CN100574106C - 在集成电路中多路复用处于多个电源电压的数字信号 - Google Patents

在集成电路中多路复用处于多个电源电压的数字信号 Download PDF

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Publication number
CN100574106C
CN100574106C CNB2004800252416A CN200480025241A CN100574106C CN 100574106 C CN100574106 C CN 100574106C CN B2004800252416 A CNB2004800252416 A CN B2004800252416A CN 200480025241 A CN200480025241 A CN 200480025241A CN 100574106 C CN100574106 C CN 100574106C
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CN
China
Prior art keywords
voltage
terminal
digital signal
signal line
multiplexer
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Expired - Fee Related
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CNB2004800252416A
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English (en)
Chinese (zh)
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CN1846354A (zh
Inventor
克里斯托弗尔·K.·丘恩
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NXP USA Inc
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Freescale Semiconductor Inc
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Publication of CN1846354A publication Critical patent/CN1846354A/zh
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Publication of CN100574106C publication Critical patent/CN100574106C/zh
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/002—Switching arrangements with several input- or output terminals
    • H03K17/005—Switching arrangements with several input- or output terminals with several inputs only
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
    • H03K17/693—Switching arrangements with several input- or output-terminals, e.g. multiplexers, distributors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/0036—Means reducing energy consumption

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  • Logic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Analogue/Digital Conversion (AREA)
  • Electronic Switches (AREA)
CNB2004800252416A 2003-09-05 2004-08-24 在集成电路中多路复用处于多个电源电压的数字信号 Expired - Fee Related CN100574106C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/656,051 US6856173B1 (en) 2003-09-05 2003-09-05 Multiplexing of digital signals at multiple supply voltages in an integrated circuit
US10/656,051 2003-09-05

Publications (2)

Publication Number Publication Date
CN1846354A CN1846354A (zh) 2006-10-11
CN100574106C true CN100574106C (zh) 2009-12-23

Family

ID=34116800

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB2004800252416A Expired - Fee Related CN100574106C (zh) 2003-09-05 2004-08-24 在集成电路中多路复用处于多个电源电压的数字信号

Country Status (6)

Country Link
US (1) US6856173B1 (enExample)
JP (1) JP4675897B2 (enExample)
KR (1) KR101102257B1 (enExample)
CN (1) CN100574106C (enExample)
TW (1) TWI344688B (enExample)
WO (1) WO2005027348A1 (enExample)

Families Citing this family (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7221185B1 (en) * 2005-02-01 2007-05-22 Altera Corporation Method and apparatus for memory block initialization
KR100555509B1 (ko) * 2003-07-23 2006-03-03 삼성전자주식회사 선택적 전압 레퍼런스로 소모 전력을 절감하는 내부 전압변환기, 이를 구비한 반도체 장치 및 그 방법
FR2872629B1 (fr) * 2004-06-30 2007-07-13 St Microelectronics Sa Circuit integre ayant une borne d'entree/sortie configurable dans une gamme de tension determinee
US7392419B2 (en) * 2005-06-30 2008-06-24 International Business Machines Corporation System and method automatically selecting intermediate power supply voltages for intermediate level shifters
CN101485089B (zh) * 2006-05-05 2012-11-28 新思科技有限公司 电子电路及其方法
US10149177B2 (en) 2006-11-18 2018-12-04 Rfmicron, Inc. Wireless sensor including an RF signal circuit
US11817637B2 (en) 2006-11-18 2023-11-14 Rfmicron, Inc. Radio frequency identification (RFID) moisture tag(s) and sensors with extended sensing via capillaries
US12073272B2 (en) 2006-11-18 2024-08-27 Rfmicron, Inc. Generating a response by a radio frequency identification (RFID) tag within a field strength shell of interest
US10715209B2 (en) 2006-11-18 2020-07-14 RF Micron, Inc. Computing device for processing environmental sensed conditions
US10164611B2 (en) 2006-11-18 2018-12-25 Rfmicron, Inc. Method and apparatus for sensing environmental conditions
US12391076B2 (en) 2006-11-18 2025-08-19 Rfmicron, Inc. Pressure based wireless sensor and applications thereof
US7498860B2 (en) * 2007-03-27 2009-03-03 Agere Systems Inc. Buffer circuit having multiplexed voltage level translation
US7808274B2 (en) * 2007-12-28 2010-10-05 Semiconductor Components Industries, Llc Monolithically integrated multiplexer-translator-demultiplexer circuit and method
US7541834B1 (en) 2008-04-15 2009-06-02 International Business Machines Corporation System and the methods of managing a set of programmable fuses on an integrated circuit
US8217700B1 (en) * 2008-07-01 2012-07-10 Cypress Semiconductor Corporation Multifunction input/output circuit
CN101640529B (zh) * 2008-07-30 2011-08-24 盛群半导体股份有限公司 电压输入及输出电路
US7948293B1 (en) * 2009-01-27 2011-05-24 Xilinx, Inc. Synchronizing transitions between voltage sources used to provide a supply voltage
JP2010199640A (ja) * 2009-02-20 2010-09-09 Toshiba Corp 信号レベル変換回路
US7816948B1 (en) 2009-06-09 2010-10-19 Freescale Semiconductor, Inc. Voltage translator
US9214860B2 (en) * 2010-05-28 2015-12-15 Texas Instruments Incorporated Comparator multiplexing LDO and converted output to DC-DC converter circuitry
WO2012157532A1 (en) 2011-05-16 2012-11-22 Semiconductor Energy Laboratory Co., Ltd. Programmable logic device
US8779799B2 (en) 2011-05-19 2014-07-15 Semiconductor Energy Laboratory Co., Ltd. Logic circuit
JP5892852B2 (ja) 2011-05-20 2016-03-23 株式会社半導体エネルギー研究所 プログラマブルロジックデバイス
US8669781B2 (en) 2011-05-31 2014-03-11 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
DE102011081989A1 (de) * 2011-09-01 2013-03-07 Robert Bosch Gmbh Verfahren zum Einlesen von Eingangssignalen
US9203411B2 (en) * 2012-10-11 2015-12-01 Qualcomm Incorporated Compact low power level shifter for dual rail
CN103856209B (zh) * 2012-12-05 2016-12-07 戴泺格集成电路（天津）有限公司 集成电路以及用于集成电路的方法
WO2015147832A1 (en) * 2014-03-27 2015-10-01 Intel Corporation Multiplexor logic functions implemented with circuits having tunneling field effect transistors (tfets)
US9292372B2 (en) 2014-05-18 2016-03-22 Freescale Semiconductor, Inc. Error pad for safety device
US10746682B2 (en) 2014-10-08 2020-08-18 Rfmicron, Inc. Wireless sensor with multiple sensing options
US9490813B2 (en) 2014-11-06 2016-11-08 Qualcomm Incorporated High-speed level-shifting multiplexer
CN104808739A (zh) 2015-04-24 2015-07-29 京东方科技集团股份有限公司 电源管理集成电路和显示装置
CN108255753B (zh) * 2016-12-28 2020-05-19 中芯国际集成电路制造(上海)有限公司 I/o接收机及其接收电路
US9762238B1 (en) * 2017-04-03 2017-09-12 Nxp Usa, Inc. Systems and methods for supplying reference voltage to multiple die of different technologies in a package
CN109428576B (zh) * 2017-08-29 2022-02-11 珠海全志科技股份有限公司 一种多路ip复用pad的控制系统
CN108363446A (zh) * 2018-03-13 2018-08-03 算丰科技（北京）有限公司 集成电路及其电源电压反馈电路和方法
US10355693B1 (en) * 2018-03-14 2019-07-16 Qualcomm Incorporated Extended GPIO (eGPIO)
CN109921780B (zh) * 2019-03-07 2023-03-14 上海申矽凌微电子科技有限公司 复用引脚电路
CN115589133B (zh) * 2022-12-12 2023-05-02 杰夫微电子（四川）有限公司 一种电源多路复用器及其控制方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5973955A (en) * 1998-02-02 1999-10-26 Motorola, Inc. Comparison circuit utilizing a differential amplifier
US6346829B1 (en) * 1998-08-31 2002-02-12 Motorola, Inc. High voltage input buffer made by a low voltage process and having a self-adjusting trigger point
US6535018B1 (en) * 2000-07-26 2003-03-18 Cirrus Logic, Inc. Voltage level shifting circuits and methods and systems using the same

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US153923A (en) * 1874-08-11 Improvement in molding-flasks for cement and clay pipes
US5221865A (en) * 1991-06-21 1993-06-22 Crosspoint Solutions, Inc. Programmable input/output buffer circuit with test capability
JPH05129914A (ja) * 1991-10-30 1993-05-25 Nec Corp 論理回路
US6020760A (en) * 1997-07-16 2000-02-01 Altera Corporation I/O buffer circuit with pin multiplexing
GB0103837D0 (en) * 2001-02-16 2001-04-04 Nallatech Ltd Programmable power supply for field programmable gate array modules
US6509758B2 (en) * 2001-04-18 2003-01-21 Cygnal Integrated Products, Inc. IC with digital and analog circuits and mixed signal I/O pins

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5973955A (en) * 1998-02-02 1999-10-26 Motorola, Inc. Comparison circuit utilizing a differential amplifier
US6346829B1 (en) * 1998-08-31 2002-02-12 Motorola, Inc. High voltage input buffer made by a low voltage process and having a self-adjusting trigger point
US6535018B1 (en) * 2000-07-26 2003-03-18 Cirrus Logic, Inc. Voltage level shifting circuits and methods and systems using the same

Also Published As

Publication number Publication date
CN1846354A (zh) 2006-10-11
JP2007504752A (ja) 2007-03-01
TWI344688B (en) 2011-07-01
US6856173B1 (en) 2005-02-15
US20050052204A1 (en) 2005-03-10
KR20060079848A (ko) 2006-07-06
TW200516754A (en) 2005-05-16
JP4675897B2 (ja) 2011-04-27
WO2005027348A1 (en) 2005-03-24
KR101102257B1 (ko) 2012-01-03

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Address after: Texas in the United States

Patentee after: NXP USA, Inc.

Address before: Texas in the United States

Patentee before: FREESCALE SEMICONDUCTOR, Inc.

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CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20091223

CF01 Termination of patent right due to non-payment of annual fee