CN100510674C - 干涉仪的被测透镜支撑装置 - Google Patents

干涉仪的被测透镜支撑装置 Download PDF

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Publication number
CN100510674C
CN100510674C CNB2006100066803A CN200610006680A CN100510674C CN 100510674 C CN100510674 C CN 100510674C CN B2006100066803 A CNB2006100066803 A CN B2006100066803A CN 200610006680 A CN200610006680 A CN 200610006680A CN 100510674 C CN100510674 C CN 100510674C
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China
Prior art keywords
lens
measured
interferometer
optical axis
pedestal
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Expired - Fee Related
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CNB2006100066803A
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English (en)
Chinese (zh)
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CN1818596A (zh
Inventor
大井重德
齐藤光昭
黑濑实
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Fujinon Corp
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Fujinon Corp
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  • Testing Of Optical Devices Or Fibers (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
CNB2006100066803A 2005-02-08 2006-02-08 干涉仪的被测透镜支撑装置 Expired - Fee Related CN100510674C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2005031840 2005-02-08
JP2005031840A JP4659476B2 (ja) 2005-02-08 2005-02-08 干渉計の被検レンズ支持装置

Publications (2)

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CN1818596A CN1818596A (zh) 2006-08-16
CN100510674C true CN100510674C (zh) 2009-07-08

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CNB2006100066803A Expired - Fee Related CN100510674C (zh) 2005-02-08 2006-02-08 干涉仪的被测透镜支撑装置

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CN (1) CN100510674C (https=)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101393073B (zh) * 2007-09-17 2011-06-22 鸿富锦精密工业（深圳）有限公司 偏心测量装置及测量仪器
TWI409431B (zh) * 2007-10-19 2013-09-21 Hon Hai Prec Ind Co Ltd 偏心測量裝置及測量儀器
KR100956230B1 (ko) * 2008-08-07 2010-05-04 삼성전기주식회사 렌즈 측정 장치 및 그 제어방법
AU2012395916B2 (en) * 2012-12-04 2017-12-21 Essilor International Apparatus and method for performing a reflection measurement on an eyeglass
JP6260141B2 (ja) * 2013-08-20 2018-01-17 株式会社ニコン アクセサリ連結装置
CN103499318B (zh) * 2013-10-21 2015-12-02 中国科学院光电技术研究所 一种光学元件自重变形量的测定方法
CN103528796A (zh) * 2013-10-23 2014-01-22 江苏双仪光学器材有限公司 一种干涉仪检具
CN103558013B (zh) * 2013-11-21 2015-11-18 苏州大学 一种旋转对称自由曲面透镜的检测方法
JP6492702B2 (ja) * 2015-01-30 2019-04-03 コニカミノルタ株式会社 光学素子の測定装置及び測定方法
CN109443280B (zh) * 2018-11-30 2024-08-30 松林光电科技（湖北）有限公司 一种透镜检测装置
CN109798840A (zh) * 2019-02-26 2019-05-24 中国科学院光电技术研究所 在拼接干涉仪中检测透镜面形的检测装置
CN110132167A (zh) * 2019-05-06 2019-08-16 苏州慧利仪器有限责任公司 平晶承托装置以及激光干涉检测设备
JP7310760B2 (ja) * 2020-08-31 2023-07-19 いすゞ自動車株式会社 搬送用パレット
JP7253753B1 (ja) 2021-11-15 2023-04-07 パナソニックＩｐマネジメント株式会社 マニュアル操作リング駆動装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4541717A (en) * 1983-12-08 1985-09-17 Fuji Photo Optical Co., Ltd. Attraction holding device

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5865504U (ja) * 1981-10-28 1983-05-04 オリンパス光学工業株式会社 レンズの肉厚測定機
JP3249717B2 (ja) * 1995-06-22 2002-01-21 キヤノン株式会社 汎用位置決めクランプ装置
JPH0921722A (ja) * 1995-07-04 1997-01-21 Olympus Optical Co Ltd レンズヤトイ
JPH09290340A (ja) * 1996-04-25 1997-11-11 Nikon Corp 円形体の心出し装置
JP2001147179A (ja) * 1999-11-24 2001-05-29 Olympus Optical Co Ltd 干渉計の被検レンズ支持機構

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4541717A (en) * 1983-12-08 1985-09-17 Fuji Photo Optical Co., Ltd. Attraction holding device

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Publication number Publication date
JP2006220440A (ja) 2006-08-24
CN1818596A (zh) 2006-08-16
JP4659476B2 (ja) 2011-03-30

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Granted publication date: 20090708

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