CN219714305U - Line laser contour scanning device - Google Patents
Line laser contour scanning device Download PDFInfo
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- CN219714305U CN219714305U CN202320819506.XU CN202320819506U CN219714305U CN 219714305 U CN219714305 U CN 219714305U CN 202320819506 U CN202320819506 U CN 202320819506U CN 219714305 U CN219714305 U CN 219714305U
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- diffuse reflection
- scanning device
- reflection light
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- 230000003287 optical effect Effects 0.000 claims abstract description 43
- 238000002834 transmittance Methods 0.000 claims abstract description 20
- 239000011248 coating agent Substances 0.000 claims description 10
- 238000000576 coating method Methods 0.000 claims description 10
- 238000005259 measurement Methods 0.000 claims description 10
- 238000012360 testing method Methods 0.000 claims description 3
- 238000001514 detection method Methods 0.000 abstract description 14
- 238000002310 reflectometry Methods 0.000 abstract description 8
- 238000000034 method Methods 0.000 description 4
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000013519 translation Methods 0.000 description 2
- WEJZHZJJXPXXMU-UHFFFAOYSA-N 2,4-dichloro-1-phenylbenzene Chemical compound ClC1=CC(Cl)=CC=C1C1=CC=CC=C1 WEJZHZJJXPXXMU-UHFFFAOYSA-N 0.000 description 1
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Abstract
The utility model relates to a line laser profile scanning device, which comprises a line laser, a line laser device and a line laser device, wherein the line laser device is used for transmitting and measuring an object to be measured; a collimator lens for collimating the line laser; the optical filter emits the collimated line laser to an object to be measured to form diffuse reflection light, the optical filter filters the diffuse reflection light, and the optical filter comprises a plurality of areas with different light transmittance; and the image acquisition device is used for acquiring the image of the diffuse reflection light filtered by the optical filter. The utility model can generate the pixel line which accurately reflects the outline of the object, and effectively expands the detection range of the objects with different reflectivities.
Description
Technical Field
The utility model relates to the technical field of three-dimensional measurement, in particular to a line laser profile scanning device.
Background
The non-contact three-dimensional measurement technology is to measure the three-dimensional morphology of the surface of the measured object without contacting the measured object. Compared with the contact three-dimensional measurement method, the method has the following advantages: the surface of the measured object is basically not damaged, the measuring speed is high, the efficiency is high, the working distance is flexible and variable, and the influence from the environment is small. The non-contact measurement technology is increasingly widely applied to the three-dimensional measurement field due to the nondestructive measurement mode, and the line laser scanning technology is also increasingly widely used in the three-dimensional measurement field due to the characteristics of simple structure, simple principle, high scanning speed, high scanning precision and the like.
The line laser scanning technology is to project one-dimensional line laser to the surface of an object by using a line laser, collect the line laser deformed on the surface of the object by using an image collecting device, and then obtain three-dimensional information of the corresponding position of the surface of the object according to a triangulation principle. The line laser scanning method has the advantages that: the device has simple principle, higher precision and lower requirement on environment. When the current line laser profilometer measures the profile of an object, the reflectivity of the object surface to light is different, so that the accuracy of profile scanning is affected, the reflectivity of light is affected by the macroscopic structure, the microscopic structure and the surface color of the object surface, and data cannot be measured particularly when the macroscopic structure, the microscopic structure, the surface color and the like of the object surface are large. When the current line laser profiler measures the profile, only objects with reflectivity in a certain smaller area can be detected, the reflectivity exceeds the detection range, the measurement cannot be well carried out, and the data can not be measured.
Disclosure of Invention
The utility model aims to solve the technical problems of overcoming the defects in the prior art and providing a line laser contour scanning device which can generate a pixel line accurately reflecting the contour of an object, improve the detection accuracy of the detected object and effectively enlarge the detection range of the object with different reflectivity.
According to the technical scheme provided by the utility model, the line laser profile scanning device comprises:
a line laser for emitting a line laser for measurement to a test object;
a collimator lens for collimating the line laser;
the optical filter emits the collimated line laser to an object to be measured to form diffuse reflection light, the optical filter filters the diffuse reflection light, and the optical filter comprises a plurality of areas with different light transmittance;
and the image acquisition device is used for acquiring the image of the diffuse reflection light filtered by the optical filter.
In one embodiment of the present utility model, the areas with different light transmittance are stripe-shaped.
In one embodiment of the present utility model, the diffuse reflected light passes through areas of different transmittance of the plurality of filters when scanning.
In one embodiment of the utility model, the optical filter is coated with coating films with different depths, and the light transmittance of the optical filter is reduced with the increase of the coating film depth.
In one embodiment of the utility model, the optical filter is coated with coating films with different depths, so that the optical filter with the surface being gradually changed in color is formed.
In one embodiment of the utility model, the focal point of the collimator corresponds to the light source of the line laser.
In one embodiment of the present utility model, a lens group for adjusting the length of the diffuse reflection light is disposed between the optical filter and the image acquisition device.
In one embodiment of the present utility model, the image acquisition device is a CMOS chip.
In one embodiment of the utility model, the filter is perpendicular to the diffusely reflected light.
In one embodiment of the present utility model, the collimated line laser is perpendicular to the object under test.
Compared with the prior art, the technical scheme of the utility model has the following advantages:
the optical filter is perpendicular to the diffuse reflection light direction and comprises a plurality of areas with different light transmittance, and the areas are coated with films to enable the light transmittance to be different. Therefore, objects with the same diffuse reflectance are detected, a plurality of pixel lines with different brightness are imaged on the COMS chip, and the pixel lines which can accurately reflect the outline of the object are selected, so that accurate detection can be realized on different objects with large macroscopic structures, microscopic structures and surface color differences, the detection accuracy of the detected objects is improved, and the detection range of the objects with different reflectances is effectively enlarged.
Drawings
In order that the utility model may be more readily understood, a more particular description of the utility model will be rendered by reference to specific embodiments thereof that are illustrated in the appended drawings.
FIG. 1 is a schematic diagram of a contour scanning apparatus according to the present utility model.
Description of the specification reference numerals: a 1-line laser; 2-collimating mirror; 3-the object to be measured; 4-an optical filter; 5-lens group; a 6-CMOS chip; 7-a PCB board; 101-line laser; 102-diffusely reflecting light.
Detailed Description
The present utility model will be further described with reference to the accompanying drawings and specific examples, which are not intended to be limiting, so that those skilled in the art will better understand the utility model and practice it.
Referring to fig. 1, in order to generate a pixel line that accurately reflects the outline of an object, to improve the detection accuracy of the object 3 to be detected, the present utility model effectively expands the detection range of objects with different reflectivities, and includes:
a line laser 1 for emitting a line laser 101 for measurement to an object to be measured;
a collimator lens 2 for collimating the line laser light 101;
the optical filter 4 emits the collimated line laser 101 onto the object 3 to be measured to form diffuse reflection light 102, the optical filter 4 filters the diffuse reflection light 102, and the optical filter 4 comprises a plurality of areas with different light transmittance;
and the image acquisition device is used for acquiring the image of the diffuse reflection light 102 filtered by the optical filter 4.
Specifically, the utility model further comprises a motion translation device, which is used for matching with the line laser 1 and carrying the tested object 3 to perform translation motion so as to complete the scanning process of the line laser 101, and when the utility model is implemented, the tested object 3 can be manually moved, and the utility model can be specifically selected according to actual needs. In the scanning process, line laser 101 is emitted from a line laser 1 to a collimating mirror 2, the collimating mirror 2 collimates the line laser 101, the focal point of the collimating mirror 2 corresponds to the light source of the line laser 1, parallel line laser 101 is obtained after collimation, the collimated line laser 101 is perpendicular to the measured object 3, the collimated line laser 101 is a collimated laser beam, the collimated laser beam irradiates the measured object 3 to form a light, and the measured object 3 moves along the direction of the light. The collimated line laser 101 generates diffuse reflection on the object 3 to be measured to form diffuse reflection light 102, the diffuse reflection light 102 passes through the optical filter 4 and then is imaged on the image acquisition device, and the optical filter 4 is perpendicular to the diffuse reflection light 102. The optical filter 4 comprises a plurality of areas with different light transmittance, as the light has a certain length, diffuse reflection light 102 can be generated for many times on the same position of the measured object 3 along with the movement of the measured object 3 along the light direction, and the diffuse reflection light 102 generated at different time can penetrate through different areas on the optical filter 4, so that the same position of the measured object 3 images a plurality of pixel lines with different brightness on the image acquisition device, and the pixel lines capable of accurately reflecting the outline of the object are selected, so that accurate detection can be realized on different objects with large macroscopic structures, microstructures and surface color differences, the detection accuracy of the measured object 3 is improved, and the detection range of the objects with different reflectivities is effectively enlarged.
Further, the areas with different light transmittance are in a strip shape.
Specifically, the diffuse reflection light is in a strip shape on the image acquisition device, and the shape of the area with different light transmittance on the optical filter corresponds to the imaging shape of the diffuse reflection light.
Further, the diffuse reflection light 102 passes through areas of different light transmittance of the plurality of filters 4 at the time of scanning.
Specifically, the optical filter 4 may be divided into two or more areas, the diffuse reflection light 102 is generated on the same position of the object 3 for multiple times, and the diffuse reflection light 102 generated at different times penetrates through different areas on the optical filter 4, so that the same position of the object 3 forms multiple pixel lines with different brightness on the image acquisition device, and the areas with different light transmittance can be set according to indexes such as surface macrostructure, microstructure, surface color and the like of the different positions of the object 3, so that when the image acquisition device forms images, the pixel lines with higher brightness can be obtained, and the detection accuracy of the object 3 is improved.
Further, the optical filter 4 is coated with coating films with different depths, and the light transmittance of the optical filter 4 is reduced along with the increase of the coating film depth.
The optical filter 4 is coated with coating films with different depths, and the optical filter 4 with the surface gradually changing color is formed.
Specifically, the optical filter 4 is perpendicular to the direction of the diffuse reflection light 102, and a gradual change of coating film is adopted, so that the light transmittance of the optical filter 4 is continuously gradual changed. Thus, the object with the same diffuse reflectance is detected, and a plurality of pixel lines with different brightness are imaged on the image acquisition device. And judging the pixel points, and selecting a pixel line capable of reflecting the outline of the object more accurately. Thus, the detection range is increased compared with that of a single-light-transmittance window mirror
Further, a lens group 5 for adjusting the length of the diffuse reflection light 102 is arranged between the optical filter 4 and the image acquisition device. The specific situation and the working principle of the lens group 5 are consistent with the existing situation, and can be selected and adjusted according to actual needs, which are well known to those skilled in the art, and are not repeated here.
Further, the image acquisition device is a CMOS chip 6, and a PCB 7 is arranged on the CMOS chip 6.
It is apparent that the above examples are given by way of illustration only and are not limiting of the embodiments. Other variations and modifications of the present utility model will be apparent to those of ordinary skill in the art in light of the foregoing description. It is not necessary here nor is it exhaustive of all embodiments. And obvious variations or modifications thereof are contemplated as falling within the scope of the present utility model.
Claims (10)
1. A line laser profile scanning apparatus, comprising:
a line laser for emitting a line laser for measurement to a test object;
a collimator lens for collimating the line laser;
the optical filter emits the collimated line laser to an object to be measured to form diffuse reflection light, the optical filter filters the diffuse reflection light, and the optical filter comprises a plurality of areas with different light transmittance;
and the image acquisition device is used for acquiring the image of the diffuse reflection light filtered by the optical filter.
2. The line laser profile scanning device as claimed in claim 1, wherein: the areas with different light transmittance are strip-shaped.
3. The line laser profile scanning device as claimed in claim 1, wherein: the diffuse reflection light passes through areas of different light transmittance of the plurality of filters when scanning.
4. The line laser profile scanning device as claimed in claim 1, wherein: the optical filter is coated with coating films with different depths, and the light transmittance of the optical filter is reduced along with the increase of the coating film depth.
5. The line laser profile scanning device as claimed in claim 1, wherein: the optical filter is coated with coating films with different depths, and the optical filter with the surface gradually changing color is formed.
6. The line laser profile scanning device as claimed in claim 1, wherein: the focal point of the collimating mirror corresponds to the light source of the line laser.
7. The line laser profile scanning device as claimed in claim 1, wherein: and a lens group for adjusting the length of the diffuse reflection light is arranged between the optical filter and the image acquisition device.
8. The line laser profile scanning device as claimed in claim 1, wherein: the image acquisition device is a CMOS chip.
9. The line laser profile scanning device as claimed in claim 1, wherein: the optical filter is perpendicular to the diffuse reflection light.
10. The line laser profile scanning device as claimed in claim 1, wherein: the collimated line laser is perpendicular to the object to be measured.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320819506.XU CN219714305U (en) | 2023-04-13 | 2023-04-13 | Line laser contour scanning device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320819506.XU CN219714305U (en) | 2023-04-13 | 2023-04-13 | Line laser contour scanning device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219714305U true CN219714305U (en) | 2023-09-19 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202320819506.XU Active CN219714305U (en) | 2023-04-13 | 2023-04-13 | Line laser contour scanning device |
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| Country | Link |
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| CN (1) | CN219714305U (en) |
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- 2023-04-13 CN CN202320819506.XU patent/CN219714305U/en active Active
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Address after: Room 1201-1, 12th Floor, Building 2, No. 9 Ronghua South Road, Beijing Economic and Technological Development Zone, Daxing District, Beijing, 100176 (Yizhuang Cluster, High end Industrial Zone, Beijing Pilot Free Trade Zone) Patentee after: Beijing Zhita Visual Technology Co.,Ltd. Country or region after: China Address before: Room 1201-1, 12th Floor, Building 2, No. 9 Ronghua South Road, Beijing Economic and Technological Development Zone, Daxing District, Beijing, 100176 (Yizhuang Cluster, High end Industrial Zone, Beijing Pilot Free Trade Zone) Patentee before: BEIJING LITRONICS OPTOELECTRONICS TECHNOLOGY CO.,LTD. Country or region before: China |