CH678666A5 - - Google Patents

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Publication number
CH678666A5
CH678666A5 CH7483A CH7483A CH678666A5 CH 678666 A5 CH678666 A5 CH 678666A5 CH 7483 A CH7483 A CH 7483A CH 7483 A CH7483 A CH 7483A CH 678666 A5 CH678666 A5 CH 678666A5
Authority
CH
Switzerland
Prior art keywords
wafer
piston
pressure
chamber
clamping
Prior art date
Application number
CH7483A
Other languages
German (de)
English (en)
Inventor
Ronald S Hershel
Martin E Lee
Original Assignee
Gen Signal Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US06/378,370 external-priority patent/US4425037A/en
Application filed by Gen Signal Corp filed Critical Gen Signal Corp
Publication of CH678666A5 publication Critical patent/CH678666A5/de

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00Systems with reflecting surfaces, with or without refracting elements
    • G02B17/08Catadioptric systems
    • G02B17/0892Catadioptric systems specially adapted for the UV
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B13/00Optical objectives specially designed for the purposes specified below
    • G02B13/24Optical objectives specially designed for the purposes specified below for reproducing or copying at short object distances
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00Systems with reflecting surfaces, with or without refracting elements
    • G02B17/08Catadioptric systems
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70225Optical aspects of catadioptric systems, i.e. comprising reflective and refractive elements
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7003Alignment type or strategy, e.g. leveling, global alignment
    • G03F9/7023Aligning or positioning in direction perpendicular to substrate surface
    • G03F9/7026Focusing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Lenses (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
CH7483A 1981-05-15 1982-05-17 CH678666A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US26424981A 1981-05-15 1981-05-15
US26417181A 1981-05-15 1981-05-15
US06/378,370 US4425037A (en) 1981-05-15 1982-05-14 Apparatus for projecting a series of images onto dies of a semiconductor wafer

Publications (1)

Publication Number Publication Date
CH678666A5 true CH678666A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1991-10-15

Family

ID=27401672

Family Applications (1)

Application Number Title Priority Date Filing Date
CH7483A CH678666A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1981-05-15 1982-05-17

Country Status (8)

Country Link
EP (3) EP0354148A3 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPS58500730A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
CH (1) CH678666A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (2) DE3249685C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
GB (1) GB2121552B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
NL (1) NL8220224A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
SE (4) SE450979B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
WO (1) WO1982004133A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5212500A (en) * 1991-03-15 1993-05-18 Eastman Kodak Company Writing beam focusing utilizing light of a different wavelength
DE69508228T2 (de) * 1994-06-02 1999-09-23 Koninklijke Philips Electronics N.V., Eindhoven Verfahren zur wiederholten abbildung eines maskenmusters auf einem substrat und vorrichtung zur durchführung des verfahrens
US5757469A (en) * 1995-03-22 1998-05-26 Etec Systems, Inc. Scanning lithography system haing double pass Wynne-Dyson optics
US5739964A (en) * 1995-03-22 1998-04-14 Etec Systems, Inc. Magnification correction for small field scanning
JP2565149B2 (ja) * 1995-04-05 1996-12-18 キヤノン株式会社 回路の製造方法及び露光装置
DE29705870U1 (de) * 1997-04-07 1998-08-20 Fehlert, Gerd-P., Dr.-Ing., 42115 Wuppertal Flachbildschirm

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US198159A (en) * 1877-12-11 Improvement in bottles for promoting vegetation
US419159A (en) * 1890-01-07 Signments
US3809050A (en) * 1971-01-13 1974-05-07 Cogar Corp Mounting block for semiconductor wafers
US3796497A (en) * 1971-12-01 1974-03-12 Ibm Optical alignment method and apparatus
US3818327A (en) * 1972-09-05 1974-06-18 Industrial Nucleonics Corp Measuring gauge with support for holding measured sheet and discharging foreign matter
US3951546A (en) * 1974-09-26 1976-04-20 The Perkin-Elmer Corporation Three-fold mirror assembly for a scanning projection system
US3917399A (en) * 1974-10-02 1975-11-04 Tropel Catadioptric projection printer
FR2330030A1 (fr) * 1975-10-31 1977-05-27 Thomson Csf Nouvel appareil photorepeteur de masques de haute precision
JPS5264932A (en) * 1975-11-25 1977-05-28 Hitachi Ltd Automatic focus adjusting device
US4103989A (en) * 1977-02-07 1978-08-01 Seymour Rosin Unit-power concentric optical systems
US4171870A (en) * 1977-05-06 1979-10-23 Bell Telephone Laboratories, Incorporated Compact image projection apparatus
US4190352A (en) * 1977-06-30 1980-02-26 Bell Telephone Laboratories, Incorporated Method and apparatus for continuously patterning a photosensitive tape
US4171871A (en) * 1977-06-30 1979-10-23 International Business Machines Corporation Achromatic unit magnification optical system
US4131267A (en) * 1978-06-02 1978-12-26 Disco Kabushiki Kaisha Apparatus for holding workpiece by suction
FR2429447A1 (fr) * 1978-06-23 1980-01-18 Thomson Csf Systeme optique de projection muni d'un positionneur de plaque
GB2063524B (en) * 1978-10-20 1982-12-22 Hitachi Ltd Method of positioning a wafer in a projection aligner
US4198159A (en) * 1978-12-29 1980-04-15 International Business Machines Corporation Optical alignment system in projection printing
DE2905635C2 (de) * 1979-02-14 1987-01-22 Perkin-Elmer Censor Anstalt, Vaduz Einrichtung zum Positionieren eines Werkstückes in Z-Richtung beim Projektionskopieren
FR2450470A1 (fr) * 1979-02-27 1980-09-26 Thomson Csf Systeme optique de projection en photorepetition
US4232969A (en) * 1979-05-30 1980-11-11 International Business Machines Corporation Projection optical system for aligning an image on a surface

Also Published As

Publication number Publication date
GB2121552A (en) 1983-12-21
SE8300183L (sv) 1983-01-14
SE450978B (sv) 1987-09-07
DE3249686C2 (de) 1986-11-13
SE8700053D0 (sv) 1987-01-08
DE3249685C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1987-09-24
SE451411B (sv) 1987-10-05
JPS58500730A (ja) 1983-05-06
NL8220224A (nl) 1983-04-05
JPH0313574B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1991-02-22
SE8700052L (sv) 1987-01-08
EP0146670A2 (en) 1985-07-03
SE459771B (sv) 1989-07-31
EP0078323A4 (en) 1983-08-09
GB2121552B (en) 1985-12-18
SE8700052D0 (sv) 1987-01-08
EP0078323B1 (en) 1987-01-14
EP0354148A3 (en) 1990-06-20
EP0146670B1 (en) 1989-07-19
SE450979B (sv) 1987-09-07
SE8700051D0 (sv) 1987-01-08
EP0146670A3 (en) 1985-11-27
WO1982004133A1 (en) 1982-11-25
SE8700051L (sv) 1987-01-08
SE8700053L (sv) 1987-01-08
EP0354148A2 (en) 1990-02-07
EP0078323A1 (en) 1983-05-11
SE8300183D0 (sv) 1983-01-14

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PL Patent ceased
PL Patent ceased