin to connect tin.
Wherein, when tested connector was a plurality of, this circuit further comprised: with the identical switch of tested connector number; Each connector is provided with a high level p-wire and company's tin pilot lamp;
One termination of described each switch is received the high level of power module output, and the other end links to each other with a high level p-wire that is a connector is provided with;
For company's tin pilot lamp of each connector setting is arranged on the low level test line and between the high level p-wire that self is provided with.
The switch that described and tested connector number is identical can be toggle switch.
Can comprise one or more groups interconnected pin in a plurality of pins of described tested connector, further comprise in the then described circuit: the 3rd p-wire and the single-pole double-throw switch (SPDT) that link to each other with described one or more groups interconnected all pins;
The stiff end of described single-pole double-throw switch (SPDT) links to each other with described the 3rd p-wire, and two selecting sides of single-pole double-throw switch (SPDT) link to each other with the low level test line with the high level p-wire respectively;
The varying level p-wire respectively with tested connector on the adjacent pin that does not link to each other with the 3rd p-wire link to each other.
Described power module can output to the high level p-wire by a current-limiting resistance with the high level signal that produces.
Can be connected by a plurality of switches between described high level p-wire and each pin of tested connector, and/or be connected by a plurality of switches between described low level test line and each pin of tested connector.
Switch between described high level p-wire and/or low level test line and each pin can adopt cascade mode.
For reaching the purpose of the cost that reduction detects the welding technology of the circuit that has only connector and connection line, the utility model also provides a kind of open detection circuit, be used for whether two connectors that link to each other on the circuit board that has only connector and connecting line opened a way and detect, this circuit comprises: power module, p-wire, with logical block or logical block, the first open circuit pilot lamp and the second open circuit pilot lamp;
Described power module produces high level signal and low level signal, and exports to first connector of two continuous connectors, and gives the level of adjacent pin output of first connector inequality;
The quantity of described p-wire is identical with second connector number of pin, and an end of every p-wire links to each other with a pin respectively;
The other end of the p-wire that is connected with the corresponding pin of pin of first connector reception high level signal on second connector is connected to the input end with logical block; Receive the other end of the p-wire that the corresponding pin of pin of low level signal connected on second connector with first connector, be connected to or the input end of logical block;
The output terminal of described and logical block and the first open circuit pilot lamp link to each other;
Output terminal described or logical block links to each other with the second open circuit pilot lamp.
This circuit may further include with the identical pull down resistor of number of terminals of the input end of logical block; With with or the identical pull-up resistor of number of terminals of the input end of logical block;
One end of described each pull down resistor with link to each other with an input terminal of logical block, the other end links to each other with ground; One end of described each pull-up resistor with or an input terminal of logical block link to each other, the other end receives high level signal.
Every p-wire of described second connector, by switch with or logical block or link to each other with an input terminal of logical block.
For reaching the purpose of the cost that reduction detects the welding technology of the circuit that has only connector and connection line, the utility model provides a kind of welding quality testing circuit again, be used for the circuit that has only connector and connecting line is detected, this circuit comprises: power module, the high level p-wire and the low level test line that are provided with for first connector of two connectors to be measured linking to each other, connect tin pilot lamp, open test line, with logical block or logical block, the first open circuit pilot lamp and the second open circuit pilot lamp;
Described power module produces high level signal and low level signal, and exports to high level p-wire and the low level test line that links to each other with described first connector respectively; The varying level p-wire links to each other with the adjacent pin of first connector respectively;
The described tin pilot lamp that connects is arranged between high level p-wire, the low level test line, indicates whether to have adjacent pin to connect tin;
The quantity of described open test line is identical with second connector number of pin, and an end of every open test line links to each other with a pin respectively;
The other end of the open test line that is connected with the corresponding pin of pin of first connector reception high level signal on second connector is connected to the input end with logical block; Receive the other end of the open test line that the corresponding pin of pin of low level signal connected on second connector with first connector, be connected to or the input end of logical block;
The output terminal of described and logical block and the first open circuit pilot lamp link to each other;
Output terminal described or logical block links to each other with the second open circuit pilot lamp.
When being comprised a plurality of continuous connector on the circuit-under-test plate, this circuit further comprises: quantity is half switch of tested connector quantity; Whenever first connector in two connectors of Xiang Lianing is provided with a high level p-wire and company's tin pilot lamp;
One termination of described each switch is received the high level of power module output, and the other end links to each other with the high level p-wire that is the setting of first connector;
For company's tin pilot lamp of each first connector setting is arranged on the low level test line and between the high level p-wire that self is provided with.
Can comprise one or more groups interconnected pin in a plurality of pins of described first connector, further comprise in the then described circuit: the 3rd p-wire and the single-pole double-throw switch (SPDT) that link to each other with described one or more groups interconnected all pins;
The stiff end of described single-pole double-throw switch (SPDT) links to each other with described the 3rd p-wire, and two selecting sides of single-pole double-throw switch (SPDT) link to each other with the low level test line with the high level p-wire respectively;
The varying level p-wire respectively with tested connector on the adjacent pin that does not link to each other with the 3rd p-wire link to each other.
Described power module can output to the high level p-wire by a current-limiting resistance with the high level signal that produces.
Can be connected by a plurality of switches between described high level p-wire and described each pin of first connector, and/or be connected by a plurality of switches between described low level test line and described each pin of first connector.
This circuit may further include with the identical pull down resistor of number of terminals of the input end of logical block; With with or the identical pull-up resistor of number of terminals of the input end of logical block;
One end of described each pull down resistor with link to each other with an input terminal of logical block, the other end links to each other with ground; One end of described each pull-up resistor with or an input terminal of logical block link to each other, the other end receives high level signal.
Every open test line of described second connector, can by switch with or logical block or link to each other with an input terminal of logical block.
As seen from the above technical solutions, for the circuit board that has only connector and connection line, company's tin testing circuit, open detection circuit and welding quality testing circuit that the utility model provides, the ball bearing made using that employing is made up of electronic devices and components, the voltage that adds different potentials by adjacent pin to connector on the circuit-under-test plate, and indicate whether to have the current potential of adjacent pin identical with pilot lamp, indicate whether to have Lian Xi or open circuit, thereby realize detection the welding quality of circuit-under-test plate.The utility model adopts special-purpose detecting instrument equipment to come welding quality is detected with respect to prior art, detects cost and reduces significantly.
In addition, the utility model is when being used for the circuit that has only connector and connection line detected, because the circuit board that need not to have described circuit is placed in the working environment, thereby need not to power on wait, reduced detection time, improved testing efficiency, also can not cause damage working environment.
Description of drawings
Fig. 1 carries out the principle schematic that welding quality detects for existing AXI technology;
Fig. 2 carries out the principle schematic that welding quality detects for existing ATE technology;
Fig. 3 a is a kind of structural representation that has only the card extender of connector and connecting line;
Fig. 3 b moves towards synoptic diagram for the data of card extender shown in Fig. 3 a;
Fig. 4 is company's tin testing circuit schematic diagram of first preferred embodiment of the present utility model;
Fig. 4 a is the synoptic diagram that connects tin testing circuit increase switch shown in Figure 4;
Fig. 5 is the open detection circuit schematic diagram of second preferred embodiment of the present utility model;
Fig. 6 is the circuit diagram of an embodiment of the welding quality testing circuit of the 3rd preferred embodiment of the present utility model;
Fig. 7 is middle power module embodiment illustrated in fig. 6 and Lian Xi detection module schematic diagram;
Fig. 8 is a middle open circuit detection module schematic diagram embodiment illustrated in fig. 7.
Embodiment
For making the purpose of this utility model, technical scheme and advantage clearer, the utility model is described in further detail below in conjunction with accompanying drawing.
The main thought of company's tin testing circuit, open detection circuit and welding quality testing circuit that the utility model provides is, for the circuit board that has only connector and connection line, the ball bearing made using that employing is made up of electronic devices and components, the voltage that adds different potentials by adjacent pin to connector on the circuit-under-test plate, and indicate whether to have the current potential of adjacent pin identical with pilot lamp, indicate whether to have Lian Xi or open circuit, thereby realize detection the welding quality of circuit-under-test plate.
Referring to Fig. 4, Fig. 4 is company's tin testing circuit schematic diagram of first preferred embodiment of the present utility model.Tested connector in the present embodiment is the socket J1 on the card extender shown in Fig. 3 a: the socket of one 16 pin connects the tin testing circuit and comprises a 3.3V power circuit, light emitting diode D, high level p-wire 1 and low level test line 0.
As shown in Figure 4, high level p-wire 1 links to each other with the 3.3V power supply, low level test line 0 links to each other with ground, the adjacent pin of tested connector is connected to the varying level p-wire, and for example: pin one connects high level p-wire 1, pin two and connects that low level test line 0, pin 3 connect high level p-wire 1, pin two meets low level test line 0.......Like this, each pin level of detected connector series arrangement of pressing 010101.......
Light emitting diode D is for connecting the tin pilot lamp among Fig. 4, and it is arranged between high level p-wire 1 and the low level test line 0, and positive pole links to each other with high level p-wire 1, negative pole links to each other with low level test line 0, indicates whether to have adjacent pin level identical.If adjacent pin level difference, then light emitting diode D is lighted, and also just indicates each pin of this socket not have even tin; Adjacent pin level is identical, and light emitting diode D does not work, and also just indicates this socket to have the pin that connects tin.
For the connector that adopts the welding of Surface Mount Reflow Soldering technology,, normally whole connector is welded again if the situation that pin connects tin has appearred in connector.Certainly, connector for other solder technology welding, sometimes also needing which pin to this connector tin to occur connecting positions, in this case, only need between described high level p-wire 1 and each pin of tested connector, a plurality of switches be set, and/or shown in a plurality of switches are set between low level test line and each pin of tested connector are connected and just can realize locating.
Switch between high level p-wire and/or low level test line and each pin can adopt cascade mode.Referring to Fig. 4 a, Fig. 4 a is the synoptic diagram that connects tin testing circuit increase switch shown in Figure 4.Fig. 4 a shows and is adopting cascade mode to increase the method for switch on the high level p-wire 1 on pin two, 4, wherein pin two and pin 4 have been connected an end of a switch respectively, the other end of these two switches links together, and link to each other with an end of the 3rd switch, the other end of the 3rd switch links to each other with the 3.3V power supply.The connected mode of other pins is identical, no longer repeats here.
Like this, by disconnection and the closure that switch is set, just can navigate to the end is that tin has appearred connecting in which two or more pin.
Referring to Fig. 5, Fig. 5 is the open detection circuit schematic diagram of second preferred embodiment of the present utility model.Be whether the socket J1 on the card extender shown in Fig. 3 b to opening a way between the socket J3 is detected in the present embodiment.As shown in Figure 5, this open detection circuit comprises: 3.3V power circuit, p-wire, with logical block (﹠amp; ) or logical block (〉=), light emitting diode D3 and light emitting diode D4;
As shown in Figure 5, the 3.3V power supply all links to each other with the even number pin of socket J1, and the odd number pin of socket J1 all links to each other with ground, and each pin of second connector receptable J3 connects a p-wire;
Even number pin on the socket J3 is connected to input end with logical block by a p-wire respectively, and just socket J3 goes up the corresponding pin of pin with socket J1 reception power supply signal, is connected to the input end with logical block; Even number pin on the socket J3 is connected to by p-wire respectively or the input end of logical block, just socket J3 go up with socket J1 on the corresponding pin of pin of ground connection, be connected to or the input end of logical block;
Among Fig. 5 link to each other the minus earth of light emitting diode D3 with the positive pole of output terminal logical block with light emitting diode D3; Or the output terminal of logical block links to each other with the negative pole of light emitting diode D4, and the positive pole of light emitting diode D4 connects the 3.3V power supply.
When all going up high level with all input terminals of logical block, then it is output as high level, and light emitting diode D3 is lighted, and the circuit of indication socket J1 and socket J3 even number pin is open circuit not; As long as when with logical block an input terminal being arranged is low level, then it is output as low level, and light emitting diode D3 does not work, and the connection line of indication socket J1 and socket J3 even number pin has open circuit.This is because the pin of socket J1 and socket J3 is corresponding one by one to link to each other, all inserts high level at the even number pin of socket J1, then under the situation that circuit does not have to open a way, all should export high level at the even number pin of socket J3.
When or all input terminals of logical block all go up low level, then it is output as low level, light emitting diode D4 is lighted, the circuit of indication socket J1 and socket J3 odd number pin is open circuit not; As long as when with logical block an input terminal being arranged is not low level, then its output is not low level, and light emitting diode D4 does not work, and the connection line of indication socket J1 and socket J3 odd number pin has open circuit.This is because the pin of socket J1 and socket J3 is corresponding one by one to link to each other, all inserts low level at the odd number pin of socket J1, then under the situation that circuit does not have to open a way, and all should output low level at the odd number pin of socket J3.
In addition, detecting the end if desired is the open circuit which pin connects, can also every p-wire of socket J3 and and logical block between, or every p-wire and or an input end of logical block between switch is set, the disconnection or the closed end that is determined to by each switch are the open circuits which pin connects.
Be that the even number pin connects high level in the present embodiment, the odd number pin connects low level, can be that the even number pin connects low level in the practical application, and the odd number pin connects high level, and effect is identical.
It is multiple to cause the reason of open circuit to have, for example: the contact pin broken needle of pin rosin joint, connection line open circuit, socket etc.For the connector of Surface Mount Reflow Soldering technology welding, then can determine it is pin rosin joint or connection line open circuit.
In fact, can realize detection by to connecting the combination of tin testing circuit and open detection circuit to the circuit board that has only connector and connection line.
Referring to Fig. 6, Fig. 6 is the circuit diagram of an embodiment of the utility model welding quality testing circuit.Present embodiment is that the card extender shown in Fig. 3 a, Fig. 3 b is detected.Comprise in this circuit: power module, company's tin detection module and open circuit detection module.Tested card extender is arranged on and connects between tin detection module and the open circuit detection module.
Wherein, power module realized by direct-current power supply converting circuit, with AC power be converted to 3.3V direct supply and the company's of exporting to tin detection module.Certainly, this power module is realized by dc power generating circuit.
Connect the tin detection module and realize, indicate socket J1 and socket J2 whether to occur connecting tin respectively, specifically see below continuous Fig. 7 explanation by light emitting diode D1, D2 by company's tin testing circuit that two embodiment one provide.
The open circuit detection module is realized that by the open detection circuit that two embodiment two provide two open detection circuit have adopted the power supply of same power module output, indicate tested card extender whether to open a way respectively by light emitting diode D3/D5/D4/D6.In the present embodiment, also between the input end of each and logical block and ground, be provided with pull down resistor; And between the input end of each or logical block and power supply, be provided with pull-up resistor, specifically see below continuous Fig. 7 explanation.
As seen, company's tin detection module in the present embodiment and open circuit detection module are corresponding two groups, respectively socket J1, J3 and socket J2, J4 are detected.
Referring to Fig. 7, Fig. 7 is middle power module embodiment illustrated in fig. 6 and Lian Xi detection module schematic diagram.Wherein power module comprises: power transfer module and light emitting diode D0.Power transfer module is converted to the direct supply of 3.3V or the 3.3V power supply that self generates and earth signal with external ac power source and exports to even tin detection module.Light emitting diode D0 positive pole connects the 3.3V power supply, minus earth, and bright when power transfer module output 3.3V power supply, indication has power supply output.
Connecting the tin detection module comprises: the high level p-wire A1 of socket J1, the high level p-wire A2 of low level test line B1, socket J2, low level test line B2, light emitting diode D1, light emitting diode D2, current-limiting resistance R1, toggle switch K1, the 3rd p-wire C, single-pole double-throw switch (SPDT) S1.
The 1st pin of socket J1 links to each other with the 16th pin in the present embodiment, all is that ground wire, the 8th pin that connects links to each other the power lead that connects with the 9th pin in application circuit in the practical application circuit; The 1st pin of socket J2 links to each other with the 16th pin, the 8th pin links to each other with the 9th pin, also be like this, just comprised many groups of interconnected pins, so be provided with the 3rd p-wire C in the present embodiment, the 3rd p-wire C will organize interconnected pin more and link together.For the adjacent pin that does not link to each other on socket J1 and the socket J2 with the 3rd p-wire C, then connect the principle of varying level p-wire according to adjacent pin, all be connected to separately on the varying level p-wire A1/B1/A2/B2.
Light emitting diode D1 is arranged between high level p-wire A1, the low level test line B1 of socket J1, and whether indication socket J1 has the tin of company; Light emitting diode D2 is arranged between high level p-wire A2, the low level test line B2 of socket J2, and whether indication socket J2 has the tin of company.
The end of current-limiting resistance R1 links to each other with the 3.3V power supply, and the other end links to each other with two stiff ends of toggle switch K1, and two selecting sides of toggle switch link to each other with high level p-wire A2 with high level p-wire A1 respectively.Like this, can select the 3.3V power supply to link to each other with high level p-wire A1 by toggle switch K1 still is to link to each other with high level p-wire A2, still link to each other simultaneously with high level p-wire A1, A2.
When beginning to detect, two selecting sides of toggle switch K1 are all closed, and promptly the 3.3V power supply links to each other simultaneously with high level p-wire A1, A2, if socket J1 and socket J2 do not connect tin, then light emitting diode D1 and light emitting diode D2 are bright; If socket J1 and socket J2 have one tin to occur connecting, then light emitting diode D1 and light emitting diode D2 do not work, and at this moment, can select the high level p-wire of a socket to link to each other by toggle switch K1, if light emitting diode that should socket is not worked, then this socket pin has the tin of company.
The stiff end of single-pole double-throw switch (SPDT) S1 links to each other with the 3rd p-wire C, and two selecting sides of single-pole double-throw switch (SPDT) S1 link to each other with low level test line B1 with the stiff end of toggle switch respectively.
Below to detect with the company tin to socket J1 be example, the detection principle of the 3rd p-wire C is described.
When the 3rd p-wire C and high level p-wire A1 link together, then high level p-wire A1, the 3rd p-wire C receive high level, low level test line B1 connects low level, at this moment, if adjacent height pin does not connect tin, then the diode D1 between high level p-wire A1, the low level test line B1 is bright, and this moment, some adjacent pin just detected not come out for high pin connects tin simultaneously.By single-pole double-throw switch (SPDT) the 3rd p-wire C is pulled out with low level test line B1 so and link to each other, disconnect with high level p-wire A1, then low level test line B1, the 3rd p-wire C are low level when the 3rd p-wire C and low level test line B1 link together.If adjacent height pin does not connect tin, then the light emitting diode D1 between high level p-wire A1 and low level test line B1 will be bright, otherwise have the tin of company not work, and the preceding part that once connects the tin omission all can be measured like this.
Fig. 8 is a middle open circuit detection module schematic diagram embodiment illustrated in fig. 7.When whether Fig. 8 only shows and is used for test jack J1 and socket J3 and opens a way, the annexation of open circuit detection module and socket J3, when whether test jack J2 and socket J4 opened a way, the structure of socket J4 was identical with it with annexation.Here no longer repeat specification.
Basic identical among the structure of socket J3 and annexation and Fig. 5 among Fig. 8, just and each input end of logical block and ground between be provided with pull down resistor, or each input end of logical block and 3.3V power supply between be provided with pull-up resistor.
In the present embodiment with logical block and or logical block can realize by programmable logic device (PLD) (CPLD).In addition, remaining pin can also be used to realizing toggle switch K1 among the CPLD, thereby can realize the automatic control of toggle switch.
It more than is explanation to the utility model specific embodiment, in concrete implementation process, can carry out suitable improvement to device of the present utility model, to adapt to the concrete needs of concrete condition, and for the circuit board that has only connector and connection line, the pin of connector is thin, close, many, and the utility model just has superiority.Therefore be appreciated that according to embodiment of the present utility model just to play an exemplary role, not in order to limit protection domain of the present utility model.
Claims (17)
1, a kind of tin testing circuit that connects is used for the connector on the circuit that has only connector and connecting line is detected, and it is characterized in that this circuit comprises: power module, high level p-wire, low level test line and Lian Xi pilot lamp;
Described power module produces high level signal and low level signal, and exports to high level p-wire and low level test line respectively; The varying level p-wire links to each other with the adjacent pin of tested connector respectively;
The described tin pilot lamp that connects is arranged between high level p-wire, the low level test line, indicates whether to have adjacent pin to connect tin.
2, the tin testing circuit that connects according to claim 1 is characterized in that when tested connector was a plurality of, this circuit further comprised: with the identical switch of tested connector number; Each connector is provided with a high level p-wire and company's tin pilot lamp;
One termination of described each switch is received the high level of power module output, and the other end links to each other with the high level p-wire that is a connector setting;
For company's tin pilot lamp of each connector setting is arranged on the low level test line and between the high level p-wire that self is provided with.
3, the tin testing circuit that connects according to claim 2 is characterized in that the switch that described and tested connector number is identical is a toggle switch.
4, the tin testing circuit that connects according to claim 1 and 2, it is characterized in that, comprise one or more groups interconnected pin in a plurality of pins of described tested connector, further comprise in the then described circuit: the 3rd p-wire and the single-pole double-throw switch (SPDT) that link to each other with described one or more groups interconnected all pins;
The stiff end of described single-pole double-throw switch (SPDT) links to each other with described the 3rd p-wire, and two selecting sides of single-pole double-throw switch (SPDT) link to each other with the low level test line with the high level p-wire respectively;
The varying level p-wire respectively with tested connector on the adjacent pin that does not link to each other with the 3rd p-wire link to each other.
5, the tin testing circuit that connects according to claim 1 and 2 is characterized in that described power module outputs to the high level p-wire with the high level signal that produces by a current-limiting resistance.
6, the tin testing circuit that connects according to claim 1, it is characterized in that, be connected by a plurality of switches between described high level p-wire and each pin of tested connector, and/or be connected by a plurality of switches between described low level test line and each pin of tested connector.
7, the tin testing circuit that connects according to claim 6 is characterized in that the switch between described high level p-wire and/or low level test line and each pin adopts cascade mode.
8, a kind of open detection circuit, be used for whether two connectors that link to each other on the circuit that has only connector and connecting line opened a way and detect, it is characterized in that this circuit comprises: power module, p-wire, with logical block or logical block, the first open circuit pilot lamp and the second open circuit pilot lamp;
Described power module produces high level signal and low level signal, and exports to first connector of two continuous connectors, and gives the level of adjacent pin output of first connector inequality;
The quantity of described p-wire is identical with second connector number of pin, and an end of every p-wire links to each other with a pin respectively;
The other end of the p-wire that is connected with the corresponding pin of pin of first connector reception high level signal on second connector is connected to the input end with logical block; Receive the other end of the p-wire that the corresponding pin of pin of low level signal connected on second connector with first connector, be connected to or the input end of logical block;
The output terminal of described and logical block and the first open circuit pilot lamp link to each other;
Output terminal described or logical block links to each other with the second open circuit pilot lamp.
9, open detection circuit according to claim 8 is characterized in that: this circuit further comprise with the identical pull down resistor of number of terminals of the input end of logical block; With with or the identical pull-up resistor of number of terminals of the input end of logical block;
One end of described each pull down resistor with link to each other with an input terminal of logical block, the other end links to each other with ground; One end of described each pull-up resistor with or an input terminal of logical block link to each other, the other end receives high level signal.
10, according to Claim 8 or 9 described open detection circuit, it is characterized in that: every p-wire of described second connector, by switch with or logical block or link to each other with an input terminal of logical block.
11, a kind of welding quality testing circuit, be used for the circuit that has only connector and connecting line is detected, it is characterized in that this circuit comprises: power module, the high level p-wire and the low level test line that are provided with for first connector of two connectors to be measured linking to each other, connect tin pilot lamp, open test line, with logical block or logical block, the first open circuit pilot lamp and the second open circuit pilot lamp;
Described power module produces high level signal and low level signal, and exports to high level p-wire and the low level test line that links to each other with described first connector respectively; The varying level p-wire links to each other with the adjacent pin of first connector respectively;
The described tin pilot lamp that connects is arranged between high level p-wire, the low level test line, indicates whether to have adjacent pin to connect tin;
The quantity of described open test line is identical with second connector number of pin, and an end of every open test line links to each other with a pin respectively;
The other end of the open test line that is connected with the corresponding pin of pin of first connector reception high level signal on second connector is connected to the input end with logical block; Receive the other end of the open test line that the corresponding pin of pin of low level signal connected on second connector with first connector, be connected to or the input end of logical block;
The output terminal of described and logical block and the first open circuit pilot lamp link to each other;
Output terminal described or logical block links to each other with the second open circuit pilot lamp.
12, welding quality testing circuit according to claim 11 is characterized in that, when comprising a plurality of continuous connector on the circuit-under-test plate, this circuit further comprises: quantity is half switch of tested connector quantity; Whenever first connector in two connectors of Xiang Lianing is provided with a high level p-wire and company's tin pilot lamp;
One termination of described each switch is received the high level of power module output, and the other end links to each other with a high level p-wire that is first connector is provided with;
For company's tin pilot lamp of each first connector setting is arranged on the low level test line and between the high level p-wire that self is provided with.
13, according to claim 11 or 12 described welding quality testing circuits, it is characterized in that, comprise one or more groups interconnected pin in a plurality of pins of described first connector, further comprise in the then described circuit: the 3rd p-wire and the single-pole double-throw switch (SPDT) that link to each other with described one or more groups interconnected all pins;
The stiff end of described single-pole double-throw switch (SPDT) links to each other with described the 3rd p-wire, and two selecting sides of single-pole double-throw switch (SPDT) link to each other with the low level test line with the high level p-wire respectively;
The varying level p-wire respectively with tested connector on the adjacent pin that does not link to each other with the 3rd p-wire link to each other.
According to claim 11 or 12 described welding quality testing circuits, it is characterized in that 14, described power module outputs to the high level p-wire with the high level signal that produces by a current-limiting resistance.
15, welding quality testing circuit according to claim 11, it is characterized in that, be connected by a plurality of switches between described high level p-wire and described each pin of first connector, and/or be connected by a plurality of switches between described low level test line and described each pin of first connector.
16, welding quality testing circuit according to claim 11 is characterized in that: this circuit further comprise with the identical pull down resistor of number of terminals of the input end of logical block; With with or the identical pull-up resistor of number of terminals of the input end of logical block;
One end of described each pull down resistor with link to each other with an input terminal of logical block, the other end links to each other with ground; One end of described each pull-up resistor with or an input terminal of logical block link to each other, the other end receives high level signal.
17, welding quality testing circuit according to claim 11 is characterized in that: every open test line of described second connector, by switch with or logical block or link to each other with an input terminal of logical block.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200620131215 CN2938129Y (en) | 2006-08-18 | 2006-08-18 | Tin interconnection detection circuit, open-circuit detection circuit and welding quiality detection circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200620131215 CN2938129Y (en) | 2006-08-18 | 2006-08-18 | Tin interconnection detection circuit, open-circuit detection circuit and welding quiality detection circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN2938129Y true CN2938129Y (en) | 2007-08-22 |
Family
ID=38362159
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200620131215 Expired - Lifetime CN2938129Y (en) | 2006-08-18 | 2006-08-18 | Tin interconnection detection circuit, open-circuit detection circuit and welding quiality detection circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN2938129Y (en) |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN102540002A (en) * | 2012-02-16 | 2012-07-04 | 杭州鸿雁智能科技有限公司 | Method for detecting open circuit and short circuit of line |
| CN102692580A (en) * | 2012-06-12 | 2012-09-26 | 东旭集团有限公司 | Method for detecting junction box faulty welding of solar battery assembly |
| CN103353578A (en) * | 2013-07-30 | 2013-10-16 | 青岛海信宽带多媒体技术有限公司 | Fault detection method of circuit board device |
| CN103604834A (en) * | 2013-11-06 | 2014-02-26 | 杭州华为数字技术有限公司 | Surface-mount memory bank socket welding detection device and method |
| CN104345241A (en) * | 2013-07-24 | 2015-02-11 | 神讯电脑(昆山)有限公司 | Keyboard tin connection test fixture |
| CN106291211A (en) * | 2015-06-01 | 2017-01-04 | 神讯电脑(昆山)有限公司 | Power-supply adapter test circuit |
| CN108760819A (en) * | 2018-05-22 | 2018-11-06 | 广州兴森快捷电路科技有限公司 | Welding quality test device and its detection method |
| CN108931697A (en) * | 2018-03-30 | 2018-12-04 | 无锡睿勤科技有限公司 | A kind of detection method and device of keyboard interface welding effect |
| CN111272818A (en) * | 2020-03-02 | 2020-06-12 | 深圳市金锐显数码科技有限公司 | Circuit board soldering tin detection method and device |
| CN111443307A (en) * | 2020-03-31 | 2020-07-24 | 四川九洲电器集团有限责任公司 | Detection method and detection system of signal processing unit |
| CN112540289A (en) * | 2020-12-07 | 2021-03-23 | 珠海泽冠科技有限公司 | Method and device for detecting welding fault of heat-sensitive sheet FPC, electronic equipment and medium |
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| US11291357B2 (en) | 2011-12-13 | 2022-04-05 | Endochoice, Inc. | Removable tip endoscope |
| CN102540002A (en) * | 2012-02-16 | 2012-07-04 | 杭州鸿雁智能科技有限公司 | Method for detecting open circuit and short circuit of line |
| CN102692580A (en) * | 2012-06-12 | 2012-09-26 | 东旭集团有限公司 | Method for detecting junction box faulty welding of solar battery assembly |
| CN102692580B (en) * | 2012-06-12 | 2015-06-17 | 成都旭双太阳能科技有限公司 | Method for detecting junction box faulty welding of solar battery assembly |
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| CN103353578A (en) * | 2013-07-30 | 2013-10-16 | 青岛海信宽带多媒体技术有限公司 | Fault detection method of circuit board device |
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| CN103604834A (en) * | 2013-11-06 | 2014-02-26 | 杭州华为数字技术有限公司 | Surface-mount memory bank socket welding detection device and method |
| CN103604834B (en) * | 2013-11-06 | 2016-01-27 | 杭州华为数字技术有限公司 | A kind of Surface-mount memory bank socket welding pick-up unit and method |
| CN106291211A (en) * | 2015-06-01 | 2017-01-04 | 神讯电脑(昆山)有限公司 | Power-supply adapter test circuit |
| CN106291211B (en) * | 2015-06-01 | 2018-06-22 | 神讯电脑(昆山)有限公司 | Power-supply adapter test circuit |
| CN108931697B (en) * | 2018-03-30 | 2020-08-18 | 无锡睿勤科技有限公司 | Method and device for detecting welding effect of keyboard interface |
| CN108931697A (en) * | 2018-03-30 | 2018-12-04 | 无锡睿勤科技有限公司 | A kind of detection method and device of keyboard interface welding effect |
| CN108760819B (en) * | 2018-05-22 | 2020-08-18 | 广州兴森快捷电路科技有限公司 | Welding quality detection device and detection method thereof |
| CN108760819A (en) * | 2018-05-22 | 2018-11-06 | 广州兴森快捷电路科技有限公司 | Welding quality test device and its detection method |
| CN111272818A (en) * | 2020-03-02 | 2020-06-12 | 深圳市金锐显数码科技有限公司 | Circuit board soldering tin detection method and device |
| CN111272818B (en) * | 2020-03-02 | 2022-12-02 | 深圳市金锐显数码科技有限公司 | Circuit board soldering tin detection method and device |
| CN111443307A (en) * | 2020-03-31 | 2020-07-24 | 四川九洲电器集团有限责任公司 | Detection method and detection system of signal processing unit |
| CN112540289A (en) * | 2020-12-07 | 2021-03-23 | 珠海泽冠科技有限公司 | Method and device for detecting welding fault of heat-sensitive sheet FPC, electronic equipment and medium |
| CN112540289B (en) * | 2020-12-07 | 2023-12-08 | 珠海趣印科技有限公司 | Method and device for detecting welding faults of FPC (flexible printed circuit) of thermosensitive sheet, electronic equipment and medium |
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| C56 | Change in the name or address of the patentee |
Owner name: HANGZHOU HUASAN COMMUNICATION TECHNOLOGY CO., LTD. Free format text: FORMER NAME OR ADDRESS: HANGZHOU HUAWEI 3COM TECHNOLOGY CO., LTD. |
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| CP03 | Change of name, title or address |
Address after: 310053, Hangzhou hi tech Industrial Development Zone, Zhejiang hi tech Industrial Park, No. six and No. 310 HUAWEI Hangzhou production base Patentee after: Huasan Communication Technology Co., Ltd. Address before: 310053, Hangzhou hi tech Industrial Development Zone, Zhejiang hi tech Industrial Park six and Lu Donghua for the 3Com company Patentee before: Huawei Sankang Technology Co., Ltd., Hangzhou |
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| CX01 | Expiry of patent term |
Granted publication date: 20070822 |
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