CN100549616C - 探测三维物体外形的方法和设备 - Google Patents

探测三维物体外形的方法和设备 Download PDF

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Publication number
CN100549616C
CN100549616C CNB028267729A CN02826772A CN100549616C CN 100549616 C CN100549616 C CN 100549616C CN B028267729 A CNB028267729 A CN B028267729A CN 02826772 A CN02826772 A CN 02826772A CN 100549616 C CN100549616 C CN 100549616C
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CN
China
Prior art keywords
light
time
equipment
intensity
converter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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CNB028267729A
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English (en)
Chinese (zh)
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CN1613001A (zh
Inventor
拉尔夫·门策尔
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Callidus Precision Systems GmbH
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Callidus Precision Systems GmbH
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Publication date
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Publication of CN1613001A publication Critical patent/CN1613001A/zh
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Publication of CN100549616C publication Critical patent/CN100549616C/zh
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88Lidar systems specially adapted for specific applications
    • G01S17/89Lidar systems specially adapted for specific applications for mapping or imaging
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
CNB028267729A 2001-11-27 2002-11-26 探测三维物体外形的方法和设备 Expired - Fee Related CN100549616C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10157810.5 2001-11-27
DE10157810A DE10157810A1 (de) 2001-11-27 2001-11-27 Dreidimensionale optische Formerfassung durch Intensitätskodierung der Pulslaufzeit

Publications (2)

Publication Number Publication Date
CN1613001A CN1613001A (zh) 2005-05-04
CN100549616C true CN100549616C (zh) 2009-10-14

Family

ID=7706932

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB028267729A Expired - Fee Related CN100549616C (zh) 2001-11-27 2002-11-26 探测三维物体外形的方法和设备

Country Status (7)

Country Link
EP (1) EP1451526A2 (fr)
JP (2) JP2005510697A (fr)
KR (1) KR100952254B1 (fr)
CN (1) CN100549616C (fr)
AU (1) AU2002358562A1 (fr)
DE (1) DE10157810A1 (fr)
WO (1) WO2003046472A2 (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10157810A1 (de) * 2001-11-27 2003-06-05 Up Transfer Ges Fuer Wissens U Dreidimensionale optische Formerfassung durch Intensitätskodierung der Pulslaufzeit
US7643025B2 (en) 2003-09-30 2010-01-05 Eric Belk Lange Method and apparatus for applying stereoscopic imagery to three-dimensionally defined substrates
JP4673674B2 (ja) * 2005-06-06 2011-04-20 株式会社リコー 形状測定装置
JP2008190883A (ja) * 2007-02-01 2008-08-21 Nikon Corp 計測装置
JP5485288B2 (ja) 2008-11-25 2014-05-07 テトラビュー, インコーポレイテッド 高解像度三次元撮像のシステムおよび方法
CN101566465B (zh) * 2009-05-18 2011-04-06 西安交通大学 一种物体变形的实时测量方法
KR102496479B1 (ko) * 2015-10-22 2023-02-06 삼성전자주식회사 3차원 카메라와 투과도 측정방법

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3503231A1 (de) * 1985-01-31 1986-08-07 Helmut A. 6720 Speyer Kappner Verfahren und einrichtung zur 3-d-erfassung von szenen mittels optischem 2-d-sensor
JPH04244904A (ja) * 1991-01-31 1992-09-01 Olympus Optical Co Ltd 干渉測定装置
DE4426515A1 (de) * 1994-07-27 1996-02-01 Erwin Dr Rer Nat Rojewski Intensitätscodiertes 3D-Bilderkennungsverfahren
JPH11337988A (ja) * 1998-05-25 1999-12-10 Asahi Glass Co Ltd 光スイッチ
JP3711808B2 (ja) * 1999-10-07 2005-11-02 富士ゼロックス株式会社 形状計測装置および形状計測方法
JP2001280927A (ja) * 2000-03-30 2001-10-10 Fuji Xerox Co Ltd 3次元形状計測方法および装置
DE10157810A1 (de) * 2001-11-27 2003-06-05 Up Transfer Ges Fuer Wissens U Dreidimensionale optische Formerfassung durch Intensitätskodierung der Pulslaufzeit
KR20060011163A (ko) * 2004-07-29 2006-02-03 엘지전자 주식회사 광학 모듈을 이용한 검사 장치

Also Published As

Publication number Publication date
EP1451526A2 (fr) 2004-09-01
AU2002358562A1 (en) 2003-06-10
KR100952254B1 (ko) 2010-04-09
JP2010175550A (ja) 2010-08-12
JP2005510697A (ja) 2005-04-21
CN1613001A (zh) 2005-05-04
WO2003046472A3 (fr) 2003-12-31
AU2002358562A8 (en) 2003-06-10
KR20040076251A (ko) 2004-08-31
WO2003046472A2 (fr) 2003-06-05
DE10157810A1 (de) 2003-06-05

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Granted publication date: 20091014

Termination date: 20111126