CA2050501A1 - Methode de verification de circuits - Google Patents

Methode de verification de circuits

Info

Publication number
CA2050501A1
CA2050501A1 CA2050501A CA2050501A CA2050501A1 CA 2050501 A1 CA2050501 A1 CA 2050501A1 CA 2050501 A CA2050501 A CA 2050501A CA 2050501 A CA2050501 A CA 2050501A CA 2050501 A1 CA2050501 A1 CA 2050501A1
Authority
CA
Canada
Prior art keywords
information
nodes
levels
voltage ranges
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA2050501A
Other languages
English (en)
Other versions
CA2050501C (fr
Inventor
Alice Wilson (Nee Mckeon)
Benjamin Rogel-Favila
Antony Wakeling
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DIAGNOSYS Ltd
Original Assignee
Alice Wilson (Nee Mckeon)
Benjamin Rogel-Favila
Antony Wakeling
Schlumberger Technologies Limited
Diagnosys Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB909019614A external-priority patent/GB9019614D0/en
Application filed by Alice Wilson (Nee Mckeon), Benjamin Rogel-Favila, Antony Wakeling, Schlumberger Technologies Limited, Diagnosys Limited filed Critical Alice Wilson (Nee Mckeon)
Publication of CA2050501A1 publication Critical patent/CA2050501A1/fr
Application granted granted Critical
Publication of CA2050501C publication Critical patent/CA2050501C/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/3167—Testing of combined analog and digital circuits
CA002050501A 1990-09-07 1991-09-03 Methode de verification de circuits Expired - Fee Related CA2050501C (fr)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
GB909019614A GB9019614D0 (en) 1990-09-07 1990-09-07 Improved probing in analogue diagnosis
GB9019614.8 1990-09-07
GB9107484.9 1991-04-09
GB9107484A GB2249399B (en) 1990-09-07 1991-04-09 Circuit test method

Publications (2)

Publication Number Publication Date
CA2050501A1 true CA2050501A1 (fr) 1992-03-08
CA2050501C CA2050501C (fr) 1999-12-21

Family

ID=26297623

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002050501A Expired - Fee Related CA2050501C (fr) 1990-09-07 1991-09-03 Methode de verification de circuits

Country Status (6)

Country Link
US (1) US5210486A (fr)
EP (1) EP0474439B1 (fr)
JP (1) JP3219287B2 (fr)
CA (1) CA2050501C (fr)
DE (1) DE69127149T2 (fr)
ES (1) ES2104672T3 (fr)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2278689B (en) * 1993-06-02 1997-03-19 Ford Motor Co Method and apparatus for testing integrated circuits
US5544175A (en) * 1994-03-15 1996-08-06 Hewlett-Packard Company Method and apparatus for the capturing and characterization of high-speed digital information
US5659257A (en) * 1994-07-05 1997-08-19 Ford Motor Company Method and circuit structure for measuring and testing discrete components on mixed-signal circuit boards
US6393385B1 (en) * 1995-02-07 2002-05-21 Texas Instruments Incorporated Knowledge driven simulation time and data reduction technique
US7395468B2 (en) * 2004-03-23 2008-07-01 Broadcom Corporation Methods for debugging scan testing failures of integrated circuits
US7581150B2 (en) 2004-09-28 2009-08-25 Broadcom Corporation Methods and computer program products for debugging clock-related scan testing failures of integrated circuits
US7500165B2 (en) 2004-10-06 2009-03-03 Broadcom Corporation Systems and methods for controlling clock signals during scan testing integrated circuits
CN105629156B (zh) * 2016-03-10 2018-04-13 电子科技大学 基于遗传规划的模拟电路故障测试最优序贯搜索方法
US11045711B2 (en) 2019-03-04 2021-06-29 MagSkiTies LLC Ski management device

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4709366A (en) * 1985-07-29 1987-11-24 John Fluke Mfg. Co., Inc. Computer assisted fault isolation in circuit board testing
US4847795A (en) * 1987-08-24 1989-07-11 Hughes Aircraft Company System for diagnosing defects in electronic assemblies
US4964125A (en) * 1988-08-19 1990-10-16 Hughes Aircraft Company Method and apparatus for diagnosing faults
GB8900386D0 (en) * 1989-01-09 1989-03-08 Shlumberger Technologies Limit Circuit test method
US5157668A (en) * 1989-07-05 1992-10-20 Applied Diagnostics, Inc. Method and apparatus for locating faults in electronic units
FR2659144B2 (fr) * 1989-07-13 1992-07-24 Dassault Electronique Dispositif electronique de test d'un reseau de composants, notamment un circuit electronique.

Also Published As

Publication number Publication date
EP0474439B1 (fr) 1997-08-06
JP3219287B2 (ja) 2001-10-15
ES2104672T3 (es) 1997-10-16
US5210486A (en) 1993-05-11
DE69127149T2 (de) 1998-02-05
DE69127149D1 (de) 1997-09-11
EP0474439A2 (fr) 1992-03-11
CA2050501C (fr) 1999-12-21
JPH04289471A (ja) 1992-10-14
EP0474439A3 (en) 1993-06-02

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