BR112015003336A8 - sistema de tomografia computadorizada e dispositivo de detecção para sistema de tomografia computadorizada - Google Patents

sistema de tomografia computadorizada e dispositivo de detecção para sistema de tomografia computadorizada

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Publication number
BR112015003336A8
BR112015003336A8 BR112015003336A BR112015003336A BR112015003336A8 BR 112015003336 A8 BR112015003336 A8 BR 112015003336A8 BR 112015003336 A BR112015003336 A BR 112015003336A BR 112015003336 A BR112015003336 A BR 112015003336A BR 112015003336 A8 BR112015003336 A8 BR 112015003336A8
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BR
Brazil
Prior art keywords
computed tomography
tomography system
detection device
detector assembly
detectors
Prior art date
Application number
BR112015003336A
Other languages
English (en)
Other versions
BR112015003336A2 (pt
BR112015003336B1 (pt
Inventor
Zhang Li
Li Mingliang
Li Yuanjing
Chen Zhiqiang
Original Assignee
Nuctech Co Ltd
Univ Tsinghua
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nuctech Co Ltd, Univ Tsinghua filed Critical Nuctech Co Ltd
Publication of BR112015003336A2 publication Critical patent/BR112015003336A2/pt
Publication of BR112015003336A8 publication Critical patent/BR112015003336A8/pt
Publication of BR112015003336B1 publication Critical patent/BR112015003336B1/pt

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    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/482—Diagnostic techniques involving multiple energy imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
    • A61B6/4208—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector
    • A61B6/4241—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector using energy resolving detectors, e.g. photon counting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/242—Stacked detectors, e.g. for depth information
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/224—Multiple energy techniques using one type of radiation, e.g. X-rays of different energies
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14634—Assemblies, i.e. Hybrid structures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14665—Imagers using a photoconductor layer
    • H01L27/14676—X-ray, gamma-ray or corpuscular radiation imagers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/148—Charge coupled imagers
    • H01L27/14806—Structural or functional details thereof
    • H01L27/14812—Special geometry or disposition of pixel-elements, address lines or gate-electrodes
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/04—Positioning of patients; Tiltable beds or the like
    • A61B6/0487—Motor-assisted positioning
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/54—Control of apparatus or devices for radiation diagnosis
    • A61B6/542—Control of apparatus or devices for radiation diagnosis involving control of exposure
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/643—Specific applications or type of materials object on conveyor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/148—Charge coupled imagers
    • H01L27/14806—Structural or functional details thereof

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Electromagnetism (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • Molecular Biology (AREA)
  • Pathology (AREA)
  • Medical Informatics (AREA)
  • Toxicology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Pulmonology (AREA)
  • Optics & Photonics (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Biophysics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)

Abstract

resumo sistema de tomografia computadorizada e dispositivo de detecção para sistema de tomografia computadorizada que compreende uma montagem de detector de baixa energia 1 e uma montagem de detector de alta energia 3 disposta sob a montagem de detector de baixa energia 1, sendo que a montagem de detector de alta energia compreende: uma pluralidade de fileiras de detectores de alta energia 31 dispostas em intervalos predeterminados, sendo que com o dispositivo de detecção 16, detectores e unidades de aquisição de dados são consideravelmente reduzidos e uma imagem de tomografia computadorizada tridimensional de alta resolução é adquirida enquanto o alarme 19 de artigo de perigo de alta precisão é alcançado, ficando o custo de fabricação do sistema consideravelmente reduzido enquanto o sistema de alto desempenho é garantido.
BR112015003336-9A 2012-09-26 2013-07-15 sistema de tomografia computadorizada e dispositivo de detecção para sistema de tomografia computadorizada BR112015003336B1 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CN201210364118.3A CN103675931B (zh) 2012-09-26 2012-09-26 Ct系统和用于ct系统的探测装置
CN201210364118.3 2012-09-26
PCT/CN2013/079382 WO2014048163A1 (zh) 2012-09-26 2013-07-15 Ct系统和用于ct系统的探测装置

Publications (3)

Publication Number Publication Date
BR112015003336A2 BR112015003336A2 (pt) 2017-12-19
BR112015003336A8 true BR112015003336A8 (pt) 2020-08-11
BR112015003336B1 BR112015003336B1 (pt) 2020-12-22

Family

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BR112015003336-9A BR112015003336B1 (pt) 2012-09-26 2013-07-15 sistema de tomografia computadorizada e dispositivo de detecção para sistema de tomografia computadorizada

Country Status (11)

Country Link
US (1) US9572540B2 (pt)
EP (1) EP2749873B1 (pt)
JP (1) JP6132916B2 (pt)
KR (2) KR101751196B1 (pt)
CN (1) CN103675931B (pt)
AU (1) AU2013324945B2 (pt)
BR (1) BR112015003336B1 (pt)
ES (1) ES2674124T3 (pt)
NO (1) NO2749873T3 (pt)
PL (1) PL2749873T3 (pt)
WO (1) WO2014048163A1 (pt)

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CN105807329B (zh) * 2016-05-30 2019-05-17 公安部第一研究所 一种用于识别包裹中危险液体的x射线检测装置与方法
CN105911604B (zh) * 2016-05-30 2019-12-10 公安部第一研究所 一种通道式危险液体检测装置与方法
CN109471185A (zh) 2018-12-17 2019-03-15 同方威视技术股份有限公司 Ct系统和用于ct系统的探测装置
CN109946747A (zh) * 2019-03-25 2019-06-28 北京航星机器制造有限公司 一种基于新型探测装置的双能ct探测系统
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CN113740361B (zh) * 2020-05-29 2023-05-23 清华大学 检测通道、通道组件和ct检测装置
CN112748133B (zh) * 2020-12-24 2023-06-16 北京航星机器制造有限公司 一种高能稀疏的ct探测器、ct检测系统及检测方法
CN112858167B (zh) * 2021-01-07 2024-01-02 上海奕瑞光电子科技股份有限公司 多排双能线阵探测器扫描方法、系统、介质及装置
CN116046815B (zh) * 2023-02-21 2023-11-03 上海福柯斯智能科技有限公司 一种双能ct成像方法、装置及系统

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Also Published As

Publication number Publication date
CN103675931B (zh) 2016-09-28
EP2749873B1 (en) 2018-02-21
EP2749873A4 (en) 2015-09-23
AU2013324945B2 (en) 2016-05-26
NO2749873T3 (pt) 2018-07-21
EP2749873A1 (en) 2014-07-02
CN103675931A (zh) 2014-03-26
PL2749873T3 (pl) 2018-09-28
US20140270058A1 (en) 2014-09-18
JP2015532974A (ja) 2015-11-16
US9572540B2 (en) 2017-02-21
WO2014048163A1 (zh) 2014-04-03
BR112015003336A2 (pt) 2017-12-19
KR20160148049A (ko) 2016-12-23
JP6132916B2 (ja) 2017-05-24
KR101751196B1 (ko) 2017-06-26
AU2013324945A1 (en) 2015-02-26
BR112015003336B1 (pt) 2020-12-22
ES2674124T3 (es) 2018-06-27
KR20150077415A (ko) 2015-07-07

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