CN101387686A - 一种使片上系统进入测试模式的装置及方法 - Google Patents
一种使片上系统进入测试模式的装置及方法 Download PDFInfo
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- CN101387686A CN101387686A CNA2008102170425A CN200810217042A CN101387686A CN 101387686 A CN101387686 A CN 101387686A CN A2008102170425 A CNA2008102170425 A CN A2008102170425A CN 200810217042 A CN200810217042 A CN 200810217042A CN 101387686 A CN101387686 A CN 101387686A
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Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102142270A (zh) * | 2009-12-22 | 2011-08-03 | 三星电子株式会社 | 半导体器件、关联的控制器、包括其的系统以及操作方法 |
CN103018657A (zh) * | 2012-12-05 | 2013-04-03 | 北京华大信安科技有限公司 | 一种电路测试控制方法及装置 |
CN103777533A (zh) * | 2014-01-09 | 2014-05-07 | 上海新进半导体制造有限公司 | 一种信号选择输出电路与控制芯片及控制电路 |
CN104268075A (zh) * | 2014-09-22 | 2015-01-07 | 广东欧珀移动通信有限公司 | 一种进入测试模式的方法、装置及移动终端 |
CN104569673A (zh) * | 2014-12-30 | 2015-04-29 | 广东欧珀移动通信有限公司 | 测试电路、方法和装置 |
US9110133B2 (en) | 2013-08-19 | 2015-08-18 | Freescale Semiconducotr, Inc. | Reconfigurable circuit and decoder therefor |
CN106066823A (zh) * | 2016-05-24 | 2016-11-02 | 福州瑞芯微电子股份有限公司 | 一种mbist时钟优化方法和装置 |
US9939840B2 (en) | 2015-02-17 | 2018-04-10 | Nxp Usa, Inc. | Enhanced status monitor for scan testing |
CN108414924A (zh) * | 2018-05-14 | 2018-08-17 | 珠海市微半导体有限公司 | 一种进入芯片测试模式的电路及其控制方法 |
CN111426944A (zh) * | 2020-03-30 | 2020-07-17 | 普源精电科技股份有限公司 | 一种芯片测试电路、方法及芯片 |
CN111913097A (zh) * | 2020-08-26 | 2020-11-10 | 西安微电子技术研究所 | 一种用于测试SoC功能的测试电路、测试方法和SoC |
CN112782551A (zh) * | 2019-11-04 | 2021-05-11 | 珠海零边界集成电路有限公司 | 一种芯片及芯片的测试系统 |
CN113641541A (zh) * | 2021-07-27 | 2021-11-12 | 西安芯海微电子科技有限公司 | 芯片测试方法、装置、芯片及存储介质 |
CN114264867A (zh) * | 2021-12-15 | 2022-04-01 | 江苏纵帆微电子有限公司 | 一种电子设备运行模式与生产测试模式的切换方法 |
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Cited By (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8832391B2 (en) | 2009-12-22 | 2014-09-09 | Samsung Electronics Co., Ltd. | Semiconductor device, controller associated therewith, system including the same, and methods of operation |
CN102142270A (zh) * | 2009-12-22 | 2011-08-03 | 三星电子株式会社 | 半导体器件、关联的控制器、包括其的系统以及操作方法 |
CN103018657A (zh) * | 2012-12-05 | 2013-04-03 | 北京华大信安科技有限公司 | 一种电路测试控制方法及装置 |
US9110133B2 (en) | 2013-08-19 | 2015-08-18 | Freescale Semiconducotr, Inc. | Reconfigurable circuit and decoder therefor |
CN103777533A (zh) * | 2014-01-09 | 2014-05-07 | 上海新进半导体制造有限公司 | 一种信号选择输出电路与控制芯片及控制电路 |
CN103777533B (zh) * | 2014-01-09 | 2016-08-17 | 上海新进半导体制造有限公司 | 一种信号选择输出电路与控制芯片及控制电路 |
CN104268075B (zh) * | 2014-09-22 | 2017-08-18 | 广东欧珀移动通信有限公司 | 一种进入测试模式的方法、装置及移动终端 |
CN104268075A (zh) * | 2014-09-22 | 2015-01-07 | 广东欧珀移动通信有限公司 | 一种进入测试模式的方法、装置及移动终端 |
CN104569673B (zh) * | 2014-12-30 | 2018-01-19 | 广东欧珀移动通信有限公司 | 测试电路、方法和装置 |
CN104569673A (zh) * | 2014-12-30 | 2015-04-29 | 广东欧珀移动通信有限公司 | 测试电路、方法和装置 |
US9939840B2 (en) | 2015-02-17 | 2018-04-10 | Nxp Usa, Inc. | Enhanced status monitor for scan testing |
CN106066823A (zh) * | 2016-05-24 | 2016-11-02 | 福州瑞芯微电子股份有限公司 | 一种mbist时钟优化方法和装置 |
CN106066823B (zh) * | 2016-05-24 | 2019-03-01 | 福州瑞芯微电子股份有限公司 | 一种mbist时钟优化方法和装置 |
CN108414924A (zh) * | 2018-05-14 | 2018-08-17 | 珠海市微半导体有限公司 | 一种进入芯片测试模式的电路及其控制方法 |
CN112782551A (zh) * | 2019-11-04 | 2021-05-11 | 珠海零边界集成电路有限公司 | 一种芯片及芯片的测试系统 |
CN111426944A (zh) * | 2020-03-30 | 2020-07-17 | 普源精电科技股份有限公司 | 一种芯片测试电路、方法及芯片 |
CN111913097A (zh) * | 2020-08-26 | 2020-11-10 | 西安微电子技术研究所 | 一种用于测试SoC功能的测试电路、测试方法和SoC |
CN111913097B (zh) * | 2020-08-26 | 2022-11-29 | 西安微电子技术研究所 | 一种用于测试SoC功能的测试电路、测试方法和SoC |
CN113641541A (zh) * | 2021-07-27 | 2021-11-12 | 西安芯海微电子科技有限公司 | 芯片测试方法、装置、芯片及存储介质 |
CN114264867A (zh) * | 2021-12-15 | 2022-04-01 | 江苏纵帆微电子有限公司 | 一种电子设备运行模式与生产测试模式的切换方法 |
CN114264867B (zh) * | 2021-12-15 | 2024-01-19 | 江苏纵帆微电子有限公司 | 一种电子设备运行模式与生产测试模式的切换方法 |
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CN101387686B (zh) | 2011-10-19 |
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