CN101438576A - 使用光电二极管的cmos图像传感器像素 - Google Patents
使用光电二极管的cmos图像传感器像素 Download PDFInfo
- Publication number
- CN101438576A CN101438576A CNA2007800158348A CN200780015834A CN101438576A CN 101438576 A CN101438576 A CN 101438576A CN A2007800158348 A CNA2007800158348 A CN A2007800158348A CN 200780015834 A CN200780015834 A CN 200780015834A CN 101438576 A CN101438576 A CN 101438576A
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- Prior art keywords
- photosensitive region
- voltage
- charge
- electric charge
- diffusion
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- 238000009792 diffusion process Methods 0.000 claims abstract description 36
- 230000005540 biological transmission Effects 0.000 claims description 21
- 238000000034 method Methods 0.000 claims description 8
- 238000006243 chemical reaction Methods 0.000 claims description 7
- 238000009825 accumulation Methods 0.000 claims description 5
- 238000003384 imaging method Methods 0.000 claims 5
- 230000000977 initiatory effect Effects 0.000 abstract 2
- 230000008859 change Effects 0.000 description 8
- 230000008901 benefit Effects 0.000 description 3
- 238000003491 array Methods 0.000 description 2
- 230000003139 buffering effect Effects 0.000 description 2
- 238000005381 potential energy Methods 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000002045 lasting effect Effects 0.000 description 1
- 230000009021 linear effect Effects 0.000 description 1
- 230000009022 nonlinear effect Effects 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/50—Control of the SSIS exposure
- H04N25/53—Control of the integration time
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
- H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
- H04N25/672—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction between adjacent sensors or output registers for reading a single image
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Solid State Image Pick-Up Elements (AREA)
Abstract
Description
Claims (16)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/416,055 | 2006-05-02 | ||
US11/416,055 US7382008B2 (en) | 2006-05-02 | 2006-05-02 | Ultra-small CMOS image sensor pixel using a photodiode potential technique |
PCT/US2007/009483 WO2007133380A1 (en) | 2006-05-02 | 2007-04-18 | Cmos image sensor pixel using a photodiode |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101438576A true CN101438576A (zh) | 2009-05-20 |
CN101438576B CN101438576B (zh) | 2012-11-14 |
Family
ID=38537945
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2007800158348A Active CN101438576B (zh) | 2006-05-02 | 2007-04-18 | 图像传感器和用于操作图像传感器的方法 |
Country Status (7)
Country | Link |
---|---|
US (1) | US7382008B2 (zh) |
EP (1) | EP2014084B1 (zh) |
JP (1) | JP4961013B2 (zh) |
KR (1) | KR101379046B1 (zh) |
CN (1) | CN101438576B (zh) |
TW (1) | TWI489620B (zh) |
WO (1) | WO2007133380A1 (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104884972A (zh) * | 2012-11-27 | 2015-09-02 | E2V半导体公司 | 利用深度信息和图像传感器来产生图像的方法 |
CN106067952A (zh) * | 2015-04-20 | 2016-11-02 | 财团法人工业技术研究院 | 图像感测装置、系统及其方法和电荷感测装置 |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7652706B2 (en) * | 2006-02-15 | 2010-01-26 | Eastman Kodak Company | Pixel analog-to-digital converter using a ramped transfer gate clock |
US8049256B2 (en) * | 2006-10-05 | 2011-11-01 | Omnivision Technologies, Inc. | Active pixel sensor having a sensor wafer connected to a support circuit wafer |
US7936039B2 (en) * | 2008-10-20 | 2011-05-03 | Teledyne Scientific & Imaging, Llc | Backside illuminated CMOS image sensor with photo gate pixel |
KR200449735Y1 (ko) * | 2010-04-07 | 2010-08-05 | 주식회사 지테크인터내셔날 | 체지방 측정장치 |
US9076706B2 (en) | 2011-01-07 | 2015-07-07 | Samsung Electronics Co., Ltd. | Image sensor based on depth pixel structure |
US9319612B2 (en) * | 2013-07-08 | 2016-04-19 | Semiconductor Components Industries, Llc | Imagers with improved analog-to-digital circuitry |
JP2018019335A (ja) * | 2016-07-29 | 2018-02-01 | ソニー株式会社 | 撮像素子および撮像装置 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0457270B1 (en) * | 1990-05-14 | 1996-10-09 | Nec Corporation | Floating diffusion type charge detection circuit for use in charge transfer device |
CN1222029A (zh) * | 1997-11-11 | 1999-07-07 | 日本电气株式会社 | 输出量高的以cmos为基础的图像传感器 |
CN1374702A (zh) * | 2001-03-05 | 2002-10-16 | 松下电器产业株式会社 | 固体摄象装置 |
KR20030084341A (ko) * | 2002-04-26 | 2003-11-01 | 주식회사 하이닉스반도체 | 특성을 향상시킨 시모스 이미지센서의 단위화소 |
CN1163059C (zh) * | 1999-12-09 | 2004-08-18 | 德国汤姆森-布兰特有限公司 | 图象记录器 |
CN1681211A (zh) * | 2004-02-23 | 2005-10-12 | 索尼株式会社 | 模拟数字转换方法和装置、半导体器件及电子装置 |
CN1706182A (zh) * | 2003-02-28 | 2005-12-07 | 松下电器产业株式会社 | 固态成像装置驱动方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH021948A (ja) * | 1988-06-10 | 1990-01-08 | Mitsubishi Electric Corp | 信号伝送装置 |
JPH05292409A (ja) * | 1992-04-09 | 1993-11-05 | Sony Corp | Ccd撮像装置 |
JP2500436B2 (ja) * | 1993-05-10 | 1996-05-29 | 日本電気株式会社 | 信号処理装置 |
CN1163059A (zh) * | 1997-04-08 | 1997-10-29 | 浙江通用包装机械厂 | 有螺旋直冷式蒸发器的冰淇淋机 |
JP4246890B2 (ja) * | 2000-06-26 | 2009-04-02 | 株式会社東芝 | 固体撮像装置 |
KR100399954B1 (ko) | 2000-12-14 | 2003-09-29 | 주식회사 하이닉스반도체 | 아날로그 상호 연관된 이중 샘플링 기능을 수행하는씨모스 이미지 센서용 비교 장치 |
JP4289206B2 (ja) * | 2004-04-26 | 2009-07-01 | ソニー株式会社 | カウンタ回路 |
US7238977B2 (en) * | 2004-08-19 | 2007-07-03 | Micron Technology, Inc. | Wide dynamic range sensor having a pinned diode with multiple pinned voltages |
US20070131992A1 (en) * | 2005-12-13 | 2007-06-14 | Dialog Semiconductor Gmbh | Multiple photosensor pixel image sensor |
KR100767629B1 (ko) * | 2006-01-05 | 2007-10-17 | 한국과학기술원 | 높은 광감도를 갖는 cmos 이미지 센서 및 이의 제조방법 |
-
2006
- 2006-05-02 US US11/416,055 patent/US7382008B2/en active Active
-
2007
- 2007-04-18 KR KR1020087026847A patent/KR101379046B1/ko active IP Right Grant
- 2007-04-18 CN CN2007800158348A patent/CN101438576B/zh active Active
- 2007-04-18 EP EP07775689.8A patent/EP2014084B1/en active Active
- 2007-04-18 JP JP2009509592A patent/JP4961013B2/ja active Active
- 2007-04-18 WO PCT/US2007/009483 patent/WO2007133380A1/en active Application Filing
- 2007-04-30 TW TW096115318A patent/TWI489620B/zh active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0457270B1 (en) * | 1990-05-14 | 1996-10-09 | Nec Corporation | Floating diffusion type charge detection circuit for use in charge transfer device |
CN1222029A (zh) * | 1997-11-11 | 1999-07-07 | 日本电气株式会社 | 输出量高的以cmos为基础的图像传感器 |
CN1163059C (zh) * | 1999-12-09 | 2004-08-18 | 德国汤姆森-布兰特有限公司 | 图象记录器 |
CN1374702A (zh) * | 2001-03-05 | 2002-10-16 | 松下电器产业株式会社 | 固体摄象装置 |
KR20030084341A (ko) * | 2002-04-26 | 2003-11-01 | 주식회사 하이닉스반도체 | 특성을 향상시킨 시모스 이미지센서의 단위화소 |
CN1706182A (zh) * | 2003-02-28 | 2005-12-07 | 松下电器产业株式会社 | 固态成像装置驱动方法 |
CN1681211A (zh) * | 2004-02-23 | 2005-10-12 | 索尼株式会社 | 模拟数字转换方法和装置、半导体器件及电子装置 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104884972A (zh) * | 2012-11-27 | 2015-09-02 | E2V半导体公司 | 利用深度信息和图像传感器来产生图像的方法 |
US9699442B2 (en) | 2012-11-27 | 2017-07-04 | E2V Semiconductors | Method for producing images with depth information and image sensor |
CN106067952A (zh) * | 2015-04-20 | 2016-11-02 | 财团法人工业技术研究院 | 图像感测装置、系统及其方法和电荷感测装置 |
CN106067952B (zh) * | 2015-04-20 | 2019-05-03 | 财团法人工业技术研究院 | 图像感测装置、系统及其方法和电荷感测装置 |
Also Published As
Publication number | Publication date |
---|---|
TW200802832A (en) | 2008-01-01 |
EP2014084A1 (en) | 2009-01-14 |
KR101379046B1 (ko) | 2014-03-28 |
WO2007133380A1 (en) | 2007-11-22 |
TWI489620B (zh) | 2015-06-21 |
CN101438576B (zh) | 2012-11-14 |
KR20090009845A (ko) | 2009-01-23 |
US7382008B2 (en) | 2008-06-03 |
JP2009535979A (ja) | 2009-10-01 |
EP2014084B1 (en) | 2016-09-14 |
US20070257284A1 (en) | 2007-11-08 |
JP4961013B2 (ja) | 2012-06-27 |
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Owner name: FULL VISION TECHNOLOGY CO., LTD. Free format text: FORMER OWNER: EASTMAN KODAK COMPANY (US) 343 STATE STREET, ROCHESTER, NEW YORK Effective date: 20110706 |
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C41 | Transfer of patent application or patent right or utility model | ||
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Free format text: CORRECT: ADDRESS; FROM: STATE OF NEW YORK, THE USA TO: STATE OF CALIFORNIA, THE USA |
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Effective date of registration: 20110706 Address after: California, USA Applicant after: Full Vision Technology Co., Ltd. Address before: American New York Applicant before: Eastman Kodak Co. |
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C14 | Grant of patent or utility model | ||
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CP01 | Change in the name or title of a patent holder | ||
CP01 | Change in the name or title of a patent holder |
Address after: California, USA Patentee after: OmniVision Technologies, Inc. Address before: California, USA Patentee before: Full Vision Technology Co., Ltd. |