CN101295626A - Method and device for peeling chip and adhesive film - Google Patents
Method and device for peeling chip and adhesive film Download PDFInfo
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- CN101295626A CN101295626A CNA2007100976254A CN200710097625A CN101295626A CN 101295626 A CN101295626 A CN 101295626A CN A2007100976254 A CNA2007100976254 A CN A2007100976254A CN 200710097625 A CN200710097625 A CN 200710097625A CN 101295626 A CN101295626 A CN 101295626A
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Abstract
Description
技术领域 technical field
本发明涉及一种剥离方法与装置,尤其涉及一种利用真空负压所产生的作用力以逐段剥离薄膜脱离芯片的一种芯片与胶膜剥离方法及其装置。The invention relates to a stripping method and device, in particular to a method and a device for peeling off a film from a chip by using the force generated by vacuum negative pressure to peel off the film piece by piece.
背景技术 Background technique
现有的芯片顶出装置如图1A所示,其是由顶针101以及取放头102所所组成,此装置目的在使芯片900与薄膜902黏着的面分离,以利于后续取放头102吸取芯片900。如图2A与图2B所示,所述图为晶圆俯视以及剖视示意图。所述晶圆90上具有多枚芯片900,所述多枚芯片900是黏着于一薄膜902上。不过图1A的技术因为顶针会对芯片产生应力集中作用,因此容易损伤芯片。此外,图1A的技术也仅能适用于芯片厚度3mil以上的芯片。The existing chip ejection device is shown in FIG. 1A, which is composed of
至于3mil以下的芯片厚度需以非针床顶出方式顶出,目前非顶针装置有如图1B所示,其为美国公告专利US.Pat.No.4,990,051所揭露的技术,所述图为现有的非顶针式的芯片与薄膜剥离装置示意图。在本实施例中,透过两阶段的作动将芯片顶出至取放头112上。亦即,第一阶段先以顶出机构111将芯片900顶出至一特定位置;然后在第二阶段中,再以顶针110将芯片900顶出。本实施例虽可以应用于3mil以下的芯片,也可以减少如图1A的现有技术所产生的应力集中的问题,不过所述技术却无法适用于不同尺寸大小的芯片,因此当芯片尺寸有变化时,必须要更换不同的尺寸顶出机构,如此变化降低生产效率,无形中增加了生产成本。As for the thickness of the chip below 3mil, it needs to be ejected in a non-needle bed ejection method. The current non-ejector device is shown in Figure 1B, which is the technology disclosed in the US Patent No. 4,990,051. The figure is an existing one. Schematic diagram of the non-thimble chip and film peeling device. In this embodiment, the chip is ejected onto the pick-and-
综合上述,因此亟需一种芯片与胶膜剥离方法及其装置来解决现有技术所产生的问题。Based on the above, there is an urgent need for a method and device for peeling off a chip from an adhesive film to solve the problems in the prior art.
发明内容 Contents of the invention
本发明的主要目的是提供一种芯片与胶膜剥离方法,其是通过真空负压所产生的作用力以逐段剥离黏着于芯片上的薄膜,使其逐渐脱离芯片,达到减少及集中应力,避免在剥离过程中损坏芯片的目的。The main purpose of the present invention is to provide a chip and adhesive film peeling method, which uses the force generated by the vacuum negative pressure to peel off the film adhered to the chip piece by piece, so that it is gradually separated from the chip, so as to reduce and concentrate the stress. The purpose of avoiding damage to the chip during the peeling process.
本发明的次要目的是提供一种芯片与胶膜剥离装置,其是通过可以逐段下降的机构使真空负压所产生的作用力剥离黏着于芯片上的薄膜,使芯片脱离薄膜达到减少集中应力,避免在剥离过程中损坏芯片的目的。The secondary purpose of the present invention is to provide a device for stripping the chip from the adhesive film, which uses a mechanism that can be lowered step by step to make the force generated by the vacuum negative pressure peel off the film adhered to the chip, so that the chip is separated from the film to reduce concentration. stress, for the purpose of avoiding damage to the chip during the lift-off process.
本发明的另一次要目的是提供一种芯片与胶膜剥离装置,其是可调整芯片与承载座体的高度,以控制剥离高度。Another secondary object of the present invention is to provide a device for peeling off the chip and the adhesive film, which can adjust the height of the chip and the carrier to control the peeling height.
本发明的另一次要目的是提供一种芯片与胶膜剥离装置,其是具有多段的剥离机构,以适应不同的晶面尺寸,避免现有技术中,因为尺寸改变时,而必须更换不同尺寸的剥离装置的问题。Another secondary purpose of the present invention is to provide a chip and adhesive film peeling device, which has a multi-stage peeling mechanism to adapt to different crystal plane sizes, avoiding the need to replace different sizes when the size changes in the prior art problem with the stripping device.
为了达到上述的目的,本发明提供一种芯片与胶膜剥离方法,其是包括有下列步骤:(a)提供一晶圆,其是黏着于一胶膜上,所述晶圆具有多个芯片;(b)移动欲剥离的芯片至一定位上,并固定所述芯片;以及(c)通过一作用力,使所述胶膜以环状且由外向内脱离所述欲剥离的芯片。其中所述作用力为一真空吸力。In order to achieve the above object, the present invention provides a chip and adhesive film peeling method, which includes the following steps: (a) providing a wafer, which is adhered on an adhesive film, the wafer has a plurality of chips ; (b) move the chip to be peeled to a position, and fix the chip; and (c) make the adhesive film ring-shaped and separate from the chip to be peeled from the outside to the inside by a force. Wherein said acting force is a vacuum suction.
为了达到上述的目的,本发明更提供一种芯片与胶膜剥离方法,其是包括有下列步骤:(a)提供一晶圆,其是黏着于一胶膜上,所述晶圆具有多个芯片;(b)移动欲剥离的芯片至一剥离装置上;(c)固定所述欲剥离的芯片,并提供一作用力于所述胶膜上;以及(d)使所述剥离装置以环形且由外向内逐渐脱离与所述欲剥离的芯片相黏着的胶膜,以使所述作用力逐渐作用于与所述欲剥离的芯片相黏着的胶膜上,而使所述胶膜逐渐脱离所述欲剥离的芯片。其中所述作用力为一真空吸力。In order to achieve the above object, the present invention further provides a chip and adhesive film peeling method, which includes the following steps: (a) providing a wafer, which is adhered on an adhesive film, and the wafer has a plurality of chip; (b) move the chip to be peeled off to a peeling device; (c) fix the chip to be peeled off, and provide an active force on the adhesive film; and (d) make the peeling device loop And gradually break away from the adhesive film adhered to the chip to be peeled off from the outside to the inside, so that the force gradually acts on the adhesive film adhered to the chip to be peeled off, so that the adhesive film is gradually separated The chip to be peeled off. Wherein said acting force is a vacuum suction.
较佳的是,所述芯片与胶膜剥离方法,其是更包括有下列步骤:(e)当所述胶膜与所述欲剥离装置呈现线接触时,取出所述欲剥离的芯片;以及(f)重复执行步骤(b)至(f)。Preferably, the chip and adhesive film peeling method further includes the following steps: (e) when the adhesive film is in line contact with the device to be peeled off, taking out the chip to be peeled off; and (f) Repeat steps (b) to (f).
为了达到上述的目的,本发明更提供一种芯片与胶膜剥离装置,包括:一承载座体,其是具有一容置空间,所述承载座体的上表面具有一开孔以及多个负压孔,所述开孔是与所述容置空间相连通;一剥离单元,其是设置于所述容置空间内,所述剥离单元的一端具有一接触部,其是延伸出所述容置空间而容置于所述开孔内,所述接触部内更开设有一第一通孔;一底座体,其是设置于所述容置空间内,所述底座体具有一顶柱,所述顶柱是可通过所述第一通孔;以及一第一弹性体,其套设于所述顶柱上,所述第一弹性体的一端是与所述剥离单元相邻靠而另一端是与所述底座体相邻靠。In order to achieve the above object, the present invention further provides a chip and adhesive film peeling device, comprising: a bearing base with an accommodating space, the upper surface of the bearing base has an opening and a plurality of negative Pressing hole, the opening is connected with the accommodating space; a stripping unit, which is arranged in the accommodating space, and one end of the stripping unit has a contact portion, which extends out of the accommodating space The opening is accommodated in the opening, and a first through hole is further opened in the contact portion; a base body is arranged in the accommodation space, and the base body has a top column. The top post can pass through the first through hole; and a first elastic body is sheathed on the top post, one end of the first elastic body is adjacent to the peeling unit and the other end is Adjacent to the base body.
较佳的是,所述底座体的两端更分别开设有一导引通孔。所述芯片与胶膜剥离装置,其是更具有一位置调整部,包括:一固定座,其是设置于所述底座体的一侧,所述固定座上更具有一调整通孔;一对导杆,其是与所述固定座相连接,所述对导杆是分别通过所述导引通孔,使所述底座体可于所述对导杆上滑动;以及一调整螺,其是与所述调整通孔相偶接,所述调整螺的一端是与所述底座体相抵靠。Preferably, two ends of the base body are respectively provided with a guiding through hole. The chip and adhesive film peeling device further has a position adjustment part, including: a fixed seat, which is arranged on one side of the base body, and the fixed seat has an adjustment through hole; a pair of a guide rod, which is connected with the fixed seat, and the pair of guide rods pass through the guide through holes respectively, so that the base body can slide on the pair of guide rods; and an adjustment screw, which is Coupled with the adjustment through hole, one end of the adjustment screw abuts against the base body.
较佳的是,所述芯片与胶膜剥离装置,其是更具有至少一子剥离单元,其是设置于所述剥离单元内,所述子剥离单元的顶部具有一子接触部,其是容置于所述通孔内,所述子接触部的内部更开设有一第二通孔以提供所述顶柱通过。其中所述子剥离单元与所述底座体之间更具有一第二弹性体。Preferably, the chip and adhesive film stripping device has at least one sub-peeling unit, which is arranged in the stripping unit, and the top of the sub-peeling unit has a sub-contact portion, which is accommodating Placed in the through hole, a second through hole is further opened inside the sub-contact portion to allow the top post to pass through. Wherein, there is a second elastic body between the sub-peeling unit and the base body.
附图说明 Description of drawings
图1A与图1B为现有的芯片与薄膜剥离装置示意图;1A and 1B are schematic diagrams of existing chip and film stripping devices;
图2A与图2B为晶圆俯视以及剖视示意图;FIG. 2A and FIG. 2B are wafer top views and cross-sectional schematic diagrams;
图3为本发明芯片与胶膜剥离方法第一实施例流程示意图;Fig. 3 is a schematic flow chart of the first embodiment of the peeling method of the chip and the adhesive film of the present invention;
图4为本发明的芯片与胶膜剥离方法第二实施例流程示意图;Fig. 4 is the schematic flow chart of the second embodiment of the peeling method of the chip and the adhesive film of the present invention;
图5A与图5B为本发明的芯片与薄膜剥离装置第一较佳实施例立体分解以及剖面示意图;5A and 5B are three-dimensional exploded and cross-sectional schematic diagrams of the first preferred embodiment of the chip and film peeling device of the present invention;
图6为本发明的芯片与薄膜剥离装置中的承载座体俯视示意图;Fig. 6 is a schematic top view of the carrier body in the chip and film peeling device of the present invention;
图7为本发明的芯片与薄膜剥离装置中的剥离单元与承载座体表面之间高度示意图;7 is a schematic diagram of the height between the peeling unit and the surface of the supporting base in the chip and film peeling device of the present invention;
图8A至图8I为本发明的芯片与薄膜剥离装置实施流程示意图。8A to 8I are schematic diagrams of the implementation process of the chip and film peeling device of the present invention.
附图标记说明:101-顶针;102-取放头;110-顶针;111-顶出机构;112-取放头;2-芯片与胶膜剥离方;20~22-步骤;3-芯片与胶膜剥离方;30~34-步骤;4-芯片与薄膜剥离装置;40-承载座体;400-容置空间;401-表面;402-开孔;403-负压孔;404、405-沟槽;41-剥离单元;410-接触部;411-第一通孔;412-板体;413-第一固定通孔;414-第一凸部;42-底座体;420-顶柱;421-圆孔;422-固定杆;423-导引通孔;43-第一弹性体;44-子剥离单元;440-子接触部;441-第二通孔;442-第二固定通孔;443-第二凸部;45-第二弹性体;46-位置调整部;460-固定座;4601-调整通孔;461-对导杆;462-调整螺;463-固定螺帽;47-第三弹性体;48-拉杆;480-杆体;481-凹形体;4810-凹槽;49-盖体;5-吸嘴;90-晶圆;900、901s-芯片;902-薄膜;91-作用力;92-真空吸力;h-高度。Explanation of reference signs: 101-ejector; 102-pick-and-place head; 110-thimble; 111-ejector mechanism; 112-pick-and-place head; Film peeling method; 30~34-steps; 4-chip and film peeling device; 40-carrying base; 400-accommodating space; 401-surface; 402-opening; 403-negative pressure hole; Groove; 41-peeling unit; 410-contact portion; 411-first through hole; 412-plate body; 413-first fixing through hole; 414-first protrusion; 42-base body; 421-round hole; 422-fixing rod; 423-guiding through hole; 43-first elastic body; 44-sub-peeling unit; 440-sub-contact portion; 441-second through hole; ; 443-the second convex part; 45-the second elastic body; 46-position adjustment part; 460-fixed seat; 4601-adjustment through hole; -the third elastic body; 48-tie rod; 480-rod body; 481-concave body; 4810-groove; 49-cover body; 5-suction nozzle; 90-wafer; - force; 92 - vacuum suction; h - height.
具体实施方式 Detailed ways
为了对本发明的特征、目的及功能有更进一步的认知与了解,下文特将本发明的装置的相关细部结构以及设计的理念原由进行说明,以使得可以了解本发明的特点,详细说明陈述如下:In order to have a further cognition and understanding of the features, purpose and functions of the present invention, the relevant detailed structure and design concept of the device of the present invention will be described below, so that the characteristics of the present invention can be understood, and the detailed description is as follows :
请参阅图3所示,所述图为本发明芯片与胶膜剥离方法第一实施例流程示意图。所述方法是包括有下列步骤:首先进行步骤20,提供一晶圆,其是黏着于一胶膜上,所述晶圆上是具有多个芯片。所述晶圆的结构如图2A与图2B所示,在此不作赘述。再回到图3所示,接下来进行步骤21,移动欲剥离的芯片至一定位上,并固定所述芯片。步骤21中的固定方式,可通过一吸嘴抵靠于欲剥离的芯片上,以固定所述芯片的位置。Please refer to FIG. 3 , which is a schematic flow chart of the first embodiment of the peeling method of the chip and the adhesive film of the present invention. The method includes the following steps: first,
步骤21之后,再进行步骤22,其是可以通过一作用力作用于胶膜上,使得所述胶膜以环状且由外向内脱离所述欲剥离的芯片。在本实施例中,所述作用力是通过一真空负压提供,通过真空负压作用于薄膜上,使得薄膜开始由芯片的周围开始剥离。After
请参阅图4所示,所述图为本发明的芯片与胶膜剥离方法第二实施例流程示意图。在本实施例中,所述方法是包括有下列步骤:首先进行步骤30,提供一晶圆,其是黏着于一胶膜上,所述晶圆具有多个芯片。然后进行步骤31,移动欲剥离的芯片至一剥离装置上,所述剥离装置可以分段逐步离开薄膜。接着,进行步骤32,固定所述欲剥离的芯片,并提供一作用力于所述胶膜上。然后,再使所述剥离装置以环形且由外向内逐渐脱离与所述欲剥离的芯片相黏着的胶膜,以使所述作用力逐渐作用于与所述欲剥离的芯片相黏着的胶膜上,而使所述胶膜逐渐脱离所述欲剥离的芯片。然后,再进行步骤33,当所述胶膜与所述欲剥离装置呈现线接触时,取出所述欲剥离的芯片。最后再重复进行步骤31至步骤33,将所述多个芯片由所述薄膜剥离,而取出所述多个芯片。Please refer to FIG. 4 , which is a schematic flow chart of the second embodiment of the peeling method of the chip and the adhesive film of the present invention. In this embodiment, the method includes the following steps: firstly,
接下来说明图4中的剥离装置的实施方式。请参阅图5A与图5B所示,所述图为本发明的芯片与薄膜剥离装置第一较佳实施例立体分解以及剖面示意图。所述芯片与薄膜剥离装置4具有一承载座体40、一剥离单元41、一底座体42以及一第一弹性体43。所述承载座体40,其是具有一容置空间400,所述承载座体40的上表面401可提供承载晶圆,且开设有一开孔402,所述开孔402是与所述容置空间400相连通。如图6所示,所述承载座体40的表面401上具有多个负压孔403,为了增加真空负压的效果,所述承载座体40的表面401更具有多个沟槽404、405与所述负压孔403相连通。Next, an embodiment of the peeling device in FIG. 4 will be described. Please refer to FIG. 5A and FIG. 5B , which are perspective exploded and cross-sectional diagrams of the first preferred embodiment of the chip and film peeling device of the present invention. The chip and
所述剥离单元41,其是设置于所述容置空间400内,所述剥离单元41的一端具有一接触部410,其是延伸出所述容置空间400而容置于所述开孔402内,所述剥离单元41内更开设有一第一通孔411,其是贯穿整个剥离单元41而于所述接触部410上呈现出开口。所述接触部410的端面是与薄膜相接触。所述底座体42,其是设置于所述容置空间400内,所述底座体42具有一顶柱420,所述顶柱420是可通过所述第一通孔411。所述顶柱420通过所述第一通孔411的端面为一圆弧面,其是可与所述薄膜形成线接触。所述第一弹性体43,其套设于所述顶柱420上,所述第一弹性体43的一端是与所述剥离单元41的内壁相邻靠而另一端是与所述底座体42相邻靠。所述剥离单元41的两侧分别设置有一板体412。The stripping
在所述剥离单元41的内部更可以设置至少一个子剥离单元44,其前端具有一子接触部440,在本实施例中,所述子接触部440的端面是与所述接触部410的端面切齐,且与薄膜相接触。通过所述剥离单元41与所述至少一个子剥离单元44的组合,可以使得接触部410与所述至少一子接触部440在整个剥离过程中,形成多个剥离阶段。所述子剥离单元44中心区域具有一第二通孔441,可提供所述顶柱420通过。同样在所述子剥离单元44与所述底座体42之间也设置有一第二弹性体45。所述第二弹性体45是套设于所述顶柱420上且容置于所述第一弹性体43之内。所述第二弹性体45的一端与所述子剥离单元44的内壁相顶靠,而以另一端与所述底座体42相抵靠。At least one
为了控制所述剥离单元41以及所述子剥离单元44的移动行程,所述顶柱420上更开设有一圆孔421,以提供一固定杆422通过,所述固定杆422的两端是分别于所述顶柱420的两侧。此外,所述剥离单元41的两侧分别开设有一第一固定通孔413,而所述至少一子剥离单元44的两侧也开设有一第二固定通孔442。所述顶柱420的两侧的固定杆422两端是分别通过所述第一固定通孔413以及所述第二固定通孔442,以局限所述剥离单元41与所述子剥离单元44移动的行程。In order to control the moving strokes of the peeling
为了可以调整所述剥离单元41以及所述子剥离单元44的初始位置,所述底座体42的下侧更设置有一位置调整部46,其是具有一固定座460、一对导杆461、一调整螺462以及一固定螺帽463。所述固定座460,其是设置于所述底座体42的一侧,所述固定座460上更具有一调整通孔4601。所述对导杆461,其是与所述固定座460相连接,所述对导杆461是分别通过底座体42上的导引通孔423,使所述底座体42可于所述对导杆461上滑动。所述调整螺462,其是与所述调整通孔4601相偶接而利用所述固定螺帽463予以固定,所述调整螺462的一端是与所述底座体42相抵靠。此外,一第三弹性体47,其是设置于所述容置空间400内,所述第三弹性体47是以一端与所述底座体42相抵靠而以另一端与所述承载座体40的内壁相抵靠。通过所述位置调整部46,可以调整所述底座体42的位置,进而调整所述接触部41与所述子接触部44的位置,而改变所述接触部41与子接触部44端面距离所述承载座体表面401的高度h(如图7所示)。In order to adjust the initial positions of the peeling
为了控制剥离单元41的动作,本发明是通过一拉杆48带动整个剥离单元41向下运动。所述拉杆48具有一杆体480以及一凹形体481。所述凹形体481,其是与所述杆体480的一端相连接,所述凹形体481的两侧分别具有一凹槽4810,以分别与所述剥离单元41两侧的板体412相扣合。再通过一盖体49,设置于所述承载座体40的底部,以提供固定整个芯片与薄膜剥离装置内的组件组合。In order to control the action of the peeling
请参阅图8A至图8I所示,所述图为本发明的芯片与薄膜剥离装置实施流程示意图。首先如图8A所示,当欲剥离的芯片901移动至承载座体40上,所述剥离单元41的接触部410与所述子剥离单元44的子接触部440的端面与芯片901底部的薄膜902相对应。接着如图8B所示,此时欲剥离的芯片901上方的吸嘴5向下移动并利用真空吸力92固定所述芯片901。接下来,参阅图8C所示,提供真空负压,此时负压由负压孔403提供作用力91于所述芯片901底部的薄膜902上,使得芯片901边角的薄膜预先剥离。接着如图8D所示,接着透过前述的拉杆480,产生向下的拉力作用于所述剥离单元41两侧的板体412(图5A所示),以拉动所述剥离单元41向下移动。当所述剥离单元41向下移动时,原先于所述剥离单元41的接触部410上方的薄膜受到真空负压的作用,使得芯片901下方的薄膜脱离所述芯片901。Please refer to FIG. 8A to FIG. 8I , which are schematic diagrams of the implementation process of the chip and film peeling device of the present invention. First, as shown in FIG. 8A, when the
如图8E所示,由于所述剥离单元41的内部侧壁上具有一第一凸部414,而所述子剥离单元44的外壁上也具有一第二凸部443。因此当所述剥离单元41下降到特定位置时,所述第一凸部414会与所述第二凸部443相抵靠,而带动所述子剥离单元44下降,使得所述子剥离单元44脱离所述芯片901下方的薄膜902,进而使得真空负压产生的作用力于所述薄膜902上,使得原先与所述子剥离单元44相接触的薄膜902也脱离芯片901。当所述剥离单元41与子剥离单元44脱离所述薄膜902后,此时只剩下所述顶柱420上方的端面与所述芯片901底部的薄膜902相接触。由于所述顶柱420上方的端面是呈现圆弧状,因此所述顶柱420在此阶段是与所述薄膜902呈现线接触的状态。接着,如图8F所示,并使所述吸嘴5将所述芯片901取出,并同时将真空负压91解除。接着,如图8G、图8H以及图8I所示,所述剥离单元41与所述子剥离单元44分别通过第二弹性体45与第一弹性体43的弹力复归回复至原先的位置,以完成整个剥离芯片离开薄膜的程序。透过反复执行图8A至图8I的程序,以将所有的芯片取出。As shown in FIG. 8E , since the inner side wall of the peeling
图5A的实施例中是利用一个剥离单元与一个子剥离单元相组合,在实施场合上只要有一个剥离单元的结构就可以达成本发明要脱离芯片与薄膜的目的,亦即利用所述剥离单元与顶柱的组合,即可达到剥离芯片的目的。在另一个实施例中,也可以根据子剥离单元与剥离单元的设计原理,在所述剥离单元内设置多个子剥离单元,以适用不同的芯片尺寸大小。In the embodiment of Fig. 5A, a peeling unit and a sub-peeling unit are used in combination. On the actual occasion, as long as there is a structure of a peeling unit, the purpose of the present invention to be separated from the chip and the film can be achieved, that is, using the peeling unit The combination with the top pillar can achieve the purpose of peeling off the chip. In another embodiment, according to the sub-stripping unit and the design principle of the stripping unit, a plurality of sub-stripping units may be provided in the stripping unit to adapt to different chip sizes.
以上所述,仅为本发明的较佳实施例,当不能以之限制本发明范围。即大凡依本发明权利要求所做的均等变化及修饰,仍将不失本发明的要义所在,亦不脱离本发明的精神和范围,故都应视为本发明的进一步实施状况。The above descriptions are only preferred embodiments of the present invention, and should not be used to limit the scope of the present invention. That is, all equivalent changes and modifications made according to the claims of the present invention will still not lose the gist of the present invention, nor depart from the spirit and scope of the present invention, so all should be regarded as further implementation status of the present invention.
综合上述,本发明的芯片与胶膜剥离方法及其装置不但可以有效减少在剥离过程中应力集中的现象以避免芯片破损,更可以适用于不同范围的芯片尺寸,以避免现有技术需要不时更换其他尺寸的剥离装置的问题。因此可以满足业界的需求,进而提高所述产业的竞争力。Based on the above, the peeling method and device of the chip and the adhesive film of the present invention can not only effectively reduce the phenomenon of stress concentration during the peeling process to avoid chip damage, but also be applicable to different chip sizes, so as to avoid the need to replace the existing technology from time to time Problems with other sizes of strippers. Therefore, the needs of the industry can be met, thereby improving the competitiveness of the industry.
Claims (10)
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| CNA2007100976254A CN101295626A (en) | 2007-04-24 | 2007-04-24 | Method and device for peeling chip and adhesive film |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101752204B (en) * | 2008-12-19 | 2011-06-29 | 均豪精密工业股份有限公司 | Chip and film separation method and chip removal method |
| CN113526118A (en) * | 2021-07-27 | 2021-10-22 | 中电鹏程智能装备有限公司 | Quick and reliable heat conduction material separating mechanism |
| CN113670815A (en) * | 2021-10-22 | 2021-11-19 | 南京日托光伏新能源有限公司 | A tensile test method for solder paste and core board for MWT components |
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2007
- 2007-04-24 CN CNA2007100976254A patent/CN101295626A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101752204B (en) * | 2008-12-19 | 2011-06-29 | 均豪精密工业股份有限公司 | Chip and film separation method and chip removal method |
| CN113526118A (en) * | 2021-07-27 | 2021-10-22 | 中电鹏程智能装备有限公司 | Quick and reliable heat conduction material separating mechanism |
| CN113670815A (en) * | 2021-10-22 | 2021-11-19 | 南京日托光伏新能源有限公司 | A tensile test method for solder paste and core board for MWT components |
| CN113670815B (en) * | 2021-10-22 | 2022-02-18 | 南京日托光伏新能源有限公司 | Tensile test method for solder paste and core plate of MWT component |
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