CN101305593B - 用于校正掩食或变暗的方法 - Google Patents

用于校正掩食或变暗的方法 Download PDF

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Publication number
CN101305593B
CN101305593B CN200680040078XA CN200680040078A CN101305593B CN 101305593 B CN101305593 B CN 101305593B CN 200680040078X A CN200680040078X A CN 200680040078XA CN 200680040078 A CN200680040078 A CN 200680040078A CN 101305593 B CN101305593 B CN 101305593B
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China
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column
circuit
reset signal
image sensor
pixel
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Chinese (zh)
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CN101305593A (zh
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C·范
M·卡扎尼加
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Omnivision Technologies Inc
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Eastman Kodak Co
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
    • H04N25/627—Detection or reduction of inverted contrast or eclipsing effects
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
CN200680040078XA 2005-10-26 2006-10-12 用于校正掩食或变暗的方法 Active CN101305593B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/258,812 US7573519B2 (en) 2005-10-26 2005-10-26 Method for correcting eclipse or darkle
US11/258,812 2005-10-26
PCT/US2006/039786 WO2007050298A1 (en) 2005-10-26 2006-10-12 Method for correcting eclipse or darkle

Publications (2)

Publication Number Publication Date
CN101305593A CN101305593A (zh) 2008-11-12
CN101305593B true CN101305593B (zh) 2010-12-08

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CN200680040078XA Active CN101305593B (zh) 2005-10-26 2006-10-12 用于校正掩食或变暗的方法

Country Status (6)

Country Link
US (1) US7573519B2 (enExample)
EP (1) EP1941716B1 (enExample)
JP (1) JP2009514352A (enExample)
KR (1) KR101289516B1 (enExample)
CN (1) CN101305593B (enExample)
WO (1) WO2007050298A1 (enExample)

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JP5304410B2 (ja) * 2009-04-17 2013-10-02 ソニー株式会社 Ａｄ変換装置、固体撮像素子、およびカメラシステム
US8310580B2 (en) * 2009-07-27 2012-11-13 Sony Corporation Solid-state imaging device and camera system for suppressing occurrence of quantization vertical streaks
US9516239B2 (en) 2012-07-26 2016-12-06 DePuy Synthes Products, Inc. YCBCR pulsed illumination scheme in a light deficient environment
US10568496B2 (en) 2012-07-26 2020-02-25 DePuy Synthes Products, Inc. Continuous video in a light deficient environment
US10206561B2 (en) 2013-02-28 2019-02-19 DePuy Synthes Products, Inc. Videostroboscopy of vocal cords with CMOS sensors
CA2906798A1 (en) 2013-03-15 2014-09-18 Olive Medical Corporation Super resolution and color motion artifact correction in a pulsed color imaging system
WO2014144986A1 (en) 2013-03-15 2014-09-18 Olive Medical Corporation Scope sensing in a light controlled environment
US9777913B2 (en) 2013-03-15 2017-10-03 DePuy Synthes Products, Inc. Controlling the integral light energy of a laser pulse
US9380232B2 (en) 2014-02-20 2016-06-28 Semiconductor Components Industries, Llc Image sensors with anti-eclipse circuitry
EP3119265B1 (en) 2014-03-21 2019-09-11 DePuy Synthes Products, Inc. Card edge connector for an imaging sensor
JP6748622B2 (ja) * 2017-02-16 2020-09-02 ソニーセミコンダクタソリューションズ株式会社 撮像システムおよび撮像装置
US10582138B2 (en) * 2017-09-22 2020-03-03 Semiconductor Components Industries, Llc Image sensors with dual conversion gain pixels and anti-eclipse circuitry
US10477126B1 (en) 2018-09-05 2019-11-12 Smartsens Technology (Cayman) Co., Limited Dual eclipse circuit for reduced image sensor shading
US10873716B2 (en) 2018-11-05 2020-12-22 SmartSens Technology (HK) Co., Ltd. Dual row control signal circuit for reduced image sensor shading
US10727268B1 (en) 2019-01-25 2020-07-28 Smartsens Technology (Cayman) Co., Ltd CMOS image sensor with compact pixel layout
US10652492B1 (en) 2019-02-12 2020-05-12 Smartsens Technology (Cayman) Co., Ltd. CMOS image sensor with improved column data shift readout
CN110896082A (zh) 2019-05-28 2020-03-20 思特威(上海)电子科技有限公司 具有新型布局的图像传感器

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US6469740B1 (en) * 1997-02-04 2002-10-22 Matsushita Electric Industrial Co., Ltd. Physical quantity distribution sensor and method for driving the same
CN1437392A (zh) * 2002-02-07 2003-08-20 富士通株式会社 相关二次采样电路和包含该电路的cmos图象传感器
CN1481147A (zh) * 2002-07-25 2004-03-10 ��ʿͨ��ʽ���� 提供改进图像质量的图像传感器
US6803958B1 (en) * 1999-03-09 2004-10-12 Micron Technology, Inc. Apparatus and method for eliminating artifacts in active pixel sensor (APS) imagers
US6873363B1 (en) * 1999-02-16 2005-03-29 Micron Technology Inc. Technique for flagging oversaturated pixels
CN1684503A (zh) * 2004-04-13 2005-10-19 松下电器产业株式会社 用于防止由于强光的进入导致图像变暗的摄像装置

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JP3517614B2 (ja) * 1998-12-25 2004-04-12 株式会社東芝 固体撮像装置
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US6888572B1 (en) * 2000-10-26 2005-05-03 Rockwell Science Center, Llc Compact active pixel with low-noise image formation
US6822679B1 (en) * 2000-10-31 2004-11-23 Texas Instruments Incorporated Offset correction to the output of a charge coupled device
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JP3992504B2 (ja) * 2002-02-04 2007-10-17 富士通株式会社 Ｃｍｏｓイメージセンサ
JP3940618B2 (ja) * 2002-03-01 2007-07-04 株式会社東芝 固体撮像装置
JP4048415B2 (ja) * 2002-03-13 2008-02-20 ソニー株式会社 固体撮像装置及びその駆動方法
JP3912672B2 (ja) * 2002-07-05 2007-05-09 ソニー株式会社 固体撮像装置及びその画素欠陥検査方法
US7502059B2 (en) * 2002-08-22 2009-03-10 Aptina Imaging Corporation Asymmetric comparator for use in pixel oversaturation detection
KR100574891B1 (ko) 2003-01-13 2006-04-27 매그나칩 반도체 유한회사 클램프 회로를 갖는 이미지센서
JP3862683B2 (ja) * 2003-07-18 2006-12-27 キヤノン株式会社 固体撮像装置
JP4517660B2 (ja) * 2004-02-09 2010-08-04 ソニー株式会社 固体撮像装置、画像入力装置および固体撮像素子の駆動方法
US7477298B2 (en) * 2004-08-30 2009-01-13 Micron Technology, Inc. Anti-eclipsing circuit for image sensors
US7659928B2 (en) * 2005-04-21 2010-02-09 Aptina Imaging Corporation Apparatus and method for providing anti-eclipse operation for imaging sensors

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Publication number Priority date Publication date Assignee Title
US6469740B1 (en) * 1997-02-04 2002-10-22 Matsushita Electric Industrial Co., Ltd. Physical quantity distribution sensor and method for driving the same
US6873363B1 (en) * 1999-02-16 2005-03-29 Micron Technology Inc. Technique for flagging oversaturated pixels
US6803958B1 (en) * 1999-03-09 2004-10-12 Micron Technology, Inc. Apparatus and method for eliminating artifacts in active pixel sensor (APS) imagers
CN1437392A (zh) * 2002-02-07 2003-08-20 富士通株式会社 相关二次采样电路和包含该电路的cmos图象传感器
CN1481147A (zh) * 2002-07-25 2004-03-10 ��ʿͨ��ʽ���� 提供改进图像质量的图像传感器
CN1684503A (zh) * 2004-04-13 2005-10-19 松下电器产业株式会社 用于防止由于强光的进入导致图像变暗的摄像装置

Also Published As

Publication number Publication date
US7573519B2 (en) 2009-08-11
US20070091193A1 (en) 2007-04-26
KR101289516B1 (ko) 2013-07-24
JP2009514352A (ja) 2009-04-02
CN101305593A (zh) 2008-11-12
WO2007050298A1 (en) 2007-05-03
KR20080063361A (ko) 2008-07-03
EP1941716B1 (en) 2018-07-04
EP1941716A1 (en) 2008-07-09

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Patentee after: OmniVision Technologies, Inc.

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