CN101154177A - Usb测试电路 - Google Patents
Usb测试电路 Download PDFInfo
- Publication number
- CN101154177A CN101154177A CNA2007101496165A CN200710149616A CN101154177A CN 101154177 A CN101154177 A CN 101154177A CN A2007101496165 A CNA2007101496165 A CN A2007101496165A CN 200710149616 A CN200710149616 A CN 200710149616A CN 101154177 A CN101154177 A CN 101154177A
- Authority
- CN
- China
- Prior art keywords
- usb
- signal
- test
- data
- grouping
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/267—Reconfiguring circuits for testing, e.g. LSSD, partitioning
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Information Transfer Systems (AREA)
Abstract
Description
Claims (12)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006266655 | 2006-09-29 | ||
JP2006-266655 | 2006-09-29 | ||
JP2006266655A JP4422134B2 (ja) | 2006-09-29 | 2006-09-29 | Usbテスト回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101154177A true CN101154177A (zh) | 2008-04-02 |
CN101154177B CN101154177B (zh) | 2012-02-08 |
Family
ID=39255850
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2007101496165A Expired - Fee Related CN101154177B (zh) | 2006-09-29 | 2007-09-10 | Usb测试电路 |
Country Status (4)
Country | Link |
---|---|
US (1) | US8099633B2 (zh) |
JP (1) | JP4422134B2 (zh) |
KR (1) | KR20080030472A (zh) |
CN (1) | CN101154177B (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI689813B (zh) * | 2014-10-30 | 2020-04-01 | 美商高通公司 | 用於電子系統中多重介面除錯之嵌入式通用串列匯流排除錯 |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI413905B (zh) * | 2010-03-24 | 2013-11-01 | Inventec Corp | 通用序列匯流排埠測試裝置 |
CN102866946A (zh) * | 2012-08-15 | 2013-01-09 | 深圳市同洲电子股份有限公司 | 读写功能的测试方法及设备 |
TWI498577B (zh) * | 2013-12-12 | 2015-09-01 | Inventec Corp | 差分信號測試系統及其方法 |
CN105511997A (zh) * | 2014-09-26 | 2016-04-20 | 神讯电脑(昆山)有限公司 | Usb3.0接口测试用治具 |
CN105700981A (zh) * | 2014-11-28 | 2016-06-22 | 神讯电脑(昆山)有限公司 | 测试用u盘 |
US10339093B2 (en) * | 2016-03-29 | 2019-07-02 | Intel Corporation | USB interface using repeaters with guest protocol support |
CN109388528A (zh) * | 2017-08-04 | 2019-02-26 | 神讯电脑(昆山)有限公司 | Usb测试方法及usb装置的测试治具 |
US10402288B2 (en) * | 2017-10-12 | 2019-09-03 | Getac Technology Corporation | USB-testing method and testing fixture board for USB device |
JP7259371B2 (ja) * | 2019-02-05 | 2023-04-18 | セイコーエプソン株式会社 | 回路装置および電子機器 |
CN110471812A (zh) * | 2019-07-23 | 2019-11-19 | 广东以诺通讯有限公司 | 一种usb和串口调试复用的方法 |
JP7139486B1 (ja) * | 2021-04-27 | 2022-09-20 | 富士通クライアントコンピューティング株式会社 | 拡張装置、プログラムおよび情報処理システム |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09127199A (ja) * | 1995-10-30 | 1997-05-16 | Toshiba Corp | 論理回路及びその試験方法 |
JP3409749B2 (ja) * | 1999-09-09 | 2003-05-26 | エヌイーシーマイクロシステム株式会社 | Usbファンクションの評価装置及びその方法 |
JP3750467B2 (ja) | 2000-02-28 | 2006-03-01 | 横河電機株式会社 | Usbシミュレーション装置、及び、記憶媒体 |
EP1272861B1 (en) * | 2000-04-05 | 2008-09-10 | Nxp B.V. | A method and test interface for testing digital circuitry |
US6629169B2 (en) * | 2001-03-14 | 2003-09-30 | Winband Electronics Corp. | Apparatus and method for testing of USB device |
JP3952780B2 (ja) * | 2002-01-09 | 2007-08-01 | 株式会社日立製作所 | 信号送受信装置、回路、およびループバックテスト方法 |
DE10239814B4 (de) * | 2002-08-29 | 2008-06-05 | Advanced Micro Devices, Inc., Sunnyvale | Erweiterte Testmodusunterstützung für Hostcontroller |
JP3632691B2 (ja) * | 2003-01-30 | 2005-03-23 | セイコーエプソン株式会社 | テスト回路、集積回路及びテスト方法 |
JP3632692B2 (ja) | 2003-01-30 | 2005-03-23 | セイコーエプソン株式会社 | テスト回路、集積回路及びテスト方法 |
US20050097403A1 (en) * | 2003-10-20 | 2005-05-05 | Ker-Min Chen | USB interface and testing method thereof |
US7587202B2 (en) * | 2004-09-07 | 2009-09-08 | Research In Motion Limited | Method for conducting digital interface and baseband circuitry tests using digital loopback |
KR100849223B1 (ko) * | 2006-07-27 | 2008-07-31 | 삼성전자주식회사 | Usb 장치 테스트 방법 및 그 시스템 |
JP5096024B2 (ja) * | 2007-03-19 | 2012-12-12 | 株式会社リコー | Usbコントローラ及びusbコントローラ試験方法 |
CN101599035A (zh) * | 2008-06-05 | 2009-12-09 | 鸿富锦精密工业(深圳)有限公司 | Usb端口测试装置及方法 |
-
2006
- 2006-09-29 JP JP2006266655A patent/JP4422134B2/ja active Active
-
2007
- 2007-09-04 KR KR1020070089296A patent/KR20080030472A/ko not_active Application Discontinuation
- 2007-09-10 CN CN2007101496165A patent/CN101154177B/zh not_active Expired - Fee Related
- 2007-09-24 US US11/902,555 patent/US8099633B2/en not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI689813B (zh) * | 2014-10-30 | 2020-04-01 | 美商高通公司 | 用於電子系統中多重介面除錯之嵌入式通用串列匯流排除錯 |
Also Published As
Publication number | Publication date |
---|---|
JP4422134B2 (ja) | 2010-02-24 |
US8099633B2 (en) | 2012-01-17 |
JP2008084273A (ja) | 2008-04-10 |
US20080082286A1 (en) | 2008-04-03 |
KR20080030472A (ko) | 2008-04-04 |
CN101154177B (zh) | 2012-02-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: OKI SEMICONDUCTOR CO., LTD. Free format text: FORMER OWNER: OKI ELECTRIC INDUSTRY CO., LTD. Effective date: 20131125 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20131125 Address after: Tokyo, Japan, Japan Patentee after: Lapis Semiconductor Co., Ltd. Address before: Tiger gate, 1, 7, 12, Tokyo harbour, Japan Patentee before: Oki Electric Industry Co., Ltd. |
|
C56 | Change in the name or address of the patentee | ||
CP02 | Change in the address of a patent holder |
Address after: Yokohama City, Kanagawa Prefecture, Japan Patentee after: Lapis Semiconductor Co., Ltd. Address before: Tokyo, Japan, Japan Patentee before: Lapis Semiconductor Co., Ltd. |
|
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20120208 Termination date: 20160910 |
|
CF01 | Termination of patent right due to non-payment of annual fee |