CN1481147A - 提供改进图像质量的图像传感器 - Google Patents
提供改进图像质量的图像传感器 Download PDFInfo
- Publication number
- CN1481147A CN1481147A CNA031498124A CN03149812A CN1481147A CN 1481147 A CN1481147 A CN 1481147A CN A031498124 A CNA031498124 A CN A031498124A CN 03149812 A CN03149812 A CN 03149812A CN 1481147 A CN1481147 A CN 1481147A
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- pixel
- current potential
- reset
- potential
- imageing sensor
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- 230000010354 integration Effects 0.000 claims abstract description 28
- 238000006243 chemical reaction Methods 0.000 claims abstract description 18
- 238000005070 sampling Methods 0.000 claims description 76
- 238000001514 detection method Methods 0.000 claims description 12
- 238000012423 maintenance Methods 0.000 claims description 8
- 239000011159 matrix material Substances 0.000 abstract 1
- 239000003990 capacitor Substances 0.000 description 13
- 230000002596 correlated effect Effects 0.000 description 12
- 238000010586 diagram Methods 0.000 description 12
- 238000000034 method Methods 0.000 description 9
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- GOLXNESZZPUPJE-UHFFFAOYSA-N spiromesifen Chemical compound CC1=CC(C)=CC(C)=C1C(C(O1)=O)=C(OC(=O)CC(C)(C)C)C11CCCC1 GOLXNESZZPUPJE-UHFFFAOYSA-N 0.000 description 1
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Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/65—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to reset noise, e.g. KTC noise related to CMOS structures by techniques other than CDS
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
- H04N25/627—Detection or reduction of inverted contrast or eclipsing effects
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Solid State Image Pick-Up Elements (AREA)
Abstract
Description
Claims (10)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002216848 | 2002-07-25 | ||
JP216848/2002 | 2002-07-25 | ||
JP317032/2002 | 2002-10-31 | ||
JP2002317032A JP4187502B2 (ja) | 2002-07-25 | 2002-10-31 | 画質を向上させたイメージセンサ |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1481147A true CN1481147A (zh) | 2004-03-10 |
CN1217524C CN1217524C (zh) | 2005-08-31 |
Family
ID=32032715
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN031498124A Expired - Fee Related CN1217524C (zh) | 2002-07-25 | 2003-07-25 | 提供改进图像质量的图像传感器 |
Country Status (5)
Country | Link |
---|---|
US (1) | US7170556B2 (zh) |
JP (1) | JP4187502B2 (zh) |
KR (1) | KR100903041B1 (zh) |
CN (1) | CN1217524C (zh) |
TW (1) | TWI222323B (zh) |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100403779C (zh) * | 2004-06-04 | 2008-07-16 | 威盛电子股份有限公司 | 数字式图像传感器及其操作方法 |
CN1816113B (zh) * | 2005-02-03 | 2010-06-02 | 富士通微电子株式会社 | 成像设备 |
CN101815179A (zh) * | 2010-04-15 | 2010-08-25 | 昆山锐芯微电子有限公司 | Cmos图像传感器 |
CN101305593B (zh) * | 2005-10-26 | 2010-12-08 | 伊斯曼柯达公司 | 用于校正掩食或变暗的方法 |
CN1893542B (zh) * | 2005-06-08 | 2011-01-12 | 三星电子株式会社 | 具有减少引线的像素电路 |
CN101090438B (zh) * | 2006-06-12 | 2011-01-19 | 精工电子有限公司 | 光电转换装置及其驱动方法、图像传感器、光学读取装置 |
CN101415072B (zh) * | 2004-07-02 | 2011-02-23 | 富士通半导体股份有限公司 | 成像设备及其控制方法以及cmos图像传感器 |
CN101494728B (zh) * | 2004-04-30 | 2011-04-06 | 伊斯曼柯达公司 | 用于消除噪声的方法 |
US7956908B2 (en) | 2004-09-08 | 2011-06-07 | Crosstek Capital, LLC | Read-out circuit of image sensor |
CN103685993B (zh) * | 2012-08-30 | 2017-03-01 | 豪威科技股份有限公司 | 用于减少cmos图像传感器的模拟图像数据中的噪声的方法及设备 |
CN110262300A (zh) * | 2018-03-12 | 2019-09-20 | 半导体元件工业有限责任公司 | 图像传感器及操作图像传感器中的升压器电路的方法 |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4251811B2 (ja) * | 2002-02-07 | 2009-04-08 | 富士通マイクロエレクトロニクス株式会社 | 相関二重サンプリング回路とこの相関二重サンプリング回路を備えたcmosイメージセンサ |
US7062402B2 (en) * | 2004-05-19 | 2006-06-13 | Microsoft Corp | System and method for automatic testing of output device capabilities via electronic document |
US7477298B2 (en) * | 2004-08-30 | 2009-01-13 | Micron Technology, Inc. | Anti-eclipsing circuit for image sensors |
JP4759293B2 (ja) * | 2005-03-15 | 2011-08-31 | キヤノン株式会社 | 撮像素子 |
US7916186B2 (en) * | 2005-04-07 | 2011-03-29 | Micron Technology, Inc. | Anti-eclipse circuitry with tracking of floating diffusion reset level |
US7282685B2 (en) * | 2005-04-14 | 2007-10-16 | Micron Technology, Inc. | Multi-point correlated sampling for image sensors |
US7659928B2 (en) * | 2005-04-21 | 2010-02-09 | Aptina Imaging Corporation | Apparatus and method for providing anti-eclipse operation for imaging sensors |
US7872682B2 (en) | 2005-05-10 | 2011-01-18 | Micron Technology, Inc. | Eclipse elimination by monitoring the pixel signal level |
JP2006352341A (ja) * | 2005-06-14 | 2006-12-28 | Micron Technol Inc | アンチエクリプス回路及びその動作方法 |
KR100775009B1 (ko) * | 2005-08-03 | 2007-11-09 | 한국과학기술원 | 상관 이중 샘플링 회로 및 이를 구비한 시모스 이미지 센서 |
JP4396655B2 (ja) * | 2006-03-06 | 2010-01-13 | ソニー株式会社 | 固体撮像装置 |
JP4572935B2 (ja) * | 2007-01-29 | 2010-11-04 | Tdk株式会社 | 接合装置の検出対象物の検出方法、接合装置及び接合方法 |
US20080179298A1 (en) * | 2007-01-29 | 2008-07-31 | Tdk Corporation | Method of detecting an object to be detected in a joining device, joining device, and joining method |
JP4385059B2 (ja) | 2007-05-16 | 2009-12-16 | シャープ株式会社 | イメージセンサ |
TWI413242B (zh) * | 2007-08-10 | 2013-10-21 | Hon Hai Prec Ind Co Ltd | 固態圖像感測器 |
JP2009159069A (ja) * | 2007-12-25 | 2009-07-16 | Panasonic Corp | 固体撮像装置およびカメラ |
FR2943178B1 (fr) * | 2009-03-13 | 2011-08-26 | New Imaging Technologies Sas | Capteur matriciel a faible consommation |
US8720125B2 (en) | 2009-07-28 | 2014-05-13 | Micah F. Andretich | Sustainable, mobile, expandable structure |
KR101107168B1 (ko) | 2010-01-04 | 2012-01-25 | 삼성모바일디스플레이주식회사 | 엑스레이 검출장치 및 이의 구동방법 |
KR101147422B1 (ko) | 2010-01-05 | 2012-05-24 | 삼성모바일디스플레이주식회사 | 엑스레이 감지 장치 및 엑스선 감지 방법 |
WO2011116345A1 (en) | 2010-03-19 | 2011-09-22 | Invisage Technologies, Inc. | Dark current reduction in image sensors via dynamic electrical biasing |
KR101368244B1 (ko) * | 2011-12-30 | 2014-02-28 | 주식회사 실리콘웍스 | 유기발광다이오드 표시장치의 문턱전압 센싱 회로 |
US9491383B2 (en) * | 2013-06-07 | 2016-11-08 | Invisage Technologies, Inc. | Image sensor with noise reduction |
JP6171997B2 (ja) * | 2014-03-14 | 2017-08-02 | ソニー株式会社 | 固体撮像素子およびその駆動方法、並びに電子機器 |
WO2016019258A1 (en) | 2014-07-31 | 2016-02-04 | Emanuele Mandelli | Image sensors with noise reduction |
US10425601B1 (en) | 2017-05-05 | 2019-09-24 | Invisage Technologies, Inc. | Three-transistor active reset pixel |
US10270992B1 (en) * | 2017-11-30 | 2019-04-23 | Taiwan Semiconductor Manufacturing Co., Ltd. | Sampling device and method for reducing noise |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6667768B1 (en) * | 1998-02-17 | 2003-12-23 | Micron Technology, Inc. | Photodiode-type pixel for global electronic shutter and reduced lag |
JP3517614B2 (ja) * | 1998-12-25 | 2004-04-12 | 株式会社東芝 | 固体撮像装置 |
KR100284309B1 (ko) * | 1998-12-30 | 2001-03-02 | 김영환 | 이미지 센서에서의 리셋 전압을 자동으로 조절하기 위한 리셋전압 조절 장치 |
US6803958B1 (en) * | 1999-03-09 | 2004-10-12 | Micron Technology, Inc. | Apparatus and method for eliminating artifacts in active pixel sensor (APS) imagers |
KR100399954B1 (ko) | 2000-12-14 | 2003-09-29 | 주식회사 하이닉스반도체 | 아날로그 상호 연관된 이중 샘플링 기능을 수행하는씨모스 이미지 센서용 비교 장치 |
-
2002
- 2002-10-31 JP JP2002317032A patent/JP4187502B2/ja not_active Expired - Fee Related
-
2003
- 2003-07-14 TW TW092119140A patent/TWI222323B/zh not_active IP Right Cessation
- 2003-07-15 US US10/618,851 patent/US7170556B2/en active Active
- 2003-07-22 KR KR1020030050013A patent/KR100903041B1/ko active IP Right Grant
- 2003-07-25 CN CN031498124A patent/CN1217524C/zh not_active Expired - Fee Related
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101494728B (zh) * | 2004-04-30 | 2011-04-06 | 伊斯曼柯达公司 | 用于消除噪声的方法 |
CN100403779C (zh) * | 2004-06-04 | 2008-07-16 | 威盛电子股份有限公司 | 数字式图像传感器及其操作方法 |
CN101415072B (zh) * | 2004-07-02 | 2011-02-23 | 富士通半导体股份有限公司 | 成像设备及其控制方法以及cmos图像传感器 |
US7956908B2 (en) | 2004-09-08 | 2011-06-07 | Crosstek Capital, LLC | Read-out circuit of image sensor |
CN1816113B (zh) * | 2005-02-03 | 2010-06-02 | 富士通微电子株式会社 | 成像设备 |
CN1893542B (zh) * | 2005-06-08 | 2011-01-12 | 三星电子株式会社 | 具有减少引线的像素电路 |
CN101305593B (zh) * | 2005-10-26 | 2010-12-08 | 伊斯曼柯达公司 | 用于校正掩食或变暗的方法 |
CN101090438B (zh) * | 2006-06-12 | 2011-01-19 | 精工电子有限公司 | 光电转换装置及其驱动方法、图像传感器、光学读取装置 |
CN101815179A (zh) * | 2010-04-15 | 2010-08-25 | 昆山锐芯微电子有限公司 | Cmos图像传感器 |
CN103685993B (zh) * | 2012-08-30 | 2017-03-01 | 豪威科技股份有限公司 | 用于减少cmos图像传感器的模拟图像数据中的噪声的方法及设备 |
CN110262300A (zh) * | 2018-03-12 | 2019-09-20 | 半导体元件工业有限责任公司 | 图像传感器及操作图像传感器中的升压器电路的方法 |
CN110262300B (zh) * | 2018-03-12 | 2022-07-19 | 半导体元件工业有限责任公司 | 图像传感器及操作图像传感器中的升压器电路的方法 |
Also Published As
Publication number | Publication date |
---|---|
CN1217524C (zh) | 2005-08-31 |
US7170556B2 (en) | 2007-01-30 |
JP4187502B2 (ja) | 2008-11-26 |
TW200402234A (en) | 2004-02-01 |
US20040119853A1 (en) | 2004-06-24 |
JP2004112740A (ja) | 2004-04-08 |
TWI222323B (en) | 2004-10-11 |
KR20040010299A (ko) | 2004-01-31 |
KR100903041B1 (ko) | 2009-06-18 |
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