BR112015003336A2 - sistema de tomografia computadorizada e dispositivo de detecção para sistema de tomografia computadorizada - Google Patents

sistema de tomografia computadorizada e dispositivo de detecção para sistema de tomografia computadorizada

Info

Publication number
BR112015003336A2
BR112015003336A2 BR112015003336A BR112015003336A BR112015003336A2 BR 112015003336 A2 BR112015003336 A2 BR 112015003336A2 BR 112015003336 A BR112015003336 A BR 112015003336A BR 112015003336 A BR112015003336 A BR 112015003336A BR 112015003336 A2 BR112015003336 A2 BR 112015003336A2
Authority
BR
Brazil
Prior art keywords
computed tomography
tomography system
detector assembly
energy detector
detection device
Prior art date
Application number
BR112015003336A
Other languages
English (en)
Other versions
BR112015003336B1 (pt
BR112015003336A8 (pt
Inventor
Zhang Li
Li Mingliang
Li Yuanjing
Chen Zhiqiang
Original Assignee
Nuctech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nuctech Co Ltd filed Critical Nuctech Co Ltd
Publication of BR112015003336A2 publication Critical patent/BR112015003336A2/pt
Publication of BR112015003336A8 publication Critical patent/BR112015003336A8/pt
Publication of BR112015003336B1 publication Critical patent/BR112015003336B1/pt

Links

Classifications

    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/482—Diagnostic techniques involving multiple energy imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
    • A61B6/42—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment with arrangements for detecting radiation specially adapted for radiation diagnosis
    • A61B6/4208—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment with arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector
    • A61B6/4241—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment with arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector using energy resolving detectors, e.g. photon counting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/242—Stacked detectors, e.g. for depth information
    • G01V5/224—
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14634—Assemblies, i.e. Hybrid structures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14665—Imagers using a photoconductor layer
    • H01L27/14676—X-ray, gamma-ray or corpuscular radiation imagers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/148—Charge coupled imagers
    • H01L27/14806—Structural or functional details thereof
    • H01L27/14812—Special geometry or disposition of pixel-elements, address lines or gate-electrodes
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
    • A61B6/04—Positioning of patients; Tiltable beds or the like
    • A61B6/0487—Motor-assisted positioning
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
    • A61B6/54—Control of apparatus or devices for radiation diagnosis
    • A61B6/542—Control of apparatus or devices for radiation diagnosis involving control of exposure
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/643—Specific applications or type of materials object on conveyor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/148—Charge coupled imagers
    • H01L27/14806—Structural or functional details thereof

Abstract

resumo sistema de tomografia computadorizada e dispositivo de detecção para sistema de tomografia computadorizada que compreende uma montagem de detector de baixa energia 1 e uma montagem de detector de alta energia 3 disposta sob a montagem de detector de baixa energia 1, sendo que a montagem de detector de alta energia compreende: uma pluralidade de fileiras de detectores de alta energia 31 dispostas em intervalos predeterminados, sendo que com o dispositivo de detecção 16, detectores e unidades de aquisição de dados são consideravelmente reduzidos e uma imagem de tomografia computadorizada tridimensional de alta resolução é adquirida enquanto o alarme 19 de artigo de perigo de alta precisão é alcançado, ficando o custo de fabricação do sistema consideravelmente reduzido enquanto o sistema de alto desempenho é garantido.
BR112015003336-9A 2012-09-26 2013-07-15 sistema de tomografia computadorizada e dispositivo de detecção para sistema de tomografia computadorizada BR112015003336B1 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CN201210364118.3 2012-09-26
CN201210364118.3A CN103675931B (zh) 2012-09-26 2012-09-26 Ct系统和用于ct系统的探测装置
PCT/CN2013/079382 WO2014048163A1 (zh) 2012-09-26 2013-07-15 Ct系统和用于ct系统的探测装置

Publications (3)

Publication Number Publication Date
BR112015003336A2 true BR112015003336A2 (pt) 2017-12-19
BR112015003336A8 BR112015003336A8 (pt) 2020-08-11
BR112015003336B1 BR112015003336B1 (pt) 2020-12-22

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
BR112015003336-9A BR112015003336B1 (pt) 2012-09-26 2013-07-15 sistema de tomografia computadorizada e dispositivo de detecção para sistema de tomografia computadorizada

Country Status (11)

Country Link
US (1) US9572540B2 (pt)
EP (1) EP2749873B1 (pt)
JP (1) JP6132916B2 (pt)
KR (2) KR101751196B1 (pt)
CN (1) CN103675931B (pt)
AU (1) AU2013324945B2 (pt)
BR (1) BR112015003336B1 (pt)
ES (1) ES2674124T3 (pt)
NO (1) NO2749873T3 (pt)
PL (1) PL2749873T3 (pt)
WO (1) WO2014048163A1 (pt)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6289223B2 (ja) * 2013-04-04 2018-03-07 キヤノンメディカルシステムズ株式会社 Ｘ線コンピュータ断層撮影装置
JP6257916B2 (ja) * 2013-04-26 2018-01-10 東芝メディカルシステムズ株式会社 光検出装置、放射線検出装置、放射線分析装置及び光検出方法
EP3025148A1 (en) * 2013-07-25 2016-06-01 Analogic Corporation Generation of diffraction signature of item within object
CN105242322A (zh) * 2014-06-25 2016-01-13 清华大学 探测器装置、双能ct系统和使用该系统的检测方法
CN105787919B (zh) 2014-12-23 2019-04-30 清华大学 一种安检ct三维图像的操作方法和装置
KR101742432B1 (ko) * 2016-03-31 2017-05-31 이화여자대학교 산학협력단 가스 전자 증폭 검출기를 이용한 에너지 필터 방식의 이중 에너지 x-선 영상 촬영 시스템 및 그 x-선 영상 생성방법
CN105911604B (zh) * 2016-05-30 2019-12-10 公安部第一研究所 一种通道式危险液体检测装置与方法
CN105807329B (zh) * 2016-05-30 2019-05-17 公安部第一研究所 一种用于识别包裹中危险液体的x射线检测装置与方法
CN109471185A (zh) * 2018-12-17 2019-03-15 同方威视技术股份有限公司 Ct系统和用于ct系统的探测装置
CN109946747A (zh) * 2019-03-25 2019-06-28 北京航星机器制造有限公司 一种基于新型探测装置的双能ct探测系统
US20220257980A1 (en) * 2019-07-09 2022-08-18 Suzhou Linatech Medical Science And Technology A method and a radiotherapy device for therapeutic energy spectrum cbct
CN113740361B (zh) * 2020-05-29 2023-05-23 清华大学 检测通道、通道组件和ct检测装置
CN112748133B (zh) * 2020-12-24 2023-06-16 北京航星机器制造有限公司 一种高能稀疏的ct探测器、ct检测系统及检测方法
CN112858167B (zh) * 2021-01-07 2024-01-02 上海奕瑞光电子科技股份有限公司 多排双能线阵探测器扫描方法、系统、介质及装置
CN116046815B (zh) * 2023-02-21 2023-11-03 上海福柯斯智能科技有限公司 一种双能ct成像方法、装置及系统

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4626688A (en) * 1982-11-26 1986-12-02 Barnes Gary T Split energy level radiation detection
JPH0743321A (ja) 1993-07-29 1995-02-14 Ishikawajima Harima Heavy Ind Co Ltd Ｘ線検査装置
US5742660A (en) * 1997-01-10 1998-04-21 Southeastern Universities Research Association, Inc. Dual energy scanning beam laminographic x-radiography
US6418189B1 (en) * 2000-01-24 2002-07-09 Analogic Corporation Explosive material detection apparatus and method using dual energy information of a scan
DE10044357A1 (de) * 2000-09-07 2002-03-21 Heimann Systems Gmbh & Co Detektoranordnung zur Detektion von Röntgenstrahlen
DE10121018A1 (de) * 2001-04-28 2002-10-31 Philips Corp Intellectual Pty Hybride zweidimensionale Szintillatoranordnung
US7103137B2 (en) 2002-07-24 2006-09-05 Varian Medical Systems Technology, Inc. Radiation scanning of objects for contraband
US7352841B2 (en) 2003-10-02 2008-04-01 Reveal Imaging Technologies, Inc. Folded array CT baggage scanner
US7260174B2 (en) * 2004-09-13 2007-08-21 General Electric Company Direct conversion energy discriminating CT detector with over-ranging correction
CN101074935B (zh) 2006-05-19 2011-03-23 清华大学 探测器阵列及设备
CA2666838C (en) 2006-09-18 2010-12-07 Optosecurity Inc. Method and apparatus for assessing characteristics of liquids
US8488736B2 (en) 2006-09-19 2013-07-16 General Electric Company Stacked flat panel x-ray detector assembly and method of making same
JP2009082250A (ja) 2007-09-28 2009-04-23 Ge Medical Systems Global Technology Co Llc Ｘ線ｃｔ装置
CN101424648B (zh) * 2007-10-30 2012-10-03 清华大学 检查系统和检查方法
JP5260036B2 (ja) * 2007-12-17 2013-08-14 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー Ｘ線ｃｔ装置
CN101470086B (zh) 2007-12-29 2012-11-28 清华大学 探测器装置及具有该探测器装置的ct检查系统
US8633445B2 (en) 2008-05-19 2014-01-21 Varian Medical Systems, Inc. Multi-energy X-ray imaging
CN101897593B (zh) * 2009-05-26 2014-08-13 清华大学 一种计算机层析成像设备和方法
CN101900695B (zh) 2009-05-27 2011-11-23 清华大学 伪双能欠采样物质识别系统和方法
CN101900694B (zh) 2009-05-27 2012-05-30 清华大学 基于直线轨迹扫描的双能欠采样物质识别系统和方法
CN101937094B (zh) * 2009-06-30 2014-03-26 同方威视技术股份有限公司 双能x射线阵列探测器
JP5467830B2 (ja) 2009-09-18 2014-04-09 浜松ホトニクス株式会社 放射線検出装置
JP5616182B2 (ja) * 2010-09-28 2014-10-29 株式会社イシダ Ｘ線検査装置
US20140037045A1 (en) * 2011-04-08 2014-02-06 Arineta Ltd. Dual energy ct scanner
CN202948145U (zh) * 2012-09-26 2013-05-22 同方威视技术股份有限公司 Ct系统和用于ct系统的探测装置

Also Published As

Publication number Publication date
EP2749873A4 (en) 2015-09-23
KR101751196B1 (ko) 2017-06-26
KR20150077415A (ko) 2015-07-07
PL2749873T3 (pl) 2018-09-28
BR112015003336B1 (pt) 2020-12-22
AU2013324945B2 (en) 2016-05-26
EP2749873A1 (en) 2014-07-02
US20140270058A1 (en) 2014-09-18
NO2749873T3 (pt) 2018-07-21
ES2674124T3 (es) 2018-06-27
JP2015532974A (ja) 2015-11-16
BR112015003336A8 (pt) 2020-08-11
CN103675931A (zh) 2014-03-26
JP6132916B2 (ja) 2017-05-24
AU2013324945A1 (en) 2015-02-26
KR20160148049A (ko) 2016-12-23
CN103675931B (zh) 2016-09-28
EP2749873B1 (en) 2018-02-21
WO2014048163A1 (zh) 2014-04-03
US9572540B2 (en) 2017-02-21

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