CN101074935A - 探测器阵列及设备 - Google Patents
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Abstract
公开了一种探测器阵列,包括:第一线阵探测器,用于探测穿透被检物体的至少一个部分的第一射线;第二线阵探测器,与所述第一线阵探测器平行设置,用于探测与所述第一射线交替发射并穿透所述至少一个部分的第二射线。利用所述探测器阵列,能够提高交替双能射线对被检物体的扫描检查效率和材料识别正确率。
Description
技术领域
本发明涉及用于物体辐射透视成像的探测器,特别涉及一种探测器阵列和使用该探测器阵列的设备,以消除利用交替产生的射线检查被检物体的过程中出现的边缘处对物体材料的错误识别和识别不准确问题,并可以加倍提高扫描检查效率。
技术背景
随着海关和安全检查系统要求的不断提高,利用两种不同能量的X射线对被检物体进行无损检查,同时实现对被检物体的物质材料识别的技术已经开始被广泛推广,如美国专利US 5,044,002。最近,在大型客体的无损检测中,在高能段(>1MeV)的双能法来实现材料识别的技术也被重新提出,见美国专利US 5,524,133。
双能法实现材料识别的物理原理是,两束不同能量的X射线与同一物体相互作用,因为光子能量不同而与物体的相互作用存在差别,可以简单的认为这差别是综合表现为衰减系数比的差别。因此,基于这一原理,提出了多种交替产生两种不同能量X射线的方法,如美国专利US 6,069,936和国际申请WO 00/43760披露的单一射线源,通过材料吸收的办法调制出高能能谱。此外,国际申请WO2004/030162 A2披露了由一个加速器交替产生高低两种能谱的射线。但是,这种交替性产生高低能X射线扫描物体时,存在一个严重缺陷:两种不同能量的X射线是一定频率交替相间产生的,产生两束射线之间存在一定的时间间隔。当用于被检客体扫描时(如行包、集装箱等),被扫描物体是一定速度在运行,高低能X射线产生的时间间隔里,被检物体将会移动一定的距离。这样,高低能的两束射线与物质相互作用的过程并不是完全相同。因此,这将影响对材料识别的正确率,尤其在被检物体的边缘处,存在两种能量的射线是与不同的物体相互作用的现象,由此得到错误的识别结果。同时,为了减小因为高低能射线与非同一物质相互作用而引起的误差,传统的方法是,让被检物体的运动速度较慢,这将严重限制了货物检查效率。而且,对于物体边缘的错误识别问题仍然无法解决。
发明内容
鉴于上述问题,完成了本发明。本发明的目的是提出一种探测器阵列和使用该探测器阵列的材料识别系统,以消除利用交替产生的射线对被检物体的检查过程中引起的物体边缘错误识别缺陷。
在本发明的第一方面,提出了一种探测器阵列,包括:第一线阵探测器,用于探测穿透被检物体的至少一个部分的第一射线;以及第二线阵探测器,与所述第一线阵探测器平行设置,用于探测与所述第一射线交替发射并穿透所述至少一个部分的第二射线。
根据本发明的实施例,所述第一线阵探测器与所述第二线阵探测器紧密排列。
根据本发明的实施例,所述第一线阵探测器和所述第二线阵探测器之间的距离是可调的。
根据本发明的实施例,所述距离取决于被检物体的运动速度和交替产生第一射线和第二射线之间的间隔时间。
根据本发明的实施例,所述第一线阵探测器和所述第二线阵探测器的每一个包括闪烁晶体或者气体探测器。
根据本发明的实施例,所述第一线阵探测器和所述第二线阵探测器与同一处理装置连接。
根据本发明的实施例,所述第一线阵探测器和所述第二线阵探测器分别与各自的处理装置连接。
根据本发明的实施例,所述第一射线和第二射线是由同一射线源产生的。
根据本发明的实施例,所述闪烁晶体是钨酸镉或碘化铯。
此外,本发明还提供了一种包括所述的探测器阵列的设备。
此外,本发明还提供了一种采用所述的探测器阵列的辐射成像方法。
此外,本发明还提供了一种采用所述的探测器阵列的材料识别方法。
在本发明的另一方面,提出了一种利用探测器阵列探测射线的方法,所述探测器阵列包括平行设置的第一线阵探测器和第二线阵探测器,该方法包括步骤:交替产生第一射线和第二射线,以穿透以固定速度运行的被检物体;用第一线阵探测器探测穿透所述被检物体的至少一个部分的第一射线;以及用第二线阵探测器探测穿透所述至少一个部分的第二射线。
根据本发明的实施例,该方法还包括步骤:根据被检物体的速度和交替产生第一射线和第二射线之间的间隔时间来调节所述第一线阵探测器与所述第二线阵探测器之间的距离。
探测器阵列对穿透射线进行探测,并通过错位匹配,实现高低能射线束对物体同一位置的相互作用并精确探测。同时,第一线阵测器和第二线阵探测器之间的距离根据被检物体的运动速度和射线源产生高低能射线的时间间隔来确定,从而保证对高低能射线与被检物体同一部分作用后的射线被探测,提高了双能法对物质材料识别的正确率,并消除了被检物体边缘的错误识别。由于第一线阵探测器和第二线阵探测器之间的距离可调整使得被检物体的运动速动可变,减少了对被检物体运动速度的要求。此外,由于第一线阵探测器和第二线阵探测器同时采集信号,相当于增加了探测面积,而单个闪烁体的较小截面又保证了对物体的探测精度,得到精细的探测图像。
附图说明
图1是根据本发明实施例的利用探测器阵列实现物质材料识别的系统的示意图;
图2是根据本发明的实施例,射线源交替产生不同的能量的射线时,探测器阵列的工作原理示意图;
图3是根据本发明实施例的探测器阵列的结构示意图。
具体实施方式
下面对照附图详细说明本发明的具体实施例。
图1是根据本发明实施例的利用双列探测器阵列实现物质材料识别的系统的示意图。
如图1所示,通过使用包括第一线阵探测器104a和第二线阵探测器104b的探测器阵列来实现对射线源交替产生的双能射线进行采集。射线源100能够交替产生诸如X射线之类的射线。同步控制部分105向射线源100和第一线阵探测器104a和第二线阵探测器104b提供同步信号110,使得射线源100同步信号110的时序交替产生高低能射线。
射线源100产生的射线102经过准直器101后,得到扇形的平面辐射。被检物体103以一固定的速度在垂直于辐射平面的一固定方向运动,如图1所示。平面辐射与被检物体103作用后的穿透辐射被第一线阵探测器104a和第二线阵探测器104b所探测。这里,第一线阵探测器104a和第二线阵探测器104b互相平行,并且根据同步控制部分105提供的同步信号,调整采集电路的参数来实现同步采集,但这并不是必须的。
然后,双列探测器阵列的处理模块对最近采集的两个射线的信号进行匹配,输出高低能射线与被检物体103同一位置作用后的探测值。该探测值经过网络传送到图像处理和材料识别部分106。图像处理和材料识别部分106通过双能算法和相关的图像处理算法,最终识别被检物体材料的属性,如无机物、有机物、重金属等。
图2是根据本发明的实施例,射线源100交替产生不同的能量的射线时,探测器阵列的工作原理示意图。
如图2所示,射线源100根据时序203交替产生高低能的射线102H和102L,高低能射线以一固定频率交替发射,而且发射两个射线之间的时间间隔t相等。物体103以固定速度V向一方向运动。假设任意时间,射线源100发射高能射线102H,射线经过准直后与被检物体103的部分1和部分2作用,穿透后的射线分别被第一线阵探测器104a和第二线阵探测器104b采集并缓存,分别表示为102H-1A和102H-2B。
然后,射线源100在经过t时间后,接着发射低能射线102L。此时,被检物体103已经向前运动一像素的距离V*t。低能射线102L穿透被检物体的部分2和部分3后,被分别被第一线阵探测器104a和第二线阵探测器104b采集并缓存,分别表示为102L-2A和102L-3B。探测器阵列的处理模块把上次缓存的高能射线102H与被检物体103的部分2作用后采集的探测值102H-2B与这次低能射线102L与被检物体103的部分2作用后采集的探测值102L-2A配对,输出给连接的图像处理和材料识别部分106。
接下来,射线源100根据时序203再次产生高能射线102H,同时被检物体103再次移动了一个像素的距离V*t,因此高能射线102H与被检物体103的部分3和部分4相互作用。第一线阵探测器104a和第二线阵探测器104b分别采集高能射线102H与被检物体103相互作用后的探测值,表示为102H-3A和102H4B。然后,探测器阵列的处理模块把上次缓存的低能射线102L与被检物体103的部分3相互作用后采集的探测值102L-3B与这次高能射线102L与被检物体103的部分3相互作用后采集的探测值102H-3A配对,输出给连接的图像处理和材料识别部分106。这样,随着被检物体103的运动,实现了高低能射线对被检物体103的同一部分作用后的信号探测。
这样,由于采用了两个平行的第一和第二线阵探测器104a和104b,射线源100先产生的一束高能的近似窄束的第一射线与被检物体103的部分1和部分2相互作用,然后被第一和第二线阵探测器104a和104b采集。穿透被检物体103的部分1的第一射线被第一线阵探测器104a探测并输出部分1的第一探测值,穿透被检物体103的部分2的第一射线被第二线阵探测器104b探测并输出部分2的第一探测值。紧接着射线源100发射一束低能的第二射线,此时被检物体103已经向前运动了一个像素的距离,即此时第二射线将同时与被检物体103的部分2和3相互作用。第一线阵探测器104a和第二线阵探测器104b分别探测第二射线穿透部分2和3的信号,输出部分2的第二探测值和部分3的第一探测值。这时,部分2的第一探测值和部分2的第二探测值就分别是第一射线和第二射线穿透被检物体103的部分2后的输出值。因此,根据其第一探测值和第二探测值就可以确定被检物体103的部分2中的有效原子序数,从而确定该部分2的的材料属性。
这里,两个线阵探测器104a和104b可以由紧挨在一起两个闪烁体,如钨酸镉(CdWO4)或者碘化铯构成,如图3的(A)所示。如图3的(A)所示,第一和第二线阵探测器104a和104b可以组合成一个整体。每行的两个闪烁晶体被固定,并且接处理模块305。两个晶体探测到信号以后,同时输出信号302A和302B,这两个信号在处理模块305里被缓存并处理,当探测器采集了两次相邻脉冲的高低能射线信号后,处理模块305匹配好高低能信号后输出被检物体相应部分的高低能探测值对给图像处理和材料识别部分106。但是,也可让第一线阵探测器104a和第二线阵探测器104b分别独立输出信号301A和301B到各自的处理模块(未示出)。探测器阵列每采集到高能或低能的射线穿透被检物体的穿透信号后就输出给处理模块305,以对探测值按照高低能进行配对,从而得到被检物体103各个部分的高低能探测值。作为替换方案,两个线阵探测器104a和104b的每一个可以由气体探测器构成。
此外,第一线阵探测器104a和第二线阵探测器104b之间的距离d可以调节,如图3的(B)所示。这里距离d由被检物体103的运动速度V和射线源100产生高低能射线的间隔时间t决定,即d=V*t。也就是,根据射线源产生高低能两个射线之间的时间间隔和被检物体的运动速度来调节这第一线阵探测器和第二线阵探测器之间的距离,从而满足相邻高低能射线穿透被检物体的同一部分的要求。
以上所述,仅为本发明中的具体实施方式,但本发明的保护范围并不局限于此,任何熟悉该技术的人在本发明所揭露的技术范围内,可轻易想到的变换或替换,都应涵盖在本发明的包含范围之内。因此,本发明的保护范围应该以权利要求书的保护范围为准。
Claims (17)
1.一种探测器阵列,包括:
第一线阵探测器,用于探测穿透被检物体的至少一个部分的第一射线;
第二线阵探测器,与所述第一线阵探测器平行设置,用于探测与所述第一射线交替发射并穿透所述至少一个部分的第二射线。
2.根据权利要求1所述的探测器阵列,其特征在于,所述第一线阵探测器与所述第二线阵探测器紧密排列。
3.根据权利要求1所述的探测器阵列,其特征在于,所述第一线阵探测器和所述第二线阵探测器之间的距离是可调的。
4.根据权利要求3所述的探测器阵列,其特征在于,所述距离取决于被检物体的运动速度和交替产生第一射线和第二射线之间的间隔时间。
5.根据权利要求2~3之一所述的探测器阵列,其特征在于,所述第一线阵探测器和所述第二线阵探测器的每一个包括闪烁晶体或气体探测器。
6.根据权利要求5所述的探测器阵列,其特征在于,所述闪烁晶体是钨酸镉或碘化铯。
7.根据权利要求5所述的探测器阵列,其特征在于,所述第一线阵探测器和所述第二线阵探测器与同一处理装置连接。
8.根据权利要求5所述的探测器阵列,其特征在于,所述第一线阵探测器和所述第二线阵探测器分别与各自的处理装置连接。
9.根据权利要求5所述的探测器阵列,其特征在于,所述第一射线和第二射线是由同一射线源产生的。
10.一种包括如权利要求1~9之一所述的探测器阵列的设备。
11.一种采用如权利要求1~9之一所述的探测器阵列的辐射成像方法。
12.一种采用如权利要求1~9之一所述的探测器阵列的材料识别方法。
13.一种利用探测器阵列探测射线的方法,所述探测器阵列包括平行设置的第一线阵探测器和第二线阵探测器,该方法包括步骤:
交替产生第一射线和第二射线,以穿透以固定速度运行的被检物体;
用第一线阵探测器探测穿透所述被检物体的至少一个部分的第一射线;
用第二线阵探测器探测穿透所述至少一个部分的第二射线。
14.根据权利要求13所述的方法,其特征在于,还包括步骤:
根据被检物体的速度和交替产生第一射线和第二射线之间的间隔时间来调节所述第一线阵探测器与所述第二线阵探测器之间的距离。
15.根据权利要求14所述的方法,其特征在于,所述第一射线和第二射线是由同一射线源产生的。
16.根据权利要求13所述的方法,其特征在于,所述第一线阵探测器和所述第二线阵探测器的每一个包括闪烁晶体或者气体探测器。
17.根据权利要求16所述的方法,其特征在于,所述闪烁晶体是钨酸镉或碘化铯。
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Also Published As
Publication number | Publication date |
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GB2438317B (en) | 2010-10-13 |
AU2007252161B2 (en) | 2010-06-17 |
WO2007134512A1 (fr) | 2007-11-29 |
JP2007309929A (ja) | 2007-11-29 |
US7724869B2 (en) | 2010-05-25 |
ITTO20070168A1 (it) | 2007-11-20 |
GB2438317A (en) | 2007-11-21 |
JP4842206B2 (ja) | 2011-12-21 |
GB0709609D0 (en) | 2007-06-27 |
DE102007020545A1 (de) | 2007-12-06 |
US20070286337A1 (en) | 2007-12-13 |
RU2397480C1 (ru) | 2010-08-20 |
CN101074935B (zh) | 2011-03-23 |
AU2007252161A1 (en) | 2007-11-29 |
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