CN103675931B - Ct系统和用于ct系统的探测装置 - Google Patents
Ct系统和用于ct系统的探测装置 Download PDFInfo
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- CN103675931B CN103675931B CN201210364118.3A CN201210364118A CN103675931B CN 103675931 B CN103675931 B CN 103675931B CN 201210364118 A CN201210364118 A CN 201210364118A CN 103675931 B CN103675931 B CN 103675931B
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Classifications
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- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/48—Diagnostic techniques
- A61B6/482—Diagnostic techniques involving multiple energy imaging
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- G—PHYSICS
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- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
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- A—HUMAN NECESSITIES
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- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
- A61B6/4208—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector
- A61B6/4241—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector using energy resolving detectors, e.g. photon counting
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- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
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- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
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- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
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- H—ELECTRICITY
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- H—ELECTRICITY
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- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
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- A—HUMAN NECESSITIES
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- G01N2223/643—Specific applications or type of materials object on conveyor
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- H—ELECTRICITY
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- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
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- H01L27/14601—Structural or functional details thereof
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
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- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
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- Chemical & Material Sciences (AREA)
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- Animal Behavior & Ethology (AREA)
- Public Health (AREA)
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- Biophysics (AREA)
- Optics & Photonics (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Geophysics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Abstract
Description
Claims (20)
Priority Applications (12)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201210364118.3A CN103675931B (zh) | 2012-09-26 | 2012-09-26 | Ct系统和用于ct系统的探测装置 |
KR1020167035006A KR101751196B1 (ko) | 2012-09-26 | 2013-07-15 | Ct 시스템 및 ct 시스템에 사용되는 탐측장치 |
NO13840115A NO2749873T3 (zh) | 2012-09-26 | 2013-07-15 | |
US14/355,175 US9572540B2 (en) | 2012-09-26 | 2013-07-15 | CT system and detection device for CT system |
PL13840115T PL2749873T3 (pl) | 2012-09-26 | 2013-07-15 | System tk oraz urządzenie wykrywające systemu tk |
EP13840115.3A EP2749873B1 (en) | 2012-09-26 | 2013-07-15 | Ct system and detection device for ct system |
KR1020157010318A KR20150077415A (ko) | 2012-09-26 | 2013-07-15 | Ct 시스템 및 ct 시스템에 사용되는 탐측장치 |
PCT/CN2013/079382 WO2014048163A1 (zh) | 2012-09-26 | 2013-07-15 | Ct系统和用于ct系统的探测装置 |
AU2013324945A AU2013324945B2 (en) | 2012-09-26 | 2013-07-15 | CT system and detection device for CT system |
JP2015532280A JP6132916B2 (ja) | 2012-09-26 | 2013-07-15 | Ctシステム及びctシステムに用いられる検知装置 |
ES13840115.3T ES2674124T3 (es) | 2012-09-26 | 2013-07-15 | Sistema de TC y dispositivo de detección para el sistema de TC |
BR112015003336-9A BR112015003336B1 (pt) | 2012-09-26 | 2013-07-15 | sistema de tomografia computadorizada e dispositivo de detecção para sistema de tomografia computadorizada |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201210364118.3A CN103675931B (zh) | 2012-09-26 | 2012-09-26 | Ct系统和用于ct系统的探测装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN103675931A CN103675931A (zh) | 2014-03-26 |
CN103675931B true CN103675931B (zh) | 2016-09-28 |
Family
ID=50314049
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201210364118.3A Active CN103675931B (zh) | 2012-09-26 | 2012-09-26 | Ct系统和用于ct系统的探测装置 |
Country Status (11)
Country | Link |
---|---|
US (1) | US9572540B2 (zh) |
EP (1) | EP2749873B1 (zh) |
JP (1) | JP6132916B2 (zh) |
KR (2) | KR20150077415A (zh) |
CN (1) | CN103675931B (zh) |
AU (1) | AU2013324945B2 (zh) |
BR (1) | BR112015003336B1 (zh) |
ES (1) | ES2674124T3 (zh) |
NO (1) | NO2749873T3 (zh) |
PL (1) | PL2749873T3 (zh) |
WO (1) | WO2014048163A1 (zh) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6289223B2 (ja) * | 2013-04-04 | 2018-03-07 | キヤノンメディカルシステムズ株式会社 | X線コンピュータ断層撮影装置 |
JP6257916B2 (ja) * | 2013-04-26 | 2018-01-10 | 東芝メディカルシステムズ株式会社 | 光検出装置、放射線検出装置、放射線分析装置及び光検出方法 |
WO2015012850A1 (en) * | 2013-07-25 | 2015-01-29 | Analogic Corporation | Generation of diffraction signature of item within object |
CN105242322A (zh) * | 2014-06-25 | 2016-01-13 | 清华大学 | 探测器装置、双能ct系统和使用该系统的检测方法 |
CN105787919B (zh) * | 2014-12-23 | 2019-04-30 | 清华大学 | 一种安检ct三维图像的操作方法和装置 |
KR101742432B1 (ko) * | 2016-03-31 | 2017-05-31 | 이화여자대학교 산학협력단 | 가스 전자 증폭 검출기를 이용한 에너지 필터 방식의 이중 에너지 x-선 영상 촬영 시스템 및 그 x-선 영상 생성방법 |
CN105807329B (zh) * | 2016-05-30 | 2019-05-17 | 公安部第一研究所 | 一种用于识别包裹中危险液体的x射线检测装置与方法 |
CN105911604B (zh) * | 2016-05-30 | 2019-12-10 | 公安部第一研究所 | 一种通道式危险液体检测装置与方法 |
CN109471185A (zh) * | 2018-12-17 | 2019-03-15 | 同方威视技术股份有限公司 | Ct系统和用于ct系统的探测装置 |
CN109946747A (zh) * | 2019-03-25 | 2019-06-28 | 北京航星机器制造有限公司 | 一种基于新型探测装置的双能ct探测系统 |
WO2021003920A1 (zh) * | 2019-07-09 | 2021-01-14 | 苏州雷泰医疗科技有限公司 | 一种放射治疗能谱cbct的成像装置、方法及放射治疗装置 |
CN113740361B (zh) * | 2020-05-29 | 2023-05-23 | 清华大学 | 检测通道、通道组件和ct检测装置 |
CN112748133B (zh) * | 2020-12-24 | 2023-06-16 | 北京航星机器制造有限公司 | 一种高能稀疏的ct探测器、ct检测系统及检测方法 |
CN112858167B (zh) * | 2021-01-07 | 2024-01-02 | 上海奕瑞光电子科技股份有限公司 | 多排双能线阵探测器扫描方法、系统、介质及装置 |
CN116046815B (zh) * | 2023-02-21 | 2023-11-03 | 上海福柯斯智能科技有限公司 | 一种双能ct成像方法、装置及系统 |
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EP1186909A2 (de) * | 2000-09-07 | 2002-03-13 | Heimann Systems GmbH | Detektoranordnung zur Detektion von Röntgenstrahlen |
CN101897593A (zh) * | 2009-05-26 | 2010-12-01 | 清华大学 | 一种计算机层析成像设备和方法 |
CN101937094A (zh) * | 2009-06-30 | 2011-01-05 | 同方威视技术股份有限公司 | 双能x射线阵列探测器 |
CN202948145U (zh) * | 2012-09-26 | 2013-05-22 | 同方威视技术股份有限公司 | Ct系统和用于ct系统的探测装置 |
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US4626688A (en) | 1982-11-26 | 1986-12-02 | Barnes Gary T | Split energy level radiation detection |
JPH0743321A (ja) * | 1993-07-29 | 1995-02-14 | Ishikawajima Harima Heavy Ind Co Ltd | X線検査装置 |
DE10121018A1 (de) * | 2001-04-28 | 2002-10-31 | Philips Corp Intellectual Pty | Hybride zweidimensionale Szintillatoranordnung |
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CN101074935B (zh) * | 2006-05-19 | 2011-03-23 | 清华大学 | 探测器阵列及设备 |
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JP2009082250A (ja) * | 2007-09-28 | 2009-04-23 | Ge Medical Systems Global Technology Co Llc | X線ct装置 |
CN101424648B (zh) * | 2007-10-30 | 2012-10-03 | 清华大学 | 检查系统和检查方法 |
JP5260036B2 (ja) * | 2007-12-17 | 2013-08-14 | ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー | X線ct装置 |
CN101470086B (zh) | 2007-12-29 | 2012-11-28 | 清华大学 | 探测器装置及具有该探测器装置的ct检查系统 |
US8633445B2 (en) * | 2008-05-19 | 2014-01-21 | Varian Medical Systems, Inc. | Multi-energy X-ray imaging |
CN101900695B (zh) * | 2009-05-27 | 2011-11-23 | 清华大学 | 伪双能欠采样物质识别系统和方法 |
CN101900694B (zh) * | 2009-05-27 | 2012-05-30 | 清华大学 | 基于直线轨迹扫描的双能欠采样物质识别系统和方法 |
JP5467830B2 (ja) * | 2009-09-18 | 2014-04-09 | 浜松ホトニクス株式会社 | 放射線検出装置 |
JP5616182B2 (ja) | 2010-09-28 | 2014-10-29 | 株式会社イシダ | X線検査装置 |
WO2012137205A1 (en) * | 2011-04-08 | 2012-10-11 | Arineta Ltd. | Dual energy ct scanner |
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2012
- 2012-09-26 CN CN201210364118.3A patent/CN103675931B/zh active Active
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2013
- 2013-07-15 NO NO13840115A patent/NO2749873T3/no unknown
- 2013-07-15 ES ES13840115.3T patent/ES2674124T3/es active Active
- 2013-07-15 EP EP13840115.3A patent/EP2749873B1/en active Active
- 2013-07-15 KR KR1020157010318A patent/KR20150077415A/ko active Search and Examination
- 2013-07-15 AU AU2013324945A patent/AU2013324945B2/en active Active
- 2013-07-15 JP JP2015532280A patent/JP6132916B2/ja active Active
- 2013-07-15 US US14/355,175 patent/US9572540B2/en active Active
- 2013-07-15 PL PL13840115T patent/PL2749873T3/pl unknown
- 2013-07-15 BR BR112015003336-9A patent/BR112015003336B1/pt active IP Right Grant
- 2013-07-15 WO PCT/CN2013/079382 patent/WO2014048163A1/zh active Application Filing
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Also Published As
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WO2014048163A1 (zh) | 2014-04-03 |
KR20150077415A (ko) | 2015-07-07 |
JP6132916B2 (ja) | 2017-05-24 |
BR112015003336A8 (pt) | 2020-08-11 |
JP2015532974A (ja) | 2015-11-16 |
BR112015003336A2 (pt) | 2017-12-19 |
AU2013324945A1 (en) | 2015-02-26 |
US20140270058A1 (en) | 2014-09-18 |
KR101751196B1 (ko) | 2017-06-26 |
NO2749873T3 (zh) | 2018-07-21 |
KR20160148049A (ko) | 2016-12-23 |
AU2013324945B2 (en) | 2016-05-26 |
EP2749873A4 (en) | 2015-09-23 |
CN103675931A (zh) | 2014-03-26 |
US9572540B2 (en) | 2017-02-21 |
EP2749873B1 (en) | 2018-02-21 |
PL2749873T3 (pl) | 2018-09-28 |
BR112015003336B1 (pt) | 2020-12-22 |
ES2674124T3 (es) | 2018-06-27 |
EP2749873A1 (en) | 2014-07-02 |
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