CA2373284A1 - Color structured light 3d-imaging system - Google Patents

Color structured light 3d-imaging system Download PDF

Info

Publication number
CA2373284A1
CA2373284A1 CA002373284A CA2373284A CA2373284A1 CA 2373284 A1 CA2373284 A1 CA 2373284A1 CA 002373284 A CA002373284 A CA 002373284A CA 2373284 A CA2373284 A CA 2373284A CA 2373284 A1 CA2373284 A1 CA 2373284A1
Authority
CA
Canada
Prior art keywords
image
light
data
color
image data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA002373284A
Other languages
English (en)
French (fr)
Inventor
Taiwei Lu
Jianzhong Zhang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
3D METRICS Inc
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of CA2373284A1 publication Critical patent/CA2373284A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2509—Color coding

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
CA002373284A 1999-05-14 1999-05-14 Color structured light 3d-imaging system Abandoned CA2373284A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US1999/010756 WO2000070303A1 (en) 1999-05-14 1999-05-14 Color structured light 3d-imaging system

Publications (1)

Publication Number Publication Date
CA2373284A1 true CA2373284A1 (en) 2000-11-23

Family

ID=22272767

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002373284A Abandoned CA2373284A1 (en) 1999-05-14 1999-05-14 Color structured light 3d-imaging system

Country Status (6)

Country Link
EP (1) EP1190213A1 (zh)
JP (1) JP2002544510A (zh)
CN (1) CN1159566C (zh)
AU (1) AU3994799A (zh)
CA (1) CA2373284A1 (zh)
WO (1) WO2000070303A1 (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109855559A (zh) * 2018-12-27 2019-06-07 成都市众智三维科技有限公司 一种全空间标定系统及方法
CN113654487A (zh) * 2021-08-17 2021-11-16 西安交通大学 一种单幅彩色条纹图动态三维测量方法及系统

Families Citing this family (58)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6556706B1 (en) * 2000-01-28 2003-04-29 Z. Jason Geng Three-dimensional surface profile imaging method and apparatus using single spectral light condition
JP2002191058A (ja) * 2000-12-20 2002-07-05 Olympus Optical Co Ltd ３次元画像取得装置および３次元画像取得方法
US7176440B2 (en) 2001-01-19 2007-02-13 Honeywell International Inc. Method and apparatus for detecting objects using structured light patterns
RU2184933C1 (ru) * 2001-02-21 2002-07-10 Климов Андрей Владимирович Устройство для бесконтактного контроля линейных размеров трехмерных объектов
RU2185599C1 (ru) * 2001-03-19 2002-07-20 Зеляев Юрий Ирфатович Способ бесконтактного контроля линейных размеров трехмерных объектов
US7174033B2 (en) 2002-05-22 2007-02-06 A4Vision Methods and systems for detecting and recognizing an object based on 3D image data
US7257236B2 (en) 2002-05-22 2007-08-14 A4Vision Methods and systems for detecting and recognizing objects in a controlled wide area
CN100417976C (zh) * 2002-09-15 2008-09-10 深圳市泛友科技有限公司 三维摄影技术方法
DE10250954B4 (de) * 2002-10-26 2007-10-18 Carl Zeiss Verfahren und Vorrichtung zum Durchführen einer Televisite sowie Televisiteempfangsgerät
US7146036B2 (en) 2003-02-03 2006-12-05 Hewlett-Packard Development Company, L.P. Multiframe correspondence estimation
TWI257072B (en) 2003-06-20 2006-06-21 Ind Tech Res Inst 3D color information acquisition method and device thereof
CN100387065C (zh) * 2003-07-07 2008-05-07 财团法人工业技术研究院 三维彩色信息撷取方法及其装置
JP3831946B2 (ja) * 2003-09-26 2006-10-11 ソニー株式会社 撮像装置
JP2005164434A (ja) * 2003-12-03 2005-06-23 Fukuoka Institute Of Technology 非接触三次元計測方法および装置
DE102004007829B4 (de) * 2004-02-18 2007-04-05 Isra Vision Systems Ag Verfahren zur Bestimmung von zu inspizierenden Bereichen
DE602005004332T2 (de) 2004-06-17 2009-01-08 Cadent Ltd. Verfahren zum Bereitstellen von Daten im Zusammenhang mit der Mundhöhle
EP1788348A4 (en) * 2004-08-12 2008-10-22 A4 Vision S A DEVICE FOR BIOMETRICALLY CONTROLLING THE SURFACE OF A FACE
US7646896B2 (en) 2005-08-02 2010-01-12 A4Vision Apparatus and method for performing enrollment of user biometric information
WO2006031143A1 (en) 2004-08-12 2006-03-23 A4 Vision S.A. Device for contactlessly controlling the surface profile of objects
JP5174684B2 (ja) * 2006-03-14 2013-04-03 プライムセンス リミテッド スペックル・パターンを用いた三次元検出
US8050486B2 (en) 2006-05-16 2011-11-01 The Boeing Company System and method for identifying a feature of a workpiece
US9052294B2 (en) 2006-05-31 2015-06-09 The Boeing Company Method and system for two-dimensional and three-dimensional inspection of a workpiece
US7495758B2 (en) 2006-09-06 2009-02-24 Theo Boeing Company Apparatus and methods for two-dimensional and three-dimensional inspection of a workpiece
JP2008170281A (ja) * 2007-01-11 2008-07-24 Nikon Corp 形状測定装置及び形状測定方法
DK2401575T3 (da) * 2009-02-25 2020-03-30 Dental Imaging Technologies Corp Fremgangsmåde og apparatur til generering af en fremvisning af en tredimensional overflade
DE102010064593A1 (de) * 2009-05-21 2015-07-30 Koh Young Technology Inc. Formmessgerät und -verfahren
JP5633719B2 (ja) * 2009-09-18 2014-12-03 学校法人福岡工業大学 三次元情報計測装置および三次元情報計測方法
CN102022981B (zh) * 2009-09-22 2013-04-03 重庆工商大学 测量亚像素位移的峰谷运动探测方法及装置
CN102052900B (zh) * 2009-11-02 2013-09-25 重庆工商大学 快速测量亚像素位移的峰谷运动探测方法及装置
US20110187878A1 (en) * 2010-02-02 2011-08-04 Primesense Ltd. Synchronization of projected illumination with rolling shutter of image sensor
US8279418B2 (en) 2010-03-17 2012-10-02 Microsoft Corporation Raster scanning for depth detection
CN101975994B (zh) * 2010-08-27 2012-03-28 中国科学院自动化研究所 多级透镜的三维成像系统
US20120062725A1 (en) * 2010-09-10 2012-03-15 Gm Global Technology Operations, Inc. System for error-proofing manual assembly operations using machine vision
CN102161291B (zh) * 2010-12-08 2013-03-27 合肥中加激光技术有限公司 三维成像水晶内雕像亭
TW201315962A (zh) * 2011-10-05 2013-04-16 Au Optronics Corp 投影式影像辨識裝置及其影像辨識方法
CN102628693A (zh) * 2012-04-16 2012-08-08 中国航空无线电电子研究所 一种用于摄像机主轴与激光束进行平行配准的方法
JP6005278B2 (ja) * 2012-07-25 2016-10-12 シーメンス アクチエンゲゼルシヤフトＳｉｅｍｅｎｓ Ａｋｔｉｅｎｇｅｓｅｌｌｓｃｈａｆｔ 特に透過性かつ散乱性の表面における三次元測定のためのカラーコーディング
ES2683364T3 (es) 2012-11-07 2018-09-26 Artec Europe S.A.R.L. Método para monitorizar dimensiones lineales de objetos tridimensionales
US10368053B2 (en) * 2012-11-14 2019-07-30 Qualcomm Incorporated Structured light active depth sensing systems combining multiple images to compensate for differences in reflectivity and/or absorption
EP2799810A1 (de) * 2013-04-30 2014-11-05 Aimess Services GmbH Vorrichtung und Verfahren zum simultanen dreidimensionalen Vermessen von Oberflächen mit mehreren Wellenlängen
TWI464367B (zh) * 2013-07-23 2014-12-11 Univ Nat Chiao Tung 主動式影像擷取之光學系統及光學方法
CN103697815B (zh) * 2014-01-15 2017-03-01 西安电子科技大学 基于相位编码的混频结构光三维信息获取方法
DE102014210672A1 (de) 2014-06-05 2015-12-17 BSH Hausgeräte GmbH Gargerät mit Lichtmusterprojektor und Kamera
CN104243843B (zh) * 2014-09-30 2017-11-03 北京智谷睿拓技术服务有限公司 拍摄光照补偿方法、补偿装置及用户设备
EP3234685B1 (en) 2014-12-18 2021-02-03 Facebook Technologies, LLC System, device and method for providing user interface for a virtual reality environment
WO2016137351A1 (ru) * 2015-02-25 2016-09-01 Андрей Владимирович КЛИМОВ Способ и устройство для зд регистрации и распознавания лица человека
CN104809940B (zh) * 2015-05-14 2018-01-26 广东小天才科技有限公司 几何立体图形投影装置及投影方法
CN105157613A (zh) * 2015-06-03 2015-12-16 五邑大学 利用彩色结构光的三维快速测量方法
CN105021138B (zh) * 2015-07-15 2017-11-07 沈阳派特模式识别技术有限公司 三维扫描显微镜及条纹投影三维扫描方法
CN106403838A (zh) * 2015-07-31 2017-02-15 北京航天计量测试技术研究所 一种手持式线结构光视觉三维扫描仪的现场标定方法
TWI550253B (zh) * 2015-08-28 2016-09-21 國立中正大學 三維影像掃描裝置及其掃描方法
CN105300319B (zh) * 2015-11-20 2017-11-07 华南理工大学 一种基于彩色光栅的快速三维立体重建方法
US10884127B2 (en) * 2016-08-02 2021-01-05 Samsung Electronics Co., Ltd. System and method for stereo triangulation
CN108693538A (zh) * 2017-04-07 2018-10-23 北京雷动云合智能技术有限公司 基于双目结构光的准确置信度深度摄像机测距装置及方法
CN108732066A (zh) * 2017-04-24 2018-11-02 河北工业大学 一种接触角测量系统
KR101931773B1 (ko) 2017-07-18 2018-12-21 한양대학교 산학협력단 형상 모델링 방법, 이를 이용하는 장치 및 시스템
CN109348607B (zh) * 2018-10-16 2020-02-21 华为技术有限公司 一种发光模组支架及终端设备
TWI763206B (zh) 2020-12-25 2022-05-01 宏碁股份有限公司 顯示驅動裝置及其操作方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4349277A (en) * 1980-06-11 1982-09-14 General Electric Company Non-contact measurement of surface profile
EP0076866B1 (de) * 1981-10-09 1985-05-02 Ibm Deutschland Gmbh Interpolierendes Lichtschnitt-Verfahren
ES2106502T3 (es) * 1993-01-21 1997-11-01 Technomed Ges Fur Med Und Med Procedimiento y dispositivo para la determinacion de la topografia de una superficie reflectante.
US5615003A (en) * 1994-11-29 1997-03-25 Hermary; Alexander T. Electromagnetic profile scanner

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109855559A (zh) * 2018-12-27 2019-06-07 成都市众智三维科技有限公司 一种全空间标定系统及方法
CN113654487A (zh) * 2021-08-17 2021-11-16 西安交通大学 一种单幅彩色条纹图动态三维测量方法及系统
CN113654487B (zh) * 2021-08-17 2023-07-18 西安交通大学 一种单幅彩色条纹图动态三维测量方法及系统

Also Published As

Publication number Publication date
CN1159566C (zh) 2004-07-28
CN1350633A (zh) 2002-05-22
JP2002544510A (ja) 2002-12-24
WO2000070303A1 (en) 2000-11-23
EP1190213A1 (en) 2002-03-27
AU3994799A (en) 2000-12-05

Similar Documents

Publication Publication Date Title
CA2373284A1 (en) Color structured light 3d-imaging system
TW385360B (en) 3D imaging system
US6341016B1 (en) Method and apparatus for measuring three-dimensional shape of object
KR100613421B1 (ko) 3차원 형상 측정 방법
US6549288B1 (en) Structured-light, triangulation-based three-dimensional digitizer
Tajima et al. 3-D data acquisition by rainbow range finder
US4842411A (en) Method of automatically measuring the shape of a continuous surface
JP4040825B2 (ja) 画像撮像装置及び距離測定方法
US6084712A (en) Three dimensional imaging using a refractive optic design
US7006132B2 (en) Aperture coded camera for three dimensional imaging
JP3884321B2 (ja) ３次元情報取得装置、３次元情報取得における投影パターン、及び、３次元情報取得方法
JP2010507079A (ja) 三次元輪郭の非接触検出のための装置および方法
KR20100017234A (ko) 편광 감지 센서와 연결된 편광 코드화 개구 마스크를 사용하는 단일-렌즈, 3-ｄ 영상화 장치
CA2017518A1 (en) Colour-range imaging
US6765606B1 (en) Three dimension imaging by dual wavelength triangulation
JPS58122409A (ja) 光セクシヨニング法
JP4090860B2 (ja) ３次元形状測定装置
JP2714152B2 (ja) 物体形状測定方法
JP2005520142A (ja) 物体の絶対座標測定方法および装置
JP2008070374A (ja) 画像撮像装置及び距離測定方法
KR20000053779A (ko) 2차원 격자무늬를 이용한 3차원 형상측정시스템
JP3912666B2 (ja) 光学的形状測定装置
JPH0723684Y2 (ja) レンジファインダ
JP4141627B2 (ja) 情報獲得方法、画像撮像装置及び、画像処理装置
JP4204746B2 (ja) 情報獲得方法、撮像装置及び、画像処理装置

Legal Events

Date Code Title Description
FZDE Discontinued