CN101324670A - 放射线图像变换面板、闪烁器面板以及放射线图像传感器 - Google Patents

放射线图像变换面板、闪烁器面板以及放射线图像传感器 Download PDF

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Publication number
CN101324670A
CN101324670A CNA200810109995XA CN200810109995A CN101324670A CN 101324670 A CN101324670 A CN 101324670A CN A200810109995X A CNA200810109995X A CN A200810109995XA CN 200810109995 A CN200810109995 A CN 200810109995A CN 101324670 A CN101324670 A CN 101324670A
Authority
CN
China
Prior art keywords
scintillator
panel
aluminum substrate
aluminum
radiation image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CNA200810109995XA
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English (en)
Chinese (zh)
Inventor
樱井纯
清水一伸
上村刚土
铃木孝治
楠山泰
白川和广
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=39967587&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=CN101324670(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Publication of CN101324670A publication Critical patent/CN101324670A/zh
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/29—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to radiation having very short wavelengths, e.g. X-rays, gamma-rays or corpuscular radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measurement Of Radiation (AREA)
  • Conversion Of X-Rays Into Visible Images (AREA)
CNA200810109995XA 2007-06-15 2008-06-16 放射线图像变换面板、闪烁器面板以及放射线图像传感器 Pending CN101324670A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/812,232 2007-06-15
US11/812,232 US20080311484A1 (en) 2007-06-15 2007-06-15 Radiation image conversion panel, scintillator panel, and radiation image sensor

Publications (1)

Publication Number Publication Date
CN101324670A true CN101324670A (zh) 2008-12-17

Family

ID=39967587

Family Applications (1)

Application Number Title Priority Date Filing Date
CNA200810109995XA Pending CN101324670A (zh) 2007-06-15 2008-06-16 放射线图像变换面板、闪烁器面板以及放射线图像传感器

Country Status (6)

Country Link
US (1) US20080311484A1 (enExample)
EP (1) EP2006710A2 (enExample)
JP (1) JP2008309769A (enExample)
KR (1) KR101026620B1 (enExample)
CN (1) CN101324670A (enExample)
CA (1) CA2633658A1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101893717A (zh) * 2010-06-24 2010-11-24 江苏康众数字医疗设备有限公司 闪烁体面板以及闪烁体组合板
CN108885274A (zh) * 2016-03-30 2018-11-23 浜松光子学株式会社 放射线检测器的制造方法

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2944879A1 (fr) * 2009-04-28 2010-10-29 Centre Nat Rech Scient Detecteur de radiation a cristaux scintillants et procede de fabrication d'une enveloppe pour un tel detecteur.
JP2011137665A (ja) * 2009-12-26 2011-07-14 Canon Inc シンチレータパネル及び放射線撮像装置とその製造方法、ならびに放射線撮像システム
JP5498982B2 (ja) * 2011-03-11 2014-05-21 富士フイルム株式会社 放射線撮影装置
USD806249S1 (en) * 2014-12-16 2017-12-26 Hamamatsu Photonics K.K. Radiation image conversion plate
JP6504997B2 (ja) * 2015-11-05 2019-04-24 浜松ホトニクス株式会社 放射線像変換パネル、放射線像変換パネルの製造方法、放射線イメージセンサ及び放射線イメージセンサの製造方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3578359D1 (de) * 1984-12-17 1990-07-26 Konishiroku Photo Ind Schirm zum speichern eines strahlungsbildes.
US4873708A (en) * 1987-05-11 1989-10-10 General Electric Company Digital radiographic imaging system and method therefor
JPH04118599A (ja) * 1990-09-10 1992-04-20 Fujitsu Ltd Ｘ線画像変換シートおよびそのシートを用いる装置
CN1144064C (zh) * 1998-06-18 2004-03-31 浜松光子学株式会社 有机膜蒸镀方法
JP3126715B2 (ja) * 1999-04-16 2001-01-22 浜松ホトニクス株式会社 シンチレータパネル及び放射線イメージセンサ
EP1211521B1 (en) * 1999-04-16 2005-12-07 Hamamatsu Photonics K.K. Scintillator panel and radiation image sensor
WO2002023220A1 (en) * 2000-09-11 2002-03-21 Hamamatsu Photonics K.K. Scintillator panel, radiation image sensor and methods of producing them
DE20021660U1 (de) 2000-12-20 2002-05-02 Alanod Aluminium Veredlung Gmb Verbundmaterial
CN1264026C (zh) * 2001-01-30 2006-07-12 浜松光子学株式会社 闪烁器板及射线图象传感器
US6652996B2 (en) * 2002-01-31 2003-11-25 Eastman Kodak Company Radiographic phosphor panel having improved speed and sharpness
JP2005181220A (ja) * 2003-12-22 2005-07-07 Fuji Photo Film Co Ltd 放射線像変換パネル
JP2006119124A (ja) * 2004-09-22 2006-05-11 Fuji Photo Film Co Ltd 放射線像変換パネルおよびその製造方法
US20060060792A1 (en) * 2004-09-22 2006-03-23 Fuji Photo Film Co., Ltd. Radiographic image conversion panel and method of manufacturing the same
JP2006113007A (ja) * 2004-10-18 2006-04-27 Konica Minolta Medical & Graphic Inc 放射線画像変換パネル
JP2006194860A (ja) * 2004-12-16 2006-07-27 Konica Minolta Medical & Graphic Inc 放射線画像変換パネル及び放射線画像変換パネルの製造方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101893717A (zh) * 2010-06-24 2010-11-24 江苏康众数字医疗设备有限公司 闪烁体面板以及闪烁体组合板
CN108885274A (zh) * 2016-03-30 2018-11-23 浜松光子学株式会社 放射线检测器的制造方法

Also Published As

Publication number Publication date
CA2633658A1 (en) 2008-12-15
US20080311484A1 (en) 2008-12-18
JP2008309769A (ja) 2008-12-25
EP2006710A2 (en) 2008-12-24
KR101026620B1 (ko) 2011-04-04
KR20080110509A (ko) 2008-12-18

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Open date: 20081217