CA2329781A1 - Procede et appareil de test de reseaux d'interconnexion - Google Patents

Procede et appareil de test de reseaux d'interconnexion Download PDF

Info

Publication number
CA2329781A1
CA2329781A1 CA002329781A CA2329781A CA2329781A1 CA 2329781 A1 CA2329781 A1 CA 2329781A1 CA 002329781 A CA002329781 A CA 002329781A CA 2329781 A CA2329781 A CA 2329781A CA 2329781 A1 CA2329781 A1 CA 2329781A1
Authority
CA
Canada
Prior art keywords
plasma
electrodes
circuit
voltage
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA002329781A
Other languages
English (en)
Inventor
Pinhas Blau
Shabtai Negri
Yaakov Levy
David Banitt
Moshe Ben Shlomo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
EXSIGHT ELECTRO-OPTICAL SYSTEMS Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from IL12730398A external-priority patent/IL127303A0/xx
Application filed by EXSIGHT ELECTRO-OPTICAL SYSTEMS Ltd filed Critical EXSIGHT ELECTRO-OPTICAL SYSTEMS Ltd
Publication of CA2329781A1 publication Critical patent/CA2329781A1/fr
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/54—Testing for continuity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/07—Non contact-making probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Plasma Technology (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

L'invention concerne un procédé et un appareil de test de réseaux d'interconnexion, le procédé consistant à générer au moins deux jets de plasma, chacun à côté d'un point distinct (12, 13) du circuit à tester ; à appliquer une différence de tension pour provoquer le flux d'un courant électrique entre les points du circuit, la tension étant appliquée à chaque point par le jet de plasma correspondant ; et à maintenir le flux de courant pour réaliser le procédé de test. On génère chaque jet de plasma en produisant une décharge entre deux électrodes dans une cavité, ce plasma étant éjecté par un orifice. L'appareil comprend : au moins deux électrodes (14, 16) d'injection de plasma destinées à entraîner un courant électrique entre deux points du circuit à tester, chaque électrode étant placée ou pouvant être placée de manière à orienter le plasma généré sur un des deux points ; un premier circuit électrique (21, 27) d'alimentation en tension de chaque électrode d'injection de plasma ; un dispositif (18, 20) d'alimentation en gaz de chaque électrode d'injection de plasma ; et un deuxième circuit électrique (21, 27) similaire au premier circuit électrique ou différent et destiné à fournir une décharge électrique.
CA002329781A 1998-04-27 1999-02-15 Procede et appareil de test de reseaux d'interconnexion Abandoned CA2329781A1 (fr)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
IL124239 1998-04-27
IL12423998 1998-04-27
IL12730398A IL127303A0 (en) 1998-11-26 1998-11-26 Method and apparatus for testing interconnect networks
IL127303 1998-11-26
PCT/IL1999/000091 WO1999056137A1 (fr) 1998-04-27 1999-02-15 Procede et appareil de test de reseaux d'interconnexion

Publications (1)

Publication Number Publication Date
CA2329781A1 true CA2329781A1 (fr) 1999-11-04

Family

ID=26323634

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002329781A Abandoned CA2329781A1 (fr) 1998-04-27 1999-02-15 Procede et appareil de test de reseaux d'interconnexion

Country Status (5)

Country Link
EP (1) EP1076827A1 (fr)
JP (1) JP2002513157A (fr)
KR (1) KR20010043017A (fr)
CA (1) CA2329781A1 (fr)
WO (1) WO1999056137A1 (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6268719B1 (en) * 1998-09-23 2001-07-31 Delaware Capital Formation, Inc. Printed circuit board test apparatus
JP4741110B2 (ja) * 2000-06-05 2011-08-03 株式会社半導体エネルギー研究所 検査装置、発光装置の作製方法
JP2010190603A (ja) * 2009-02-16 2010-09-02 Hioki Ee Corp プローブ、プローブユニットおよび測定装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0218058B1 (fr) * 1985-09-04 1990-05-09 Siemens Aktiengesellschaft Procédé pour tester le fonctionnement électrique de plage de connexion, en particulier d'un circuit imprimé
US5202623A (en) * 1992-02-26 1993-04-13 Digital Equipment Corporation Laser-activated plasma chamber for non-contact testing
DE4228691A1 (de) * 1992-08-28 1994-03-03 Siemens Ag Vorrichtung für die elektrische Funktionsprüfung von Verdrahtungsfeldern, insbesondere von Leiterplatten
US5587664A (en) * 1995-07-12 1996-12-24 Exsight Ltd. Laser-induced metallic plasma for non-contact inspection

Also Published As

Publication number Publication date
JP2002513157A (ja) 2002-05-08
WO1999056137A1 (fr) 1999-11-04
EP1076827A1 (fr) 2001-02-21
KR20010043017A (ko) 2001-05-25

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Legal Events

Date Code Title Description
FZDE Discontinued