CN100549616C - The method and apparatus of detection of three dimensional object profile - Google Patents
The method and apparatus of detection of three dimensional object profile Download PDFInfo
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- CN100549616C CN100549616C CNB028267729A CN02826772A CN100549616C CN 100549616 C CN100549616 C CN 100549616C CN B028267729 A CNB028267729 A CN B028267729A CN 02826772 A CN02826772 A CN 02826772A CN 100549616 C CN100549616 C CN 100549616C
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/88—Lidar systems specially adapted for specific applications
- G01S17/89—Lidar systems specially adapted for specific applications for mapping or imaging
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
Abstract
The equipment and the method that the purpose of this invention is to provide a kind of detection of three dimensional object profile, this method detection time is extremely short, especially obviously shorter than the detection time of known method under the present technical conditions, so this method also is applicable to detection three-dimensional profile rapid movement or fast-changing testee in addition.According to the present invention, be encoded as intensity modulation by travel-time of the light object under test scattering and/or reflection and/or emission, and measure light intensity or light distribution.Measurement numerical value with light distribution can be in the hope of the profile of this three-dimensional body.
Description
Technical field
The present invention relates to a kind of method and apparatus of detection of three dimensional object profile.
Background technology
The method of surveying the object profile has been applied to commercial production, especially is applied in many fields of quality control.Its geometric data with object is converted to digitalized data by suitable measuring equipment in computing machine, realize size accuracy and other parameter control by program then.
Be to survey the profile of object, known have various machinery and an optical means.In mechanical means, typical mode is to survey Measuring Object by the sensor pointwise, by being connected to each other of point-to-point measurement result, determines the three-dimensional profile of object then.The shortcoming of this method is on the one hand, must mechanically contact testee; On the other hand, in order to obtain high precision, need very long Measuring Time.
The great advantage of optical means is that it is a contact-free detection, and thus object is not produced mechanical influence.So just, can get rid of because the object deformation that measurement itself causes.The special advantage of optics profile detection method is that the surface of testee is deformable, such as the situation that is resilient material.Another advantage of the profile detection method of contactless work is, can measure the such small area unit of a large amount of impact points simultaneously.Compare with the mechanical detection method, it has realized shorter Measuring Time veritably.Therefore it also can be measured, the object structures with height grade that the mechanical detection method is difficult to measure usually.
Known optics profile detection method is based on that triangulation or interference technique principle carry out.
In triangulation, a luminous point projects on the surface of object under test, and is departing from the direction of light fixture, observes this luminous point.From the direction of the orientation of projection light the space and observed observation station, just can calculate the volume coordinate of illuminated point.This method is very accurate comparatively speaking, and has uniqueness.But,, the detection of complete object shape is needed long time because must carry out point-to-point measurement to body surface to be measured.Because energy measurement object that in the space, move or that change not by this method, and become the shortcoming of this method thus.So on the basis of this triangulation, further developed light scattering technique (Lichtschnitt-Technik) and light belt projective technique (Streifenprojektion).
In light scattering technique, replace single luminous point, light projects on the surface of object under test with a line.This light can depart from the illumination direction by camera observation or record, to obtain the volume coordinate of this illuminated point with mode the same in the above-mentioned triangulation.Although this line projective technique method is faster than the triangulation of pointwise mode, but still than once more other method of surveying of large tracts of land is slow.
The light belt projective technique is further developing of line projective technique, promptly projects simultaneously on the surface of object under test with many light.Light intensity is cyclical variation in a lateral direction, and makes observation phase function distinguish out single light.Because this method once can be surveyed bigger surface range, so it is faster than line projective technique.But it can not distinguish the light of same intensity, and therefore the uniqueness of measurement result has partial loss at least.
In order to measure more accurately, usually adopt the optical interferometry method, such as white light interferometry method.But the defective of all said methods is, all needs very long Measuring Time, and being typically needs a lot of seconds, and under high-precision requirement, it is measured needs to continue a lot of minutes.At this, accessible minimum detection time is not the speed that is subject to numerical evaluation, but is subject to the optical measurement of a large amount of necessity.
Summary of the invention
Therefore, the purpose of this invention is to provide a kind of equipment and method of optical detection three-dimensional profile, this method only needs extremely short Measuring Time, compares with known method according to prior art, and it has shorter Measuring Time especially significantly.Therefore, also can carry out the detection of three-dimensional profile to object rapid movement or fast-changing.
The objective of the invention is by the following method to realize with equipment.
The method of this detection of three dimensional object profile comprises step: a) to being encoded as intensity modulation by travel-time of the light object under test scattering and/or reflection and/or emission, b) measure light intensity or light distribution, c) measurement data is calculated and is tried to achieve the profile of this three-dimensional body, wherein, before the travel-time of light being encoded as intensity modulation and light intensity measured, adopt suitable this object under test of light source irradiation; The coding that the travel-time of light is carried out as intensity modulation has and absorption, reflection, the transmission of time correlation and/or the converter generation that polarizes and change by at least one; The coding of the travel-time of light in intensity modulation is by a light filter, semiconductor switch or at least one non-linear absorption body generation based on dyestuff.
This is used for the equipment of detection of three dimensional object profile, having at least one is used to measure by the unit of the light light intensity of object under test emission and at least one and is used to calculate the unit of measurement data, this equipment has at least one converter, this converter has the variation with absorption, reflection, transmission and/or the polarization of time correlation, wherein, this converter is a non-linear absorption body based on dyestuff, a light filter or semiconductor switch.
The present invention also provides some practical technical schemes.
Outstanding advantage of the present invention is, adopts equipment of the present invention or method of the present invention, can realize the optical detection three-dimensional profile at several milliseconds or in the extremely short time of psec.For this reason, be encoded as intensity modulation by travel-time of the light object under test scattering and/or reflection and/or emission, and measure light intensity or light distribution.By the measurement data of light distribution, can be in the hope of the profile of three dimensional object/object.Usefully especially at this be, before the travel-time of light being encoded as intensity modulation and measures light intensity or light distribution, additional suitable this object under test of light source irradiation that uses.Here preferably use a pulsed laser light source.Travel-time of light coding as intensity modulation is undertaken by at least one converter, and this converter has the variation with absorption, reflection, transmission and/or the polarization of the light of time correlation.Whereby, have a longer light path and the light by this converter laterly, be subjected to the different absorption of this converter or transmission, reflection and/or polarization, and will produce the another one light distribution with regard to this respect.Therefore, just can get the travel-time of bright dipping, just can determine the profile of three-dimensional body then from the travel-time of light by light distribution.Measuring Object is indirect illumination light in a different manner, and such as reflecting by the different reflection coefficients at three-dimensional surface, the distribution of its reflection can be surveyed by second light path that is realized by an optical splitter.The three-dimensional height or the surface profile of object then are by the light distribution of the light path of the light distribution that measures later at converter (dimensionless) and no converter, by drawing after the suitable mathematical operation of being correlated with (such as, division).From these distribute, just can obtain the travel-time of light, and then try to achieve the three-dimensional profile of object under test.
Converter is preferably a non-linear absorption body based on dyestuff, a dye solution, a light filter and/or semiconductor switch.Be to use kiton colors as the preferred form of implementation of dyestuff.This semiconductor switch preferably has a GaAs structure.And this converter also can be an optical gate, such as a Kerr cell or a Pockels' cell.In order to measure light intensity, in preferred embodiment, adopt CCD camera or CMOS camera.In addition, also have a catoptron and/or a part of Transflective mirror, optical imaging system and/or optical gate in the equipment of the present invention.
Description of drawings
Below by means of shown in the accompanying drawing to small part embodiment, the present invention will be further explained, wherein:
Fig. 1 is the synoptic diagram that the present invention is used for the equipment of optical detection profile;
Fig. 2 is the photo of first Measuring Object;
Fig. 3 is after adopting method of the present invention to measure, the height profile figure of first Measuring Object that calculates;
Fig. 4 is the intensity distributions that first Measuring Object is measured of encoding as gray-scale map;
Fig. 5 is the photo of second Measuring Object;
Fig. 6 is after adopting method of the present invention to measure, the height profile figure of second Measuring Object that calculates;
Fig. 7 is the intensity distributions that second Measuring Object measured of encoding as gray-scale map.
Embodiment
Fig. 1 has schematically shown two equipment of measuring the optical detection three-dimensional profile of passage that have of the present invention, and a femtosecond laser 14 shines on the Measuring Object 10.The light of laser 14 is drawn towards Measuring Object 10 after optical splitter 16 output, another part light by optical splitter 16 will be deflected the converter 12 that is used for intensity coding with suitable delay by high reflection mirror 20.This converter 12 relates to the light filter of a non-linear high-speed switch, and such light filter for example can adopt RG-series of products (Schott AG (Firma Schott), Germany).The light of scattering is conducted through being excited of non-linear absorption body (converter 12) by lens combination 18 and the zone (Volumen) of fading on Measuring Object 10.The scattered light of Measuring Object 10 images on the surface of CCD camera by a lens combination 22 by behind this converter 12.The result shows, can observe scattered light on the Measuring Object 10 by CCD camera 26.Depend on the nonlinear characteristic curve in light travel-time by non-linear absorption body (converter 12), the light intensity of light is modulated.When using converter 12 (RG-light filter), produce the logarithm time of return that absorbs, so light intensity will depend on the log scale of time delay and come the shape of Measuring Object is encoded.By non-linear absorption body (converter 12), will on CCD camera 26, be produced corresponding image by the light intensity distributions of the light of intensity coding.Because first Measuring Object is with various mode indirect illumination light, such as different reflection coefficient reflected light by three-dimensional surface, so this reflection can be by surveying at second CCD camera 28 of optical splitter 32, high reflection mirror 30 and lens combination 24 back, perhaps (such as removing converter 12 or suitable turn light rays) carries out the exposure detection second time to camera 26 when not having converter.The height profile of Measuring Object 10 is obtained divided by second light distribution that measures after removing converter 12 by CCD camera 26 equally by the intensity that records by CCD camera 26 in converter 12 back then.Transformable is that this second light distribution (not having light to pass through converter 12) can be measured by second CCD camera 28.To being that the light intensity coding of function is asked logarithm and after calibration, drawn the standard (Normierung) of height profile with the life-span of fading in the non-linear absorption body (converter 12).
Fig. 2 shows the photo of first Measuring Object, and this photo relates to one and is used for teflon (Teflon) the vessel plug that glass is justified vessel, and this vessel plug has the actual extension (Ausdehnung) that is approximately 10 millimeters.
Fig. 3 shows the height profile profile of first Measuring Object, and it can be measured the back by method of the present invention and be calculated, but the scale of this height profile profile does not conform to its actual numerical value.Actual total directions X that extends in is about 10 millimeters, is about 7.5 millimeters in the Y direction.By method of the present invention, only only can measure the diameter of this vessel plug from the perspective photograph that among Fig. 2, provides.And be that noise by the CCD camera causes around the background of this vessel plug.
Fig. 4 shows the intensity distributions that first Measuring Object is measured of encoding as gray-scale map.
The outstanding advantage of the inventive method is, its can temporal resolution in the subnanosecond scope, repetition rate is in kilohertz range, and the relative accuracy that is better than 1/1000, measures fast-changing object.
In order to measure, used converter is that electricity triggers, and perhaps in order to obtain higher measuring accuracy, it is that employing is light-triggered.Because in the fluctuating (Flanke) of transmission varying effect (or reflection/polarization varying effect), just can measure, and always specify a preset time at interval to this measurement thus, so its requirement for precision is not very high.Basically, not only can use the rising edge of transmission varying effect (or reflection/polarization varying effect), but also can use its negative edge.In above-mentioned and Fig. 2 to Fig. 7 respective embodiments, use be its negative edge.
Under the simplest situation, use to have the non-linear absorption body that known absorbing reverses the time.By corresponding exciting light, a preferred pulse laser fades this absorber, and in this process, exciting light is synchronous with measuring light.The light of that be scattered and/or that be reflected and/or emission on the three-dimensional measurement object dies down with the increase in travel-time then.
One such non-linear absorption body can be realized on the basis of high-speed switch light filter, such as operational RG-series of products (Schott AG, Germany), or by suitable dyestuff, realize as kiton colors, perhaps realize by suitable semiconductor switch.Owing to serial spendable standard package is arranged, can produce equipment of the present invention in favorable cost ground.Except the CCD camera, particularly have the CMOS camera of logarithm characteristic curve, also be fit to calculate light distribution, because this camera can make full use of the characteristic curve of non-linear absorption body well.
By the measuring accuracy of the inhomogeneous characteristic limitations of the illumination or the transmission cross section of converter, can pass through a reference channel or a reference measure, and raising significantly.In addition, in order to improve measuring accuracy, can also in different measurement passages or successively, different converters be installed simultaneously as annex.Activate in the slower converter process each, can pass through suitable device (as resonator), double to strengthen activation very fast converter.Just can in big (extended) measurement range, reach a very high measuring accuracy thus.
The different measurement result that difference observation can be obtained makes up, and for example the mathematical description of three-dimensional measurement object can be converted to the CAD form.
By the present invention, can also in measuring equipment, add grid is installed, make that only being used for that prior fixed depth range is carried out the object dimensional profile surveys.So just might carry out 3D shape and survey at the interior of articles of for example scattering.This method can be particularly suitable in biology and/or the medical science.
Method of the present invention can also be carried out the detection of one dimension or two-dimentional profile except that can surveying three-dimensional profile.Surveying under the situation of two-dimentional profile, such as can operate camera under belt pattern, measuring light intensity, or replacing camera by a linear rows or a PIN diode.By a picture point is carried out numerical evaluation, just can carry out the measurement of distance.
Fig. 5 shows the photo of second Measuring Object.But what this photo related to is the CD sheath interior zone of a fixation of C D and the combination of being located at the olive-shaped bayonet socket of elasticity (Schlaucholive) thereafter.
Fig. 6 shows the height profile profile of second Measuring Object, and it can calculate after measuring by method of the present invention.In the figure, the differing heights grade of this second Measuring Object obviously as seen.But only according to the measurement pattern of corresponding figures 6, can only measure the previous section of elastic bayonet lock (Klammern), can not measure the extension of its depths.Therefore, in Fig. 6, only demonstrated of the extension of CD sheath elastic bayonet lock in Z direction (degree of depth).An effect in addition is, because the shade of the elastic bayonet lock tooth on this olive-shaped bayonet socket makes that this zone also is immeasurable.Therefore at the three-D profile of the olive-shaped bayonet socket that is arranged in CD sheath back, a part that illustrates does not meet truth, but this effect obviously can be eliminated by a suitable illumination.This example just is used for illustrating method of the present invention, in addition in Fig. 6, does not also provide a final scale as the same in Fig. 3,4 and 7.However, the three-dimensional structure of second Measuring Object still can be recognized well.
Fig. 7 shows the intensity distributions that second Measuring Object measured of encoding as gray-scale map.
By using the high-quality element can improve the performance of this measuring method basically, can estimate from existing measurement, to a depth survey at the object of cm section extension, its measuring accuracy can be less than 10 μ m.
The speed of continuous coverage only by the speed decision of data computation, thus, under the condition that enough counting yielies are arranged, can realize the fast-changing object of three-dimensional is measured in real time.
Because above-mentioned advantage, method of the present invention can be applied to a lot of fields, for example to the measurement of rapid movement part, as turbine, perhaps carries out quality control fast, as in microelectronics, particularly to the quality control of chip, DVD and CD.Can also be used to measuring transparency material in addition,, perhaps be used for measuring the flow process of liquids and gases such as the quality control of optical fiber.In addition, method of the present invention also allows to measure the time sequencing of passing through the light intensity that its xsect distributes of an object.Therefore, this method can realize the beam shape of for example laser is carried out quality control.
The present invention is not limited to the foregoing description.In not departing from the scope of the present invention, can realize the conversion of more embodiments by described method and combination of features and modification.
The Reference numeral list
10 measure object
12 converters
14 pulse lasers
16 optical splitters
18 lens combinations
20 high reflection mirrors
22 lens combinations
24 lens combinations
26 CCD cameras
28 CCD cameras
30 high reflection mirrors
32 optical splitters
Claims (22)
1. the method for detection of three dimensional object profile comprises step:
A) to encoding as intensity modulation by travel-time of the light object under test scattering and/or reflection and/or emission,
B) measure light intensity or light distribution,
C) measurement data is calculated and is tried to achieve the profile of this three-dimensional body,
It is characterized in that,
Before the travel-time of light being encoded as intensity modulation and light intensity measured, adopt suitable this object under test of light source irradiation;
The coding that the travel-time of light is carried out as intensity modulation has and absorption, reflection, the transmission of time correlation and/or the converter generation that polarizes and change by at least one;
The coding of the travel-time of light in intensity modulation is by a light filter, semiconductor switch or at least one non-linear absorption body generation based on dyestuff.
2. method according to claim 1 is characterized in that this dyestuff is kiton colors.
3. method according to claim 1 is characterized in that, this semiconductor switch has a GaAs structure.
4. method according to claim 1 is characterized in that, the coding that the travel-time of light is carried out as intensity modulation produces by at least one optical gate based on polarization effect.
5. method according to claim 4 is characterized in that, this optical gate is a Kerr cell or a Pockels' cell.
6. method according to claim 1 is characterized in that, this light source is a pulsed laser light source.
7. according to each described method in the claim 1 to 5, it is characterized in that the converter that this transmission or absorption change is shone by a pulsed laser light source.
8. method according to claim 1 is characterized in that, the measurement of light intensity is by a film, a CCD camera, and a CMOS camera, the capable camera of a capable camera of a CCD or a CMOS is realized.
9. method according to claim 1 is characterized in that, to not by a converter, by the light intensity object scattering and/or light reflection and/or that emit, additionally carries out one-shot measurement at least.
10. method according to claim 1, it is characterized in that, on plenty of time displacement ground the travel-time of light is encoded as intensity modulation and measure on the basis of light intensity, and/or side by side the travel-time of light is encoded as intensity modulation in a large number and basis by a plurality of measurement channel measurement light intensity on, measurement data is calculated.
11. method according to claim 1 is characterized in that, by at least one optical gate, makes by the light object scattering and/or reflection and/or emission, and the influence of measuring equipment is restricted in time.
12. method according to claim 1 is characterized in that, only one dimension or two-dimensional shapes is measured and/or is calculated.
13. method according to claim 1, it is characterized in that, in a large number the travel-time of light being encoded as intensity modulation and measuring on the basis of light intensity, measurement data is calculated, at this moment a plurality of converters are by simultaneously or in turn be used in the different measurement passages.
14. equipment that is used for detection of three dimensional object profile, having at least one is used to measure by the unit of the light light intensity of object under test emission and at least one and is used to calculate the unit of measurement data, this equipment has at least one converter, this converter has the variation with absorption, reflection, transmission and/or the polarization of time correlation, it is characterized in that this converter is a non-linear absorption body based on dyestuff, a light filter or semiconductor switch.
15. equipment according to claim 14 is characterized in that, this dyestuff is kiton colors, and this semiconductor switch has a GaAs structure.
16. equipment according to claim 14 is characterized in that, this converter is an optical gate.
17. equipment according to claim 16 is characterized in that, this optical gate is a Kerr cell or a Pockels' cell.
18., it is characterized in that this equipment adds a light source according to each described equipment in the claim 14 to 17.
19. equipment according to claim 18 is characterized in that, this light source is a pulsed laser.
20. equipment according to claim 14 is characterized in that, this unit that is used to measure light intensity is a CCD camera, a CMOS camera, the capable camera of a CCD or the capable camera of a CMOS.
21. equipment according to claim 14 is characterized in that, this equipment has a plurality of measurement passages.
22. equipment according to claim 14 is characterized in that, this equipment adds catoptron, part Transflective mirror, optical imaging system and/or optical gate.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE10157810A DE10157810A1 (en) | 2001-11-27 | 2001-11-27 | Three-dimensional optical shape acquisition through intensity coding of the pulse duration |
| DE10157810.5 | 2001-11-27 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1613001A CN1613001A (en) | 2005-05-04 |
| CN100549616C true CN100549616C (en) | 2009-10-14 |
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| CNB028267729A Expired - Fee Related CN100549616C (en) | 2001-11-27 | 2002-11-26 | The method and apparatus of detection of three dimensional object profile |
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| EP (1) | EP1451526A2 (en) |
| JP (2) | JP2005510697A (en) |
| KR (1) | KR100952254B1 (en) |
| CN (1) | CN100549616C (en) |
| AU (1) | AU2002358562A1 (en) |
| DE (1) | DE10157810A1 (en) |
| WO (1) | WO2003046472A2 (en) |
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| DE10157810A1 (en) * | 2001-11-27 | 2003-06-05 | Up Transfer Ges Fuer Wissens U | Three-dimensional optical shape acquisition through intensity coding of the pulse duration |
| US7643025B2 (en) | 2003-09-30 | 2010-01-05 | Eric Belk Lange | Method and apparatus for applying stereoscopic imagery to three-dimensionally defined substrates |
| JP4673674B2 (en) * | 2005-06-06 | 2011-04-20 | 株式会社リコー | Shape measuring device |
| JP2008190883A (en) * | 2007-02-01 | 2008-08-21 | Nikon Corp | Measuring device |
| EP3396416A1 (en) * | 2008-11-25 | 2018-10-31 | Tetravue, Inc. | Systems and methods of high resolution three-dimensional imaging |
| CN101566465B (en) * | 2009-05-18 | 2011-04-06 | 西安交通大学 | Method for measuring object deformation in real time |
| KR102496479B1 (en) * | 2015-10-22 | 2023-02-06 | 삼성전자주식회사 | 3D camera and method for measuring transmittance |
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| DE3503231A1 (en) * | 1985-01-31 | 1986-08-07 | Helmut A. 6720 Speyer Kappner | METHOD AND DEVICE FOR THE 3-D DETECTION OF SCENES BY MEANS OF THE OPTICAL 2-D SENSOR |
| JPH04244904A (en) * | 1991-01-31 | 1992-09-01 | Olympus Optical Co Ltd | Interference measuring device |
| DE4426515A1 (en) * | 1994-07-27 | 1996-02-01 | Erwin Dr Rer Nat Rojewski | Intensity coded three=dimensional image recognition method |
| JPH11337988A (en) * | 1998-05-25 | 1999-12-10 | Asahi Glass Co Ltd | Optical switch |
| JP3711808B2 (en) * | 1999-10-07 | 2005-11-02 | 富士ゼロックス株式会社 | Shape measuring apparatus and shape measuring method |
| JP2001280927A (en) * | 2000-03-30 | 2001-10-10 | Fuji Xerox Co Ltd | Method and instrument for measuring three-dimensional shape |
| DE10157810A1 (en) * | 2001-11-27 | 2003-06-05 | Up Transfer Ges Fuer Wissens U | Three-dimensional optical shape acquisition through intensity coding of the pulse duration |
| KR20060011163A (en) * | 2004-07-29 | 2006-02-03 | 엘지전자 주식회사 | Test apparatus using optical module |
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- 2002-11-26 KR KR1020047007955A patent/KR100952254B1/en not_active IP Right Cessation
- 2002-11-26 AU AU2002358562A patent/AU2002358562A1/en not_active Abandoned
- 2002-11-26 CN CNB028267729A patent/CN100549616C/en not_active Expired - Fee Related
- 2002-11-26 EP EP02792830A patent/EP1451526A2/en not_active Withdrawn
- 2002-11-26 WO PCT/EP2002/013483 patent/WO2003046472A2/en active Application Filing
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2010
- 2010-03-04 JP JP2010048273A patent/JP2010175550A/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| CN1613001A (en) | 2005-05-04 |
| WO2003046472A3 (en) | 2003-12-31 |
| AU2002358562A1 (en) | 2003-06-10 |
| KR20040076251A (en) | 2004-08-31 |
| EP1451526A2 (en) | 2004-09-01 |
| WO2003046472A2 (en) | 2003-06-05 |
| DE10157810A1 (en) | 2003-06-05 |
| JP2005510697A (en) | 2005-04-21 |
| AU2002358562A8 (en) | 2003-06-10 |
| JP2010175550A (en) | 2010-08-12 |
| KR100952254B1 (en) | 2010-04-09 |
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